Laser heterodyne interference linearity measuring device and laser heterodyne interference linearity measuring method with six-degree-of-freedom detection
A technology of laser heterodyne interference and measuring device, which is applied in the direction of measuring device, optical device, instrument, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0061] The present invention will be further described below in conjunction with drawings and embodiments.
[0062] The optical path structure of the device of the present invention is as figure 1 As shown, including laser heterodyne interference straightness and its position detection part and error detection and compensation part, the specific implementation process is as follows:
[0063] Dual-frequency laser 1 adopts a He-Ne frequency-stabilized laser with transverse Zeeman effect, and the output frequencies are f 1 and f 2 The orthogonal linearly polarized light beam is divided into two beams of light after the first ordinary beam splitter 2, wherein the reflected beam is incident on the plane reflector installed on the top of the reflective prism 9 formed by the upper and lower rectangular prisms after being reflected by the second ordinary beam splitter 5 10, the plane mirror 10 and the reflective prism 9 form a measuring mirror, which is fixed on the mobile platform ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com