11results about "Tube electron sources" patented technology

The invention discloses an ultraviolet light electron spectrometer which comprises a vacuum cavity and a magnetic shielding layer. A barrel lens type electron energy analyzer is arranged in the magnetic shielding layer, and the barrel lens type electron energy analyzer comprises a lens system and an electron multiplication detector; the lens system comprises two coaxially arranged annular lenses, a uniform annular channel is formed between the two annular lenses, and an ultraviolet light beam incidence channel is formed in the middle of the annular lens on the inner side; the electron multiplication detector is arranged on the upper portion of the inner side face of the inner side annular lens. The ultraviolet light source is arranged at the top of the ultraviolet light beam incidence channel; the sample table is arranged at the bottom of the ultraviolet light beam incidence channel and is arranged opposite to the ultraviolet light source emitting end; according to the invention, the ultraviolet light beam is combined with the barrel lens type electron energy analyzer, so that the miniaturization of the ultraviolet light electron energy spectrometer is realized.

This invention relates to high-resolution imaging of samples using imaging mass spectrometry (IMS), and imaging of biological samples by imaging mass cytometry (IMC®) in which labeled atoms are detected by IMS. LA-ICP-MS (a form of IMS in which the sample is ablated by a laser, the ablated material is ionized in an inductively coupled plasma, and then the ions are detected by mass spectrometry) is used for the analysis of various materials, including mineral analysis of geological samples, analysis of archaeological samples, and imaging of biological materials. However, conventional LA-ICP-MS systems and methods may not provide high resolution. [Solution] This specification describes methods and systems for high-resolution IMS and IMC (use of immersion lenses in an ablation laser and combined use with electron microscopy observation, and laser ionization after sample sputtering by ion scanning).

An angle-resolved photoelectron spectrometer and a method for such a spectrometer are described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2) and arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3) and to transfer the electrons to the second end (2), and a first lens element (4) is configured to be arranged at a positive voltage with respect to the sample (3). The spectrometer comprises at least a first shielding electrode (17) having a limiting aperture (18) arranged such that, as viewed from a point on the sample surface (Ss) at the optical axis (6), an angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, and at least one compensation electrode (7) arranged around the optical axis (6) at a greater distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be placed at a negative voltage with respect to the sample (3).

This invention belongs to the field of mass spectrometry analysis instruments, specifically relating to an ion receiving device designed to solve the signal crosstalk problem between multiple channels of a combined receiver. The ion receiving device provided by this invention includes a receiver body and a signal detection cup unit, a slit, a suppression grid unit, a Faraday cup unit, and an electron multiplier unit mounted on the receiver body. The slit, suppression grid, and Faraday cup units are arranged along a first direction, and the ion beam sequentially passes through the slit, the receiver body, and the suppression grid unit before entering the Faraday cup unit. The signal detection cup unit, Faraday cup unit, and electron multiplier unit are arranged at intervals along a second direction, which is perpendicular to the first direction. By arranging the signal detection cup unit, Faraday cup unit, and electron multiplier unit at intervals along a direction perpendicular to the ion beam incident direction, the ion receiving device provided by this invention avoids signal crosstalk between channels.

An angle-resolved photoelectron spectrometer and a method for using such a spectrometer are described. The spectrometer includes an electrostatic lens system (101) having a first end (1) and a second end (2), arranged to form an electron beam emitted from a measurement region (A) on a sample surface (Ss) of a solid sample (3) and to transfer electrons to the second end (2), wherein a first lens element (4) is configured to be arranged with a positive voltage relative to the sample (3). The spectrometer includes at least one first shielding electrode (17) and at least one compensation electrode (7), the first shielding electrode having a limiting aperture (18) arranged such that, viewed from a point on the sample surface (Ss) at the optical axis (6), the angle between the optical axis (6) and any point on the limiting aperture (18) is greater than 45° and less than 70°, the at least one compensation electrode being arranged around the optical axis (6) at a greater distance from the measurement region (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged with a negative voltage relative to the sample (3).

An angle-resolving photoelectron spectrometer and a method for such a spectrometer is described. The spectrometer comprises an electrostatic lens system (101) having a first end (1) and a second end (2), and being arranged to form a beam of electrons emitted from a measurement area (A) on a sample surface (Ss) of a solid sample (3), and to transport the electrons to the second end (2), and wherein the first lens element (4) is configured to be arranged at a positive voltage in relation to the sample (3). The spectrometer comprises at least a first shielding electrode (17) with a limiting aperture (18), arranged such that the angle between the optical axis (6) and any point on the limiting aperture (18) is larger than 45° and smaller than 70°, seen from a point on the sample surface (Ss) at the optical axis (6), and at least one compensation electrode (7) which is arranged around the optical axis (6) at a larger distance from the measurement area (A) than the first lens element (4). According to the method, the compensation electrode (7) is configured to be arranged at a negative voltage in relation to the sample (3).

An ion-electron reaction device includes a first tubular magnet, a second tubular magnet disposed coaxially with the first tubular magnet, and a gasket located between the first tubular magnet and the second tubular magnet. The gasket is arranged and configured such that the first tubular magnet and the second tubular magnet provide a substantially uniform magnetic field along a central axis of the device.

According to a first aspect, this disclosure provides a method for reducing charge on a contaminated surface of an ion optical system, the contaminated surface having a layer of charged contaminants. The method includes: generating charged particles by exciting a radiation source different from the contaminated surface of the ion optical system; and neutralizing at least a portion of the charged contaminant layer by causing the charged particles to interact with the charged contaminant layer, wherein (i) the radiation source includes an electromagnetic radiation source, wherein exciting the radiation source includes causing the electromagnetic radiation source to emit electromagnetic radiation, and wherein generating charged particles includes causing the electromagnetic radiation to interact with the charged contaminant layer and / or the ion optical system to generate charged particles; and / or (ii) the radiation source includes an electron source, wherein exciting the radiation source includes causing the electron source to emit free electrons. In a second aspect, an ion optical system is provided, the ion optical system being configured to reduce charge on a contaminated surface of the ion optical system.

This light emitting body (10) converts incident charged particles into light, and is provided with a multiple quantum well structure (14C) that emits light by the incidence of charged particles. The well layer (141) constituting the multiple quantum well structure (14C) has a thickness of 0.2 nm or more and less than 1.5 nm. The concentration of an additive added to a barrier layer (142) and a well layer (141) constituting the multiple quantum well structure (14C) is greater than 4 * 1018 cm <-3 > and 1 * 1020 cm <-3 > or less.

A light-emitting body is a light-emitting body that converts incident charged particles into light and includes a multiple quantum well structure for emitting the light upon incidence of the charged particles. A thickness of a well layer constituting the multiple quantum well structure is equal to or greater than 0.2 nm and less than 1.5 nm. A concentration of an additive added in a barrier layer and the well layer constituting the multiple quantum well structure is higher than 4 × 1018 cm-3 and equal to or lower than 1 × 1020 cm-3.