Fibre-optical probe with excellent vibration characteristic and producing method thereof

A technology of optical fiber probe and vibration characteristics, which is applied in the field of scanning optical microscopy imaging, can solve problems such as failure to work, system failure to work well, and difficulty in forming a fundamental frequency vibration frequency curve, etc., to achieve increased costs, no transmission efficiency, The effect of excellent vibration characteristics
CN1510694AInactive Publication Date: 2004-07-07UNIV OF SCI & TECH OF CHINA

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
UNIV OF SCI & TECH OF CHINA
Publication Date
2004-07-07
Estimated Expiration
Not applicable · inactive patent

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Abstract

The present invention is an optical fiber probe having excellent vibration property and its manufacturing method relating to the scanning optical micro-imaging technology, particularly being directed to the imaging members provided in the scanning type of the near-field optical microscope and their manufacturing method in the near-field optical experiment technology. In this method, the optical fiber probe of prior art is cut off into a shape of short needle to make it face and be coupled with the end face of another long optical fiber connected to an photoelectric detector, said optical fiber short needle being placed on a vibrating arm of a vibrating member (e.g. quartz tuning fork) and said long optical fiber being placed on a fixed arm of the vibrating member; its manufacturing steps comprises preprocessing, marking position, pre-cutting, needle shaping, fixing optical fiber needle, cutting off it into short needle, coupling it with long optical fiber, etc. This invention has the novel structure of non-contacting type of short probe and the basic frequency of the vibrating frequency of the vibrating member is not interfered, so that the optical fiber probe has the excellent vibrating property, and the optical transmitting efficiency is not affected very much, the manufacturing cost is not increased. The invention can be used readily in the current near-field optical microscopes.
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Description

Technical field:

[0001] The invention relates to a scanning optical microscopic imaging technology, in particular to an imaging component provided by a scanning near-field optical microscope in the near-field optical experimental technology and a manufacturing method thereof. Background technique:

[0002] Near-field optical microscopy (abbreviated as NSOM) performs optical measurements at distances much smaller than a wavelength (i.e., in the near-field) to obtain super-diffraction-limited spatial resolution. The current near-field optical microscope uses a melted or corroded optical fiber, and coats it with a metal film to form an optical aperture with a diameter of 10nm to 100nm at the end as an optical probe, which can be installed on a precision displacement and scanning probe. On the piezoelectric ceramic material, combined with the highly accurate feedback control provided by atomic force microscopy (AFM), the optical probe is very precisely controlled at a height of ...

Claims

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