This invention discloses a method for fabricating a
photomask using deep
silicon etching technology, comprising the following steps: a) pretreatment of a
silicon substrate; b)
coating a pretreated
silicon substrate with
photoresist, followed by soft baking, resting,
exposure, development, fixing, and post-baking to form the desired pattern on the silicon substrate; c)
etching and cleaning the silicon substrate from step b to obtain the
photomask. A method for fabricating
perovskite array patterns using this
photomask is also provided. This invention employs
dry etching to fabricate
perovskite array patterns, utilizing
reactive ion beam etching (RIB) technology. The process is simple, the IIB equipment is simple in structure and inexpensive, and it is compatible with all MEMS-scale manufacturing plants, significantly reducing manufacturing costs. It proposes a new
process strategy for
perovskite array patterning, reducing side
corrosion, improving patterning accuracy, and is suitable for micron-level pattern
etching.