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151 results about "Atomic mass" patented technology

The atomic mass (mₐ) is the mass of an atom. Its unit is the unified atomic mass unit (symbol: u, or Da) where 1 unified atomic mass unit is defined as ¹⁄₁₂ of the mass of a single carbon-12 atom, at rest. The protons and neutrons of the nucleus account for nearly all of the total mass of atoms, with the electrons and nuclear binding energy making minor contributions. Thus, the atomic mass measured in u has nearly the same value as the mass number.

Detection method and test device for catalytic properties of heatproof material based on emission spectrum

ActiveCN103411940AObtain Surface Catalytic CoefficientEasy to operateFluorescence/phosphorescenceGas phaseInlet valve
The invention provides a detection method and a test device for catalytic properties of a heatproof material based on an emission spectrum. The test device comprises a plasma power supply, an air inlet valve, an infrared temperature measurement window, a double-colorimetric thermodetector, an emission piston, an induction heating power supply, a reaction cavity, a resistance vacuum gauge, a vacuum flange, an induction coil, a zirconium oxide support frame, a single-shaft electric stepping machine, a long-focus focusing lens and a short-focus focusing lens. According to an 'atom-dissipation' laboratory representation method based on emission spectrum diagnosis disclosed by the invention, the disturbance of the surface of the material to gas-phase atoms is quantitatively analyzed by an actinic ray strength method, and the recombination coefficient of the gas-phase atoms at the surface of the material is calculated according to mathematic models of gas-phase diffusion and object surface atomic mass conservation conditions. The test device has the advantages that the operation is simple; based on a catalytic mechanism and by virtue of an emission spectrum diagnosis technique, the surface catalysis coefficients of conductive heatproof materials in a temperature range of 600-3000 DEG C can be obtained through measuring the concentration change of oxygen atoms at the surfaces of the materials to represent the surface catalytic properties of the materials based on catalysis principles and diffusion equations.
Owner:HARBIN INST OF TECH

Seed breeding method of moso bamboo by physical and chemical composite mutagenesis

The invention discloses a seed breeding method of moso bamboo by physical and chemical composite mutagenesis. The seed breeding method comprises the following five steps of: (1) collection of the moso bamboo seeds, wherein the purity of the seeds is more than or equal to 90%, the thousand seed weight is more than or equal to 28g, the moisture content is 10%-14%, and after being sealed, the seeds are stored for later use at the temperature of 4 DEG C; (2) irradiation ray selection of caesium Gamma rays with the atomic weight being 137 as an irradiation source, and selection of two types of mutagen treating liquid; (3) preparation of the two types of mutagen treating liquid; (4) physical and chemical composite mutagenesis treatment, wherein the radiation dose rate is 1Gy/min, the radiation dose is 30Gy, the seeds are soaked for tens of hours with warm water, after water-absorbing paper absorbs the surface water of the seeds completely, the seeds are soaked and mutagenized for eight hours by using a sodium azide solution (NaN3) or ethylmethane sulfonate (EMS) solution with the concentration of 0.04mmol/L, and after being taken, the seeds are cleaned repeatedly for 2 hours by using clean water to obtain the moso bamboo seeds treated by composite mutagenesis; and (5) germination test of the seeds, verification of mutagenic effect and determination of mutagenesis dose. The seed breeding method disclosed by the method has the advantages that the mutants in mutagenesis are more in quantity, the character mutation is diversified, and the selection range of excellent characters needed in seed breeding is large.
Owner:ZHEJIANG FORESTRY UNIVERSITY

Lithographic printing plate support and presensitized plate

InactiveUS20060223005A1Water visibilityPreventing scummingPhotomechanical apparatusPlate printingEngineeringAlkali metal
Disclosed is a lithographic printing plate support obtainable by subjecting an aluminum plate to an electrochemical graining treatment with an aqueous solution containing hydrochloric acid, anodizing treatment and alkali metal silicate treatment at least, wherein: a surface of the support has a grained shape in which large pits with a mean aperture diameter of 2 to 10 μm and small pits with a mean aperture diameter of 0.05 to 0.8 μm overlap with each other, with the mean ratio of depth to aperture diameter of the small pits being 0.2 to 0.6; a surface area difference ΔS50 defined by equation (1):
ΔS50=(Sx50−S050)/S050×100 (%)   (1)
in which Sx50 is the actual area of a 50 μm square region of the surface as determined by three-point approximation from three-dimensional data obtained by measuring the region with an atomic force microscope at 512×512 points and S050 is the geometrically measured area of the same region, is 20 to 40%; the alkali metal silicate treatment is performed using an aqueous solution of pH 11.5 to 13.0 which contains an alkali metal silicate; and an amount of Si atoms deposited to the surface is 3.0 to 15.0 mg/m2. The presensitized plate according to the present invention allows not only the press life but also the resistance to scumming by ink spreading, resistance to scumming by leaving and resistance to scumming by failed deletion, and the water visibility as well, to be excellent, even if an FM screen is used for halftone.
Owner:FUJIFILM CORP +1

Ultraviolet diode and atomic mass analysis ionization source collecting device using ultraviolet diode and an mcp

The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.
Owner:KOREA BASIC SCI INST
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