463 results about "Material analysis" patented technology

A system and method of drilling and/or perforating uses a laser beam to remove material, such as to perforate the casing, cement and formation or drill a well bore. The system and method can further or alternately encompass material analysis that can be performed without removing the material from the well bore. The analysis can be performed apart from or in connection with drilling operations and/or perforating the casing, cement and formation. The analysis can be used in a feed back loop to adjust material removal, adjust material analysis, determine the location of future material removal, and for other uses.

Methods, for use with a laser ablation or drilling process, which achieve depth-controlled removal of composite-layered work-piece material by real-time feedback of ablation plasma spectral features. The methods employ the use of electric, magnetic or combined fields in the region of the laser ablation plume to direct the ablated material. Specifically, the electric, magnetic or combined fields cause the ablated material to be widely dispersed, concentrated in a target region, or accelerated along a selected axis for optical or physical sampling, analysis and laser feedback control. The methods may be used with any laser drilling, welding or marking process and are particularly applicable to laser micro-machining. The described methods may be effectively used with ferrous and non-ferrous metals and non-metallic work-pieces. The two primary benefits of these methods are the ability to drill or ablate to a controlled depth, and to provide controlled removal of ablation debris from the ablation site. An ancillary benefit of the described methods is that they facilitate ablated materials analysis and characterization by optical and/or mass spectroscopy.

A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.

A computer-implemented analytical and reporting system includes an input device, a database and a processor. The input device is operative for inputting analytical data results of a test sample. The database includes an analysis methodology data section, an instrument data section and a forms data section. The processor is operative for receiving from the input device the analytical data results of the test sample. The processor is also operative for receiving from the database analysis methodology data of at least one analysis method, instrument data of at least one analytical instrument and forms data of a desired analytical report form. The processor is also operative for processing the analytical data results and the instrument data using the analysis methodology data and is operative for generating an analytical report produced on the desired analytical report form depicting final analytical results based on the analysis method and the analytical instrument.

A miniaturized, increased efficiency x-ray source for materials analysis includes a laser source, an optical delivery structure, a laser-driven thermionic cathode (108), an anode (122), and a target from the laser source and directs the beam onto a surface of the themionic cathode. The surfaces electrons form an electron beam along a beam path. The target element (110) is disposed in the beam path, and emits x-rays in response to incident accelerated electrons from the thermionic cathode. The target element includes an inclined surface that forms an angle of inclination (113) of about 40 degrees with respect to the electon beam path, so that x-rays are emitted from the target substantially at an angle of about 45 degrees with respect to the electron beam path.

The invention relates to a multi-purpose salt fog test box belonging to the technical field of material analysis equipment. The multi-purpose salt fog test box comprises a main box body (1), a box cover (2), an observation cover (3), a salt water box (5) and a control device panel (4), wherein the main box body (1) is provided with a sealed water tank and internally comprises a salt fog collector(6-1), an ultrasonic salt fog generating device (8), a conduit (8-1), a heating and temperature warning device (9), a temperature sensor (10), a humidity sensor (11), support blocks (12-1), (13-1) and (14-1), a diaphragm (13), a sealing diaphragm (14) and a sample stage combination shelf (12); the external accessories of the test box comprise a box cover handle (2-1), a salt water box cover (5-1), a salt fog metering device (6), waste liquid drain pipes (5-2) and (8-2), a pipe (14-2) and a hinge part (7). The multi-purpose salt fog test box adopts the principle of the ultrasonic spray, omits the air compressor in the traditional salt fog test box, simplifies the test box and can be used for corrosion tests under constant-temperature-and-humidity conditions, alternating wetting and drying conditions and other conditions.

This invention pertains to an x-ray microprobe that can be placed very close the sample surface. A practical implementation is an x-ray target material integrated to an atomic force microscope (AFM) tip and an electron beam is focused to the target materials to generate x-ray emission. This microprobe can be combined with energy-resolved detector or a fluorescence imaging system for material analysis applications.

The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review.

The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis.

The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.

A method for preparing calibration test sample of X ray stress measurement includes removing phenomenon of crystal particle coarsening and crystal face preferred orientation, carrying out short blasting treatment for semiproduct of the sample, stripping layer by layer for portion with greater stress gradient by electrochemical corrosion, carrying out X ray stress measurement and calibrating out work surface of the sample by utilizing relation curve of stress to layer depth.

The invention provides a laser-induced breakdown spectrum in-situ analyzer, belonging to the technical field of material analysis and characterization. The laser-induced breakdown spectrum in-situ analyzer comprises an excitation source system, a laser beam shaping system, a beam splitting system, a high-speed signal collecting system, a signal analyzing system, a sample chamber vacuum system, a continuous excitation synchronous scanning and positioning system and a sample surface imaging system. The laser beam emitted by the laser source is processed by a laser beam shaping system and is subsequently focused on the surface of an analyzed sample that can move in a three-dimensional way. The sample chamber vacuum system provides a closed environment for the analyzed sample so as to fill inthe protective gas. The beam splitting system and the signal colleting system are connected with each other by a photomultiplier; and the plasma spectrum generated on the surface of the sample is converted into an electric signal by the photomultiplier through the optical signal generated by the beam splitting system. The data processing system processes and calculates the photoelectric signal generated by the data processing system and outputs the results such as content of each element, in-situ statistics distribution and the like in the sample. Compared with the prior art, the laser-induced breakdown spectrum in-situ analyzer has the advantages of increasing the functions and extending the sample scope.

The invention discloses a microscopic Raman imaging spectrum rapid detection apparatus and a method thereof, which belong to the technical field of optical microscopic imaging and spectral measurement. The microscopic Raman imaging spectrum rapid detection apparatus comprises a light source, a multifunctional sample room, a composite optical system, an image acquisition system, a data fusion processing system, a Raman spectrum detection system, and a computer control and display system. According to white light or laser emitted by the light source, sample in-situ observation and microscopic Raman imaging spectrum real-time on-line detection are respectively realized, the data fusion processing system performs real-time analysis processing on images and spectrum information, and images andspectrum information are displayed and output in the computer control and display system. The microscopic Raman imaging spectrum rapid detection apparatus has the characteristics of compact structure,high spatial resolution, convenient usage, and stable performance, can be used in the fields of water quality detection, material analysis, petrochemical engineering, environment monitoring, and industrial precision detection, is convenient for field on-site investigation experiment and on-line test real-time analysis, and has a wide application prospect.

In thermography apparatus, a lamp 102 is modulated sinusoidally and a camera 106 captures thermal images at the modulated frequency, but delayed by an adjustable preset delay. A signal delay box 107 is connected between a sinusoidal modulation signal function generator 104 and the camera 106. The delay box introduces a delay to the function generator signal so that the thermal image is captured after a period of time, resulting in an enhanced image.

The invention discloses an LA-ICPMS (laser ablation inductively coupled plasma mass spectrometry) based original position statistic distribution analysis system and belongs to the technical field of material analysis characterization. The system disclosed by the invention comprises a laser ablation sample-injection system, an ICP (inductively coupled plasma) ion source system, an interface system, an ion transmission system, a mass spectrum detection system, a sample moving/positioning system and a signal processing system, wherein the sample moving/positioning system is used for continuously activating synchronous scanning, and the signal processing system is used for carrying out mathematical resolution on acquired mass spectrum signals. By using the system disclosed by the invention, based on the continuously-activated synchronous scanning moving/positioning of samples and the laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS), an original position statistic distribution analysis on chemical compositions and states thereof in large-scale ranges of uneven surfaces of metallic and non-metallic materials can be realized. The system disclosed by the invention has the advantages that the system can be used for metal samples and appropriate for non-metallic samples as well; the content and distribution of an element (as low as 0.1 mu g/g) can be analyzed; compared with an original position analyzer for metals, the sensitivity is increased by three orders of magnitude; and the system is suitable for samples with regular and even surfaces and samples with irregular or special-shaped surfaces.

A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps M_i are created representing the intensity of X-rays characteristic for such elements. The X-ray maps M_i and the electron map B are converted into differential X-ray maps D_i, which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum X_j is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.

A system for processing bulk materials, comprising at least one transport apparatus that conveys a stream of bulk materials from a first process position to a second process position, an illumination source that projects light on to a surface of the stream, and at least one spectrometer that captures light reflected, emitted, or absorbed by the stream.

A stream of shredded scrap metal is divided into increments. A bulk material analyzer is employed to determine the bulk chemical composition of each increment. The increments are then sorted on the basis of the bulk chemical composition of each increment.

The present invention relates to systems and methods for analyzing media material having articles continuing across multiple pages. A media material analyzer includes a segmenter and an article composer. The segmenter identifies block segments associated with columnar body test in the media material. The article composer determines which of the identified block segments belong to a continuing article extending across multiple pages in the media material based on language statistics information and continuation transition information.