119 results about "Near field optical microscope" patented technology

A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may terminate the nanowire to realize an apertureless near-field optical microscope probe.

This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques.

A complete optical probe scanning near field optical microscope is disclosed, comprising laser lighting system, monitoring system, sample support, light fiber probe scanning mechanism, three-dimensional rack and pinion adjustment, feedback control and data collecting system. Its basic idea that light fiber probe is fixed on tuning fork, through three -dimensional scanner, light fiber probe is made to scan on the surface of sample nearby, when light fiber probe is approaching the surface of sample, it will be influenced by effect of atom shearing force which will change concussion of tuning fork so that the information of distance between light fiber probe and sample can be obtained. The information is feedback to Z direction control system to make light fiber probe keep a distance to a constant value with surface of sample, whose appearance will be reflected by the information feedback, and light intensity collected by light fiber probe provides permeability of sample. The invention has the advantages of large scanning range, no limitation of sample, high modularization, convenient combination and change.

Provided is a scanning near-field optical microscope capable of obtaining in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

The invention discloses a device for measuring nano-scale light field phase distribution. The device comprises a scanning near field optical microscope, a heterodyne interference light path module, a microscope observation alignment module, a signal collection and synchronous demodulation module and a signal processing, storing and displaying module, wherein the scanning near field optical microscope is used for achieving scanning of nano-scale spatial resolution and signal collection, the heterodyne interference light path module is used for generating low-frequency beat signals which can be processed, possibility is provided for phase demodulation, the microscope observation alignment module is used for monitoring the probe point scanning state and assisting in achieving alignment of a probe point, a sample and illumination light, the signal collection and synchronous demodulation module can control a probe to conduct scanning at a nano-scale precision and a nano-scale step pitch, demodulate collected signals in real time and output the light field vibration amplitude and the phase information of a corresponding point, and the signal processing, storing and displaying module collects and stores measurement results and generates a synchronous spatial position topology topography and a corresponding light field vibration amplitude and a phase distribution graph on a computer. The device for measuring nano-scale light field phase distribution can achieve measurement of field distribution of a section at any height in a space and 3D field distribution.

The invention discloses an optical fiber probe with the polarization maintaining characteristic and a manufacturing method of the optical fiber probe. The optical fiber probe comprises a bare optical fiber probe body and metal film, wherein the bare optical fiber probe body is made of oval core polarization-maintaining optical fibers with a protective layer removed, one end of the bare optical fiber probe body is of a needle point structure, the lower end face of the needle point is oval, a groove is formed in the top of the needle point in the long axis direction of the lower end face of the needle point, the top of the needle point is divided into two symmetrical sections, the surface of the portion, except for the groove, of the bare optical fiber probe body is covered with the metal film, two-section metal film is formed on the top of the needle point, and a surface plasma reinforcing structure is formed by the two-section metal film and the groove. According to the optical fiber probe with the polarization maintaining characteristic and the manufacturing method of the optical fiber probe, the radiance of a dipole at the top end of the probe can be remarkably improved, the coherent signal to noise ratio is increased, the manufacturing process can be easily and accurately controlled, and repeatability is good; the optical fiber probe can be applied to a near-field optical microscope, and can also be applied to detection of a Raman spectrum, a white-light nanometer ellipsometer and an ultra-fast pump.

To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely. Numerical modeling shows that, even with substantial measurement noise, the suggested probes can resolve objects that are significantly smaller than the probe size and, in certain cases, can perform better than miniature nanoprobes.

The present invention relates to a modular scanning probe microscope combined with inverted fluorescence microscope. It is formed from five modules, in which the first module is inverted fluorescence microscope, second module is three-jaw approaching device, third module is scanning head, fourth module includes transparent sample table and X, Y and Z three-dimensional scanner and fifth module is laser microscopic extension module. Said invention also provides its working principle and concrete operation method.

A multiple-degree-of-freedom near-field optical microscope based on a micro-nano motion arm comprises the micro-nano motion arm, a quartz tuning fork, a near-field optical probe, a sample scanning stand, a sinusoidal signal generator, a preposed lock-in amplifier, a control box and a detector and/or a light source, wherein the quartz tuning fork is fixed at the front end of the micro-nano motion arm; the near-field optical probe is fixed on one tuning fork arm of the quartz tuning fork; the sample scanning stand is positioned under the quartz tuning fork; the signal output end of the sinusoidal signal generator is connected with the input end of the quartz tuning fork; the input end of the preposed lock-in amplifier is connected with the output end of the quartz tuning fork; the input end of the control box is connected with the output end of the preposed lock-in amplifier, one output end of the control box is connected with the input end of the micro-nano motion arm, and the other output end of the control box is connected with the input end of the sample scanning stand; and the detector and/or the light source are/is connected with the near-field optical probe. The multiple-degree-of-freedom near-field optical microscope has an optical resolution capability beyond the diffraction limit as well as large-scale mobile flexibility and multi-degree-of-freedom operation capability, occupies a small space, and is very convenient to be combined with other microscopic characterization methods.

A near-field light-generating element has a support member and a minute aperture having a size smaller than the wavelength of incident light provided on the support member so as to produce near-field light in response to incident light directed thereto. The minute aperture has a contour in a given plane with one side lying along a line perpendicular to a direction of polarization of the incident light and an opposite side in the given plane defining an apex.

The apparatus and method for preparing optical fiber microprobe by siphon lifting corrosion process, wherein the method comprises, fixing one end of the optical fiber above the etching solution container, placing another end in the etching solution positioned in the etching solution container, which is suspended on the liquid level in the main siphon container, adjusting the siphon speed-regulating valve at the center of the siphon, making the liquid level of the etching solution in the etching solution container slowly leave the optical fiber mounted on the helical micrometer, etching required probe according to the predetermined falling speed. The method by the invention realizes low fabrication cost, better repeatability and simple process. íí

The invention discloses a manufacture method of an optical fiber probe. The manufacture method includes mixing an HF solution with an NH4F solution to obtain an etch solution, covering an organic solvent layer which is insoluble in the etch solution and serves as a protection layer on the surface of the etch solution; keeping the temperature of the etch solution constant, inserting a bare optical fiber with an end surface smooth into the etch solution, and performing static etching; dropwise adding a correction liquor to the etch solution while stirring the etch solution, and performing dynamic etching, wherein the correction liquor is the HF solution or the NH4F solution; stopping adding the correction liquor, stopping stirring the etch solution, and performing static etching to obtain the optical fiber probe. The manufacture method of the optical fiber probe is capable of effectively manufacturing the nonlinear taper probe, the manufactured optical fiber probe is smooth in surface appearance, an in-depth study of the influence of taper changes on a light transmission rate of the probe is facilitated, and further, a near-field optical microscope probe with excellent properties are obtained. Besides, the manufacture method is low in cost, easy to implement, high in controllability, and capable of achieving volume production.

The invention discloses a vibration reduction structure of a low temperature scanning near-field optical microscope (SNOM), and belongs to the field of manufacture of near-field optical instruments. The vibration reduction structure is characterized in that a vacuum cavity of the low temperature scanning near-field optical microscope is internally provided with a metal sleeve, a low temperature SNOM scanning head is hung on the top in the metal sleeve so as to play the role of primary vibration reduction action; further a magnetic damping vibration reduction device is arranged on the vibration reduction structure, a U-shaped copper frame of the magnetic damping vibration reduction device is partially fixed on the lower surface of a scanning head pedestal, and a corresponding magnet is fixed on a heat conduction copper disc; when the vibration reduction structure is vibrated, one edge of the U-shaped copper frame does a motion of cutting the magnetic line of force along one edge of the magnet so as to cause magnetic damping, thereby playing a secondary vibration reduction action. The vibration reduction structure provided by the invention can be used for reducing of the low temperature scanning near-field optical microscope.

Disclosed is a near field light generating device comprising a first medium layer which transmits light from a light source. This near field light generating device generates near field light by using light irradiating a plasmon probe through the first medium. This near field light generating device is characterized in that a second medium layer having a refractive index lower than that of the first medium layer is formed between the first medium layer and the plasmon probe.

The present invention is an optical fiber probe having excellent vibration property and its manufacturing method relating to the scanning optical micro-imaging technology, particularly being directed to the imaging members provided in the scanning type of the near-field optical microscope and their manufacturing method in the near-field optical experiment technology. In this method, the optical fiber probe of prior art is cut off into a shape of short needle to make it face and be coupled with the end face of another long optical fiber connected to an photoelectric detector, said optical fiber short needle being placed on a vibrating arm of a vibrating member (e.g. quartz tuning fork) and said long optical fiber being placed on a fixed arm of the vibrating member; its manufacturing steps comprises preprocessing, marking position, pre-cutting, needle shaping, fixing optical fiber needle, cutting off it into short needle, coupling it with long optical fiber, etc. This invention has the novel structure of non-contacting type of short probe and the basic frequency of the vibrating frequency of the vibrating member is not interfered, so that the optical fiber probe has the excellent vibrating property, and the optical transmitting efficiency is not affected very much, the manufacturing cost is not increased. The invention can be used readily in the current near-field optical microscopes.

The invention discloses a method for using light guide fiber and indium stannic oxide to make the optical scanning channel microscope probe. The method comprises: choosing the optical fiber, preparing for the buffer solution, chemical etching the optical fiber, evaporated depositing the mental conductive film, etching removing the optical fiber push-button metal membrane, magnetron sputtering depositing the ITO film, connecting the pivot-end and the base. The optical scanning channel microscope probe can be sued in scanning channel microscope, light quantum scanning channel microscope and scanning near-field optics microscope and so on.

A near field microscope of optical band consists of near field viewfinder, near field coding plat , light wave guide for switching over , beam splitting system and photoelectric probe . It features setting near field coding plate as sub wavelength microhole array circulated as per S matrix distribution with microhole diameter being less than r value in Rayleigh criterion, picking up light coming from viewfinder and extracting it in microhole and converting it to be conduction wave for being sent to the following device.

This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques. In other embodiments, phase and amplitude stability are improved with a novel s-SNOM configuration. In other embodiments an absorption spectrum may be obtained directly by comparing properties from a known and unknown region of a sample as a function of illumination center wavelength.

The invention discloses a method for testing the light transmittance performance of an optical waveguide on the basis of a scanning near-field optical microscope. The method is realized on the basis of a testing system which comprises a laser device, an optical waveguide device provided with the optical waveguide, a scanning and driving device, an input near-field optical fiber probe, an output near-field optical fiber probe, a signal generator, a phase-locking amplifier, a micro nano operation arm, detection equipment, a control box and a computer. The method comprises the steps as follows: firstly, the manufactured waveguide device is bonded on a sample box with an adhesive; then the accurate position of the optical waveguide is found through an electron microscope, the near-field optical fiber probes are moved to a certain position of the optical waveguide through the micro nano operation arm, and a light signal is introduced by the input near-field optical fiber probe; an output light signal is transmitted into detection equipment through the output near-field optical fiber probe; the optical waveguide is driven to be scanned point by point in the X-direction and the Y-direction through a scanning platform, so that a near-field optical image of the whole optical waveguide is obtained; and testing of an optical waveguide chip is completed. According to the method, the light transmittance performance of the optical waveguide device can be tested accurately.

This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques. In other embodiments, phase and amplitude stability are improved with a novel s-SNOM configuration. In other embodiments an absorption spectrum may be obtained directly by comparing properties from a known and unknown region of a sample as a function of illumination center wavelength.

An imaging-type near-field optical microscope mainly comprises a light source and a photodetector array. The array functions as imaging array where each cell or photodetector has subwavelength dimensions. A sample under test is disposed in optical near field of the photodetectors, e.g., on surface of the array. As a result of subwavelength dimensions and near-field effect, resolution can break the diffraction limit and even reach nanoscale. The microscope has a fast speed, works with soft sample and sample in solution, and is capable of dynamic observations. In addition, the array surface doubles as a platform for molecule manipulation.

The invention relates to a method for measuring cavity surface temperature of a semiconductor laser by using a scanning near-field optical microscope, which comprises the following steps of: installing the semiconductor laser on a heat sink, and leading out an electrode; testing parameters of the semiconductor laser; fixing the heat sink on a sample test table of the scanning near-field optical microscope; connecting an electrode with a current output end of a current output device; placing a probe of the scanning near-field optical microscope above a light emergent cavity surface of the semiconductor laser; enabling the semiconductor laser to be close to the probe of the scanning near-field optical microscope to be in a non-contact working state; determining the scanning range of an active region including the semiconductor laser according to the characteristic dimension of the semiconductor laser; scanning to obtain a feature image under the condition of no current injection; injecting a constant current to obtain a feature image and a near field light spot image of the light emergent cavity surface of the semiconductor laser; comparing the feature images before and after the current is injected, calculating the difference value of the feature change; and calculating corresponding temperature change according to coefficients of thermal expansion of various materials in the semiconductor laser.