Microscope having a reference specimen

a reference specimen and microscope technology, applied in the field of microscopes, can solve the problems of time-consuming and laborious user effort, affecting the accuracy of the detection results, and the inability to focus a new sample after the new sample has been placed, so as to achieve the effect of easy and reliably focused

Inactive Publication Date: 2005-04-14
LEICA MICROSYSTEMS CMS GMBH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Benefits of technology

[0005] It is therefore the object of the present invention to describe and further develop a microscope, in particular a confocal or double confocal scanning microscope, and a method f

Problems solved by technology

In confocal and especially in double confocal scanning microscopes, however, the individual components of the microscope and the specimen are subject to temperature-related drifts relative to the objective, so that specimen detections lasting for a longer period of time may thereby be erroneous.
In confocal and double confo

Method used

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  • Microscope having a reference specimen
  • Microscope having a reference specimen
  • Microscope having a reference specimen

Examples

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Embodiment Construction

[0044]FIGS. 1a, 2a, 3a, 4a, 5a, and 6a all show elemental cells of a texture that are assembled, in FIGS. 1b, 2b, 3b, 4b, 5b, and 6b respectively, into an extended two-dimensional texture. These textures are of known configurations, i.e. the respective lines and respective line widths are in a range of approximately 200 to 400 nm. These textures serve as a reference specimen, these textures being applied onto surfaces of various cover glasses. A cover glass of this kind serves as a specimen support unit. The specimen support unit configured as a cover glass thus possesses a surface configured as a reference specimen. The texture is applied onto the surface in the form of a coating. The coatings of FIGS. 1b, 2b, and 3b are in each case reflective coatings that possess a reflection coefficient of, for example, 0.01 for light of a wavelength region in the near infrared. A suitable laser light source is then, for example, a CW diode laser.

[0045] The coatings of FIGS. 4b, 5b, and 6b are...

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Abstract

The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.

Description

CROSS REFERENCE TO RELATED APPLICATIONS [0001] This application is a division of prior application Ser. No. 10 / 037,851, filed Jan. 4, 2002, which claims priority to German patent application no. 101 00 246.7, filed on Jan. 5, 2001. The entire disclosures of both of these applications are hereby incorporated by reference herein.FIELD OF THE INVENTION [0002] The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope. BACKGROUND OF THE INVENTION [0003] Microscopes, in particular confocal scanning microscopes, have been known for some time from practical use. The reader is referred to J. B. Pawley, ed., “Handbook of Biological Confocal Microscopy,” Plenum Press 1995, 2nd edition, regarding confocal scanning microscopes; and to EP 0 491 289 A1 regarding double confocal microscopes. [0004] The microscopes of the generic type are used in particular for images of biomedical specimens, where spe...

Claims

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Application Information

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IPC IPC(8): G02B21/00G02B21/34
CPCG02B21/0024G02B21/0076G02B21/006
Inventor BEWERSDORF, JOERGGUGEL, HILMAR
Owner LEICA MICROSYSTEMS CMS GMBH
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