Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Microscope having a reference specimen

a reference specimen and microscope technology, applied in the field of microscopes, can solve the problems of time-consuming and laborious user effort, affecting the accuracy of the detection results, and the inability to focus a new sample after the new sample has been placed, so as to achieve the effect of easy and reliably focused

Inactive Publication Date: 2005-04-14
LEICA MICROSYSTEMS CMS GMBH
View PDF2 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0005] It is therefore the object of the present invention to describe and further develop a microscope, in particular a confocal or double confocal scanning microscope, and a method for operating a microscope, in which drift-related changes can be detected and compensated for, and auxiliary means are provided with which a specimen can be easily and reliably focused.

Problems solved by technology

In confocal and especially in double confocal scanning microscopes, however, the individual components of the microscope and the specimen are subject to temperature-related drifts relative to the objective, so that specimen detections lasting for a longer period of time may thereby be erroneous.
In confocal and double confocal scanning microscopes in particular, the focusing of a new sample after the new sample has been put in place is time-consuming, and requires a high level of skill on the part of the user.
Finding the specimen and positioning it in the focal plane of the microscope objective can thus be difficult if not in fact impossible.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microscope having a reference specimen
  • Microscope having a reference specimen
  • Microscope having a reference specimen

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044]FIGS. 1a, 2a, 3a, 4a, 5a, and 6a all show elemental cells of a texture that are assembled, in FIGS. 1b, 2b, 3b, 4b, 5b, and 6b respectively, into an extended two-dimensional texture. These textures are of known configurations, i.e. the respective lines and respective line widths are in a range of approximately 200 to 400 nm. These textures serve as a reference specimen, these textures being applied onto surfaces of various cover glasses. A cover glass of this kind serves as a specimen support unit. The specimen support unit configured as a cover glass thus possesses a surface configured as a reference specimen. The texture is applied onto the surface in the form of a coating. The coatings of FIGS. 1b, 2b, and 3b are in each case reflective coatings that possess a reflection coefficient of, for example, 0.01 for light of a wavelength region in the near infrared. A suitable laser light source is then, for example, a CW diode laser.

[0045] The coatings of FIGS. 4b, 5b, and 6b are...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.

Description

CROSS REFERENCE TO RELATED APPLICATIONS [0001] This application is a division of prior application Ser. No. 10 / 037,851, filed Jan. 4, 2002, which claims priority to German patent application no. 101 00 246.7, filed on Jan. 5, 2001. The entire disclosures of both of these applications are hereby incorporated by reference herein.FIELD OF THE INVENTION [0002] The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope. BACKGROUND OF THE INVENTION [0003] Microscopes, in particular confocal scanning microscopes, have been known for some time from practical use. The reader is referred to J. B. Pawley, ed., “Handbook of Biological Confocal Microscopy,” Plenum Press 1995, 2nd edition, regarding confocal scanning microscopes; and to EP 0 491 289 A1 regarding double confocal microscopes. [0004] The microscopes of the generic type are used in particular for images of biomedical specimens, where spe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G02B21/00G02B21/34
CPCG02B21/0024G02B21/0076G02B21/006
Inventor BEWERSDORF, JOERGGUGEL, HILMAR
Owner LEICA MICROSYSTEMS CMS GMBH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com