The invention discloses a
harmonic microscopic measurement method based on sheet-light
microscopy and
confocal slit detection, and belongs to the field of non-linear optical measurement. In the
harmonic microscopy measurement, the detection direction of a
harmonic signal is perpendicular to the illumination direction of a sample, so that sheet-light measurement in harmonic
microscopy is achieved.
Confocal slit detection is achieved by using sCMOS as a
detector and a
rolling shutter working mode. A
femtosecond laser pulse is reflected by a scanning
galvanometer, then enters a switching opticalsystem for
spherical aberration compensation, and is converged in the sample by a microscopic objective to form an excitation focusing light -spot needed by harmonic
signal generation. The harmonic
signal excited by the sample is collected by a detecting objective perpendicular to the illumination direction, and then passes through a spike filter to filter
stray light, and is received for detection by the sCMOS working in a
rolling shutter mode. The scanning process and
rolling shutter docking are synchronic, and harmonic images with different position pixels are compounded by algorithms. According to the harmonic microscopic measurement method, the
contrast ratio and the signal-to-
noise ratio of harmonic
microscopic imaging can be effectively increased, and harmonic
microscopic imaging with the
high frame rate is achieved.