1035 results about "Ionization chamber" patented technology

An ion source is disclosed for forming multiply-charged analyte ions from a solid sample. A beam of pulsed radiation is directed onto a portion of the sample to desorb analyte molecules. A retaining structure holding a solvent volume is positioned proximate the sample. Desorbed analyte molecules contact a free surface of the solvent and pass into solution. The solution is then conveyed through an outlet passageway to an electrospray apparatus, which introduces a spray of charged solvent droplets into an ionization chamber.

A detector for detecting neutrons and gamma radiation includes a cathode that defines an interior surface and an interior volume. A conductive neutron-capturing layer is disposed on the interior surface of the cathode and a plastic housing surrounds the cathode. A plastic lid is attached to the housing and encloses the interior volume of the cathode forming an ionization chamber, into the center of which an anode extends from the plastic lid. A working gas is disposed within the ionization chamber and a high biasing voltage is connected to the cathode. Processing electronics are coupled to the anode and process current pulses which are converted into Gaussian pulses, which are either counted as neutrons or integrated as gammas, in response to whether pulse amplitude crosses a neutron threshold. The detector according to the invention may be readily fabricated into single or multilayer detector arrays.

A new ionization source named Surface Activated Chemical Ionization (SACI) has been discovered and used to improve the sensitivity of the mass spectrometer. According to this invention the ionization chamber of a mass spectrometer is heated and contains a physical new surface to improve the ionization process. The analyte neutral molecules that are present in gas phase are ionized on this surface. The surface can be made of various materials and may also chemically modified so to bind different molecules. This new ionization source is able to generate ions with high molecular weight and low charge, an essential new key feature of the invention so to improve sensitivity and reduce noise. The new device can be especially used for the analysis of proteins, peptides and other macromolecules. The new invention overcomes some of the well known and critical limitations of the Electrospray (ESI) and Matrix Assisted Laser Desorption Ionization (MALDI) mass spectrometric techniques.

An electrospray interface for forming ions from a liquid sample in a mass analyzing system includes a capillary tube having a free end for introducing a spray of droplets into an ionization chamber, a first gas passageway positioned near the capillary tube for directing a first gas stream into the ionization chamber, and a second gas passageway positioned more remotely from the capillary tube for directing a second, low-velocity gas stream into the ionization chamber. The second gas stream is heated to increase the droplet desolvation rate. A heated sampling capillary having an end extending into the ionization chamber guides the analyte ions toward a mass analyzer and evaporates the solvent from any incompletely desolvated droplets entering the sampling capillary.

An ion beam device according to the present invention includes a gas field ion source (1) including an emitter tip (21) supported by an emitter base mount (64), a ionization chamber (15) including an extraction electrode (24) and being configured to surround the emitter tip (21), and a gas supply tube (25). A center axis line of the extraction electrode (24) overlaps or is parallel to a center axis line (14A) of the ion irradiation light system, and a center axis line (66) passing the emitter tip (21) and the emitter base mount (64) is inclinable with respect to a center axis line of the ionization chamber (15). Accordingly, an ion beam device including a gas field ion source capable of adjusting the direction of the emitter tip is provided.

A gas field ion source that can simultaneously increase a conductance during rough vacuuming and reduce an extraction electrode aperture diameter from the viewpoint of the increase of ion current. The gas field ion source has a mechanism to change a conductance in vacuuming a gas molecule ionization chamber. That is, the conductance in vacuuming a gas molecule ionization chamber is changed in accordance with whether or not an ion beam is extracted from the gas molecule ionization chamber. By forming lids as parts of the members constituting the mechanism to change the conductance with a bimetal alloy, the conductance can be changed in accordance with the temperature of the gas molecule ionization chamber, for example the conductance is changed to a relatively small conductance at a relatively low temperature and to a relatively large conductance at a relatively high temperature.

The invention discloses a high-temperature synchrotron radiation in-situ research device. The high-temperature fused salt synchrotron radiation in-situ research device comprises a fused salt test tube, a vacuum furnace, a heating device, a first ionization chamber, a second ionization chamber or a charge coupled device (CCD) detector and an external fluorescence detector, wherein a cavity is formed in the vacuum furnace; an incident window, a transmission window and a fluorescence window are arranged on the furnace wall of the vacuum furnace; the incident window and the transmission window are arranged coaxially and collinearly; the axial line of the fluorescence window is vertical to that of the incident window and/or the transmission window; the heating device is arranged in the cavity of the vacuum furnace and is used for heating the fused salt test tube arranged in the heating device; an incident hole, a transmission hole and a fluorescence hole corresponding to the incident window, the transmission window and the fluorescence window respectively are formed on the heating device; the first ionization chamber corresponding to the incident window is arranged outside the vacuum furnace; the second ionization chamber or the CCD detector corresponding to the transmission window is arranged outside the vacuum furnace; and the external fluorescence detector corresponding to the fluorescence window is arranged outside the vacuum furnace.

A radiation detection system has a linear array of radiation detectors, which are preferably ionization chambers. The detectors are connected, preferably permanently, to a multi-channel signal processor through a flexible multi-conductor shielded cable. The multi-channel signal processor is connected to a controller, such as a personal computer, through a multi-conductor cable and a communication interface device. Multiple detector arrays and multi-channel electrometers may be connected to a single personal computer and used simultaneously.

An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis (on-axis) to ionize an analyte sample provided to the ionization chamber.

An ion source for ion implantation system and a method of ion implantation employs a controlled broad, directional electron beam to ionize process gas or vapor, such as decaborane, within an ionization volume by primary electron impact, in CMOS manufacturing and the like. Isolation of the electron gun for producing the energetic electron beam and of the beam dump to which the energetic beam is directed, as well as use of the thermally conductive members for cooling the ionization chamber and the vaporizer, enable use with large molecular species such as decaborane, and other materials which are unstable with temperature. Electron optics systems, facilitate focusing of electrons from an emitting surface to effectively ionize a desired volume of the gas or vapor that is located adjacent the extraction aperture. The components enable retrofit into ion implanters that have used other types of ion sources. Demountable vaporizers, and numerous other important features, realize economies in construction and operation. Achievement of production-worthy operation in respect of very shallow implants is realized.

A mass spectrometer including a sample attaching member of attaching a sample, an ionizing chamber including an introductory port of the sample attaching member and an ionization source of generating a sample ion, a vacuumed chamber having a mass analyzer of analyzing the sample ion, and an opening/closing mechanism provided between the ionizing chamber and the vacuumed chamber, in which the opening/closing mechanism is controlled from a closed state to an open state after introducing the sample attaching member into the ionizing chamber to thereby enable to perform ionization with inconsiderable fragmentation at a high sensitivity with a high throughput

An ion source is disclosed for use in fabrication of semiconductors. The ion source includes an electron emitter that includes a cathode mounted external to the ionization chamber for use in fabrication of semiconductors. In accordance with an important aspect of the invention, the electron emitter is employed without a corresponding anode or electron optics. As such, the distance between the cathode and the ionization chamber can be shortened to enable the ion source to be operated in an arc discharge mode or generate a plasma. Alternatively, the ion source can be operated in a dual mode with a single electron emitter by selectively varying the distance between the cathode and the ionization chamber.

A front-end ion source for a mass spectrometer generates both analyte and reagent ions. The reagent source may include a heater for vaporizing a condensed-phase reagent substance and an electron source for ionizing reagent molecules. The interior of the reagent ionization chamber is purged with a purge gas to avoid or minimize reaction of the reagent ions with oxygen or other reactive species, thereby enabling operation of the reagent ionization chamber at or near atmospheric pressure. The reagent and analyte ions are directed into a reduced-pressure chamber through separate passageways. An ion transport optic selectively transmits one of the analyte ions or the reagent ions from the reduced-pressure chamber to downstream regions of the mass spectrometer.

The invention includes a high-voltage gas cluster ion beam (GCIB) processing system for treating a workpiece using a gas cluster ion beam. The high-voltage GCIB processing system includes a high-voltage (HV) source system that includes a high-voltage (HV) source chamber having a high-voltage (HV) nozzle subassembly, a nozzle element, and a high-voltage (HV) skimmer subassembly therein. The high-voltage gas cluster ion beam (GCIB) processing system includes a high-voltage (HV) power supply coupled to the HV nozzle subassembly and the HV skimmer subassembly. A high-voltage (HV) ionization chamber can be coupled to the HV source chamber and can include an ionizer coupled to the chamber wall by an isolation structure. In addition, a grounded GCIB processing chamber can be coupled to the HV ionization chamber by an isolation structure and can include a scanable workpiece holder.

An ion source for use in a mass spectrometer includes an electron emitter assembly configured to emit electron beams, wherein the electron emitter assembly comprises carbon nanotube bundles fixed to a substrate for emitting the electron beams, a first control grid configured to control emission of the electron beams, and a second control grid configured to control energies of the electron beams; an ionization chamber having an electron-beam inlet to allow the electron beams to enter the ionization chamber, a sample inlet for sample introduction, and an ion-beam outlet to provide an exit for ionized sample molecules; an electron lens disposed between the electron emitter assembly and the ionization chamber to focus the electron beams; and at least one electrode disposed proximate the ion-beam outlet to focus the ionized sample molecules exiting the ionization chamber.

An ion source (50) for an ion implanter is provided, comprising a remotely located vaporizer (51) and an ionizer (53) connected to the vaporizer by a feed tube (62). The vaporizer comprises a sublimator (52) for receiving a solid source material such as decaborane and sublimating (vaporizing) the decaborane. A heating mechanism is provided for heating the sublimator, and the feed tube connecting the sublimator to the ionizer, to maintain a suitable temperature for the vaporized decaborane. The ionizer (53) comprises a body (96) having an inlet (119) for receiving the vaporized decaborane; an ionization chamber (108) in which the vaporized decaborane may be ionized by an energy-emitting element (110) to create a plasma; and an exit aperture (126) for extracting an ion beam comprised of the plasma. A cooling mechanism (100, 104) is provided for lowering the temperature of walls (128) of the ionization chamber (108) (e.g., to below 350° C.) during ionization of the vaporized decaborane to prevent dissociation of vaporized decaborane molecules into atomic boron ions. In addition, the energy-emitting element is operated at a sufficiently low power level to minimize plasma density within the ionization chamber (108) to prevent additional dissociation of the vaporized decaborane molecules by the plasma itself.

A photo ionization detector (PID) is provided for selectively determining various compounds or gases present in a breath sample. The PID, comprises a substrate comprising a gas ionization chamber, at least one pair of ion sensing electrodes, and at least one amplifying circuit; and an ultraviolet (UV) ionization source to transmit a UV light beam into the gas ionization chamber. A system comprises the PID is also provided. A method of detecting a response pattern for various compounds or gases in breath using PID is also provided.

The closed electron drift plasma accelerator comprises an annular ionization chamber, an acceleration chamber on the same axis as the ionization chamber, an annular anode, a hollow cathode, a first DC voltage source, an annular gas manifold, a magnetic circuit, and magnetic field generators. A coaxial annular coil is placed in the cavity of the ionization chamber, is provided with bias conductive cladding connected, together with the electrically-conductive material of the inside faces of the walls of the ionization chamber, to the positive pole of a second voltage source whose negative pole is connected to the anode, and constitutes an additional magnetic field generator which, together with the other magnetic field generators, forms a magnetic field having a magnetic line of force with an “X” point corresponding to a magnetic field zero situated between the coaxial annular coil and the anode.