14 results about "Polarization splitter" patented technology

The application discloses a laser converging system, a laser welding system and a laser welding machine, and relates to the technical field of optical converging. The laser converging system converts the preset S polarization laser beams sent by a laser device into two S polarization beams, and then into two P polarization beams through a plane mirror, an S polarization beam splitter, a first controlled mirror and a second controlled mirror arranged in the same XY plane, and converges the first light path and the second light path corresponding to the two P polarization beams at a preset space point outside the XY plane, so that the imaging light path for observing the converging conditions of the P polarization beams is designed outside the XY plane where the laser transmission light path is located, the mutual interference between the laser transmission light path and the imaging light path is avoided, and the control precision of the laser convergence is improved.

This invention relates to a real-time monitoring device for yarn vibration characteristics based on laser imaging, comprising: a laser for emitting laser light to form a laser beam; a first polarizing beam splitter for orthogonally decomposing the laser beam into a measurement beam and a reference beam according to the polarization state of the laser; a measurement imaging optical path for measuring the yarn under test using the measurement beam and reflecting the measurement beam passing through the area where the yarn under test is located through a reflector to form an echo beam carrying the characteristic information of the yarn under test; a reference illumination optical path for constructing a uniform and stable background illumination reference beam; a beam splitter for combining the echo beam and the background illumination reference beam to obtain a combined beam; an area array camera for acquiring the combined beam; and an image processing system connected to the area array camera for performing image processing on the acquired combined beam to obtain the vibration characteristics of the yarn. This invention can accurately capture and quantify the vertical vibration characteristics of the yarn.

The application provides an optical scanning system, which comprises a polarization converter, a polarization beam splitter, a phase delay element and a scanning element. The polarization converter receives first light with a first polarization state and second light with a second polarization state, and is configured to convert the polarization state of the first light into the second polarization state and to emit the first light and the second light together as third light with the second polarization state. The polarization beam splitter receives and reflects the third light. The phase delay element is configured to receive the third light and emit fourth light with a third polarization state. The scanning element is configured to receive the fourth light and emit fifth light with a fourth polarization state towards the phase delay element, and is further configured to change the emission angle of the fifth light. The fifth light emitted from the scanning element is converted into scanning light with the first polarization state by the phase delay element, and the polarization beam splitter is configured to transmit and emit the scanning light. The application further provides a laser radar using the optical scanning system and a vehicle.

Transparent optical repeater for satellite, and communication satellite including such a repeater. This transparent optical repeater, configured for onboard use on a satellite, comprises: - an optical fiber (OF) assembly; - a first optical head (OHU1); - a first low-noise optical amplifier (LNOA); - a polarization splitter and controller (PCS) comprising, for each output channel of the bandpass filter (BPF), a channel polarization splitter and controller (C-PCS); - a third high-power optical amplifier (HPOA), per output channel of the polarization splitter and controller (PCS); - a polarization combination unit (PBC), configured to recombine the respective output channels of the two optical multiplexers (HPWDM); and - a second optical head (OHU2) configured to output the optical signals from the output of the polarization combination unit (PBC). Figure for the abstract: [Fig. 4]

The application discloses a laser converging system, a laser welding system and a laser welding machine, and relates to the technical field of optical co-converging. The laser converging system converts the preset P-polarized laser beam sent by a laser into a first light path and a second light path corresponding to two P-polarized light beams through a plane mirror, a P-polarized light splitter, a first controlled mirror and a second controlled mirror arranged in the same XY plane, and converges the two light paths at a preset space point outside the XY plane, so that an imaging light path for observing the converging conditions of the P-polarized light beams can be designed outside the XY plane where the laser transmission light path is located, the mutual interference between the laser transmission light path and the imaging light path is avoided, and the control precision of the laser converging can be improved.

A method according to one embodiment of the present disclosure for controlling an optical amplification device (10) of a polarization diversity configuration comprises: detecting a first optical intensity of first polarized waves from a first amplifier (102) which is disposed between a polarization splitter (121) and a polarization combiner (122); detecting a second optical intensity of second polarized waves from a second amplifier (103) which is disposed between the polarization splitter (121) and the polarization combiner (122); detecting a third optical intensity of the first polarized waves from the polarization combiner (122) in a state where the second polarized waves are not input to the polarization combiner (122); detecting a fourth optical intensity of the second polarized waves from the polarization combiner (122) in a state where the first polarized waves are not input to the polarization combiner (122); and acquiring loss of the first polarized waves from the first amplifier (102) to the polarization combiner (122) and loss of the second polarized waves from the second amplifier (103) to the polarization combiner (122) on the basis of the first optical intensity, the second optical intensity, the third optical intensity, and the fourth optical intensity.

This invention provides a method and system for on-orbit polarization state correction of spaceborne laser signals. First, the rotation direction and pulse parameters required for switching between left- and right-hand circular polarization states are calibrated on the ground, from zero position to the default polarization state. During on-orbit operation, the motor is driven back to zero or polarity switching is performed based on the ground calibration parameters to resolve the issue of unclear rotation direction caused by command errors. To address environmental drift and accumulated errors, the characteristic of a laser corner bevel prism to reverse the rotation direction of the returning light is utilized, combined with the physical properties of orthogonally linearly polarized light from a polarization beam splitter, to fine-tune the rotating motor and monitor the energy received by the detector in real time. When the received energy reaches its peak value, it is determined to be the optimal polarization state under the current environment, achieving closed-loop circularity optimization and performance correction. This method eliminates dependence on interstellar links and effectively solves the problems of on-orbit parameter drift and multi-parameter coupling debugging of open-loop motors.

The utility model relates to a light path design technical field especially relates to a kind of laser light path system and laser fusion welding machine.The system includes: laser light path system includes: laser, first to third P polarized light splitter and first to fourth mirror group.Laser emitted by laser passes through first to third P polarized light splitter laser emitted by laser light splitting processing being arranged in the same XY plane, and through first to fourth mirror group reflection converges in the fusion center outside XY plane, forms first to fourth light path.The projection point of the reflection point of first to fourth mirror group on XY plane is symmetrically distributed relative to fusion center.Due to the laser light path design and fusion center almost not coplanar, imaging light path on the plane of laser light path and fusion center will not interfere, can be designed respective mounting structure member, improves the control precision of each laser convergence.

The utility model relates to the technical field of light path design, especially, a kind of laser light path system and laser fusion welding machine.The system includes: laser light path system includes: laser, first to third S polarization spectroscope and first to fourth mirror group.Laser emitted by laser passes through first to third S polarization spectroscope laser emitted by laser spectroscope processing being arranged in the same XY plane, and through first to fourth mirror group being also arranged in XY plane reflection converges in the fusion center outside XY plane, forms first to fourth light path.The projection point of the reflection point of first to fourth mirror group on XY plane is symmetrically distributed relative to fusion center.Due to the laser light path design and fusion center almost not coplanar, imaging light path on the plane of laser light path and fusion center will not interfere, can be designed respective mounting structure member, improve the control precision of each laser convergence.

This invention relates to the field of holographic-controlled femtosecond laser micro / nano fabrication technology, and in particular to a flexible holographic femtosecond laser fabrication system and method for overcoming the diffraction limit. The system includes: a laser; an optical path system comprising, sequentially arranged along the laser emission direction, an optical shutter, a beam expander, a first half-wave plate, a first polarizing beam splitter, two laser beam paths, a second polarizing beam splitter, a 4f optical system, an aperture, and a focusing objective; each laser beam path includes a spatial light modulator along the laser emission direction; and a motion platform for clamping, moving, and positioning the material to be processed, positioned in the direction of laser emission from the focusing objective. This invention, by modulating the shape of the laser spot, can achieve two laser spots of arbitrary shapes. By controlling the overlap range of the laser spots and utilizing the principle of phase overlap and energy superposition, material removal is achieved in the overlapping area, ultimately realizing flexible and diverse fabrication of micro / nano structures at sub-diffraction-limit scales.

Techniques for determining an alignment status of a subject's eyes are presented. The techniques utilize an optical scanner, a left polarizing beam splitter, a first left optical sensor, a second left optical sensor, a right polarizing beam splitter, a first right optical sensor, a second right optical sensor, and an electronic processor. The techniques include: normalizing a left eye electrical signal based on a power of a left eye normalizing signal at a spectrum that is characteristic of central fixation, and normalizing a right eye electrical signal based on a power of a right eye normalizing signal at a spectrum that is characteristic of central fixation. The techniques also include determining an alignment status of the subject's eyes based on a level of the normalized left eye electrical signal and a level of the normalized right eye electrical signal, and outputting an alignment status of the subject's eyes.

The embodiment of the application discloses a spatial beam combining method of a semiconductor laser module, comprising the following steps: acquiring a first curvature radius of a second lens and a second curvature radius of a third lens, determining a first adjusting instruction and a second adjusting instruction, adjusting the second lens and the third lens according to the first adjusting instruction and the second adjusting instruction, controlling a first light beam emitted by a first semiconductor laser chip to enter a polarization beam splitter via the first lens and the adjusted second lens, controlling a second light beam emitted by a second semiconductor laser chip to enter the polarization beam splitter via the first lens, the adjusted third lens and a mirror in sequence, combining the first light beam and the second light beam into a third light path by the polarization beam splitter to form a third light beam, and making the third light beam enter an optical fiber via a fourth lens. By using the application, the output power of the semiconductor laser module can be increased without changing the size of the semiconductor laser module.

The present application discloses an optical phase analysis system, an optical phase analysis method and an optical measuring device. The optical phase analysis system comprises a light source assembly, an optical measuring device and a processing device. The optical phase measuring device comprises a polarizing beam splitter, an interference polarizing mirror set and a polarized camera. The polarizing beam splitter is used to separate the polarized light into a reference beam and a measuring beam with a polarization angle difference of 90°. The measuring beam passes through the hyper-lens to be measured to form a phase analysis beam. The interference polarizing mirror set is used to interfere the reference beam and the phase analysis beam and circularly polarize to form a circularly polarized beam. The polarized camera is used to receive the circularly polarized beam to generate an image to be analyzed. The processing device is used to obtain the phase of the hyper-lens according to the image to be analyzed.

This invention provides a wafer surface defect detection system and method based on polarized light. The system includes: an illumination optical path; a collection optical path, including a phase modulator, a polarization modulator, a polarization beam splitter, and a differential detector arranged sequentially; the differential detector is used to receive... P Light and S The system outputs differential signals from two optical paths. A signal processing module acquires calibration parameters for the phase modulator and polarization modulator, which are parameters that ensure the differential signal corresponding to the surface region of the calibrated wafer is zero. It also fixes the phase modulator and polarization modulator to the corresponding calibration parameters, sends a scanning strategy for scanning the test area of ​​the wafer under test, generates an image based on the differential signal obtained from scanning the wafer, and detects defects on the wafer surface based on the image. The material of the test area is the same as the material of the surface region of the calibrated wafer. This invention improves the detection sensitivity of minute defects on the wafer surface.