33 results about "Transmission microscopy" patented technology

The magnetic tape includes a magnetic layer containing ferromagnetic hexagonal ferrite powder, abrasive, and binder on a nonmagnetic support, wherein the ferromagnetic hexagonal ferrite powder exhibits an activation volume of less than or equal to 1,800 nm³, and inclination, cos θ, of the ferromagnetic hexagonal ferrite powder relative to a surface of the magnetic layer as determined by sectional observation by a scanning electron transmission microscope is greater than or equal to 0.85 but less than or equal to 1.00.

The invention discloses a method for in situ generating a nano cellulose microfibril reinforced polymer composite material, comprising the following steps: using ionic liquid as a primary solvent, dissolving cellulose, or mixing cellulose with other polymers via solution mixing, and controlling the solubility of the cellulosic material in the solvent to maintain naturally occurring nano cellulose microfibril in the cellulosic material, so as to in situ obtain the nano cellulose microfibril reinforced polymer composite material. The nano microfibril can be observed under a transmission microscope obviously, which is different from the completely dissolved cellulose solution. In the preparing process, the dissolving temperature is controlled within 30-150 DEG C, and stirring and vacuum deaeration are used as auxiliary. By controlling the dissolving time, solution concentration and ratio of mixing, a polymer solution containing cellulose microfibril with dimension of 5-300 nanometers can be obtained. The polymer solution can be used for preparing composite material fiber, hollow fibrous membrane, diaphragm, film, gel, porous material and other known applications of enhanced material.

The present invention is a microscope slide apparatus and method of use thereof, wherein the slide has an integrated color calibration array of filter elements, each element having a given dimension, each element also having a known transmission spectrum. The complete filter array is observable in the field of view of a microscope under at least one magnification setting of a microscope. The invention further characterized with a secondary integrated filter array that is completely observable at a second magnification setting.

The present invention provides a method and apparatus for improving the signal to noise ratio, the contrast and the resolution in images recorded using an optical imaging system which produces a spatially resolved image. The method is based on the incorporation of a polarimeter into the setup and polarization calculations to produce better images. After calculating the spatially resolved Mueller matrix of a sample, images for incident light with different states of polarization were reconstructed. In a shorter method, only a polarization generator is used and the first row of the Mueller matrix is calculated. In each method, both the best and the worst images were computed. In both reflection and transmission microscope and Macroscope and ophthalmoscope modes, the best images are better than any of the original images recorded. In contrast, the worst images are poorer. This technique is useful in different fields such as confocal microscopy, Macroscopy and retinal imaging.

The present invention concerns a system and method for calibration and adjustment of the pixel color values represented within a digital image of a sample by a transmission microscope. Furthermore the present invention is directed to providing sufficient color information in order to generate a color mapping matrix that allows for the creation of a synthetic image to depict the sample under a desired illumination. The system and method provides a solution that generates a destination-device independent image that is configurable to any calibrated display device.

The invention is concerned with the method that can locate the focusing ion beam to repair the location accurately, it is: locates the aiming area by the optics transmission microscope coordinating with the laser mark, the optics transmission microscope can show the circuitry structure directly by penetrating passive layer, the traditional method uses focusing ion beam imaging that can only show the outer layer situation of the sample, so the invention can locate the repair position of the focusing ion beam. The invention is: the laser energy of mark on the dope is lower that cannot damage the material of the sample. Moreover, the dope can be chemical reagent, such as acetone, that can be easy to scour off and daub times without number, and cannot affect the following steps.

The invention discloses a method for preparing a planar sample for a transmission electron microscope at a specific failure point. The method comprises the following steps: intercepting a piece of the sample close to the failure point on the sample by a focused ion beam, sucking the intercepted sample by a Pick-Up system and vertically placing the intercepted sample on the surface of a silicon slice, and fixing the sample on the surface of the silicon slice by means of focused ion beam gold-plating to prepare the planar sample for the transmission electron microscope. According to the method disclosed by the invention, by accurately intercepting the sample by the focused ion beam, a process of manually grinding is omitted, the success rate of sample preparation and the quality of the sample are greatly improved, and great assistance is provided for the subsequent failure analysis and structure analysis.

It is possible to reliably and efficiently determine whether a specimen contains viruses, bacteria, etc. and, if it does, identify their types, regardless of the observer. Furthermore, even a newly-discovered bacterium can be quickly identified by utilizing a database at a remote location. A transmission microscope system has a microscope for observing a specimen and a database which stores, for each microscopic thing (such as a virus), a name, a specimen pretreatment method and an imaging condition used when the microscopic thing is observed, captured image data, etc. An image of the specimen is captured according to a specimen pretreatment method and an imaging condition retrieved from the database using the name of a target microscopic thing as a key, and the captured image is compared with images stored in the database to identify microscopic things present in the specimen.

An object of the invention is to provide an azo pigment having extremely good dispersibility and dispersion stability and having excellent hue and tinctorial strength and, preferably, having a long axis observed with a transmission microscope of from 0.01 μm to 30 μM.

An azo pigment which is represented by the following formula (1) and having characteristic peaks at Bragg angles) (2θ±0.2°) of (i) 7.6° and 25.6°, (ii) 7.0°, 26.4°, and 27.3°, or (iii) 6.4°, 26.4°, and 27.2° in X-ray diffraction with characteristic Cu Kα line, or a tautomer thereof:

The invention provides an aluminum foil mesh for a transmission microscope and a scanning microscope. The thickness of the aluminum foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the aluminum foil mesh comprises drawing, aluminum foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the aluminum foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope aluminum foil meshes to be clear and hole walls of the electron microscope aluminum foil meshes to be smooth.

The invention provides a tungsten foil mesh for a transmission microscope and a scanning microscope. The thickness of the tungsten foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the tungsten foil mesh comprises drawing, tungsten foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the tungsten foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope tungsten foil meshes to be clear and hole walls of the electron microscope tungsten foil meshes to be smooth.

The invention discloses a color digital transmission microscope color correction method. A micro transmission color card is used for correcting colors of microscopic images collected by a color digital transmission microscope, since an illumination light source of the digital microscope is usually fixed, chroma characterization of a digital camera under fixed conditions is particularly suitable for color correction of the digital microscope, therefore, the color blocks in the micro transmission color card are used as training samples to establish a positive chroma characterization model of thecolor digital transmission microscope, and the model can be used for realizing accurate color correction of a shooting target; and the color accuracy of the color digital transmission microscope is improved, the method is consistent with the color perception of human eyes, the effect that what you see is what you get is achieved, the recognition degree of a target object in microscopic inspectionis significantly improved, and the accurate identification and positioning of the target object are realized.

The invention provides a di(polyoxometallate)-organic chain-cage silsesquioxane hybrid cluster compound and a preparation method thereof. The hybrid cluster compound is formed by covalent bonding of two polyoxometallates and one cage silsesquioxane through an organic chain. According to the preparation method, two polyoxometallates (Bu4N)6[H3P2W15V3O62] and one cage silsesquioxane (POSS-NH2) are connected through a six-step reaction to obtain the organic-inorganic hybrid material. The hybrid cluster compound is formed through connection via the organic chain by the means of covalent bonds andhas a precisely fixed molecular weight and molecular shape; and in solution self-assembly studies, the hybrid cluster compound is dissolved in acetone, n-decane is added, and volatilization at 25 DEGC is performed. During the volatilization of acetone, di(polyoxometallate)-organic chain-cage silsesquioxane molecules undergo self-assembling; and with a high-power transmission microscope, a stripedsheet structure is observed in a high-angle annular dark field image-scanning transmission mode.

The invention discloses a fixing device for a transmission electron microscope sample. The fixing device comprises a metal sheet, an elastic piece and a fastening piece, wherein the metal sheet consists of a thin sheet part and a hollow annular fixing part which are connected with each other; the end part of a thin sheet is used for fixing a metal net; the inner wall of the annular fixing part is provided with an annular step; the elastic piece is arranged on the annular step; the fastening piece comprises a first fixing element and a second fixing element; the first fixing element is used for fixing the annular fixing part on the second fixing element through the elastic piece. According to the fixing device disclosed by the invention, direct contact of the first fixing element of the fastening piece and the metal sheet is avoided, so that the problem of stressed deformation of the metal sheet is solved.

The invention provides a nickel foil mesh for a transmission microscope and a scanning microscope. The thickness of the nickel foil mesh is from 0.01 mm to 0.05 mm and the number of mesh holes is from 1 mesh to 600 meshes. A production method of the nickel foil mesh comprises drawing, nickel foil processing, performing photoresist, pre-baking, performing exposure, developing, rinsing, post-baking, etching and removing of photoresist. The production method of the nickel foil mesh for the transmission microscope and the scanning microscope has the advantage of enabling obtained mesh holes of electron microscope nickel foil meshes to be clear and hole walls of the electron microscope nickel foil meshes to be smooth.