The application discloses a kind of sheet type porcelain
dielectric capacitor appearance defect intelligent detection method and
system, the method includes: the acquisition of the measured gray image of measured
capacitor, the measured gray image is preprocessed and the
region of interest extraction;The outline of measured
capacitor is extracted, the center coordinates of the outline are calculated, and the
pose of the outline is corrected;The appearance similarity of the measured gray image after correction is judged with standard sample, and the
macro defect of measured capacitor is judged, if similarity coefficient is not lower than similarity judgment threshold, then enter next step;Determine the abnormal pixel point in measured image, and the abnormal pixel point is clustered analysis.The application can realize the high-precision automatic detection and classification of capacitor device size compliance, mixing, damage,
foreign matter and surface micro scratch by fusing geometric feature constraint, normalized cross-correlation
template matching and improved multi-variance differential gradient operator.