35results about "Tube electron sources" patented technology

The invention relates to a holding device for at least one filament, comprising: at least one filament receptacle for receiving the at least one filament. The holding device is designed for the detachable attachment, in particular clamping attachment, of the at least one filament receptacle to a container of an ionization device. The invention also relates to a mass spectrometer comprising: an ionization device having a container in which an ionization space for ionizing a gas is formed, at least one holding device which is designed for the detachable attachment, in particular clamping attachment, of the at least one filament receptacle to the container, and a vacuum housing to which the holding device, in particular a base body of the holding device, is detachably connected.

The invention relates to an electron extraction method and system for a low-energy electron source. The method comprises the following steps: providing at least one cathode, at least one heating power supply and at least one control electrode; in a first time period, the heating power supply provides heating current for the cathode, so that the temperature of the cathode is increased to be higher than an electron emission threshold value, meanwhile, the potential difference between the control electrode and the cathode is controlled to be a suppression value, and electrons generated by the cathode are prevented from reaching a preset target spot; and in the second time period, the current is stopped from being supplied to the cathode, and meanwhile, the potential difference between the control electrode and the cathode is controlled to reach a guide value, so that electrons emitted by the cathode through waste heat reach the preset target spot and interact with target particles. Cathode heating is controlled in an intermittent energization mode, and accurate extraction of the low-energy scattered electron beam is achieved.

To provide a method for reducing charge on a contaminated surface of an ion optical system.SOLUTION: In accordance with a first aspect, there is provided a method for reducing charge on a contaminated surface of an ion optical system, the contaminated surface having a layer of charged contaminant thereon, and the method comprising: generating charged particles by exciting a radiation source that is distinct from the contaminated surface of the ion optical system; and neutralizing at least a portion of the layer of charged contaminant by causing the charged particles to interact with the layer of charged contaminant; where (i) the radiation source comprises an electromagnetic radiation source, where exciting the radiation source comprises causing the electromagnetic radiation source to emit electromagnetic radiation, and generating the charged particles comprises causing the electromagnetic radiation to interact with the layer of charged contaminant and / or the ion optical system to generate the charged particles, and / or (ii) the radiation source comprises an electron source, where exciting the radiation source comprises causing the electron source to emit free electrons. In a second aspect, there is provided an ion optical system configured to reduce charge on a contaminated surface of the ion optical system.SELECTED DRAWING: Figure 1

Methods and systems for controlling a filament of an electron emitter associated with an ion reaction cell in accordance with various aspects of the present teachings may account for inter-filament and inter-instrument variability and can provide improved reproducibility in EAD experiments and ease of use. In some aspects, a method of operating an ion reaction device of a mass spectrometer system is provided. The method comprises applying a calibration drive voltage to a filament of an electron emitter associated with an ion reaction cell and determining a value representative of the calibration electron emission current generated by the filament while having the calibration drive voltage applied thereto. A calibration saturation voltage can be determined by iteratively increasing the calibration drive voltage applied to the filament and determining the value of the calibration electron emission current at each corresponding calibration drive voltage until the filament reaches a saturation condition.

To further enhance high-speed responsiveness.SOLUTION: A light emitting body 10 converts incident electrons into light. The light emitting body 10 includes a multi-quantum-well structure 14C that emits light upon incidence of electrons. A well layer 141 of the multi-quantum-well structure 14C is 0.2 nm or more and less than 1.5 nm thick. The concentration of additives added to a barrier layer 142 and the well layer 141 constituting the multi-quantum-well structure 14C is greater than 4×1018 cm-3 and equal to or less than 1×1020 cm-3.SELECTED DRAWING: Figure 1

Ion-electron reaction device comprising: a first tubular magnet 2; a second tubular magnet 4 arranged coaxially with first tubular magnet; and a shim 10 located between the first and second tubular m

The invention discloses a method capable of accurately controlling electron energy of an electron gun, and the method comprises the following steps: S1, in the working process of the electron gun, heating a filament of the electron gun, not adding an ionization energy electric field, not emitting electrons, and cutting off a filament heating power supply until the heating is completed, and obtaining electrons in an activated state at the moment; s2, after the S1 process, an ionization energy electric field is applied to the filament and the ionization chamber, and electrons in an activated state are pulled out; s3, alternately performing S1 and S2 by using a pulse duty ratio scheme; the multiple electron guns are arranged in the vertical direction of the ionization chamber, it can be guaranteed that the electron beams conduct ionization on the sample continuously without losing the sample, and in addition, the ionization energy band ionization method or the electron energy band scanning ionization method is achieved by combining ion deflection and the multiple ionization energy electron guns which are connected in series.

The invention belongs to the field of mass spectrometry instruments, particularly relates to an ion receiving device, and aims to solve the problem of signal crosstalk among multiple channels of a combined receiver. The ion receiving device provided by the invention comprises a receiver body, and a signal detection cup unit, a slit sheet, a suppression gate unit, a Faraday cup unit and an electron multiplier unit which are mounted on the receiver body, the slit piece, the suppression gate unit and the Faraday cup unit are arranged along a first direction, and an ion beam sequentially passes through the slit piece, the receiver body and the suppression gate unit and then enters the Faraday cup unit; the signal detection cup unit, the Faraday cup unit and the electron multiplier unit are arranged at intervals along a second direction, and the second direction is perpendicular to the first direction. According to the ion receiving device provided by the invention, the signal detection cup unit, the Faraday cup unit and the electron multiplier unit are arranged at intervals along the direction perpendicular to the incident direction of the ion beam, so that signal crosstalk among channels is avoided.

The invention discloses an ultraviolet light electron spectrometer which comprises a vacuum cavity and a magnetic shielding layer. A barrel lens type electron energy analyzer is arranged in the magnetic shielding layer, and the barrel lens type electron energy analyzer comprises a lens system and an electron multiplication detector; the lens system comprises two coaxially arranged annular lenses, a uniform annular channel is formed between the two annular lenses, and an ultraviolet light beam incidence channel is formed in the middle of the annular lens on the inner side; the electron multiplication detector is arranged on the upper portion of the inner side face of the inner side annular lens. The ultraviolet light source is arranged at the top of the ultraviolet light beam incidence channel; the sample table is arranged at the bottom of the ultraviolet light beam incidence channel and is arranged opposite to the ultraviolet light source emitting end; according to the invention, the ultraviolet light beam is combined with the barrel lens type electron energy analyzer, so that the miniaturization of the ultraviolet light electron energy spectrometer is realized.

Described is an angle-resolving photoelectron spectrometer comprising an electrostatic lens system having a first end and a second end, and arranged to form a beam of electrons emitted from a measurement area on a sample surface, and to transport the electrons to the second end, wherein the first lens element is configured to be arranged at a positive voltage in relation to the sample. The spectrometer comprises at least a first shielding electrode with a limiting aperture, arranged such that the angle between the optical axis and any point on the limiting aperture is larger than 45° and smaller than 70, and at least one compensation electrode which is arranged around the optical axis at a larger distance from the measurement area than the first lens element. The compensation electrode is configured to be arranged at a negative voltage in relation to the sample.

This invention relates to high-resolution imaging of samples using imaging mass spectrometry (IMS), and imaging of biological samples by imaging mass cytometry (IMC®) in which labeled atoms are detected by IMS. LA-ICP-MS (a form of IMS in which the sample is ablated by a laser, the ablated material is ionized in an inductively coupled plasma, and then the ions are detected by mass spectrometry) is used for the analysis of various materials, including mineral analysis of geological samples, analysis of archaeological samples, and imaging of biological materials. However, conventional LA-ICP-MS systems and methods may not provide high resolution. [Solution] This specification describes methods and systems for high-resolution IMS and IMC (use of immersion lenses in an ablation laser and combined use with electron microscopy observation, and laser ionization after sample sputtering by ion scanning).

An angle-resolving photoelectron spectrometer and a method for such a spectrometer is described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2), and being arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3), and to transport the electrons to the second end (2), and wherein the first lens element (4) is configured to be arranged at a positive voltage in relation to the sample (3). The spectrometer comprises at least a first shielding electrode (17) with a limiting aperture (18), arranged such that the angle between the optical axis (6) and any point on the limiting aperture (18) is larger than 45° and smaller than 70°, seen from a point on the sample surface (Ss) at the optical axis (6), and at least one compensation electrode (7) which is arranged around the optical axis (6) at a larger distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged at a negative voltage in relation to the sample (3).

An angle-resolved photoelectron spectrometer and a method for such a spectrometer are described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2) and arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3) and to transfer the electrons to the second end (2), and a first lens element (4) is configured to be arranged at a positive voltage with respect to the sample (3). The spectrometer comprises at least a first shielding electrode (17) having a limiting aperture (18) arranged such that, as viewed from a point on the sample surface (Ss) at the optical axis (6), an angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, and at least one compensation electrode (7) arranged around the optical axis (6) at a greater distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be placed at a negative voltage with respect to the sample (3).

The utility model discloses a charged particle energy band-pass device, an electron energy analyzer and a photoelectron spectrometer, an incident channel and an emergent channel are arranged on a reflection cavity, a particle transmitter is arranged at the incident channel and / or the emergent channel, a particle reflector is arranged in the reflection cavity, and the charged particle energy band-pass device is obtained by adjusting the electric field distribution of the reflector and the transmitter. And a particle band-pass function is realized. The particle energy band-pass device designed by the utility model can also be compatible with various lens systems and energy analyzers, is flexible in conversion, and is suitable for various particle energy selection scenes. The device is simple and compact in structure, and is particularly suitable for application scenes of small particle selection and analysis.

This light-emitting body (10) converts incident charged particles into light, and the light-emitting body (10) is provided with a multiple quantum well structure (14C) that emits light upon incidence of charged particles. The thickness of a well layer (141) constituting the multiple quantum well structure (14C) is 0.2 nm or more and less than 1.5 nm. The concentration of an additive added to a barrier layer (142) and the well layer (141) constituting the multiple quantum well structure (14C) is greater than 4×1018cm-3 and less than or equal to 1×1020cm-3.　If the thickness of the well layer and the concentration of the additive of the barrier layer and the well layer can be optimized, the afterglow time can be reduced while maintaining the light emission intensity, and the high-speed responsiveness can be further enhanced.

An ion-electron reaction device comprises a first tubular magnet, a second tubular magnet arranged coaxially with the first tubular magnet, and a shim located between the first and second tubular magnets. The shim is arranged and configured such that the first and second tubular magnets provide a substantially homogenous magnetic field along a central axis of the device.

This invention belongs to the field of mass spectrometry analysis instruments, specifically relating to an ion receiving device designed to solve the signal crosstalk problem between multiple channels of a combined receiver. The ion receiving device provided by this invention includes a receiver body and a signal detection cup unit, a slit, a suppression grid unit, a Faraday cup unit, and an electron multiplier unit mounted on the receiver body. The slit, suppression grid, and Faraday cup units are arranged along a first direction, and the ion beam sequentially passes through the slit, the receiver body, and the suppression grid unit before entering the Faraday cup unit. The signal detection cup unit, Faraday cup unit, and electron multiplier unit are arranged at intervals along a second direction, which is perpendicular to the first direction. By arranging the signal detection cup unit, Faraday cup unit, and electron multiplier unit at intervals along a direction perpendicular to the ion beam incident direction, the ion receiving device provided by this invention avoids signal crosstalk between channels.

This invention provides a sequential ionization source and method. The sequential ionization source includes a first set of magnets and a first electron source, the first electron source being disposed in a first magnetic field formed by the first set of magnets. It also includes: a cavity having an ion outlet, internally divided into sequentially connected multi-stage chambers by multiple isolators, with a pump connected to the interior of the cavity; the isolators having through-holes allowing ions to pass through, the arrangement direction of the through-holes on the multiple isolators forming an acute angle or a right angle with the direction of the first magnetic field; the first electron source being disposed in a first-stage chamber; a second electron source being disposed in a second-stage chamber and situated in a second magnetic field formed by a second set of magnets, the arrangement direction of the through-holes on the multiple isolators forming an acute angle or a right angle with the direction of the first magnetic field; an ion transport device being disposed within the cavity; the angle between the velocity direction of the sample entering the first-stage chamber from the sample inlet and the arrangement direction is zero or an acute angle. This invention has the advantage of high ionization efficiency.

The present invention relates to a holding device (1) for at least one filament, comprising at least one filament receptacle (2a, 2b) for accommodating at least one filament. The holding device (1) is designed for removably attaching, in particular by clamping, the at least one filament receptacle (2a, 2b) to a vessel (7) of an ionizer. The present invention also relates to a mass analyzer comprising: an ionizer having a vessel (7) in which an ionization space for ionizing gas is formed; at least one holding device (1) designed for removably attaching, in particular by clamping, the at least one filament receptacle (2a, 2b) to the vessel (7); and a vacuum housing to which the holding device (1), in particular a base body (4) of the holding device (1), is removably coupled.

The present invention relates to a clamping device (1) for at least one filament, comprising: at least one filament receptacle (2a, 2b) for receiving at least one filament. The clamping device (1) is designed for detachable attachment, in particular clamping attachment, of at least one filament receptacle (2a, 2b) to a container (7) of an ionization device. The present invention also relates to a mass spectrometer, comprising: an ionization device having a container (7) in which an ionization space for ionizing a gas is formed; at least one clamping device (1) designed for detachable attachment, in particular clamping attachment, of at least one filament receptacle (2a, 2b) to the container (7); and a vacuum housing to which the clamping device (1), in particular the base body (4) of the clamping device (1), is detachably connected. The clamping device (1) is designed to exert a clamping force on at least one filament receptacle (2a, 2b) in the installed position in order to press the at least one filament receptacle (2a, 2b) against the container (7).

The present invention provides a space time-of-flight mass spectrometer based on a diamond detector, which includes a secondary electron emission thin film, an electrode system, a microchannel plate detector, and electronics; the secondary electron emission thin film is used to generate secondary electrons when ions pass through; the electrode system is used to apply a voltage to the secondary electrons and guide them to the microchannel detector; the microchannel detector receives the secondary electrons and outputs signals to the electronics; the diamond detector is used to receive ions, convert the total ion energy into charge pulses, and output them to the electronics; the electronics is used to process the output signals of the microchannel detector and the charge pulses output by the diamond detector, and analyze to obtain information about the incident ions. The present invention applies the diamond detector to the SEE TOF×E mass spectrometer, which can improve the detection efficiency, long-term performance stability, and adaptability to harsh space radiation environments of the SEE TOF×E mass spectrometer.

An angle-resolved photoelectron spectrometer and a method for using such a spectrometer are described. The spectrometer includes an electrostatic lens system (101) having a first end (1) and a second end (2), arranged to form an electron beam emitted from a measurement region (A) on a sample surface (Ss) of a solid sample (3) and to transfer electrons to the second end (2), wherein a first lens element (4) is configured to be arranged with a positive voltage relative to the sample (3). The spectrometer includes at least one first shielding electrode (17) and at least one compensation electrode (7), the first shielding electrode having a limiting aperture (18) arranged such that, viewed from a point on the sample surface (Ss) at the optical axis (6), the angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, the at least one compensation electrode being arranged around the optical axis (6) at a greater distance from the measurement region (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged with a negative voltage relative to the sample (3).

An angle-resolving photoelectron spectrometer and a method for such a spectrometer is described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2), and being arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3), and to transport the electrons to the second end (2), and wherein the first lens element (4) is configured to be arranged at a positive voltage in relation to the sample (3). The spectrometer comprises at least a first shielding electrode (17) with a limiting aperture (18), arranged such that the angle between the optical axis (6) and any point on the limiting aperture (18) is larger than 45° and smaller than 70°, seen from a point on the sample surface (Ss) at the optical axis (6), and at least one compensation electrode (7) which is arranged around the optical axis (6) at a larger distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged at a negative voltage in relation to the sample (3).

An ion-electron reaction device includes a first tubular magnet, a second tubular magnet disposed coaxially with the first tubular magnet, and a gasket located between the first tubular magnet and the second tubular magnet. The gasket is arranged and configured such that the first tubular magnet and the second tubular magnet provide a substantially uniform magnetic field along a central axis of the device.

An ion-electron reaction device comprises a first tubular magnet, a second tubular magnet arranged coaxially with the first tubular magnet, and a shim located between the first and second tubular magnets. The shim is arranged and configured such that the first and second tubular magnets provide a substantially homogenous magnetic field along a central axis of the device.

The present invention provides a quantitative small molecule MALDI mass spectrometer, comprising: a box body, a box cover is arranged above the box body, and a first sponge board is arranged on the inner bottom surface of the box body. The present invention is small in volume and convenient to carry. The present invention is also provided with an automatic sampler, which samples the test sample through the automatic sampler, which can not only reduce the workload of experimental personnel, but also enhance the automation level of the entire inspection platform. And sampling through the automatic sampler can avoid manual sampling, resulting in inconsistent test samples and large errors in test results. And relevant software for instrument control and suitable for automatic processing of clinical data is compiled to further simplify the clinical application and inspection result reporting process. A variable electric field generator is arranged inside the present invention, and the electric field direction can be changed through the variable electric field generator to make ions reflect in the flight tube, which is more suitable for testing small molecule metabolites, and its mass resolution ability is greatly improved.

According to a first aspect, this disclosure provides a method for reducing charge on a contaminated surface of an ion optical system, the contaminated surface having a layer of charged contaminants. The method includes: generating charged particles by exciting a radiation source different from the contaminated surface of the ion optical system; and neutralizing at least a portion of the charged contaminant layer by causing the charged particles to interact with the charged contaminant layer, wherein (i) the radiation source includes an electromagnetic radiation source, wherein exciting the radiation source includes causing the electromagnetic radiation source to emit electromagnetic radiation, and wherein generating charged particles includes causing the electromagnetic radiation to interact with the charged contaminant layer and / or the ion optical system to generate charged particles; and / or (ii) the radiation source includes an electron source, wherein exciting the radiation source includes causing the electron source to emit free electrons. In a second aspect, an ion optical system is provided, the ion optical system being configured to reduce charge on a contaminated surface of the ion optical system.

The present invention discloses an ionization source, a detection device, and a detection system. The ionization source includes a first electrode member, a second electrode member, and a dielectric member. The first electrode member is adapted to be electrically connected to a first terminal of an external power source. The second electrode member is formed into a body having a through hole. The first and second electrode members are spaced apart and adapted to be electrically connected to a second terminal of the external power source. The dielectric member is disposed between the first and second electrode members and is in contact with the first and second electrode members. The dielectric member and the through hole enclose an ion generation chamber. The ionization source of this structure replaces the container used in conventional ionization sources with the ion generation chamber, reducing its overall size and achieving greater device structural stability. This reduces the difficulty in transporting and the susceptibility to damage of the container of conventional ionization sources and increases the service life of the device.

The utility model discloses a direct-heated thermal emission electron source, which includes a base, a shielding cover, a heating element, and a support assembly; the support assembly includes two support rods fixed on the base, the support rods are made of conductive high-temperature resistant material, and the base is made of insulating high-temperature resistant material; the left and right ends of the heating element are respectively connected to the two support rods, and the heating element has a spiral heating body; the shielding cover is connected to a support rod of the support assembly, the shielding cover shields the front and back sides and the bottom side of the heating element, and the shielding cover is made of conductive high-temperature resistant material. The direct-heated thermal emission electron source of the utility model has the advantages of large emission current and stable use.