2results about How to "Avoid incidence" patented technology

The application provides a display panel and a preparation method thereof, and solves the problems of poor display color and poor display uniformity in the prior art. The display panel comprises: a substrate; an isolation structure located on one side of the substrate, the isolation structure comprising a plurality of first openings; a light-emitting device partially located in the first openings; a light-blocking layer located on the side of the isolation structure away from the substrate, comprising a plurality of second openings, the orthographic projection of the second openings on the substrate covering the orthographic projection of the first openings on the substrate; and a texture layer located on the side of the light-blocking layer away from the substrate, the orthographic projection of the light-blocking layer on the substrate being located within the range of the orthographic projection of the texture layer on the substrate.

A cleaning machine table comprises a cleaning pool, a cleaning device and a control device, the manipulator is suitable for grabbing the wafer and transmitting the wafer; a transmitting end of the laser detection module is located on one side of the cleaning pool, a receiving end of the laser detection module is located on the other side of the cleaning pool, and a light path between the transmitting end and the receiving end corresponds to the position of the wafer grabbed by the manipulator; the first baffle is located on one side of the receiving end away from the transmitting end; and the first anti-reflection layer is arranged between the first baffle and the receiving end, and the first anti-reflection layer is suitable for inhibiting mirror reflection of the laser. The first anti-reflection layer is arranged, so that laser subjected to scattering and diffuse reflection on the surface of the wafer is prevented from entering the surface of the first baffle and being reflected to the receiving end through the mirror surface of the first baffle, reflected light received by the receiving end is reduced, and the situation that the light received by the receiving end is too complex is avoided. Therefore, the receiving end can judge the position of the wafer according to the received laser from the transmitting end, so that machine shutdown caused by wrong feedback of the laser detection module to a machine is avoided.