Manufacture method of optical fiber probe

An optical fiber probe and etching solution technology, which is applied in scanning probe technology, scanning probe microscopy, instruments, etc., can solve the problems of improvement of conical light transmittance, reduction of resolution, and uneven surface roughness of the probe , to achieve the effect of smooth surface morphology, high controllability and low cost
CN104101737AInactive Publication Date: 2014-10-15HUAZHONG UNIV OF SCI & TECH +1
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
HUAZHONG UNIV OF SCI & TECH
Publication Date
2014-10-15
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a manufacture method of an optical fiber probe. The manufacture method includes mixing an HF solution with an NH4F solution to obtain an etch solution, covering an organic solvent layer which is insoluble in the etch solution and serves as a protection layer on the surface of the etch solution; keeping the temperature of the etch solution constant, inserting a bare optical fiber with an end surface smooth into the etch solution, and performing static etching; dropwise adding a correction liquor to the etch solution while stirring the etch solution, and performing dynamic etching, wherein the correction liquor is the HF solution or the NH4F solution; stopping adding the correction liquor, stopping stirring the etch solution, and performing static etching to obtain the optical fiber probe. The manufacture method of the optical fiber probe is capable of effectively manufacturing the nonlinear taper probe, the manufactured optical fiber probe is smooth in surface appearance, an in-depth study of the influence of taper changes on a light transmission rate of the probe is facilitated, and further, a near-field optical microscope probe with excellent properties are obtained. Besides, the manufacture method is low in cost, easy to implement, high in controllability, and capable of achieving volume production.
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Description

technical field

[0001] The invention belongs to the technical field of near-field optical microscopic measurement, and more specifically relates to a preparation method of an optical fiber probe. Background technique

[0002] The development of nanotechnology has made the optical measurement of submicron structures increasingly important. Due to the diffraction limit of one-half wavelength in traditional optical imaging methods, the resolution of optical microscopes is limited. The birth of the near-field optical microscope broke through this limitation. Through the control of the feedback system, a probe with a nano-hole at the tip is scanned in the near-field region of the sample to obtain evanescent waves that can reflect fine structure information. signal, thereby achieving sub-micron resolution.

[0003] The performance of the nanoprobe determines the imaging quality of the near-field optical microscope, especially the light transmittance of the probe. At present, the...

Claims

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