77 results about "Scanning microscopy" patented technology

To provide a technique capable of inversely transforming a detection signal of a photodetector by using an optimal transformation matrix.SOLUTION: An optical measurement device includes: an optical sensor unit for detecting pulse-like signal light so as to output a detection signal composed of exponential responses; an A / D conversion unit for converting the detection signal into a digital signal; a setting unit for setting a transformation matrix for inversely transforming the digital signal; and a calculation unit for inversely transforming the digital signal by the transformation matrix set by the setting unit so as to calculate an estimated pulse of the signal light.SELECTED DRAWING: Figure 1

The invention discloses a turntable-based dual confocal image scanning microscope and an imaging method, and relates to the technical field of optical elements, systems, instruments and imaging. The imaging light source assembly, the optical fiber transmission assembly, the light source collimation assembly, the structured light generation assembly, the turntable assembly, the microscopic amplification assembly and the camera detection assembly are arranged along a light path; the structured light generation module realizes structured light illumination on a sample surface by loading a specific mask sequence, super-resolution imaging is realized, pinholes in the turntable assembly are equidistantly arranged according to an Archimedes spiral, and the turntable assembly rotates at a high speed to realize multi-point parallel scanning and de-scanning; the detection module performs detection by using an area array detector, so that the resolution improvement of double diffraction limit is realized; according to the dynamic pinhole array-pixel redistribution method, super-resolution reconstruction is carried out based on an image scanning microscopic system principle, and Stokes shift, optical aberration and other non-ideal conditions can be effectively corrected.

The invention discloses a tunable excited Raman spectrum microimaging method and device, and belongs to the field of spectrum detection and optical imaging. The device comprises a broadband adjustable wavelength light source, a high-resolution wavelength scanning module, a stimulated Raman signal excitation module and a stimulated Raman signal detection module. The stimulated Raman signal excitation and imaging module is used for focusing the two beams of narrow-band femtosecond pulse light which are overlapped in time and space on a sample and exciting a stimulated Raman signal, and meanwhile, moving the sample to realize spot scanning microscopic imaging; and the stimulated Raman signal detection module is used for converting the stimulated Raman scattering signal into an electric signal, demodulating the electric signal by using a lock-in amplifier, and recording spectral information by using a data acquisition card. According to the invention, the broadband tunable characteristic of the optical parametric amplifier is utilized to tune the pump light to the wavelength region of the sample absorption peak length so as to realize electron pre-resonance stimulated Raman; and a balance detection technology is combined at a detection end, so that high-sensitivity, high-resolution and high-signal-to-noise-ratio detection of stimulated Raman signals is realized.

The invention discloses a cell image segmentation method, and relates to the technical field of cell analysis, and the method comprises the following steps: S1, image acquisition; s2, processing optical artifacts generated by imaging of the phase contrast microscope; s3, processing interference of impurities and debris in the cell image; in the method, a phase contrast microscope and an optical coherence tomography microscope are combined to obtain a cell image, three-dimensional structure information of an OCT image is utilized to assist in correcting artifacts generated by imaging of the phase contrast microscope, and the artifacts are processed based on phase recovery and filtering and texture feature matching and repairing. According to the method, the interference of impurities and debris is removed by applying a diffusion and repair method based on a partial differential equation and a machine learning classification and reconstruction method, so that the cell image quality is effectively improved, the interference of artifacts and impurities on subsequent analysis is reduced, and a reliable image data basis is provided for cell image segmentation and cell morphology analysis.

According to the laser confocal scanning microscope, the scanning image distortion correction method and the acquisition card provided by the invention, the transflective mirror is fixedly arranged between the resonance galvanometer and the galvanometer galvanometer, and the monitoring light path and the second detector are arranged in the transmission direction of the transflective mirror. The acquisition card is respectively connected with the first detector and the second detector; the confocal signal and the grating signal which are synchronously acquired by the acquisition card in an isochronous manner are twin images in time and space, and the grating image formed by the grating signal depicts the movement of the resonance galvanometer in the scanning process, so that distortion correction can be performed on the twin object plane image of the grating image through distortion analysis on the grating image, and the distortion correction accuracy is improved. Therefore, the correction accuracy is effectively improved, and the method is not easily influenced by factors such as environment, service life and optical path deviation. Moreover, in the distortion correction process, correction is carried out through the odd-numbered line sub-graphs and the even-numbered line sub-graphs, so that the distortion correction accuracy is further improved.

Embodiments are for a confocal microscope unit attached to a connection port of a microscope including: light sources which output irradiation light to a sample to be observed; photodetectors which detect observation light generated from a sample in response to the irradiation light; a scan mirror which scans the irradiation light on the sample and guides the observation light generated from the sample to the photodetectors; a scan lens which guides the irradiation light scanned by the scan mirror to the microscope optical system and guides the observation light focused by the microscope optical system to the scan mirror; a lens barrel to which the scan lens is fixed; an attachment portion which attaches the lens barrel to the connection port ; and a movable portion which supports the lens barrel so that an angle of the lens barrel with respect to the attachment portion is changeable.

The invention provides an automatic focusing device and method for an ultrasonic scanning microscope, and the device comprises a motion platform module, a distance measurement module, and an ultrasonic probe module. The motion platform module comprises a scanning shaft, a focusing shaft and a stepping shaft, the scanning shaft is arranged in the X-axis direction, the stepping shaft is arranged in the Y-axis direction, the focusing shaft is arranged in the Z-axis direction, and the motion platform module is used for focusing the ultrasonic module probe; the distance measuring module is mounted on the scanning shaft or the focusing shaft and is used for measuring the surface height of the measured workpiece; and the ultrasonic probe module is mounted on the focusing shaft and is used for transmitting and receiving ultrasonic waves to detect the detected workpiece. According to the invention, the distance measuring module is adopted to obtain the height change of the surface of the measured workpiece, the heights of the focusing shaft and the ultrasonic probe module are automatically adjusted in real time, the probe and the measured workpiece are always kept on the optimal focal plane, automatic focusing is realized, and the ultrasonic scanning image quality is improved.

A mosaic scan filter array has a plurality of identical tiles, each tile have n rows and m columns where n is equal to a greater than 1 and m is equal to a greater than 2. One row of tiles extends a width of a detector array and constitutes a base pattern. The base pattern is repeated M times and each repetition is laterally offset in one direction by one pixel width. The base pattern and laterally offset repetitions constitute a repeat pattern. There are MxN filters selected from the group of one or more of the following: RGBW filters, fluorescence emission filters and a series of narrow spectral band filters covering a continuous spectral range. The mosaic scan filter arrays can be used with a scanning microscope or a scanning camera.

The invention relates to the technical field of ultrasonic scanning microscopes, in particular to a system and a method for measuring surface unevenness and warping of an ultrasonic scanning microscope. The system comprises a water tank, a light emitting device, a light receiving device and a signal processing module, the light emitting device generates line laser through a semiconductor laser and an optical shaping module, and scanning is achieved through a high-precision galvanometer. The light receiving device is provided with a narrow-band filter, a telecentric lens and a CMOS sensor and is used for capturing a light spot image; the signal processing module integrates sub-pixel positioning, galvanometer nonlinear correction, self-adaptive filtering and temperature compensation algorithms, light spot center sub-pixel-level positioning is achieved through Gaussian curved surface fitting, galvanometer correction and temperature drift compensation are combined, the measurement precision and stability are improved, and finally high-precision height information is fed back to an ultrasonic scanning system. According to the invention, the accuracy and reliability of surface unevenness and warping measurement are improved.

The invention provides an MLCC short-circuit product defect position analysis method, and belongs to the technical field of multilayer ceramic capacitor failure analysis. The method comprises the following steps: carrying out rapid leakage current detection on MLCC products for 0.5-2 seconds, and screening out short-circuit products of which the leakage current is greater than a first preset threshold value; products with crack defects are eliminated through an acoustic scanning microscope; gradually applying increased direct-current voltage to the screened crack-free short-circuit product, monitoring leakage current in real time, and terminating the test when the sudden change amplitude of the current exceeds a second preset threshold value; then acoustic scanning is carried out on the protective cover surface and the cutting surface, and two-dimensional coordinates of defect points on the two surfaces are extracted; and calculating the three-dimensional coordinates of the defect in the MLCC through image registration and a spatial inversion algorithm. According to the method, the internal hidden short circuit defect can be identified and positioned in a non-destructive manner, the positioning precision and the analysis efficiency are improved, and the method is suitable for batch failure analysis and manufacturing process optimization.

A multifocal scanning microscopy (MSM) for super-resolution imaging was developed with multicolor acquisition and minimal instrumental complexity. MSM implements a stationary, interposed multi-focal multicolor excitation by exploiting the motion of the specimens, realizing super-resolution microscopy through a general epi-fluorescence platform without compromising the image-scanning mechanism or inducing complex instrument alignment. The system is demonstrated with various phantom and biological specimens, and the results present effective resolution doubling, optical sectioning, and contrast enhancement. MSM, as a highly accessible and compatible super-resolution technique, may offer a promising methodological pathway for broad cell biological discoveries.

The present application relates to the technical fields of optical elements, systems, instruments and imaging, and discloses a multi-point confocal image scanning microscope and an imaging method. According to the present application, an imaging light source assembly, a light source collimation assembly, a multi-focus generation assembly, a multi-focus moving assembly, a multi-focus projection assembly, and a camera detection assembly are arranged along a light path, so as to achieve complete image recording. A unique multi-focus illumination mode provided by the present application is used in combination with an optical locked-phase detection technology, so that a defocus-induced stray signal during thick sample imaging can be effectively removed, and depth imaging is performed; the multi-focus generation assembly is switched, so that switching between a wide-field mode, a confocal mode and a super-resolution mode is easily achieved. Moreover, the present application uses a pixel redistribution algorithm to perform super-resolution reconstruction, and uses a multi-image deconvolution reconstruction algorithm and redundant information in a raw data set to perform frame reduction reconstruction, thereby increasing the imaging speed. Compared with the existing methods, the present application can increase the imaging speed, improve the imaging depth, reduce phototoxicity, and widen the diversity of imaging modes.

The invention provides a microscope for point scanning a probe. The microscope comprises an illumination light path for directing at least one illumination beam to the sample; a detection light path for directing a detection light beam from the sample to a detector. A microlens array, comprising a plurality of microlenses, is arranged in the detection light path. Ones of the plurality of microlenses of the microlens array are optically coupled to the detector via an associated one of a plurality of optical fibers. Ones of the plurality of optical fibers have an optical path length. The optical path lengths of ones of the plurality of optical fibers differ by distances Δsi.

The present invention application discloses a defect detection data evaluation method based on an ultrasonic scanning microscope, and relates to the technical field of ultrasonic detection of ceramic material defects. The defect detection data evaluation method based on an ultrasonic scanning microscope includes the following steps: S1, preliminary experiment; S2, performance test; S3, judging the performance evaluation value; S4, obtaining the defect coefficient. The present invention application determines the optimal number of ultrasonic scanning microscopes through preliminary experiments, then performs performance testing on the ultrasonic scanning microscope, and then adjusts the scanning parameters of the ultrasonic scanning microscope until the performance evaluation value meets the preset working standard, and finally collects the defect data of the material to be detected through the ultrasonic scanning microscope, and obtains the defect coefficient based on this, so as to achieve a more accurate effect of performing defect detection of ceramic materials through an ultrasonic scanning microscope, and solves the problem of low data accuracy when performing defect detection of ceramic materials through an ultrasonic scanning microscope in the prior art.

The invention provides a microscope with rapid quasi-confocal detection. The simultaneous acquisition of multiple images in a microscope should be possible with greater flexibility. In addition, simultaneous acquisition should be made possible with less effort. In a microscope (1) having a main beam splitter (22) and an adjustable beam deflection unit (21) for moving illumination light through a sample space (P), the beam deflection unit (21) is optically arranged for this purpose between a light source (12) and the main beam splitter (22) such that sample light away from the beam deflection unit (21) passes to a sensor (28), both the illumination light and the sample light passing through the same intermediate image (ZB). The invention also provides a method for scanning image acquisition by means of a scanning microscope.

An image scanning microscope includes: an excitation unit that generates excitation light; an objective lens pointing to the sample space and guiding the excitation light into the sample space and receiving the detection light from the sample space; a scanning unit arranged along a beam path between the excitation unit and the objective lens and selectively directing the excitation light into different regions of the sample space via the objective lens; a detection arrangement comprising at least one spectral coding element that changes a spatial distribution of the intensity of the detection light based on the wavelength of the detection light and at least one array detector that detects the spatial distribution of the intensity of the detection light; a main beam splitter that directs the excitation light into the objective lens via the scanning unit and directs the detection light into the detection arrangement; and a control unit that controls the excitation unit to set the excitation modality and determines a spatial distribution of concentrations of at least two different fluorophore species in a sample arranged in the sample space based on a spatial distribution of the intensity of the detection light and based on the excitation modality and / or the photon arrival time.

The invention relates to a scanning microscope (1) comprising a first assembly (I) with a sample stage (2) for holding a sample carrier (4) and a sample (5) placed thereon in a sample chamber. Furthermore, a second assembly (II) is provided, comprising illumination optics (7, 8) for guiding and shaping illumination radiation and for illuminating the sample (5); and detection optics (9) for collecting and guiding detection radiation emanating from the sample (5) along a detection beam path. The scanning microscope (1) is characterized by the fact that the second assembly (II) has a first section (12.1) of the detection beam path; a third assembly (III) is present which includes a second section (12.2) of the detection beam path; and at least one drive (6) is present to move the second assembly (II) relative to the third assembly (III) in a controlled manner. The invention further relates to a use of the scanning microscope (1).

The invention provides a compact automatic slide scanning device which comprises an electronic scanning microscope, the electronic scanning microscope comprises a liftable lifting platform, the lifting platform is provided with a two-dimensional displacement platform, the two-dimensional displacement platform comprises a connecting bottom plate, and the connecting bottom plate is used for being connected with the lifting platform of the electronic scanning microscope. The upper end of the electronic scanning microscope is provided with a movable bearing table, the bearing table is provided with a movable film clip tray in the length direction, the film clip tray is used for placing a film clip body, the film clip tray is perpendicular to the moving direction of the bearing table, one end of the bearing table is provided with a film clip storage frame capable of moving up and down, and the film clip storage frame is of a frame-shaped structure with two through ends. The through end of the slide holder storage rack faces the length direction of the bearing table, the slide holder storage rack is provided with a plurality of slide holder slots for storing slide holder main bodies along the height direction, and a downward preview camera is arranged above one end, close to the slide holder storage rack, of the bearing table, so that the problems of miniaturization and light weight of the slide scanner are solved.

An image scanning microscope (100, 200) comprises a detection arrangement (112, 204) comprising a beam splitting element (122) configured to receive detection light (120), to split the detection light (120) into two parts, to direct a first part (124a) of the detection light (120) into a first beam path (126a), and to direct a second part (124b) of the detection light (120) into a second beam path (126b). The first beam path (126a) comprises a spatially resolved detector (128, 202) configured to detect a spatial distribution of the intensity of the first part (124a) of the detection light (120). The second beam path (126b) comprises a spectrally resolved detector (130) configured to detect a spectral information of the second part (124b) of the detection light (120). The image scanning microscope (100, 200) further comprises a controller (116) configured to determine a spatial distribution of at least one fluorophore species in a sample (104) based on the spatial distribution of the intensity of the first part (124a) of the detection light (120) and the spectral information of the second part (124b) of the detection light (120).

A scanning microscope system configured for material analysis and mineralogy comprising a first detector and a second detector, and a data-processing system comprising a data-storage component and a segmentation component. The data-storage component is configured for providing image(s) of a sample based on first emissions from a plurality of first scan locations. The segmentation component is configured for determining at least one or a plurality of second scan locations for at least one or a plurality of region(s) of the at least one image. The second detector is configured for detecting second emissions from at least one of the second scan locations of at least one of the regions. The system is further configured for determining the second scan location(s) for the region(s) and detecting the second emissions from the at least one of the second scan locations of the at least one of the regions in parallel.

The invention discloses an assessment test and decision-making method for regression use of a domestic plastic package layered device based on layering characteristics, and relates to the field of reliability assessment and test of plastic package layered devices. The process comprises the following steps: obtaining a screened plastic package layered device, and determining an initial state and basic parameters of a to-be-tested device; extracting hierarchical feature data; classifying the devices based on the hierarchical features; designing a multi-stress assessment test, and carrying out the multi-stress assessment test on different layered devices to obtain reliability layered characteristic changes and test data of the devices; and judging the regression use qualification of the device. The hierarchical feature data is obtained through an acoustic scanning microscope and a computer vision algorithm based on OpenCV; the design method of the multi-stress assessment test is an iterative test framework comprising configurable environmental stress (such as high temperature and high humidity, temperature cycle) and synchronous electrical stress (such as dynamic / static signals); the regression use decision-making method is a comprehensive decision in combination with the category of the device, the electrical parameter state after examination, the layering proportion change trend and whether reliability improvement measures such as coating and the like are added or not; according to the method, the screened layered devices can be scientifically evaluated and recycled, and the accuracy and economical efficiency of screening decisions are remarkably improved.

The utility model belongs to the field of supports of microscopes, and particularly relates to a multifunctional support for a high-resolution confocal scanning microscope. The device comprises a horizontally arranged bottom plate and a microscope body, the bottom plate is horizontally provided with a placing groove, a driving assembly is arranged between the bottom plate and the placing groove, a stand column is vertically fixed on the bottom plate at the rear side of a placing plate, a connecting block is hinged to the front side wall of the top of the stand column, a fixing rod is arranged at the top of the connecting block, and a limiting assembly is arranged on the fixing rod. The front side wall of the fixing rod is provided with a first insertion block used for installing a microscope body, the side wall of the fixing rod is provided with a plurality of adjusting blocks which freely rotate left and right relative to the fixing rod, and the adjusting blocks are provided with second insertion blocks used for installing accessories. According to the design, the device can be conveniently driven to horizontally rotate in the observation process so that observation can be more comprehensive and specific, accessories with different functions can be conveniently additionally installed according to experiment requirements, the adaptability is higher, the flexibility is higher, and meanwhile the use cost is reduced.

1. The name of the product of this design: clamp. 2. Purpose of the product of this design: used to fix the coaxial resonant sensor, rangefinder and CCD camera components inside the microwave near-field scanning microscope, so as to facilitate equidistant scanning and sample photography of the microwave near-field scanning microscope. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.

To provide an image scanning microscope and a method capable of excellently determining the spatial distribution of the concentration of at least two different phosphor species in a sample.SOLUTION: The scanning unit 110 is arranged along the beam path between the excitation unit 108 and the objective 102 and directs the excitation light 118 via the objective onto different regions of the sample space 106. The image scanning microscope 100 also includes a detection device 112 that includes a spectral encoding element 128 that varies the spatial distribution of the intensity of the detected light based on the wavelength of the detected light 126, and an array detector that detects the spatial distribution. The image scanning microscope also comprises a control unit 116 for controlling the excitation unit to set an excitation mode and for determining a spatial distribution of a concentration of at least two different fluorophore species in a sample 104 arranged in the sample space on the basis of the spatial distribution and the excitation mode and / or photon arrival times detected by the time-resolved detector elements of the detection device.SELECTED DRAWING: Figure 1

The present description relates to a linear scanning optical coherence tomography microscopy device (200). It comprises an interferometric microscope (201) including a reference arm, an object arm configured to receive an object (10), a beam splitter (204) coupling said object and reference arms to a light source (210) and a detector (222), and a first microscope objective (202) arranged on said object arm.It further comprises a one-dimensional confocal spatial filtering device configured to cooperate with said light source to illuminate said object along a focal line located in an object space of the first microscope objective, and a one-way scanning device (235, 237) of said focal line, arranged on said object arm upstream of said first microscope objective, and configured to scan the focal line in a lateral direction (y) substantially perpendicular to an optical axis (z) of said first microscope objective. FIG. 2.

The utility model provides an automatic focusing device of an ultrasonic scanning microscope, which comprises a motion platform module, a distance measuring module and an ultrasonic probe module, the motion platform module comprises a scanning shaft, a focusing shaft and a stepping shaft, the scanning shaft is arranged in the X-axis direction, the stepping shaft is arranged in the Y-axis direction, the focusing shaft is arranged in the Z-axis direction, and the motion platform module is used for focusing the ultrasonic module probe; the distance measuring module is mounted on the scanning shaft or the focusing shaft and is used for measuring the surface height of the measured workpiece; and the ultrasonic probe module is mounted on the focusing shaft and is used for transmitting and receiving ultrasonic waves to detect the detected workpiece. According to the utility model, the distance measuring module is adopted to obtain the height change of the surface of the measured workpiece, the heights of the focusing shaft and the ultrasonic probe module are automatically adjusted in real time, the probe and the measured workpiece are always kept on the optimal focal plane, automatic focusing is realized, and the ultrasonic scanning image quality is improved.

1. A method for scanning a microscope slide using at least two microscope slide scanners, comprising: The method comprises the following steps: a) loading a plurality of microscope slides (14) each belonging to one of a plurality of sample sets into a supply unit (6) for microscope slides (14); b) transporting one microscope slide (14) from the supply unit (6) to each microscope slide scanner (7, 8, 9, 10, 11, 12) that does not have a microscope slide loaded thereon; c) performing a scanning process on each loaded microscope slide scanner (7, 8, 9, 10, 11, 12); d) transporting each scanned microscope slide (14) from each microscope slide scanner (7, 8, 9, 10, 11, 12) to an intermediate storage location (16); e) providing a data record of each scanning process for evaluation; f) transferring all microscope slides (14) of the sample set from intermediate storage (16) to final storage (17); Includes.

The application provides a compact automatic slide scanning device, comprising an electronic scanning microscope, the electronic scanning microscope comprising a liftable lifting table, the lifting table being provided with a two-dimensional displacement table, the two-dimensional displacement table comprising a connecting base plate, the connecting base plate being used for being connected with the lifting table of the electronic scanning microscope, the upper end of the electronic scanning microscope being provided with a movable bearing table, the bearing table being provided with a movable slide clamp tray along the length direction, the slide clamp tray being used for placing a slide clamp main body, the moving direction of the slide clamp tray and the bearing table being perpendicular, one end of the bearing table being provided with a slide clamp storage rack which can move up and down, the slide clamp storage rack being a frame-shaped structure with both ends being through, the through end of the slide clamp storage rack facing the length direction of the bearing table, the slide clamp storage rack being provided with a plurality of slide clamp insertion slots for storing the slide clamp main body along the height direction, the upper side of one end of the bearing table close to the slide clamp storage rack being provided with a downward preview camera, and the problems of miniaturization and light weight of the slide scanner are solved.

The present invention discloses an end detection device for multilayer ceramic capacitors, which includes an introduction plate, cutting glue, and an ultrasonic scanning microscope; a plurality of introduction holes are formed in the introduction plate, and the introduction holes are used for implanting upright multilayer ceramic capacitors; the cutting glue is used for pasting each of the multilayer ceramic capacitors implanted into the introduction holes; the ultrasonic scanning microscope includes a water tank and a sensor probe arranged above the water tank, the water tank is used for carrying the introduction plate implanted with a plurality of multilayer ceramic capacitors, and the sensor probe is used for scanning the multilayer ceramic capacitors to obtain an entity scan image and a back scan image of the scanning area. The present invention can judge whether each multilayer ceramic capacitor is a defective product one by one through the entity scan image and the back scan image, thereby realizing batch detection of multilayer ceramic capacitors, with short detection time, high efficiency, and high precision measurement. The present invention discloses a method for detecting the ends of multilayer ceramic capacitors.