Ion source for time-of-flight mass spectrometers for analyzing gas samples

Abstract

In accordance with the invention, the ion source of a time-of-flight mass spectrometer includes an electron gun having an electron source and at least one electrode for conditioning the flow of electrons, followed by at least one microchannel wafer for generating a pulsed secondary electron beam containing a greater number of electrons from a pulsed primary electron beam. The secondary electron beam enters a gas ionization area of an ion gun which produces a flow of ions which is then passed through the flight tube in order to be analyzed by an ion detector. This provides a high-performance ion source which is compact, sensitive and easy to integrate.

Description

The present invention relates to means for ionizing gas samples for analysis in a mass spectrometer.A mass spectrometer analyses a gas sample by bombarding it with a flow of electrons, imparting movement to the ions obtained in this way and distinguishing them according to their trajectory or velocity.To increase the measurement sensitivity and resolution of the mass spectrometer it is beneficial for the gas sample to be strongly ionized.In time-of-flight mass spectrometers, ions produced by the ion source are launched into the entry of a flight tube, in which they retain a constant velocity. The nature of the ions is deduced from the time of flight corresponding to each type of ion in the gas sample to be analyzed, which is detected at the outlet from the flight tube. This entails launching a packet of previously accelerated ions into the entry of the flight tube and marking the departure time of the packet of ions and the arrival times of the various ions at the other end of the f...

AI Technical Summary

Benefits of technology

The problem addressed by the present invention is that of designing a new ion source structure for mass spectrometers which is more compact and more sensitive and which can easily be integrated with other components of a mass spectrometer.

The microchannel wafers multiply the flow of electrons to intensify subsequent ionization of the gas sample. This significantly increases the sensitivity and resolution of the apparatus.

This encourages further intensification of the ionization of the gas sample and therefore increases the sensitivity of the apparatus incorporating the ion source.

Because of this feature, the ion source can be at the entry of and aligned with the axis of the flight tube of a time-of-flight mass spectrometer. This achieves better integration of the ion source and makes the apparatus more compact.

Problems solved by technology

This results in a large overall size and makes integration difficult.

A relatively small quantity of ions is produced, which limits the sensitivity of the apparatus.

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