22results about "Tube electron sources" patented technology

The invention relates to an electron extraction method and system for a low-energy electron source. The method comprises the following steps: providing at least one cathode, at least one heating power supply and at least one control electrode; in a first time period, the heating power supply provides heating current for the cathode, so that the temperature of the cathode is increased to be higher than an electron emission threshold value, meanwhile, the potential difference between the control electrode and the cathode is controlled to be a suppression value, and electrons generated by the cathode are prevented from reaching a preset target spot; and in the second time period, the current is stopped from being supplied to the cathode, and meanwhile, the potential difference between the control electrode and the cathode is controlled to reach a guide value, so that electrons emitted by the cathode through waste heat reach the preset target spot and interact with target particles. Cathode heating is controlled in an intermittent energization mode, and accurate extraction of the low-energy scattered electron beam is achieved.

Ion-electron reaction device comprising: a first tubular magnet 2; a second tubular magnet 4 arranged coaxially with first tubular magnet; and a shim 10 located between the first and second tubular m

The invention belongs to the field of mass spectrometry instruments, particularly relates to an ion receiving device, and aims to solve the problem of signal crosstalk among multiple channels of a combined receiver. The ion receiving device provided by the invention comprises a receiver body, and a signal detection cup unit, a slit sheet, a suppression gate unit, a Faraday cup unit and an electron multiplier unit which are mounted on the receiver body, the slit piece, the suppression gate unit and the Faraday cup unit are arranged along a first direction, and an ion beam sequentially passes through the slit piece, the receiver body and the suppression gate unit and then enters the Faraday cup unit; the signal detection cup unit, the Faraday cup unit and the electron multiplier unit are arranged at intervals along a second direction, and the second direction is perpendicular to the first direction. According to the ion receiving device provided by the invention, the signal detection cup unit, the Faraday cup unit and the electron multiplier unit are arranged at intervals along the direction perpendicular to the incident direction of the ion beam, so that signal crosstalk among channels is avoided.

The invention discloses an ultraviolet light electron spectrometer which comprises a vacuum cavity and a magnetic shielding layer. A barrel lens type electron energy analyzer is arranged in the magnetic shielding layer, and the barrel lens type electron energy analyzer comprises a lens system and an electron multiplication detector; the lens system comprises two coaxially arranged annular lenses, a uniform annular channel is formed between the two annular lenses, and an ultraviolet light beam incidence channel is formed in the middle of the annular lens on the inner side; the electron multiplication detector is arranged on the upper portion of the inner side face of the inner side annular lens. The ultraviolet light source is arranged at the top of the ultraviolet light beam incidence channel; the sample table is arranged at the bottom of the ultraviolet light beam incidence channel and is arranged opposite to the ultraviolet light source emitting end; according to the invention, the ultraviolet light beam is combined with the barrel lens type electron energy analyzer, so that the miniaturization of the ultraviolet light electron energy spectrometer is realized.

Described is an angle-resolving photoelectron spectrometer comprising an electrostatic lens system having a first end and a second end, and arranged to form a beam of electrons emitted from a measurement area on a sample surface, and to transport the electrons to the second end, wherein the first lens element is configured to be arranged at a positive voltage in relation to the sample. The spectrometer comprises at least a first shielding electrode with a limiting aperture, arranged such that the angle between the optical axis and any point on the limiting aperture is larger than 45° and smaller than 70, and at least one compensation electrode which is arranged around the optical axis at a larger distance from the measurement area than the first lens element. The compensation electrode is configured to be arranged at a negative voltage in relation to the sample.

This invention relates to high-resolution imaging of samples using imaging mass spectrometry (IMS), and imaging of biological samples by imaging mass cytometry (IMC®) in which labeled atoms are detected by IMS. LA-ICP-MS (a form of IMS in which the sample is ablated by a laser, the ablated material is ionized in an inductively coupled plasma, and then the ions are detected by mass spectrometry) is used for the analysis of various materials, including mineral analysis of geological samples, analysis of archaeological samples, and imaging of biological materials. However, conventional LA-ICP-MS systems and methods may not provide high resolution. [Solution] This specification describes methods and systems for high-resolution IMS and IMC (use of immersion lenses in an ablation laser and combined use with electron microscopy observation, and laser ionization after sample sputtering by ion scanning).

An angle-resolved photoelectron spectrometer and a method for such a spectrometer are described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2) and arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3) and to transfer the electrons to the second end (2), and a first lens element (4) is configured to be arranged at a positive voltage with respect to the sample (3). The spectrometer comprises at least a first shielding electrode (17) having a limiting aperture (18) arranged such that, as viewed from a point on the sample surface (Ss) at the optical axis (6), an angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, and at least one compensation electrode (7) arranged around the optical axis (6) at a greater distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be placed at a negative voltage with respect to the sample (3).

An ion-electron reaction device comprises a first tubular magnet, a second tubular magnet arranged coaxially with the first tubular magnet, and a shim located between the first and second tubular magnets. The shim is arranged and configured such that the first and second tubular magnets provide a substantially homogenous magnetic field along a central axis of the device.

This invention belongs to the field of mass spectrometry analysis instruments, specifically relating to an ion receiving device designed to solve the signal crosstalk problem between multiple channels of a combined receiver. The ion receiving device provided by this invention includes a receiver body and a signal detection cup unit, a slit, a suppression grid unit, a Faraday cup unit, and an electron multiplier unit mounted on the receiver body. The slit, suppression grid, and Faraday cup units are arranged along a first direction, and the ion beam sequentially passes through the slit, the receiver body, and the suppression grid unit before entering the Faraday cup unit. The signal detection cup unit, Faraday cup unit, and electron multiplier unit are arranged at intervals along a second direction, which is perpendicular to the first direction. By arranging the signal detection cup unit, Faraday cup unit, and electron multiplier unit at intervals along a direction perpendicular to the ion beam incident direction, the ion receiving device provided by this invention avoids signal crosstalk between channels.

This invention provides a sequential ionization source and method. The sequential ionization source includes a first set of magnets and a first electron source, the first electron source being disposed in a first magnetic field formed by the first set of magnets. It also includes: a cavity having an ion outlet, internally divided into sequentially connected multi-stage chambers by multiple isolators, with a pump connected to the interior of the cavity; the isolators having through-holes allowing ions to pass through, the arrangement direction of the through-holes on the multiple isolators forming an acute angle or a right angle with the direction of the first magnetic field; the first electron source being disposed in a first-stage chamber; a second electron source being disposed in a second-stage chamber and situated in a second magnetic field formed by a second set of magnets, the arrangement direction of the through-holes on the multiple isolators forming an acute angle or a right angle with the direction of the first magnetic field; an ion transport device being disposed within the cavity; the angle between the velocity direction of the sample entering the first-stage chamber from the sample inlet and the arrangement direction is zero or an acute angle. This invention has the advantage of high ionization efficiency.

The present invention provides a space time-of-flight mass spectrometer based on a diamond detector, which includes a secondary electron emission thin film, an electrode system, a microchannel plate detector, and electronics; the secondary electron emission thin film is used to generate secondary electrons when ions pass through; the electrode system is used to apply a voltage to the secondary electrons and guide them to the microchannel detector; the microchannel detector receives the secondary electrons and outputs signals to the electronics; the diamond detector is used to receive ions, convert the total ion energy into charge pulses, and output them to the electronics; the electronics is used to process the output signals of the microchannel detector and the charge pulses output by the diamond detector, and analyze to obtain information about the incident ions. The present invention applies the diamond detector to the SEE TOF×E mass spectrometer, which can improve the detection efficiency, long-term performance stability, and adaptability to harsh space radiation environments of the SEE TOF×E mass spectrometer.

An angle-resolved photoelectron spectrometer and a method for using such a spectrometer are described. The spectrometer includes an electrostatic lens system (101) having a first end (1) and a second end (2), arranged to form an electron beam emitted from a measurement region (A) on a sample surface (Ss) of a solid sample (3) and to transfer electrons to the second end (2), wherein a first lens element (4) is configured to be arranged with a positive voltage relative to the sample (3). The spectrometer includes at least one first shielding electrode (17) and at least one compensation electrode (7), the first shielding electrode having a limiting aperture (18) arranged such that, viewed from a point on the sample surface (Ss) at the optical axis (6), the angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, the at least one compensation electrode being arranged around the optical axis (6) at a greater distance from the measurement region (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged with a negative voltage relative to the sample (3).

An angle-resolving photoelectron spectrometer and a method for such a spectrometer is described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2), and being arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3), and to transport the electrons to the second end (2), and wherein the first lens element (4) is configured to be arranged at a positive voltage in relation to the sample (3). The spectrometer comprises at least a first shielding electrode (17) with a limiting aperture (18), arranged such that the angle between the optical axis (6) and any point on the limiting aperture (18) is larger than 45° and smaller than 70°, seen from a point on the sample surface (Ss) at the optical axis (6), and at least one compensation electrode (7) which is arranged around the optical axis (6) at a larger distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged at a negative voltage in relation to the sample (3).

An ion-electron reaction device includes a first tubular magnet, a second tubular magnet disposed coaxially with the first tubular magnet, and a gasket located between the first tubular magnet and the second tubular magnet. The gasket is arranged and configured such that the first tubular magnet and the second tubular magnet provide a substantially uniform magnetic field along a central axis of the device.

According to a first aspect, this disclosure provides a method for reducing charge on a contaminated surface of an ion optical system, the contaminated surface having a layer of charged contaminants. The method includes: generating charged particles by exciting a radiation source different from the contaminated surface of the ion optical system; and neutralizing at least a portion of the charged contaminant layer by causing the charged particles to interact with the charged contaminant layer, wherein (i) the radiation source includes an electromagnetic radiation source, wherein exciting the radiation source includes causing the electromagnetic radiation source to emit electromagnetic radiation, and wherein generating charged particles includes causing the electromagnetic radiation to interact with the charged contaminant layer and / or the ion optical system to generate charged particles; and / or (ii) the radiation source includes an electron source, wherein exciting the radiation source includes causing the electron source to emit free electrons. In a second aspect, an ion optical system is provided, the ion optical system being configured to reduce charge on a contaminated surface of the ion optical system.

The present invention discloses an ionization source, a detection device, and a detection system. The ionization source includes a first electrode member, a second electrode member, and a dielectric member. The first electrode member is adapted to be electrically connected to a first terminal of an external power source. The second electrode member is formed into a body having a through hole. The first and second electrode members are spaced apart and adapted to be electrically connected to a second terminal of the external power source. The dielectric member is disposed between the first and second electrode members and is in contact with the first and second electrode members. The dielectric member and the through hole enclose an ion generation chamber. The ionization source of this structure replaces the container used in conventional ionization sources with the ion generation chamber, reducing its overall size and achieving greater device structural stability. This reduces the difficulty in transporting and the susceptibility to damage of the container of conventional ionization sources and increases the service life of the device.

The invention belongs to the technical field of mass spectrometers and peripheral corollary equipment thereof, and particularly relates to an electron beam emitting device, a cleaning device, a mass spectrometer and a working method. The electron beam emitting device comprises an electron beam emitting assembly and a high-temperature-resistant insulating seat, the electron beam emitting assembly is supported and installed on the high-temperature-resistant insulating seat, and the electron beam emitting assembly comprises a power supply connecting piece, a lamp filament and a flow guide cover; the lamp filament is connected with the power connector to generate electron beams when the power connector is electrified; the fairing is provided with a first opening, covers the lamp filament and forms an electric field suitable for guiding electron beams to be emitted from the first opening when the power supply connecting piece is powered on. The filament can generate electron beams with high energy density to achieve the purpose of cleaning, the fairing can guide the electron beams to be emitted along a preset path so that the electron beams can act on a specified target object, the directivity of the electron beams is good, and control precision can be improved. The filament and the flow guide cover are matched with each other, so that the cleaning effect is ensured, the structure is simplified, and the occupied space is reduced.

This light emitting body (10) converts incident charged particles into light, and is provided with a multiple quantum well structure (14C) that emits light by the incidence of charged particles. The well layer (141) constituting the multiple quantum well structure (14C) has a thickness of 0.2 nm or more and less than 1.5 nm. The concentration of an additive added to a barrier layer (142) and a well layer (141) constituting the multiple quantum well structure (14C) is greater than 4 * 1018 cm <-3 > and 1 * 1020 cm <-3 > or less.

The utility model relates to a small-sized electron ionization source hot cathode structure, which comprises insulating glass provided with a plurality of through holes; the connecting column penetrates through the through hole of the insulating glass; the metal fixing plate is arranged at the joint of the insulating glass and the connecting column; the metal fixing plate and the insulating glass are sintered to form a glass-gold sealing area, and the glass-gold sealing area is used for fixing the connecting column; the lamp filaments are welded to the fixing columns, and the number of the lamp filaments is two; a filament grating is fixedly arranged in the middle of the insulating glass; the two ends of the lamp filament grating are provided with the folded edges, so that electrons are more uniformly released in the middle of the lamp filament and are distributed to the lamp filament grating area. According to the utility model, the connecting column is fixed by sealing the sealing area through the glass gold, so that the stability and durability of the whole structure are enhanced; the lamp filaments are arranged into two groups, and the two lamp filaments are lightened at the same time in a vacuum environment so as to release electrons to the maximum extent.

A light-emitting body is a light-emitting body that converts incident charged particles into light and includes a multiple quantum well structure for emitting the light upon incidence of the charged particles. A thickness of a well layer constituting the multiple quantum well structure is equal to or greater than 0.2 nm and less than 1.5 nm. A concentration of an additive added in a barrier layer and the well layer constituting the multiple quantum well structure is higher than 4 × 1018 cm-3 and equal to or lower than 1 × 1020 cm-3.

Described are illumination control devices, for an analyser arrangement and method of using thereof. The analyser arrangement is configured to determine at least one parameter related to charged particles emitted from a sample. The illumination control device comprises an input for input electromagnetic radiation, and is configured to control the illumination of the sample to induce the emission of charged particles from the sample and to operate in at least a first mode and a second mode, wherein the illumination control device in the first mode, is configured to illuminate a first area of the sample with a first part of the input electromagnetic radiation and a second area part of the first area of the sample with a second part of the input electromagnetic radiation, and in a second mode, is configured to illuminate the second area of the sample with the second part of the input electromagnetic radiation.