64results about How to "Accurate profile" patented technology

A process for fabricating an MOS device having a highly-localized halo region includes the formation of a first halo region at a first surface of a silicon substrate, and a second halo region at a second surface of the silicon substrate. The second surface of the silicon substrate is formed by anisotropically etching the first surface of the silicon substrate to remove a portion of the material from the substrate. Both the first and second halo regions are formed by low-energy ion implantation. For the fabrication of an n-channel device, boron is implanted at an energy of no more than about 1 keV. Upon implantation and a subsequent annealing process, the first and second halo regions form a continuous halo region within the semiconductor substrate.

Systems and methods for calibrating a temperature sensing system are disclosed. In one respect, a dual light source configuration may be provided. A first light source may illuminate a sensing fiber and an anti-Stokes band may be detected. A second light source may illuminate a sensing fiber and a Stokes band may be detected, where the Stokes band is substantially similar to the anti-Stokes band of the first light source. A ratio between the anti-Stokes and Stokes band may be used to calibrate a temperature sensing system.

A time-resolved, fluorescence spectrometer makes use of a RadiaLight® optical switch and no dispersive optical elements (DOE) like gratings. The structure is unique in its compactness and simplicity of operation. In one embodiment, the spectrometer makes use of only one photo-detector and an efficient linear regression algorithm. The structure offers a time resolution, for multiple species measurements, of less than 1 s. The structure can also be used to perform fluorescence correlation spectroscopy and fluorescence cross-correlation spectroscopy.

Multiple groups of sensors are circumferentially spaced apart at each cross-directional position along a sensing roll of a nip press to measure and cancel or nearly cancel the effects of rotational variability which may be acting on the sensing roll. The strategically-placed sensors are designed to measure the pressure being placed against the web that is being advanced through the nip press. The average of the measurements of multiple sensors spaced circumferential apart provides a good cancellation of any rotational variability that might be found at a cross-directional position on the sensing roll. In this manner, a more true measurement of the nip pressure profile can be obtained and better adjustments made to reduce nip pressure profile variability. In addition, the nip variability profile may be used as a predictor of cover or bearing failures, resonant frequencies and other roll anomalies.

Methods and apparatus facilitating radial profiling of formation mobility are disclosed. Radial profiling of formation mobility aids in an optimal completion of a well for enhanced production. Some aspects of the present invention provide a technique for radial profiling of formation mobility based on inverting differences between a Stoneley radial profile of horizontal shear slowness and a dipole radial profile of vertical shear slowness for a reservoir interval.

A semiconductor substrate shaped to have a curved surface profile by anodization. Prior to being anodized, the substrate is finished with an anode pattern on its bottom surface so as to be consolidated into a unitary structure in which the anode pattern is precisely reproduced on the substrate. The anodization utilizes an electrolytic solution which etches out an oxidized portion as soon as it is formed as a result of the anodization, to thereby develop a porous layer in a pattern in match with the anode pattern. The anode pattern brings about an in-plane distribution of varying electric field intensity by which the porous layer develops into a shape complementary to a desired surface profile. Upon completion of the anodization, the curves surface is revealed on the surface of the substrate by etching out the porous layer and the anode pattern from the substrate.

A profile correction apparatus has a measured value obtaining section for obtaining measured values in which a predetermined physical amount involved in colors of color patches constituting a chart is measured, and a correction section for correcting the post-stage sections to reduce a difference between the colors of the color patches and a predetermined target color in accordance with the measured values obtained in the measured value obtaining section.

A measuring method, comprising a step of drawing a line on a surface such as ground surface, a step of performing measurement along the line on a predetermined measurement range including the line, a step of acquiring an image of a range including the predetermined measurement range as an image data, a step of superimposing the image data on a measurement data, and a step of calculating a measurement data of the line from line position in the image data and from the measurement data near the line.

A sensor suitable for measuring the pressure applied by a bandage, the sensor being in the form of an elongate strip having a plurality of pads arranged along its length, wherein the sensor includes a connection to each pad, whereby the pressure applied to each pad can be determined independently, wherein each pad is inflatable to form an expanded pad protruding above the surface of the strip, and deflatable so that it does not impede removal of the sensor from the bandage. Such a sensor is primarily intended for single use, i.e. is disposable.

A measuring method, comprising a step of drawing a line on a surface such as ground surface, a step of performing measurement along the line on a predetermined measurement range including the line, a step of acquiring an image of a range including the predetermined measurement range as an image data, a step of superimposing the image data on a measurement data, and a step of calculating a measurement data of the line from line position in the image data and from the measurement data near the line.

A retention arrangement that includes one or more templates for securing and aligning probes for testing a device under test.

Multiple groups of sensors are circumferentially spaced apart at each cross-directional position along a sensing roll of a nip press to measure and cancel or nearly cancel the effects of rotational variability which may be acting on the sensing roll. The strategically-placed sensors are designed to measure the pressure being placed against the web that is being advanced through the nip press. The average of the measurements of multiple sensors spaced circumferential apart provides a good cancellation of any rotational variability that might be found at a cross-directional position on the sensing roll. In this manner, a more true measurement of the nip pressure profile can be obtained and better adjustments made to reduce nip pressure profile variability. In addition, the nip variability profile may be used as a predictor of cover or bearing failures, resonant frequencies and other roll anomalies.

To correct the position of a conveyed item (12) in a conveyance system (10), the deviation of the conveyed item (12) from its target position is detected. If this deviation reveals that a correction is necessary, a suitable correction profile Pi is selected from a plurality of available correction profiles (P1, P2, P3), and the correction is carried out.