The invention discloses a small-size vibration-free quick temperature change test device. The small-size vibration-free quick temperature change test device comprises a lower box body, an upper box body and a test cavity, wherein the lower box body comprises a lower heat insulation baffle plate, a lower
semiconductor refrigerator fixing sleeve, a lower water-cooling boss, a lower supporting stud, a lower high-power
semiconductor refrigerator, a lower double-stage
semiconductor refrigerator, a lower heat insulation particle layer and a lower
water pipe opening; and the upper box body comprises an upper heat insulation baffle plate, an upper semiconductor refrigerator fixing sleeve, an upper water-cooling boss, an upper supporting stud, an upper high-power semiconductor refrigerator, an upper double-stage semiconductor refrigerator, an upper heat insulation particle layer and an upper
water pipe opening. The small-size vibration-free quick temperature change test device has good
temperature control effect and is free from
mechanical vibration; the heat insulation baffle plates are adopted between the box body and the cavity and used for sealing, and heat insulation material particles are filled between the box body and the cavity, so the small-size vibration-free quick temperature change test device can be used for heating and refrigerating; the temperature change rate is 30 DEG C per minute; the small-size vibration-free quick temperature change test device can be applied to the field of optical coherence detection, in particular high-precision
temperature stress optical coherence detection systems for separating vibration interferences.