3 results about "Focal volume" patented technology

A gamma camera device comprises a collimator with pinholes, the collimator enclosing an object space for receiving an object; a detector surface for detecting gamma radiation emitted by the object and passing through the pinholes of the collimator; and a controller for processing detector signals into an image of the object. The collimator and the object space have a common longitudinal axis, wherein the collimator comprises a plurality of groups, each of a plurality of pinholes having a center line. In each group, the pinholes are located in a plane perpendicular to the longitudinal axis, wherein the pinholes of the group together see a focal volume, the focal volume having a geometric center. Within each group, upon rotation around the longitudinal axis, the respective center line of each of the pinholes becomes coincident with the center line of each of the other pinholes of the group.

The present invention proposes a photothermal microscopy system (1) for analysing a sample, comprising a pulse light source system (10) configured for providing a first train of optical pulses (B1) at first optical center wavelengths (λ1) and a second train of optical pulses (B2) at second optical center wavelengths (λ2) in a burst mode, wherein the microscopy system is a stimulated Raman photothermal microscopy system with a Stokes beam and a pump beam. A probe light source (30) provides a probe beam (P) at a third wavelength (λ3), the third wavelength different from the first and second wavelengths. The system comprises focusing optics (40) configured to direct the first train of optical pulses (B1), the second train of optical pulses (B2) and the probe beam (P) to a sample in a focal volume (5), an optical detector (60) configured to detect a transmitted or reflected probe beam (P1) after interaction in the sample in the focal volume, and a processor (80) configured to process signal components from the detected transmitted or reflected probe beam (P1) and to output a signal or a pixel representative of the interaction in the sample.

The invention relates to an electron imaging apparatus (23) configured to be connected to an energy analyzer apparatus. The electron imaging apparatus comprises a receiving aperture (22), a control unit, and a field generating unit (65). The receiving aperture is configured for receiving electrons from a focal volume (200) which form an electron beam (25). The control unit is configured for providing a control signal to the field generating unit based on a desired height of the electron beam in an energy dispersive direction (y) of the energy analyzer apparatus at a proximal end (90) of the electron imaging apparatus and a desired angular distribution (α p ) in the energy dispersive direction at the proximal end. The field generating unit is configured for generating at least one electrostatic, magnetic, or electrostatic and magnetic field based on the at least one control signal such that the at least one electrostatic, magnetic, or electrostatic and magnetic field is configured for exerting a force on the electrons of the electron beam in the energy dispersive direction such that a height of the electron beam in the energy dispersive direction at the proximal end corresponds to the desired height in the energy dispersive direction at the proximal end and an angular distribution in the energy dispersive direction at the proximal end corresponds to the desired angular distribution in the energy dispersive direction at the proximal end.