Confocal-scanning microscopic imaging method and system based on laser heterodyne interferometry
A technology of optical heterodyne interference and scanning microscopy, which is used in material analysis by optical means, measurement of phase influence characteristics, instruments, etc. It can solve samples that cannot obtain quantitative phase information, cannot be resolved by confocal microscopy, and have birefringence characteristics. detection and other problems, to achieve the effect of increasing the detectable depth, realizing high-resolution measurement, and improving the axial resolution
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[0042] Such as figure 1 , the specific embodiment of the present invention comprises a laser light source part, a frequency shift part, a confocal scanning part, an optical signal acquisition part and a signal analysis part;
[0043] The laser light source includes a laser 1 that outputs a single-wavelength laser, a half-wave plate 2a, and a polarization beam splitter 3a that splits the laser into two laser beams;
[0044] The frequency shift part includes a local oscillator optical transmission optical path and a signal optical transmission optical path. The local oscillator optical transmission optical path is provided with a first acousto-optic frequency shifter 4b with adjustable frequency, a transmitting mirror 10 for adjusting the optical transmission direction of the local oscillator, and a half-wave plate 2d, local oscillator optical polarization beam splitter 3d, half-wave plate 2g; signal light transmission optical path is provided with a second acousto-optic frequen...
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