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84 results about "Third wave" patented technology

Method for monitoring forest fire by means of combination of infrared and multi-spectral wave bands

ActiveCN104240429AHighlight fire range featuresFire Range Characteristic PreservationRadiation pyrometryFire alarm radiation actuationImage resolutionData acquisition
The invention provides a method for monitoring a forest fire by means of combination of infrared and multi-spectral wave bands. The method includes the steps that (1) CCD camera data and infrared camera data collected by an environment satellite on the same day are selected; the third wave band namely an infrared wave band and the fourth wave band namely a near infrared wave band of a CCD camera and the third wave band namely an infrared wave band of an infrared camera are selected; (2) radiation brightness calculation is carried out on the collected infrared camera data, whether fire points exist is judged primarily, if the answer is positive, the step (3) is carried out and otherwise, the step (1) is carried out again for data collection; (3) data of the third wave band of the infrared camera are adjusted so that the infrared camera can keep consistent with the CCD camera in mapsheet and space resolution ratio; (4) precise geometric rectification is carried out on the adjusted CCD camera data and the adjusted infrared camera data; (5) the third wave band of the CCD undergoing precise geometric rectification serves as a new first wave band, the fourth wave band serves as a new second wave band, the third wave band of the infrared camera serves as a new third wave band and the forest fire is monitored by means of a newly obtained image.
Owner:CHINA CENT FOR RESOURCES SATELLITE DATA & APPL

Phase measuring device for laser interference photoetching system and using method thereof

The invention belongs to the technical field of optical instruments and meters, and provides a phase measuring device for a laser interference photoetching system and a using method thereof. The phasemeasuring device comprises a first wave plate, a first polarization splitting prism, a fourth wave plate, a backward reflecting mirror, a third wave plate, a reflecting mirror, a second wave plate, apolarizing film, a second polarization splitting prism, a third polarization splitting prism, a first photoelectric detector, a second photoelectric detector and a base, wherein the first polarization splitting prism, the second polarization splitting prism, the third polarization splitting prism, the first photoelectric detector and the second photoelectric detector are fixed on the base; the first wave plate, the second wave plate, the third wave plate and the fourth wave plate are respectively arranged around the first polarization splitting prism; the polarizing film and the emergent surface of the third polarization splitting prism, the backward reflecting mirror outside the fourth wave plate, and the reflecting mirror outside the third wave plate form a light path system for phase measurement. An interference measurement signal is resolved to obtain a measurement light phase, and the device and the method are used for fringe control of variable-period interference exposure.
Owner:TSINGHUA UNIV +1

Organic luminous device

The invention relates to an organic luminous device, which comprises a transparent base plate, a first electrode, an organic luminous layer, a middle layer and a second electrode, wherein the first electrode is positioned above the transparent base plate, the organic luminous layer is positioned above the first electrode and is used for sending out light in the first wave length, the second wave length and the third wave length, and the first wave length, the second wave length and the third wave length are mutually different. The middle layer is arranged between the transparent base plate and the first electrode in a clamping way, and the refractive index of the middle layer is in a range between the refractive index of the transparent base plate and the refractive index of the first electrode. The middle layer is provided with a first region, a second region and a third region ranged in a plane direction, the thicknesses d of the first region, the second region and the third region are respectively calculated according to the following formula that d=(2x+1) lambda/4n, wherein x is 0 or an integer, lambda is respectively the first wave length, the second wave length and the third wave length, and n is the refractive index of the middle layer. The second electrode is positioned above the organic luminous layer.
Owner:华映视讯(吴江)有限公司 +1
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