Manufacture method of optical fiber probe

Abstract

The invention discloses a manufacture method of an optical fiber probe. The manufacture method includes mixing an HF solution with an NH4F solution to obtain an etch solution, covering an organic solvent layer which is insoluble in the etch solution and serves as a protection layer on the surface of the etch solution; keeping the temperature of the etch solution constant, inserting a bare optical fiber with an end surface smooth into the etch solution, and performing static etching; dropwise adding a correction liquor to the etch solution while stirring the etch solution, and performing dynamic etching, wherein the correction liquor is the HF solution or the NH4F solution; stopping adding the correction liquor, stopping stirring the etch solution, and performing static etching to obtain the optical fiber probe. The manufacture method of the optical fiber probe is capable of effectively manufacturing the nonlinear taper probe, the manufactured optical fiber probe is smooth in surface appearance, an in-depth study of the influence of taper changes on a light transmission rate of the probe is facilitated, and further, a near-field optical microscope probe with excellent properties are obtained. Besides, the manufacture method is low in cost, easy to implement, high in controllability, and capable of achieving volume production.

Description

technical field [0001] The invention belongs to the technical field of near-field optical microscopic measurement, and more specifically relates to a preparation method of an optical fiber probe. Background technique [0002] The development of nanotechnology has made the optical measurement of submicron structures increasingly important. Due to the diffraction limit of one-half wavelength in traditional optical imaging methods, the resolution of optical microscopes is limited. The birth of the near-field optical microscope broke through this limitation. Through the control of the feedback system, a probe with a nano-hole at the tip is scanned in the near-field region of the sample to obtain evanescent waves that can reflect fine structure information. signal, thereby achieving sub-micron resolution. [0003] The performance of the nanoprobe determines the imaging quality of the near-field optical microscope, especially the light transmittance of the probe. At present, the...

AI Technical Summary

Problems solved by technology

The probe formed by drawing the cone is often too long in cone length, which sharply reduces the light transmittance of the probe, resulting in weakened detection signal intensity and decreased resolution.

On the other hand, although the conventional chemical etching method can prepare probes with larger cone angles, the surface of the probes is rough and uneven, causing light signals to scatter, causing energy dissipation and signal distortion, and affecting imaging quality.

Although many subsequent etching methods can improve the quality of the probes, since the prepared probes are all linear tapered, that is, conical, it is difficult to give full play to the effect of the tapered factor on improving the light transmittance.

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