Production of X-ray stress measuring calibrated sample

A stress measurement and X-ray technology, applied in the field of material analysis and testing, achieves the effects of portability, improved reliability, and easy on-site operation

Inactive Publication Date: 2005-07-27
SHANGHAI JIAO TONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The disadvantage of this calibration sample is that it ne

Method used

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  • Production of X-ray stress measuring calibrated sample
  • Production of X-ray stress measuring calibrated sample
  • Production of X-ray stress measuring calibrated sample

Examples

Experimental program
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Embodiment Construction

[0022] Provide following embodiment in conjunction with content of the present invention:

[0023] (1) material quenching and tempering

[0024] 2Cr13 ferritic stainless steel material is selected, and after forging, it is quenched and tempered. The quenching and tempering process is oil quenching at 1000°C and tempering at 660°C. Such as figure 1 As shown, the diffraction spectrum shows that the coarse grain and texture of the material are removed, and because the material contains 13% Cr element, the material does not rust in the atmospheric environment.

[0025] (2) Shot peening prestress

[0026] Such as figure 2 As shown, the end face of the calibration sample blank is subjected to shot peening prestressing treatment. The shot peening parameters are: the diameter of steel ball projectile is 0.15~0.25mm, the shot peening intensity is arc height 0.2mm, and the shot peening time is 10min. The outermost layer of the calibration sample obtained a residual stress of -218M...

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Abstract

A method for preparing calibration test sample of X ray stress measurement includes removing phenomenon of crystal particle coarsening and crystal face preferred orientation, carrying out short blasting treatment for semiproduct of the sample, stripping layer by layer for portion with greater stress gradient by electrochemical corrosion, carrying out X ray stress measurement and calibrating out work surface of the sample by utilizing relation curve of stress to layer depth.

Description

technical field [0001] The invention relates to a method for preparing a calibration sample, in particular to a method for preparing a calibration sample for X-ray stress measurement. It is used in the technical field of material analysis and testing. Background technique [0002] Although there are many stress methods, the X-ray stress measurement method is the most typical. Because the theoretical basis of this method is relatively rigorous, the experimental technology is becoming more and more perfect, the measurement results are very reliable, and it is another non-destructive measurement method, so it has been widely used at home and abroad. [0003] Before performing X-ray stress measurement, a calibration sample with known stress must be detected first to verify whether the instrument system is normal. Therefore, choosing a suitable calibration sample is very important to the whole measurement work. The current preparation method of the calibration sample for X-ray...

Claims

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Application Information

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IPC IPC(8): G01L1/25G01N1/28G01N23/207
Inventor 姜传海洪波
Owner SHANGHAI JIAO TONG UNIV
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