Super-resolution fluorescence fluctuation microscopy imaging method and device and storage medium

Abstract

The invention discloses a super-resolution fluorescence fluctuation microscopy imaging method and device and a storage medium. The super-resolution fluorescence fluctuation microscopy imaging method comprises the following steps: acquiring a plurality of detection images of fluorescent molecule labeled samples by virtue of a fluorescence microscopy imaging system; performing Fourier transform on the detection images to obtain Fourier spectrums of the plurality of detection images; setting initial estimated values of sample structures and fluorescence intensity fluctuations, performing iterative computations for preset times according to a preset iterative algorithm based on the initial estimated values of sample structures and fluorescence intensity fluctuations and the plurality of detection images, and outputting imaging results of the samples. Fluorescence blinking intensity changes serve as random speckles needed in ordinary structured light imaging, and the super-resolution imagesare acquired by virtue of the iterative algorithm, so that the structured light does not need to be introduced by an extra experimental device, the resolution ratio of structured light lighting microscopy imaging can be improved under a low detection frequency, and a balance between the resolution ratio and the imaging cost is realized.

Description

technical field [0001] The invention relates to the technical field of microscopic imaging, in particular to a super-resolution fluorescence fluctuation microscopic imaging method, device and storage medium. Background technique [0002] Fluorescence optical microscopy is a kind of optical microscope, and its spatial resolution is also limited by the diffraction limit. In order to break through the diffraction limit, existing methods include Structured Illumination Microscopy (SIM), Single Molecule Localization Microscopy (STORM, PALM) and Fluorescence Fluorescence Imaging (SOFI), etc. Among them, SIM uses the designed structured light to irradiate the sample and modulate the point spread function of the system to obtain high-frequency information of the sample and realize super-resolution imaging. However, when this method introduces structured light, some additional devices are required, and the highest frequency of structured light is limited by the diffraction limit, wh...

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Problems solved by technology

The number of detections required by these methods is much larger than that of SIM imaging, which makes the time resolution of this method lower

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