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62 results about "Confocal scanning microscopy" patented technology

Indirect imaging technique which uses a sharply focused light source (typically a laser) to excite fluors or otherwise visualize the specimen one point at a time; 2 or 3 dimensional likenesses are then reconstructed by computer; relatively noninvasive, applicable to thick sections and living tissue.

Bilateral dislocation differential confocal measuring method

The invention belongs to the technical field of optical imaging and detecting and relates to a bilateral dislocation differential confocal measuring method. According to the method, due to the dislocation differential subtracting process on data sets on the two sides of the confocal axial characteristic curve, the position of the extreme point of a confocal system characteristic curve is accurately obtained. Due to the fact that two sections of data, close to the position of the full width at half maximum and very sensitive to axial displacement, of the cofocal characteristic curve are used for conducting the dislocation differential subtracting processing, the position, calculated by the data sections, of the extreme point of the confocal characteristic curve is more sensitive than that the position, calculated through an existing confocal characteristic curve top fitting method, of the extreme point of the confocal characteristic curve, according to the result of the bilateral dislocation differential confocal measuring method, under the condition that the structure of a confocal microscopy system is not changed, the axial resolving power, the signal-to-noise ratio and the like of the existing confocal microscopy system can be obviously improve, and a new technological approach is provided for the field of confocal imaging or detecting.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Confocal microscopy measuring device based on measured surface fluorescence excitation

The invention provides a confocal microscopy measuring device based on measured surface fluorescence excitation, and belongs to the technical field of surface topography measurement. The confocal microscopy measuring device comprises a laser device, a collimation beam expander, a polarizing beam splitter, a quarter-wave plate, a detection objective lens, a tested part, a collection objective lens, a pinhole and a detector, wherein the collimation beam expander and the polarizing beam splitter are configured on a collineation light path of the laser device along the light propagation direction; the quarter-wave plate, the detection objective lens and the tested part are configured on the reflection light path of the polarizing beam splitter; the collection objective lens, the pinhole and the detector are configured on the transmission light path of the polarizing beam splitter; a narrow band filter is contained inside the detector; and the tested part is borne by a micrometric displacement objective table, and the surface of the tested part is coated with a film in a vacuum evaporating coating method. By means of the design that surface characteristics of the tested surface are changed through film coating, the fact that measurement light can return back to a detection system after being reflected by the tested surface is guaranteed, the difficult problems of detection of a large numerical aperture (NA) and high gradient surface are resolved, and the confocal microscopy measuring device is suitable for ultra precise measurement of three-dimensional shapes with large NA and high gradient spherical surfaces, aspheric surfaces and free-form surfaces.
Owner:HARBIN INST OF TECH

Laser confocal scanning microscope and methods of improving image quality in such microscope

According to a first embodiment the invention provides for increasing the throughput and reducing the striping due to imperfections in the microlens and / or confocal aperture arrays of a Laser Confocal Scanning Microscope by increasing the number of repeat patterns in the microlens and confocal aperture arrays to more than one, and incorporating an intensity modulation function that ensures constant integrated image intensities at the image detector independent of the instantaneous speed of scanning. According to a second embodiment the invention provides for reducing the striping in a Laser Confocal Scanning Microscope by introducing a second galvanometer mirror such that the emitted laser light beam is descanned at the image (sample) plane. According to embodiments three to five, striping in a Laser Confocal Scanning Microscope is also reduced by destroying coherency in the emitted light beam by insertion of a small angle diffuser, by flattening the Gaussian intensity distribution of the emitted laser light beam and changing the characteristics of the beam expander. According to embodiment six the invention provides for changing the degree of confocality of a Laser Confocal Scanning Microscope by inserting a mechanism that offers a range of selectable confocal aperture sizes.
Owner:VISITECH INT LTD

Laser confocal scanning microscope and methods of improving image quality in such microscope

According to a first embodiment the invention provides for increasing the throughput and reducing the striping due to imperfections in the microlens and / or confocal aperture arrays of a Laser Confocal Scanning Microscope by increasing the number of repeat patterns in the microlens and confocal aperture arrays to more than one, and incorporating an intensity modulation function that ensures constant integrated image intensities at the image detector independent of the instantaneous speed of scanning. According to a second embodiment the invention provides for reducing the striping in a Laser Confocal Scanning Microscope by introducing a second galvanometer mirror such that the emitted laser light beam is descanned at the image (sample) plane. According to embodiments three to five, striping in a Laser Confocal Scanning Microscope is also reduced by destroying coherency in the emitted light beam by insertion of a small angle diffuser, by flattening the Gaussian intensity distribution of the emitted laser light beam and changing the characteristics of the beam expander. According to embodiment six the invention provides for changing the degree of confocality of a Laser Confocal Scanning Microscope by inserting a mechanism that offers a range of selectable confocal aperture sizes.
Owner:VISITECH INT LTD

Cellular surgery utilizing confocal microscopy

An improved system for cellular surgery which includes a laser for producing a laser beam, and confocal optics for scanning and focusing the laser beam in tissue and generating confocal images of the tissue in accordance with returned light from the tissue. The confocal images are visualized on a display. The system includes a controller for enabling the operator to select one or more cells of the tissue in the displayed confocal images for surgical treatment. The controller operates the laser and confocal optics in a first mode to treat the tissue when the confocal optics focus the laser beam at least one region associated with the selected cells in the tissue, but at all other times operates the laser and confocal optics in a second mode which does not damage the tissue. The treatment may be localized to concentrate the energy of the laser to the region including the selected cell or cells, or the treatment may be non-localized to distribute the energy of the laser to the region which includes the selected cell(s) and also the cells of the tissue surrounding such selected cell(s). In another embodiment, an apparatus is provided having a confocal imaging system, which focuses a first laser beam through confocal optics to tissue and provides confocal images of the tissue, and a treatment system which focuses a second laser beam through the confocal optics coaxial with the first laser beam for treating at one or more selected locations in the imaged tissue.
Owner:CALIBER IMAGING & DIAGNOSTICS

Far-infrared detector spectral response measuring system in confocal microscopy

The invention provides a confocal microscopy mid and far-infrared spectral response measurement system, which comprises an infrared source; an input end of an infrared monochrometer is connected to an output end of the infrared source; an infrared confocal microscopic system is arranged on an output light path of the infrared monochrometer; a chopper light limiting unit is arranged between the infrared confocal microscopic system and a three-dimensional micro-displacement platform and arranged on the output light path of the infrared monochrometer; the three-dimensional micro-displacement platform is arranged on the output light path of the infrared monochrometer; a sample refrigeration Dewar is fixed on the three-dimensional micro-displacement platform; a preamplifier is connected with the sample refrigeration Dewar, which plays a role of amplifying the sample electric signals; a phase-locked amplifier is connected with the preamplifier; a controlling computer is connected with the phase-locked amplifier and the infrared monochrometer to control the course of the test implemented by the phase-locked amplifier and the infrared monochrometer and collects the data signal inputted by the phase-locked amplifier and the infrared monochrometer at the same time.
Owner:INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI

Confocal microscopy imaging system for fluorescence lifetime in second near-infrared region

InactiveCN109324026AHigh sensitivityExtending Fluorescence Lifetime Imaging CapabilitiesFluorescence/phosphorescenceConfocal scanning microscopyGalvanometer
The invention discloses a confocal microscopy imaging system for the fluorescence lifetime in a second near-infrared region. A laser emitted by a femtosecond laser source is introduced into an uprightconfocal scanning microscope. The laser is focused on the sample by a near-infrared enhanced objective lens, after pass through a scanning galvanometer, a scanning lens, and a sleeve lens. The signals in the second near-infrared region of the sample are collected by a same near-infrared enhanced objective lens; are split by a long-pass dichroic mirror and then are taken out of the system, after pass through a sleeve lens, a scanning lens, and a scanning galvanometer; are collected and coupled into a large diameter fiber; and finally are converted into electrical signals by a photomultiplier tube detection. The electrical signals are converted into electrical counting signals, and input to a counting board. At the same time, the counting board receives synchronous pulse signals from an excitation light, and uses the signals as timing stop signals. The system obtains each sample of a fluorescence lifetime image in the second near-infrared region and a fluorescence intensity image in thesecond near-infrared region, after processed by the computer. According to the confocal microscopy imaging system for the fluorescence lifetime in the second near-infrared region, the system expandsa function of the fluorescence lifetime imaging in the second near-infrared region; and obtains more abundant image information.
Owner:ZHEJIANG UNIV

Method for preparing multilayer thin film and evaluating binding performance thereof

The invention discloses a method for preparing a multilayer thin film and evaluating binding performance thereof. The method includes: respectively depositing a Cr binding layer, a CrN transition layer and a CrMoAlN functional layer on an H13 matrix through an unbalanced ion sputtering coating process to obtain a Cr-CrN0CrMoAlN multilayer thin film; setting Cr target current to 4A, Al target current to 6A, Mo target current to 0-6A and bias voltage to -75V, and depositing the Cr binding layer for 360s, the CrN transition layer for 600s and the CrMoAlN functional layer for 3600s; conducting a scratch test through a multifunctional scratch tester; acquiring scratch shape on the surface of the thin film through an optical confocal scanning microscope to evaluate the binding performance of the thin film. The multilayer thin film prepared by the method is of a gradient structure, and the binding performance of the thin film is improved by using the Cr layer for bottoming; CrN serving as the transition layer enhances bearing capacity of the thin film; CrMoAlN serving as the functional layer can improve high-temperature resistance and friction resistance of the thin film. A scratch method is adopted to represent difference in the binding performance of the thin film due to Mo content difference.
Owner:ZHEJIANG UNIV OF TECH
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