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1351results about How to "Low refractive index" patented technology

Nanometer cellulose/polyvinyl alcohol gel composite material

The invention relates to a nanometer cellulose/polyvinyl alcohol gel composite material, which is characterized by comprising hydrogel and aerogel. A preparation method of the nanometer cellulose/polyvinyl alcohol gel composite material comprises the following process steps of 1, nanometer cellulose preparation by a chemical combination mechanical treatment method; 2, composite hydrogel preparation; and 3, composite aerogel preparation. The nanometer cellulose/polyvinyl alcohol gel composite material has the advantages that the composite aerogel belongs to a porous amorphous solid material consisting of nanometer level colloid particles or high-polymer molecules, and a unique open nanometer level porous structure and a continuous three-dimensional reticular structure are adopted, so the density is extremely low, the specific surface area is high, and the porosity is high, wherein the solid phase of the aerogel accounts for 0.2 percent to 20 percent of the total volume percentage, the characteristics of high adsorption catalytic capability, low thermal conductivity, low sound resistance, low refractive index and the like are shown, and wide application prospects are realized in the fields of aviation, spaceflight, chemical industry, metallurgy, energy-saving building and the like.
Owner:SHANDONG LVSEN WOOD PLASTIC COMPOSITE

Film having low refractive index film and method for producing the same, Anti-relection film and method for producing the same, coating liquid set for low refractive index film, substrate having microparticle-laminated thin film and method for producing the same, and optical member

Provided is a film having a low refractive index, which can be formed under normal temperature and pressure while obtaining a lower refractive index, has excellent adhesion with a solid substrate, and does not lose geometric optical properties, such as the diffusibility or light-harvesting capability attributed to the microstructure. Also disclosed is a method for producing the same. The film having a low refractive index is obtained by causing an electrolyte polymer and microparticles to be alternately adsorbed on the surface of a solid substrate and bringing the resulting microparticle-laminated film into contact with a silicon compound solution in order to bond the solid substrate with microparticles and microparticles with microparticles. The silicon compound solution is selected from (1) the hydrolysis product of alkoxysilane (I) wherein the functional groups are formed from hydrolyzable groups and non-hydrolyzable organic groups, and the condensation reaction product thereof, (2) the hydrolysis product of a mixture of alkoxysilane (I) and alkoxysilane (II) wherein the functional groups are formed from hydrolyzable groups alone, and the condensation reaction product thereof; and (3) a mixture of hydrolysis product and condensation product thereof according to (1) and alkoxysilane (II).
Owner:RESONAC CORP

Thin film thickness and refractivity optical measurement method and its device

The invention discloses an optical measurement method and devices used for measuring film thickness and refractive index. Light emitted out of a broadband light source generates an interference signal through interference structure, the spectrum information of the interference signal is detected and the fourier transform of the spectrum information is carried out, thus obtaining the optical path difference information of two optical paths which can generate the interference signal. Under known refractive index, a sample is arranged in an interference arm in the same type and is measured again, and the film thickness can be obtained by comparing the information of twice optical path differences. If the refractive index is unknown, the film is required to be rotated by an angle, and the refractive index and the thickness of the film can be worked out by the measurement of a third time. The optical measurement method and the devices used for measuring film thickness and refractive index adopt an optical method and have no damage to the sample; the resolution is micro level and the measured range can achieve millimeter level. Furthermore, the sample is not required to be strictly attached onto a sample platform; meanwhile, the information processing method is simple, and the information of the thickness and the refractive index of transparent or half-transparent film can be conveniently obtained in real time.
Owner:HUAZHONG UNIV OF SCI & TECH
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