3results about "Tube electron sources" patented technology

This invention relates to high-resolution imaging of samples using imaging mass spectrometry (IMS), and imaging of biological samples by imaging mass cytometry (IMC®) in which labeled atoms are detected by IMS. LA-ICP-MS (a form of IMS in which the sample is ablated by a laser, the ablated material is ionized in an inductively coupled plasma, and then the ions are detected by mass spectrometry) is used for the analysis of various materials, including mineral analysis of geological samples, analysis of archaeological samples, and imaging of biological materials. However, conventional LA-ICP-MS systems and methods may not provide high resolution. [Solution] This specification describes methods and systems for high-resolution IMS and IMC (use of immersion lenses in an ablation laser and combined use with electron microscopy observation, and laser ionization after sample sputtering by ion scanning).

An angle-resolved photoelectron spectrometer and a method for using such a spectrometer are described. The spectrometer includes an electrostatic lens system (101) having a first end (1) and a second end (2), arranged to form an electron beam emitted from a measurement region (A) on a sample surface (Ss) of a solid sample (3) and to transfer electrons to the second end (2), wherein a first lens element (4) is configured to be arranged with a positive voltage relative to the sample (3). The spectrometer includes at least one first shielding electrode (17) and at least one compensation electrode (7), the first shielding electrode having a limiting aperture (18) arranged such that, viewed from a point on the sample surface (Ss) at the optical axis (6), the angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, the at least one compensation electrode being arranged around the optical axis (6) at a greater distance from the measurement region (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged with a negative voltage relative to the sample (3).

According to a first aspect, this disclosure provides a method for reducing charge on a contaminated surface of an ion optical system, the contaminated surface having a layer of charged contaminants. The method includes: generating charged particles by exciting a radiation source different from the contaminated surface of the ion optical system; and neutralizing at least a portion of the charged contaminant layer by causing the charged particles to interact with the charged contaminant layer, wherein (i) the radiation source includes an electromagnetic radiation source, wherein exciting the radiation source includes causing the electromagnetic radiation source to emit electromagnetic radiation, and wherein generating charged particles includes causing the electromagnetic radiation to interact with the charged contaminant layer and / or the ion optical system to generate charged particles; and / or (ii) the radiation source includes an electron source, wherein exciting the radiation source includes causing the electron source to emit free electrons. In a second aspect, an ion optical system is provided, the ion optical system being configured to reduce charge on a contaminated surface of the ion optical system.