The present application relates to a kind of film defect identification and
processing system, photograph module cooperates with the
surface pattern information of film product obtained by graphic acquisition module, microscopic interference module can obtain the internal pattern information of film product, two kinds of pattern information agree to be transmitted to
information processing module,
information processing module carries out analysis to pattern information and judges whether product has defect,
information processing module will be analyzed and identified pattern defect
information transmission to control terminal, control will be analyzed to pattern defect information, and according to the result of pattern defect
information analysis to adjust the process parameter of
production line, to eliminate the defect on production in turn;The present
system can gather the
surface pattern of film product also can gather its internal pattern, will not be missed;And the present
system is further provided with control terminal outside information
processing module, control terminal back to pattern defect information analyzed by information
processing module again analysis, to adjust the process of
production line in turn, realize active intervention to eliminate defect.