Manufacture method of optical fiber probe

An optical fiber probe and etching solution technology, which is applied in scanning probe technology, scanning probe microscopy, instruments, etc., can solve the problems of improvement of conical light transmittance, reduction of resolution, and uneven surface roughness of the probe , to achieve the effect of smooth surface morphology, high controllability and low cost

Inactive Publication Date: 2014-10-15
HUAZHONG UNIV OF SCI & TECH +1
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

The probe formed by drawing the cone is often too long in cone length, which sharply reduces the light transmittance of the probe, resulting in weakened detection signal intensity and decreased resolution.
On the other hand, although the conventional chemical etching method can prepare probes with larger cone angles, the surface of the probes is rough and uneven, ca

Method used

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  • Manufacture method of optical fiber probe
  • Manufacture method of optical fiber probe
  • Manufacture method of optical fiber probe

Examples

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preparation example Construction

[0022] The optical fiber probes obtained by the existing preparation methods are all linear tapered. However, the light transmittance of linear tapered probes is limited, and the nonlinear tapered structure (with a changing cone angle) can change the transmission characteristics of light and improve The light transmittance has broad application prospects. In the present invention, adjusting liquid is added in the etching process, and by changing the type and dripping speed of the adjusting liquid, the tapered shape of the optical fiber probe is adjusted to prepare non-linear tapered probes of different shapes, which is conducive to further in-depth research on the effect of the tapered change on the probe. The influence of needle light rate.

[0023] The preparation method of the optical fiber probe of the embodiment of the present invention comprises the following steps:

[0024] (1) Mix HF solution and NH 4 The F solution is mixed to obtain an etching solution, and an orga...

Embodiment 1

[0033] 10ml of 50% HF solution and 23ml of 22% NH 4 F solution was mixed to form an etching solution, and a layer of isooctane with a thickness of 3 cm was covered on the etching solution; the magnetic stirrer 5 was turned on, and the temperature of the etching solution was controlled at 28° C. with a water bath; the optical fiber was inserted into the etching solution , for 60min of static etching; the mass fraction of 40% NH 4 F solution is injected into the flow controller 4 as the adjustment liquid, put the stirrer 7 into the etching solution and start stirring, open the valve of the flow controller to let the adjustment liquid drop into the etching solution, the dropping speed is 0.3ml / min, drop into The process lasts for 15 minutes; adjust the dropping speed to 1.5ml / min, and the dropping process lasts for 15 minutes; the stirring bar stops stirring, maintains the current concentration, and performs static etching for 10 minutes.

[0034] The prepared fiber optic probes...

Embodiment 2

[0036] 20ml mass fraction of 22% HF solution and 19ml mass fraction of 40% NH 4F solution was mixed to form an etching solution, and a layer of isooctane with a thickness of 3 cm was covered on the etching solution; the magnetic stirrer 5 was turned on, and the temperature of the etching solution was controlled at 30° C. with a water bath; the optical fiber was inserted into the etching solution , carry out static etching for 20 min; inject the HF solution with a mass fraction of 22% as the adjustment liquid into the flow controller 4, put the stirrer 7 into the etching solution and start stirring, open the valve of the flow controller to allow the adjustment liquid to drip into the In the etching solution, the dropping speed is 1ml / min, and the dropping process lasts for 15 minutes; adjust the dropping speed to 0.3ml / min, and the dropping process lasts for 5 minutes; the stirring bar stops stirring, maintains the current concentration, and performs static etching for 5 minutes...

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Abstract

The invention discloses a manufacture method of an optical fiber probe. The manufacture method includes mixing an HF solution with an NH4F solution to obtain an etch solution, covering an organic solvent layer which is insoluble in the etch solution and serves as a protection layer on the surface of the etch solution; keeping the temperature of the etch solution constant, inserting a bare optical fiber with an end surface smooth into the etch solution, and performing static etching; dropwise adding a correction liquor to the etch solution while stirring the etch solution, and performing dynamic etching, wherein the correction liquor is the HF solution or the NH4F solution; stopping adding the correction liquor, stopping stirring the etch solution, and performing static etching to obtain the optical fiber probe. The manufacture method of the optical fiber probe is capable of effectively manufacturing the nonlinear taper probe, the manufactured optical fiber probe is smooth in surface appearance, an in-depth study of the influence of taper changes on a light transmission rate of the probe is facilitated, and further, a near-field optical microscope probe with excellent properties are obtained. Besides, the manufacture method is low in cost, easy to implement, high in controllability, and capable of achieving volume production.

Description

technical field [0001] The invention belongs to the technical field of near-field optical microscopic measurement, and more specifically relates to a preparation method of an optical fiber probe. Background technique [0002] The development of nanotechnology has made the optical measurement of submicron structures increasingly important. Due to the diffraction limit of one-half wavelength in traditional optical imaging methods, the resolution of optical microscopes is limited. The birth of the near-field optical microscope broke through this limitation. Through the control of the feedback system, a probe with a nano-hole at the tip is scanned in the near-field region of the sample to obtain evanescent waves that can reflect fine structure information. signal, thereby achieving sub-micron resolution. [0003] The performance of the nanoprobe determines the imaging quality of the near-field optical microscope, especially the light transmittance of the probe. At present, the...

Claims

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Application Information

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IPC IPC(8): G01Q60/22
Inventor 汤自荣朱桅孙永明周炜龚渤
Owner HUAZHONG UNIV OF SCI & TECH
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