397 results about "Optical diffraction" patented technology

Lightwave diffraction device formed of a dielectric layer (4), a mirror (12) arranged at the lower face (10) of said layer, a semi-reflective structure (13) arranged at the upper face (100) of said layer, and a diffractive structure (8) arranged in said layer or on its faces. The height (H) of the layer is chosen so as to substantially satisfy the resonance condition for at least one leaky mode propagating in said layer for at least one given incident wave having a determined wavelengthλ and a determined incidence angle θ_c. Next, the diffractive structure is arranged so that there is no propagating positive diffracted order, and so that all negative orders other than the −1^st propagating order have zero or a relatively small diffraction efficiency, the reflected −1^st order propagating in a direction non-parallel to the incident wave. This diffraction device allows a high diffraction efficiency of up to 100% for the −1^st order.

PCT No. PCT/GB97/00817 Sec. 371 Date Apr. 13, 1998 Sec. 102(e) Date Apr. 13, 1998 PCT Filed Mar. 24, 1997 PCT Pub. No. WO97/36198 PCT Pub. Date Oct. 2, 1997An optical diffraction grating is formed from a region of photonic crystalline material Light is coupled into the photonic crystalline material, and the grazingly emergent output beam is collected. The photonic crystalline material may include an array of holes formed in a substrate of dielectric material, e.g., InP, and integrated with planar waveguide structures.

A doubly clamped beam has an asymmetric piezoelectric layer within the beam with a gate proximate to the beam within a submicron distance with a gate and beam dipole. A suspended beam is formed using a Cl₂/He plasma etch supplied at a flow rate ratio of 1:9 respectively into a plasma chamber. A parametric amplifier comprises a NEMS signal beam driven at resonance and a pair of pump beams driven at twice resonance to generate a modulated Lorentz force on the pump beams to perturb the spring constant of the signal beam. A bridge circuit provides two out-of-phase components of an excitation signal to a first and second NEMS beam in a first and second arm. A DC current is supplied to an AC driven NEMS device to tune the resonant frequency. An analyzer comprises a plurality of piezoresistive NEMS cantilevers with different resonant frequencies and a plurality of drive/sense elements, or an interacting plurality of beams to form an optical diffraction grating, or a plurality of strain-sensing NEMS cantilevers, each responsive to a different analyte, or a plurality of piezoresistive NEMS cantilevers with different IR absorbers.

An optical diffraction grating includes a substrate and a diffraction surface comprising, for example, diffraction grooves. The diffraction grating has a spatially varying diffraction efficiency which increases or decreases as a function of distance from a reference location at which an incident light beam is received at the grating. Spatially varying the diffraction efficiency of the grating may be accomplished by selectively changing or modifying one or more grating design parameters such as the shape, size, depth, profile, pitch, and optical properties of the diffraction grooves at predetermined locations on the grating.

The invention provides an incoherent digital holography three-dimensional dynamic microscopic imaging system and method and belongs to the field of an optical diffraction imaging and incoherent digital holography technology. Three-dimensional microscopic imaging of dynamic samples is achieved through adoption of a single exposure phase shift technology based on a phase spatial light modulator on the condition of incoherent light illumination. In a hologram shooting light path, incident light is incoherent light transmitted or reflected by the samples, is subjected to convergence of a collimation lens and modulation of the spatial light modulator, and is received by an image sensor. The image sensor and the spatial light modulator are respectively connected with a computer. Diffraction spectroscopic phase mask patterns which are made and generated in the computer are loaded on the spatial light modulator. In order to enable a plurality of phase holograms to be recorded by the system through one-time exposure, a phase loading method on the spatial light modulator needs to be adjusted to a regional phase shift loading method. The incoherent digital holography three-dimensional dynamic microscopic imaging system and method can be used for simultaneously recording the plurality of incoherent digital holograms through one-time exposure, and can be used for carrying out real-time three-dimensional imaging with low requirements for coherence of light sources. Moreover, any moving components or scanning components are not needed in the system.

An enhanced diffraction based biosensor system and method are provided for detecting an analyte of interest in a test medium. The system incorporates at least one additional detection tag substance with the analyte of interest, the tag emitting a measurable parameter that is different from optical diffraction characteristics of the analyte. The biosensor may be a “fluoroptical” system wherein the detection tag is a fluorescence emitting substance, including fluorescent-labeled diffraction enhancing elements. The enhanced diffraction biosensor system may determine the presence of analytes in biological fluids both qualitatively and quantitatively.

Decoration of a material is enabled with a high degree of recycling properties while satisfying the requirements for putting a structural color into practical use on the industrial scale. Furthermore, whether an object is genuine or not can be verified easily, and reusing by peeling as in the case of a hologram seal is prevented.

A cavity 12 having a periodic structure 13 causing optical diffraction is formed in the inside of a substrate 11, and a periodic structure 15 causing optical diffraction is formed on part or the whole of the substrate 11. These cavity interface periodic structure 13 and the substrate surface periodic structure 15 have a regular arrangement developing a structural color. In addition, by bringing a functional material to be in contact with the substrate surface periodic structure 15, development of a structural color by the substrate surface periodic structure 15 is suppressed, thereby enabling a structural color developed by the cavity interface periodic structure 13 to be read.

The invention discloses an all-solid digital holography imaging system capable of reducing speckle noise, and belongs to the technical field of optical diffraction imaging and digital holography. The all-solid digital holography imaging system capable of reducing the speckle noise comprises a hologram shooting light path, a spatial light modulator, a sample to be detected, an image sensor and a computer. The reference light in the hologram shooting light path is directly incident to the image sensor, the object light in the hologram shooting light path passes through the spatial light modulator and the sample to be detected and then is incident to the image sensor, both the image sensor and the spatial light modulator are connected with the computer, under the control of different phase information provided by the computer, the spatial light modulator is loaded with different random phase mask plates, every time a random phase mask plate is loaded, the image sensor is controlled to record a hologram for one time, multiple holograms are continuously and automatically obtained, and all reproductive images of the holograms are overlapped. The speckle noise of the reproductive images of the digital holography imaging system can be automatically reduced, and the all-solid digital holography imaging system capable of reducing the speckle noise can be used for imaging detection which is relatively high in requirements for instantaneity and distinguishability.

The invention relates to an optical proximity correction method which comprises the following steps: correcting a design figure according to the optical diffraction theory to acquire an expected figure; acquiring a corresponding exposure figure according to a mask plate figure; acquiring the difference between the pattern in the exposure figure and the corresponding pattern in the expected figure; comparing the acquired difference with the preset threshold; when the difference is less than or equal to the preset threshold, finishing the optical proximity correction; and when the difference is greater than the preset threshold, adjusting the mask plate figure, and carrying out the steps of exposing, computing and comparing again on the new mask plate figure until the optical proximity correction is finished. In the method of the invention, the time of the optical proximity correction is shortened and the production efficiency is improved.

The present invention is to provide a standard reference for metrology having finer reference sizes and high-precision electron-beam metrology including the same. By using a standard reference member in which a grating unit pattern of a pitch size proven by an optical diffraction angle by using a laser beam whose wavelength is absolutely guaranteed and a plurality of patterns having a finer size than that (100 nm or less) over the same substrate, fineness and correctness of calibration are made verifiable on a regular basis, and by using an electron-beam collective exposure method for pattern fabrication, fabrication of this standard reference is made possible.

In a laser processing method for accurately forming a convexo-concave structure on the surface of a glass substrate, a periodic optical intensity distribution of a laser beam is obtained by an interference between diffracted light beams of +1 degree and −1 degree emitted from a phase mask, onto which the laser beam is irradiated, in the vicinity of the emission side of the phase mask, and a glass substrate, on which a thin film is formed, is set in the area where the periodic optical intensity distribution is provided. As a result, the thin film is evaporated or ablated depending on the periodic optical intensity, thereby a diffraction grating, which has the same period as that of the varying optical intensity, is formed on the glass substrate.

The invention discloses a super-resolution microscopic imaging method and a super-resolution microscopic imaging system based on a microcantilever and microsphere combined probe. The system comprises a super-resolution microscopic imaging device which comprises the microcantilever and microsphere combined probe, piezoelectric ceramic, a laser, a transflective prism, a position sensitive element, a stepping movable table, an objective, a charge coupled device (CCD) and the like, and a control system which comprises a current-to-voltage converter, a feedback control module, a high-voltage amplifier, a stepping controller, a computer, an interface and the like. A microsphere is lifted off by the microcantilever and microsphere combined probe and is approximate to the surface of a sample, and an atomic-force-based micro/nano feedback control method is adopted, so that the distance between the microsphere and the sample is controlled in a near-field range, and super-resolution optical microscopic imaging is realized. The new super-resolution microscopic imaging method based on the microcantilever and microsphere probe has the advantages that the multi-zone, full-field and super-resolution optical microscopic imaging of the sample is realized, the limit of optical diffraction is broken, and the defects of the traditional microsphere microscopic imaging technology in many aspects are overcome.

The invention discloses a glass chip packaging method. A penetrating conductive metal electrode is prefabricated in the thickness direction of a glass sheet, and laser welding packaging is carried out on a glass chip by adopting ultrafast laser light. By using an ultra-high light intensity characteristic of ultra-short pulse laser light, a nonlinear absorption effect is generated in a transparent medium and the transparent medium is melted on a focus point, so that selective micro-welding in a transparent material space is achieved. The structure size processed by the ultra-short pulse laser light can break through an optical diffraction limit and precise welding smaller than a laser wavelength is achieved. Furthermore, the interaction time of the laser light and a material is extremely short, cracks and sputtered materials, caused by different expansion coefficients, of the material can be effectively avoided; and improvement of the welding packaging precision and quality is facilitated. Compared with other packaging technologies of bonding and the like, the glass chip packaging method has the advantages that the manufacturing process is simple, the thickness of the chip is not limited, fillers of different materials do not need to be added, the strength performance, the stability and the reliability of glass chip packaging can be improved and the service life of the glass chip is prolonged.

At least one diffraction element is used to diffract light of multiple wavelengths into different wavelength components. Instead of moving the diffraction element as in certain prior filters, light from the at least one element is reflected back towards the at least one element so that light is diffracted at least twice by the at least one element. The reflection is such that at least one selected wavelength component of said wavelength components will pass from an input port to an output port or to another device.

A method for specifying products to be sold, in which a plurality of mutually substantially identical products and/or their packages are equipped each with an optical diffraction element of its own. The element gives the same visual impression in each product or its package. In addition to the product and/or its package, the material relating to the distribution or sales of the product is also equipped with an optical diffraction element giving the same visual impression as the optical diffraction element on the product or its package. The material may also be equipped with an element simulating this visual impression.

The invention relates to an optical diffraction element-based laser speckle suppressing method. According to the implementation system of the method, a laser beam emitted by a laser is subjected to beam expansion, shaping and calibration by a modulation lens assembly; and the normal incidence of the processed laser beam into the plane of a binary optical diffractive element is realized; the binary optical diffractive element can be mounted on a horizontal guide rail in a horizontally movable manner, an included angle being formed between the binary optical diffractive element and a horizontal plane; the movement velocity and the included angle of the binary optical diffractive element are calculated according to the theoretical derivation of a mathematical model; and the binary optical diffraction element is controlled to move according to the set movement velocity and the included angle. The optical diffraction element-based laser speckle suppressing method provided by the invention has the advantages of good speckle suppression effect, simple structure, easiness in realization, good system versatility, good robustness and low cost.

Ordered colloids are rapidly formed by dialysis and exhibit unusual levels of shock resistance. Ordered colloids may be used to form a “fingerprint” optical diffraction pattern for security marking, and may also be used for freshness dating by controlling the timing of the formation or loss of order. The ordered colloids may be biocompatible, and may be directly incorporated into foods, drugs, or other ingestible substances, or they may be incorporated into distinctive packaging.

A process for preparing multi-phase optical diffraction element includes sputtering Cr film on substrate, exposing the nagative photoresist on the back to form mask, determining the positions of each steps, etching ultraviolet transmitting substance (SiO2) with reactive ions, etc. Its advantages are low precision requirement of masks except the first one, and high diffraction efficiency.

A double-clamped beam has an asymmetric piezoelectric layer within the beam, and a grid is located within submicron distances of the beam, forming a grid beam dipole. The cantilever beams were formed by etching with Cl2/He plasma, which were respectively input into the plasma chamber at a flow rate ratio of 1:9. The parametric amplifier consists of a NEMS signal beam driven at resonance and a pair of pump beams driven at twice the resonance to generate a modulated Lorentz force on the pump beam to perturb the spring constant of the signal beam. The bridge circuit provides two out-of-phase components of the excitation signal to the first and second NEMS beams in the first and second arms. A DC current is supplied to an AC-driven NEMS device to tune the resonant frequency. The analyzer includes multiple piezoresistive NEMS cantilevers with different resonant frequencies and multiple drive/sensing elements, or multiple beams interacting to form an optical diffraction grating, or multiple strain sensing NEMS cantilevers, each of which All respond to a different analyte, or include multiple piezoresistive NEMS cantilevers with different IR adsorbates.

The invention provides a point diffraction interferometer and comprises a light source module, a mask which can produce an ideal spherical wave, an optical diffraction component which can produce multi-level sub-diffraction light, an image sensor and an optical component. The measured optical component is arranged between the mask and the optical diffraction component and the diffraction light of some levels can permeate the optical component completely, wherein, the diffraction light of a certain level can permeate the optical component partly while being diffracted partly; the diffraction light of some levels can permeate the optical component completely, wherein, the diffraction light of a certain level can be diffracted or the optical component consists of a plurality of windows and a plurality of small holes; diffraction light of some levels can selectively permeate the window, however, the non-diffracted light can be diffracted through the small hole on the optical component. The point diffraction interferometer of the invention conducts measurement through a plurality of interference graphs which are produced at the same time and the sampling frequency is improved, moreover, the design and operation of the whole system is simplified and the motion error of a phase-shift component can be avoided.