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466 results about "Material analysis" patented technology
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Drilling, perforating and formation analysis
ActiveUS20060102343A1Easy to useImprove breathabilitySpectrum investigationConstructionsMaterial removalWell drilling
A system and method of drilling and / or perforating uses a laser beam to remove material, such as to perforate the casing, cement and formation or drill a well bore. The system and method can further or alternately encompass material analysis that can be performed without removing the material from the well bore. The analysis can be performed apart from or in connection with drilling operations and / or perforating the casing, cement and formation. The analysis can be used in a feed back loop to adjust material removal, adjust material analysis, determine the location of future material removal, and for other uses.
Owner:HALLIBURTON ENERGY SERVICES INC
Laser ablation feedback spectroscopy
InactiveUS20050061779A1Precise depth controlReduce the amount requiredWelding/soldering/cutting articlesMetal working apparatusMass spectrometryAblation plasma
Methods, for use with a laser ablation or drilling process, which achieve depth-controlled removal of composite-layered work-piece material by real-time feedback of ablation plasma spectral features. The methods employ the use of electric, magnetic or combined fields in the region of the laser ablation plume to direct the ablated material. Specifically, the electric, magnetic or combined fields cause the ablated material to be widely dispersed, concentrated in a target region, or accelerated along a selected axis for optical or physical sampling, analysis and laser feedback control. The methods may be used with any laser drilling, welding or marking process and are particularly applicable to laser micro-machining. The described methods may be effectively used with ferrous and non-ferrous metals and non-metallic work-pieces. The two primary benefits of these methods are the ability to drill or ablate to a controlled depth, and to provide controlled removal of ablation debris from the ablation site. An ancillary benefit of the described methods is that they facilitate ablated materials analysis and characterization by optical and / or mass spectroscopy.
Owner:BLUMENFELD WALTER +2
Drilling, perforating and formation analysis
ActiveUS7490664B2Easy to useWithout usingSpectrum investigationConstructionsMaterial removalWell drilling
A system and method of drilling and / or perforating uses a laser beam to remove material, such as to perforate the casing, cement and formation or drill a well bore. The system and method can further or alternately encompass material analysis that can be performed without removing the material from the well bore. The analysis can be performed apart from or in connection with drilling operations and / or perforating the casing, cement and formation. The analysis can be used in a feed back loop to adjust material removal, adjust material analysis, determine the location of future material removal, and for other uses.
Owner:HALLIBURTON ENERGY SERVICES INC
Material analysis including density and moisture content determinations
Owner:TRANSTECH SYST
Material analysis including density and moisture content determinations
ActiveUS20050267700A1Resistance/reactance/impedenceNuclear monitoringEngineeringContent determination
A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.
Owner:TRANSTECH SYST
Method for direct recovery and restoration of lithium ion battery positive electrode material
ActiveCN103915661AAvoid leachingPrevent extractionWaste accumulators reclaimingProcess efficiency improvementLiquid wasteCharge discharge
The invention discloses a method for direct recovery and restoration of a lithium ion battery positive electrode material, and belongs to the field of resource recycling. According to the method, waste positive electrode pieces of lithium cobaltate or lithium nickel manganese cobalt multi-element layered oxide or a positive electrode piece leftover material and defective products are used as a positive electrode material; the materials are classified according to the type of binder by component analysis, the binder is directly damaged, cleaning and separation of the positive electrode material and a current collector are realized; by use of a heavy liquid separation principle, the positive electrode and a conductive agent are separated; the positive electrode failure mechanism is studied by use of SEM (scanning electron microscope), XRD (X-ray diffraction), STEM (scanning transmission electron microscope), XPS (X-ray photoelectron spectroscopy) and other analysis means; chemical components of the positive electrode material with the layered structure not damaged can be repaired by high temperature roasting, the layered structure of the positive electrode material with disordered and defective crystal lattice can be repaired by dissolving with a hydrothermal reaction and then precipitation, and the positive electrode material with good charge discharge performances can be again obtained. The method avoids the dissolving leaching process, reduces waste liquid generation, and simplifies the technological process.
Owner:INST OF PROCESS ENG CHINESE ACAD OF SCI
Materials analytical review and reporting system
A computer-implemented analytical and reporting system includes an input device, a database and a processor. The input device is operative for inputting analytical data results of a test sample. The database includes an analysis methodology data section, an instrument data section and a forms data section. The processor is operative for receiving from the input device the analytical data results of the test sample. The processor is also operative for receiving from the database analysis methodology data of at least one analysis method, instrument data of at least one analytical instrument and forms data of a desired analytical report form. The processor is also operative for processing the analytical data results and the instrument data using the analysis methodology data and is operative for generating an analytical report produced on the desired analytical report form depicting final analytical results based on the analysis method and the analytical instrument.
Owner:ENVIRONMENTAL INFORMATION SYST
X-ray source for materials analysis systems
A miniaturized, increased efficiency x-ray source for materials analysis includes a laser source, an optical delivery structure, a laser-driven thermionic cathode (108), an anode (122), and a target from the laser source and directs the beam onto a surface of the themionic cathode. The surfaces electrons form an electron beam along a beam path. The target element (110) is disposed in the beam path, and emits x-rays in response to incident accelerated electrons from the thermionic cathode. The target element includes an inclined surface that forms an angle of inclination (113) of about 40 degrees with respect to the electon beam path, so that x-rays are emitted from the target substantially at an angle of about 45 degrees with respect to the electron beam path.
Owner:CARL ZEISS STIFTUNG DOING BUSINESS CARL ZEISS
Multi-purpose salt fog test box
ActiveCN102156092ACorrosion Test AccelerationThe principle is simpleWeather/light/corrosion resistanceSaline mistDevice Panel
The invention relates to a multi-purpose salt fog test box belonging to the technical field of material analysis equipment. The multi-purpose salt fog test box comprises a main box body (1), a box cover (2), an observation cover (3), a salt water box (5) and a control device panel (4), wherein the main box body (1) is provided with a sealed water tank and internally comprises a salt fog collector(6-1), an ultrasonic salt fog generating device (8), a conduit (8-1), a heating and temperature warning device (9), a temperature sensor (10), a humidity sensor (11), support blocks (12-1), (13-1) and (14-1), a diaphragm (13), a sealing diaphragm (14) and a sample stage combination shelf (12); the external accessories of the test box comprise a box cover handle (2-1), a salt water box cover (5-1), a salt fog metering device (6), waste liquid drain pipes (5-2) and (8-2), a pipe (14-2) and a hinge part (7). The multi-purpose salt fog test box adopts the principle of the ultrasonic spray, omits the air compressor in the traditional salt fog test box, simplifies the test box and can be used for corrosion tests under constant-temperature-and-humidity conditions, alternating wetting and drying conditions and other conditions.
Owner:安科工程技术研究院(北京)有限公司
Near-field X-ray fluorescence microprobe
This invention pertains to an x-ray microprobe that can be placed very close the sample surface. A practical implementation is an x-ray target material integrated to an atomic force microscope (AFM) tip and an electron beam is focused to the target materials to generate x-ray emission. This microprobe can be combined with energy-resolved detector or a fluorescence imaging system for material analysis applications.
Owner:CARL ZEISS X RAY MICROSCOPY
Bidirectional test device and test method for single-shaft material test machine
ActiveCN105571942AAccurate measurementFunction increaseMaterial strength using tensile/compressive forcesMechanical engineeringMaterial analysis
The invention provides a bidirectional test device and a test method for a single-shaft material test machine. The bidirectional test device comprises a machine frame, two slide blocks and a measuring device, wherein the machine frame comprises two side frames in opposite arrangement; the two ends of the opposite sides of the two side frames are provided with relatively projected triangular end wings; the two slide blocks are movably fixed between the two side frames in a way of being clamped by the end wings arranged at the two ends of the two side frames; a space defined by the machine frame and the slide blocks is a test specimen installing space; the measuring device comprises measuring springs and displacement sensors; each measuring spring is arranged at one end, in contact with the slide block and the test specimen, of each side frame; the displacement sensors are used for detecting the displacement of the measuring springs. The bidirectional test device has the function of realizing bidirectional stretching and bidirectional compression on a single-axis material test machine; the loading synchronization problem is solved; meanwhile, the bidirectional test device can accurately measure the force and the displacement of the test specimen during the stretching and compression loading, so that an important stress-stress relationship curve during the material analysis can be given.
Owner:INST OF MECHANICS - CHINESE ACAD OF SCI
Electron beam apparatus
InactiveUS20100102227A1Improve imaging resolutionLarge aberrationThermometer detailsMaterial analysis using wave/particle radiationScanning electron microscopeAcceleration voltage
The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review.The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis.The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.
Owner:ASML NETHERLANDS BV
Production of X-ray stress measuring calibrated sample
InactiveCN1645091AEasy to carryBeautiful surfaceMaterial analysis using wave/particle radiationPreparing sample for investigationSurface stressStress measurement
A method for preparing calibration test sample of X ray stress measurement includes removing phenomenon of crystal particle coarsening and crystal face preferred orientation, carrying out short blasting treatment for semiproduct of the sample, stripping layer by layer for portion with greater stress gradient by electrochemical corrosion, carrying out X ray stress measurement and calibrating out work surface of the sample by utilizing relation curve of stress to layer depth.
Owner:SHANGHAI JIAO TONG UNIV
X-ray source for materials analysis systems
Owner:CARL ZEISS STIFTUNG DOING BUSINESS CARL ZEISS
High throughput preparation and analysis of materials
A rapid throughput method for the preparation, analysis or both of libraries of material samples is provided. According to the method, a plurality of samples is provided. Providing the plurality of samples can include a variety of sample formation techniques including, but not limited to, extruding, milling, compression preparation, rotary mixing, microcentrifugation, molding and casting. Preferably, the samples are solidified into a near net shape configuration appropriate for testing of properties or characteristics of the samples.
Owner:INTERMOLECULAR
Laser-induced breakdown spectrum in-situ analyzer
ActiveCN102221539AImprove analysis efficiencyEnhanced Analysis FunctionsAnalysis by material excitationOptical elementsBeam splittingLaser-induced breakdown spectroscopy
Owner:NCS TESTING TECH
Microscopic Raman imaging spectrum rapid detection apparatus and method thereof
The invention discloses a microscopic Raman imaging spectrum rapid detection apparatus and a method thereof, which belong to the technical field of optical microscopic imaging and spectral measurement. The microscopic Raman imaging spectrum rapid detection apparatus comprises a light source, a multifunctional sample room, a composite optical system, an image acquisition system, a data fusion processing system, a Raman spectrum detection system, and a computer control and display system. According to white light or laser emitted by the light source, sample in-situ observation and microscopic Raman imaging spectrum real-time on-line detection are respectively realized, the data fusion processing system performs real-time analysis processing on images and spectrum information, and images andspectrum information are displayed and output in the computer control and display system. The microscopic Raman imaging spectrum rapid detection apparatus has the characteristics of compact structure,high spatial resolution, convenient usage, and stable performance, can be used in the fields of water quality detection, material analysis, petrochemical engineering, environment monitoring, and industrial precision detection, is convenient for field on-site investigation experiment and on-line test real-time analysis, and has a wide application prospect.
Owner:CHONGQING INST OF GREEN & INTELLIGENT TECH CHINESE ACADEMY OF SCI
Material analysis
InactiveUS7018094B1Radiation pyrometryMaterial analysis by optical meansSinusoidal modulationFunction generator
In thermography apparatus, a lamp 102 is modulated sinusoidally and a camera 106 captures thermal images at the modulated frequency, but delayed by an adjustable preset delay. A signal delay box 107 is connected between a sinusoidal modulation signal function generator 104 and the camera 106. The delay box introduces a delay to the function generator signal so that the thermal image is captured after a period of time, resulting in an enhanced image.
Owner:AIRBUS UK
LA-ICPMS (laser ablation inductively coupled plasma mass spectrometry) based original position statistic distribution analysis system
InactiveCN102375022AHigh sensitivityPreparing sample for investigationMaterial analysis by electric/magnetic meansLaser ablation inductively coupled plasma mass spectrometryMetallic materials
The invention discloses an LA-ICPMS (laser ablation inductively coupled plasma mass spectrometry) based original position statistic distribution analysis system and belongs to the technical field of material analysis characterization. The system disclosed by the invention comprises a laser ablation sample-injection system, an ICP (inductively coupled plasma) ion source system, an interface system, an ion transmission system, a mass spectrum detection system, a sample moving / positioning system and a signal processing system, wherein the sample moving / positioning system is used for continuously activating synchronous scanning, and the signal processing system is used for carrying out mathematical resolution on acquired mass spectrum signals. By using the system disclosed by the invention, based on the continuously-activated synchronous scanning moving / positioning of samples and the laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS), an original position statistic distribution analysis on chemical compositions and states thereof in large-scale ranges of uneven surfaces of metallic and non-metallic materials can be realized. The system disclosed by the invention has the advantages that the system can be used for metal samples and appropriate for non-metallic samples as well; the content and distribution of an element (as low as 0.1 mu g / g) can be analyzed; compared with an original position analyzer for metals, the sensitivity is increased by three orders of magnitude; and the system is suitable for samples with regular and even surfaces and samples with irregular or special-shaped surfaces.
Owner:NCS TESTING TECH
Method and apparatus for material analysis by a focused electron beam using characteristic x-rays and back-scattered electrons
InactiveUS20130054153A1Eliminate disadvantagesElectric discharge tubesSpecial data processing applicationsParticle physicsPeak intensity
A material analysis method by a focused electron beam and an equipment for performing such an analysis where an electron map B is created describing the intensity of emitted back-scattered electrons at various points on a sample, and a spectral map S is created describing the intensity of emitted X-rays at points on the sample depending on the radiation energy. For selected chemical elements, X-ray maps Mi are created representing the intensity of X-rays characteristic for such elements. The X-ray maps Mi and the electron map B are converted into differential X-ray maps Di, which are subsequently merged into a final differential X-ray map D. The final differential X-ray map D is then used to search particles. Subsequently, a cumulative X-ray spectrum Xj is calculated for each particle and subsequently the classification of particles based on the peak intensities and the intensity of back-scattered electron is performed.
Owner:TESCAN
Non-Hazardous Bulk Material Analyzer System
A system for processing bulk materials, comprising at least one transport apparatus that conveys a stream of bulk materials from a first process position to a second process position, an illumination source that projects light on to a surface of the stream, and at least one spectrometer that captures light reflected, emitted, or absorbed by the stream.
Owner:ABB (SCHWEIZ) AG
Systems for bioagent identification
ActiveUS20120115213A1Enhances uniform mixingEasy to introduceBioreactor/fermenter combinationsBiological substance pretreatmentsMass Spectrometry-Mass SpectrometryEngineering
The present invention provides systems and methods for analysis of samples, particularly biological and environmental sample to detect biomolecules of interest contained therein. A variety of system components are described herein, including, but not limited to, components for sample handling, mixing of materials, sample processing, transfer of materials, and analysis of materials. The invention further provides mechanisms for combining and integrating the different components and for housing, moving, and storing system components or the system as a whole. The systems may include any one or more or all of these components. The system finds particular use when employed for analysis of nucleic acid molecule using mass spectrometry, however, the invention is not limited such specific uses.
Owner:IBIS BIOSCI
Method for Bulk Sorting Shredded Scrap Metal
InactiveUS20090236268A1Increase valueReduce copper contentSeparation devicesSortingChemical compositionBulk material analyzer
A stream of shredded scrap metal is divided into increments. A bulk material analyzer is employed to determine the bulk chemical composition of each increment. The increments are then sorted on the basis of the bulk chemical composition of each increment.
Owner:SHULMAN ALVIN D
Electron beam apparatus
InactiveUS7960697B2Improve imaging resolutionIncrease intensityThermometer detailsMaterial analysis using wave/particle radiationScanning tunneling microscopeScanning electron microscope
The present invention relates to a charged particle beam apparatus which employs a scanning electron microscope for sample inspection and defect review.The present invent provides solution of improving imaging resolution by utilizing a field emission cathode tip with a large tip radius, applying a large accelerating voltage across ground potential between the cathode and anode, positioning the beam limit aperture before condenser lens, utilizing condenser lens excitation current to optimize image resolution, applying a high tube bias to shorten electron travel time, adopting and modifying SORIL objective lens to ameliorate aberration at large field of view and under electric drifting and reduce the urgency of water cooling objective lens while operating material analysis.The present invent provides solution of improving throughput by utilizing fast scanning ability of SORIL and providing a large voltage difference between sample and detectors.
Owner:ASML NETHERLANDS BV
Media material analysis of continuing article portions
The present invention relates to systems and methods for analyzing media material having articles continuing across multiple pages. A media material analyzer includes a segmenter and an article composer. The segmenter identifies block segments associated with columnar body test in the media material. The article composer determines which of the identified block segments belong to a continuing article extending across multiple pages in the media material based on language statistics information and continuation transition information.
Owner:GOOGLE LLC
System for analyzing biological sample material
InactiveUS20150204763A1Simple designLow costBioreactor/fermenter combinationsBiological substance pretreatmentsControl cellEngineering
A system for carrying out analyses on and / or with biological sample material present in a sample arrangement region of a microfluidic sample chip comprises a connector plate for receiving the sample chip and a control unit to which the connector plate is detachably connectable for exchange of fluids and electrical signals.
Owner:NMI NATURWISSENSCHAFTLICHES & MEDIZINISCHES INST AN DER UNIV TUBINGEN
Material analysis
InactiveUS6786098B2Radiation pyrometryAnalysing solids using sonic/ultrasonic/infrasonic wavesSonificationAudio power amplifier
Material analysis apparatus and method, particularly of use in detecting barely visible impact damage but also of use to detect other material characteristics. The apparatus includes a function generator which provides a sinusoidal signal to an ultrasonic amplifier as well as to a PC. The PC is connected to an infrared camera. The sinusoidal signal is fed into the amplifier and causes two probes attached to the sample of material to emit ultrasonic energy at the modulated frequency. Ultrasonic energy from the two probes then enters the sample by means of mechanical coupling and an image of the resulting thermal radiation is captured by the infrared camera and transferred to the PC for further processing and analysis.
Owner:AIRBUS OPERATIONS LTD
Method and apparatus for analysis of elements in bulk substance
InactiveUS7152002B2Reduce heatReduce excitationMaterial analysis using wave/particle radiationConversion outside reactor/acceleratorsNeutron radiationAnalysis method
A substance analyzer utilizing Prompt Gamma Neutron Activation Analysis for identifying characteristics of a substance and method of manufacturing the same are disclosed. The analyzer is small enough to be portable and to allow its use in many applications where current analyzers cannot be utilized. The analyzer uses a neutron radiation source and a gamma-ray detector to activate the sample material and detect the prompt gamma rays emitted by the sample material. A novel housing for such an analyzer and method for making the housing are also described. Novel methods of operating such an analyzer including via a communications network are also disclosed. Also disclosed are data analysis methods that improve the accuracy and sensitivity of the results of such material analysis.
Owner:ARATAY INC
NMR probe for material analysis
InactiveUS7095230B2Analysis using nuclear magnetic resonanceElectric/magnetic detectionElectrical conductorRadio frequency
In a unilateral NMR probe for the analysis of a material comprising at least one magnet for generating a constant time-invariant polarization field B0 in the material to be analyzed and current conductors forming a radio frequency oscillation circuit for generating a pulsed radio frequency magnetic excitation field B1 which is superimposed on the polarization field N0 in the material, the circuit conductors are so designed as to provide several adjacent excitation fields B0 with alternatingly oppositely oriented magnetic fields, whereby the current conductors generating each one of the excitation fields have a distance from each other which causes a certain penetration depth in the material to be analyzed and echoes received therefrom provide measurement values which are characteristic for the material being analyzed.
Owner:PROF DR BERNHARD
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