Fully optical fiber probe scan type near-field optical microscope

A fiber-optic probe and near-field optics technology, applied in the field of complete fiber-optic probe scanning near-field optical microscopes, can solve problems such as unrealistic scanning, and achieve the effects of high modularity, high sensitivity, and low noise

Inactive Publication Date: 2005-03-02
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the case of relatively large samples, it is difficult to scan by moving the sample, and this structure is no longer applicable
Especially for the recording device and recording medium in near-field optical storage, the recording device and the testing device are respectively locat

Method used

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  • Fully optical fiber probe scan type near-field optical microscope
  • Fully optical fiber probe scan type near-field optical microscope

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Embodiment Construction

[0035] The present invention will be further described below through specific examples, but the protection scope of the present invention should not be limited thereby.

[0036] see first figure 1 and figure 2 , figure 1 It is a structural schematic diagram of a specific embodiment of the present invention. It can be seen from the figure that a complete optical fiber probe scanning near-field optical microscope includes a laser illumination system, a monitoring system, a sample holder, an optical fiber probe scanning mechanism, a three-dimensional rough adjustment device, Feedback control and data acquisition system, characterized in that

[0037] Described laser illumination system comprises laser light source 1, focusing device 5 and microscopic objective lens 6, and the laser light beam of laser light source 1 output passes through first reflection mirror 2, spectroscopic beam splitter 3, second reflection mirror 4 and microscopic objective lens 6 The optical axes coinc...

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Abstract

A complete optical probe scanning near field optical microscope is disclosed, comprising laser lighting system, monitoring system, sample support, light fiber probe scanning mechanism, three-dimensional rack and pinion adjustment, feedback control and data collecting system. Its basic idea that light fiber probe is fixed on tuning fork, through three -dimensional scanner, light fiber probe is made to scan on the surface of sample nearby, when light fiber probe is approaching the surface of sample, it will be influenced by effect of atom shearing force which will change concussion of tuning fork so that the information of distance between light fiber probe and sample can be obtained. The information is feedback to Z direction control system to make light fiber probe keep a distance to a constant value with surface of sample, whose appearance will be reflected by the information feedback, and light intensity collected by light fiber probe provides permeability of sample. The invention has the advantages of large scanning range, no limitation of sample, high modularization, convenient combination and change.

Description

technical field [0001] The invention relates to a near-field optical scanning microscope, in particular to a complete optical fiber probe scanning near-field optical microscope for scanning by moving an optical fiber probe. It is suitable for molecular biology (natural nanostructures), nanomaterials and nanodevices (artificial nanostructures), and high-density information optical storage, etc. technical background [0002] As early as 1928, Synge predicted that if a point source smaller than the wavelength illuminates an object at a close enough distance or a point detector smaller than the wavelength detects the scattered wave of an object at a close enough distance, the resolution can break through diffraction limit. After entering the 1980s, modern microscopy represented by near-field scanning optical microscopy has become a reality, not only breaking through the diffraction limit, but also opening up a series of new researches such as nano-optics and ultra-high-density ...

Claims

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Application Information

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IPC IPC(8): G01N21/84G01Q60/18
Inventor 周飞徐文东干福熹
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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