83 results about "Transmission illumination" patented technology

To provide a blue composition for a color filter which realizes an image with a high color purity, a color filter and a color image display device.

A color image display device comprising a combination of light bulbs, a color filter having color elements of at least three colors of red, green and blue corresponding to the light bulbs, and a backlight for transmission illumination, wherein the backlight contains a LED in its structure, and under the following definitions: λ_n nm represents a wavelength at every interval of 5 nm in the visible light range of from 380 to 780 nm; T^R(λ_n) a spectral transmittance (%) at a wavelength λ_n nm by a red pixel of the color filter; and I(λ_n) a relative emission intensity, normalized by a total emission intensity, at a wavelength λ_n nm from the backlight, these satisfy the following condition (1):

I(620-680)×T^R(620-680)≧1.1   (1)

The size and production costs of an optical microscope apparatus capable of blocking light or maintaining the specimen environment are reduced. The provided optical microscope apparatus includes a microscope that has a stage for mounting a specimen A, a transmission-illumination optical system, and an detection optical system; and a housing that surrounds the microscope, wherein the housing includes a fixed housing, and a movable housing, wherein, among optical parts constituting the transmission-illumination optical system and the image-forming optical system, at least some optical parts disposed above the stage are movable, and wherein a switching mechanism is provided, the switching mechanism being configured to retract the optical parts away from above the stage when the movable housing is disposed in an open position relative to the fixed housing and to substantially align the optical axes of both optical systems when the movable housing is disposed in a closed position relative to the fixed housing.

The invention provides a detecting device of wiring figures and a method thereof, which can differentiate dents and protuberances generated on the surface of the figures, and can a measure linewidth when detecting out the dents. As means to solve the problems, from one side equipped with figures of TAB belts, luminous light is irradiated in a slantly ripping way for the detected area through a reflecting luminous unit (12), meanwhile from the opposite side of one side formed with figures, the luminous light is irradiated through a transmission luminous unit (13), and figures are shot through a shooting unit (11). If dents are present on the surface of the figures, the reflected light from the reflecting luminous unit (12) is ripped into the shooting unit (11), and the part is shot as brightness. Also, through the luminous light from the transmission luminous unit (13), the part formed with figures are shot as grey, while the part not formed with figures are shot as brightness. Therefore, through using the reflected illumination and the transmission illumination to shoot, the linewidth can be measured when detecting out the dents.

An electronic component mounting apparatus which uses a mounting head to hold an electronic component, takes a picture of the electronic component by a line camera (11), processes the image of the electronic component taken by the line camera, and identifies the electronic component by using a recognition unit (16) position, positioning the electronic component on the substrate according to the position recognition result, and mounting the electronic component on the substrate. The pre-stored offset for each identification system with its own light source is used for positioning when correcting the position according to the position of the identification result, wherein the light source is a light source for transmitted illumination (15a) or Light source (15b) for reflected lighting. Even in such an electronic component mounting apparatus that selectively uses a plurality of recognition systems, differences in position recognition results caused by use of other types of lighting methods are corrected to secure necessary component mounting accuracy.

The invention provides an alignment inspection device and method for a liquid crystal display panel. The alignment inspection device for the liquid crystal display panel comprises light sources, an alignment CCD camera (50) and a transparent fixed disc (60) located below the alignment CCD camera (50); the light sources comprise the upper light source located above the transparent fixed disc (60) and the lower light source located below the transparent fixed disc (60); a circle of reflecting film (61) is arranged on the edge of the lower surface of the transparent fixed disc (60). As the upper light source and the lower light source provide a vertical illumination mode and a transmission illumination mode respectively, the alignment marker recognition rate of the alignment CCD camera can be effectively increased, and alignment detection accuracy of the alignment CCD camera can be effectively improved. According to the alignment inspection method for the liquid crystal display panel, when alignment markers are overlapped with the edge of the transparent fixed disc, by the adoption of the mode of combining vertical illumination and transmission illumination, the alignment marker recognition rate of the alignment CCD camera can be effectively increased, and the alignment detection accuracy is high.

The invention discloses a sunlight conveyor for direct illumination of a basement, which comprises an automatic polar coordinate sunlight tracking system, wherein a plurality of condensers which are arranged on the ground are connected with the automatic polar coordinate sunlight tracking system, optical output ends of the condensers are connected with optical input ends of a light guide device, the light guide device extends into the basement, and optical output ends of the light guide device, which serve as an illuminating surface, are arranged on a ceiling of the basement. The sunlight conveyor differs from the method for directly illuminating an underground structure by lighting drums which are commonly used at present, and condensation is achieved to increase the brightness, so that the problem of low brightness is solved; and transmission illumination in the air is achieved directly in a reflecting mode, so that the cost of the system is greatly reduced when compared with that of a light-guide fiber transmission illumination system. Besides, a method for achieving uniform illumination of a large area by secondary curved surface reflection is used for further optimizing the luminous effect after condensation, and the sunlight conveyor which serves as an enhanced lighting source for the underground structure is the optimal choice with respect to the method. The sunlight conveyor is obvious in social benefits such as energy conservation and emission reduction and has great practical values.

The device is composed of the lighting system, mechanical drive unit and the light pipe transmission system. The lighting system includes the lighting pipe composed of at least two 'L' shaped prepositive light pipes and the collecting light pipe located between the said 'L' shaped pipes. The lighting system through a bracket is connected to the assisting axis in the assisting axis mechanism. The principal axis in the principal axis mechanism is in hollowness type. Thus, the light pipe transmission system is installed inside the principal axis. The exit of the collecting light pipe is faced tothe entrance of the light pipe transmission system. The invented device can transfer visible light, infrared ray and ultraviolet radiation so as to use full spectrum of sunlight. The light pipe possesses effect of ideal total reflection. Thus light beam can be transmitted in long distance. The invention has the advantages of easy of manufacture and low cost.

There are provided a blue color composition for color filter, a color filter, and a color image display device capable of realizing an image of high purity. A color image display device is formed by a combination of an optic shutter, a color filter having at least three color elements: red, green, and blue corresponding to the optic shutter, and a backlight for transmission lighting. The backlight includes an LED in its structure. When the wavelength of the visible light range 380 to 780 nm for each 5 nm is lambdannm, the spectral transmittance (%) at the wavelength lambdannm by the red color pixel of the color filter is T(lambdan), and the relative light emission intensity normalized by the entire light emission intensity at the wavelength lambdannm from the backlight is I(lambdan), these satisfy the condition (1) as follows: I(620 - 680) x T(620 - 680) >= 1.1(1).

A pattern detecting device uses indirect illumination light and transmission illumination light to differentiate the concave pit and bulge generated at surface of the pattern and only detects the concave pit as the badness. The pattern detecting device judges whether the pattern is qualified according to the camera image of the illumination light for illuminating the pattern (2) formed on a light transmission substrate (1); the pattern detecting device comprises a first lighting unit (31) for irradiating the illumination light almost vertical to the substrate relative to the central light; a second lighting unit (32) for irradiating illumination light to the substrate from the detecting area (6) arranged at back of the substrate to the area of substrate mapped on the normal direction; a camera unit (33) arranged on the direction the same with the illumination direction of the first lighting unit (31); and a control unit (4) for controlling the first lighting unit and the second lighting unit (32). The control unit irradiates the first lighting unit and the second lighting unit; the camera unit shoots the irradiated pattern.

The invention relates to a large-format high-speed high-precision automatic optical detector, belongs to the field of automatic optical detection, and solves the problem that the detection precision tends to be influenced by different errors when a mobile small-view-field lens is moved in a present automatic optical detector. The detector comprises a support platform, damping supports, a translation guide rail pair, a workbench on the translation guide rail pair, a transmission illumination light source, a precise driver, a control system, a grating ruler, a lens support, a reflection illumination light source, a reflector, a precise focusing platform, a large-view-field high-precision lens and a splicing detector focal plane assembly. The imaging view field of the large-view-field high-precision lens is greater than 750mm, an imaging focal plane is composed of a triangularly spliced detector array, and part or all spliced detectors are controlled to work in different frame frequencies to match the movement speeds of different workpieces. The large-view-field high-precision lens is combined with the multi-detector spliced focal plane, the problem that a single lens cannot realize large-view-field imaging but multiple lenses are inconsistent in imaging is overcome, and the detection precision and efficiency are improved.

Provided is an inspection apparatus of a wiring pattern that has a small number of false detections and can reduce inspection time by combining an inspection by vertical illumination and that by reflection illumination. A pattern 5a on a TAB tape 5 is carried to an inspection section 1 by a tape conveyance mechanism 10, illumination light is applied from a transmission illumination means 1a, the transmitted illumination image of the pattern 5a is imaged by a CCD line sensor 1c, illumination light is applied from a vertical illumination means 1b, and the vertical illumination image from the pattern 5a is imaged. The captured image is sent to a control section 4. The control section 4 compares the pattern of the transmission illumination image with a first reference pattern, inspects the pattern 5a, compares the pattern of the vertical illumination image at a position corresponding to a faulty section with a second reference pattern regarding the pattern 5a that is determined to be a faulty candidate, and determines whether the pattern 5a is conforming or not.

The invention discloses a screen stain handling device and a screen stain handling method. The device comprises a stain detection module, a display content detection module and a display control module. The stain detection module is used for detecting transmission illumination intensity of a screen pixel region pre-partitioned in a detected screen, and notifying the display content detection module of position information of the screen pixel region when judging the detected transmission illumination intensity of the screen pixel region is smaller than a preset threshold value. The display content detection module is used for detecting a display cache region corresponding to a screen pixel region position with the transmission illumination intensity smaller than the preset threshold value according to the notification information of the stain detection module, and notifying the display control module when reading display content is stored in the display cache region. The display control module is used for controlling the reading display content of the display cache region to be displayed at a corresponding position of the screen in a rolling manner. By the screen stain handling device and the screen stain handling method, text content shielded by screen stains can be displayed dynamically to facilitate reading of users, and accordingly, user experience is improved.

The present invention provides a film thickness unevenness inspection device and method capable of acquiring an image with brightness and contrast suitable for inspection, so as to obtain an accurate inspection result. The present invention discloses a film thickness unevenness inspection device and method, characterized in moving a substrate with a surface formed thereon a coating film along a direction and, at the same time, inspecting film thickness unevenness of the coating film formed on the substrate. A film thickness inspection portion is provided for inspecting a thickness of the coating film. A light source portion comprises a reflection illumination portion installed in one side of an image capturing portion, and a transmission illumination portion installed in a location opposite to the image capturing portion with the substrate installed in-between. The image capturing portion comprises an image capturing portion angle adjustment mechanism for adjusting a relative angle with respect to the substrate. The reflection illumination portion comprises a reflection illumination angle adjustment mechanism for adjusting a relative angle between the reflection illumination portion and the substrate. The transmission illumination portion comprises a transmission illumination angle adjustment mechanism for adjusting a relative angle between the transmission illumination portion and the substrate. The film thickness unevenness inspection device comprises a control portion. According to film thickness information from the film thickness inspection portion, the control portion controls the reflection illumination angle adjustment mechanism and the transmission illumination angle adjustment mechanism to regulate a light quantity of reflection illumination and a light quantity of transmission illumination.

The invention relates to a mobile microscopic imaging device comprising a sample stage for holding a sample to be imaged, at least one light source for illumination of the sample, an imaging panel capable of capturing an image of the sample upon transmission illumination of the sample by the light source, and an optical magnification unit between the sample and the imaging panel for guiding light from the illuminated sample to the imaging panel so that a magnified image of at least portion of the sample is formed at the imaging panel. According to the invention, the optical magnification unit comprises a filter integrated polymeric lens assembly in a transmitted light fluorescence configuration which allows for both miniaturization of the device to a truly mobile level and reducing manufacturing costs.

The invention relates to a substrate inspecting device and a transmission illumination device for substrate inspecting device. The substrate inspecting device can be used for preventing infrared light from the infrared light source from transmitting substrate and emitting to the camera, thereby accurately inspecting the substrate. The shape and the arrangment of infrared light can be set in the mode that the view of infrared light source of a CCD camera is covered by the view of the substrate of the CCD camera. However, by the effect of Fresnel lens, the illuminating angle of infrared light emitted from LED elment equipped near the end of the infrered light source deflects to the end directon of the substrate. In addition, the intensify of the infrared light sourface on the end region of the substrate to the substrate is larger than the intensify of the infrared light on the central part of the substrate.

The invention relates to a microscope (100) having a transmitted illumination device (10) for critical illumination of an object (O) to be viewed, comprising:

a light source (20) comprising an LED arrangement having a light emitting surface;

a light directing unit (30, 30′) comprising a collimator (35, 35′) and a reflective enveloping surface (34, 34′), both of them for aligning light coupled into the light directing unit (30, 30′), also comprising an outcoupling surface (32, 32′), the outcoupling surface (32, 32′) possessing an outcoupling surface dimension (D), the light emitting surface of the light source (20) being smaller than the outcoupling surface (32, 32′) of the light directing unit (30, 30′), the light directing unit (30, 30′) being arranged in such a way that light emitted from the light source (20) is coupled in, and is coupled out from the outcoupling surface (32, 32′);

a condenser (40) between the outcoupling surface (32, 32′) of the light directing unit (30, 30′) and the object (O) to be viewed, the condenser having an aperture (41) having an aperture dimension (A) and being arranged so that the aperture (41) is completely irradiated with the light coupled out from the outcoupling surface (32, 32′).

A microscope system is characterized in comprising a transmission illumination optical system having a light source (11) and a condenser lens (13); a first dry objective (15a) having a magnification of from 20 or higher to 40 or lower and capable of viewing by at least one of a differential interference viewing method and a modulation contrast viewing method; and a second dry objective (15b) having a magnification of from 60 or higher to 100 or lower and capable of viewing by a differential interference viewing method; the first objective (15a) and the second objective (15b) being exchangeable.

The invention discloses a sunlight transmission device for illuminating an underground building, and the sunlight transmission device comprises a folding surface type collecting mirror and a parabolic cylinder curved surface dimming mirror which are fixedly connected with an optical axis, wherein the folding surface type collecting mirror and the parabolic cylinder curved surface dimming mirror are provided with the same focal point and are respectively located at two sides of the focal point; the folding surface type collecting mirror faces to the sun; and parallel sunlights reflected by the parabolic cylinder curved surface dimming mirror are reflected to a light transmitting barrel at the top of the underground building through a curved surface light-guiding mirror. Compared with the condition that the existing illumination of an underground garage is directly carried out by a light collecting barrel, the brightness of the sunlight collected by a light collecting system is obviously enhanced; and the sunlight transmission device directly realizes the transmission illumination by a reflection manner so that the cost is greatly reduced compared with the optical fiber transmission illumination.