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3 results about "Heterodyne interferometry" patented technology

A laser linewidth measurement device and method based on switchable channel delay self-heterodyne interferometry

PendingCN122306378AFiber couplerFrequency spectrum
This invention discloses a laser linewidth measurement device and method based on switchable channel delay self-heterodyne interferometry, belonging to the field of laser linewidth measurement technology. The laser to be measured is incident on a first fiber coupler via an isolator and splits into two paths: one path enters a computer-controlled first and second optical switches via a three-port fiber circulator, switching between different lengths of delay fiber via the first and second optical switches, rotating the polarization state by 90° via a Faraday rotating mirror before returning along the original path, and then restoring the original polarization state via a polarization controller; the other path undergoes frequency shifting via an acousto-optic frequency shifter. The two paths are combined via a second fiber coupler to generate a beat frequency optical signal, which is then acquired by a photodetector for photoelectric conversion and a spectrum analysis module. The computer fits the beat frequency power spectrum corresponding to different delay lengths to obtain the laser linewidth to be measured. This invention has strong anti-interference capabilities and can simultaneously acquire Lorentz linewidth, Gaussian linewidth, and composite linewidth, with a wide linewidth measurement range.
Owner:BEIHANG UNIV

A single-beam three-degree-of-freedom pose measurement method and device based on heterodyne interference and autocollimation

PendingCN122345358AAutocollimationHemt circuits
This invention belongs to the field of three-degree-of-freedom pose measurement technology, and relates to a single-beam three-degree-of-freedom pose measurement method and device based on heterodyne interferometry and self-collimation. The measurement method includes the following steps: Step 1: A laser beam is split into two beams with a certain frequency difference; Step 2: In the self-collimation module, the laser is split into a first reference beam and a first beam; the first beam is modulated, reflected, and then modulated again to split into a first measurement beam and a second beam; the second beam is modulated to a first photoelectric detection module; Step 3: In the heterodyne interferometry optical path, the laser is split into a second reference beam and a third beam; the third beam is modulated, reflected, and then split into a second measurement beam and a fourth beam; the two reference beams are merged to form a first interference beam, and the two measurement beams are merged to form a second interference beam; Step 4: A circuit module acquires the angle and displacement; The measurement device includes an optomechanical module, a target under test, and a circuit module. Using the above scheme, displacement and angle are measured simultaneously.
Owner:HARBIN INST OF TECH

A heterodyne interferometry apparatus and method based on wavefront manipulation of a target mirror

PendingCN122448066AHeterodyne interferometerOptical axis
A heterodyne interferometer device and method based on wavefront regulation target mirror belong to laser interferometer measurement technical field, the present application solves the problem of insufficient system interference keeping ability under the condition of large angle deflection of target mirror. The device comprises a heterodyne interference mirror group and a wavefront regulation target mirror, the heterodyne interference mirror group separates a bundle of input light beams into a first measurement light beam and a first reference light beam, and separates another bundle of input light beams into a second measurement light beam and a second reference light beam, the wavefront regulation target mirror is installed on the measured object, and the second measurement light beam is reflected to form a return measurement light beam and returns to the heterodyne interference mirror group, when the measured object occurs angle deflection such as pitching or yawing in the movement process, the wavefront regulation target mirror deflects synchronously with the measured object, the return measurement light beam is parallel to the second measurement light beam, the change of the return measurement light beam caused by large angle deflection of the wavefront regulation target mirror is more manifested as the position translation of the optical axis, thereby weakening the angle mismatch and wavefront mismatch.
Owner:HARBIN INST OF TECH