The invention discloses a double-source excitation EDXRF analysis instrument based on spectrum
zoning, and belongs to the technical field of analysis and detection instruments, the double-source excitation EDXRF analysis instrument comprises a vacuum measurement chamber formed by a sealed shell, a vacuum
system, a sample carrying table, a detection unit, double excitation sources and a control
processing module, the first excitation source is a
rhodium target X-
ray tube and is adaptive to light element excitation, and the second excitation source is a
rhodium target X-
ray tube and is adaptive to light element excitation; a second excitation source is a
tungsten target X-
ray tube, is adaptive to medium and
heavy element excitation, is provided with an aluminum-
copper composite
optical filter, adopts a compact
layout of double units, is matched with a circulating
water cooling system and a
graphene window SDD
detector, and is matched with a spectrum partition design to physically separate double-source signals and a low-vacuum environment to guarantee light element transmission; the instrument solves the problem that a traditional single source cannot give consideration to full-spectrum excitation and spectrum overlapping interference, realizes high-sensitivity and high-
signal-to-
noise-
ratio measurement of all elements from
sodium to
uranium, supports synchronization and
time sequence dual
modes, and improves the detection efficiency and precision.