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6 results about "S-matrix" patented technology

In physics, the S-matrix or scattering matrix relates the initial state and the final state of a physical system undergoing a scattering process. It is used in quantum mechanics, scattering theory and quantum field theory (QFT).

Mathematical and physical combination-based optical device parameter measurement method, medium and system

The application relates to a kind of optical device parameter measurement methods based on mathematical physics combination, medium and system, to optoelectronic test technical field, it includes: the physical field simulation model of optical device is established and obtains port electromagnetic field distribution;Utilize waveguide mode orthogonality to the port electromagnetic field is carried out surface integration, obtains the frequency domain complex amplitude of each port;According to the frequency domain complex amplitude, calculate scattering matrix, extract optical device parameter.The optical device parameter measurement method provided by the application can reflect the physical characteristics of the optical device, and can be accurately fitted and optimized through mathematical algorithm, thereby improving the accuracy and efficiency of parameter extraction.
Owner:上海芯源创新中心

High-order mode coupler based on double suppression structure of transmission line model and design method

ActiveCN121902528BAccelerator physicsSecondary electrons
The application discloses a high-order mode coupler based on a double-inhibition structure of a transmission line model and a design method, and belongs to the accelerator physics and superconducting high-frequency technical field.The method comprises the following steps: determining a superconducting cavity base mode frequency, a high-order mode frequency band and an external quality factor Qe requirement; establishing an equivalent transmission line model comprising two parallel resonance base mode inhibition structures; optimizing a transmission curve through a normalized scattering matrix theory; converting the optimized transmission line model into a three-dimensional structure and further optimizing; modeling and calculating the external quality factor Qe in combination with the superconducting cavity; performing secondary electron multiplication effect simulation analysis; performing thermal load analysis by using an iterative process; and finally completing mechanical design.The application adopts the double-inhibition structure, greatly improves the base mode inhibition bandwidth, realizes deep inhibition of the base mode without pre-tuning, significantly reduces the superconducting module integration cost, improves the assembly efficiency and reduces the operation risk.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI

High-order mode coupler based on transmission line model dual-suppression structure and design method

The invention discloses a high-order mode coupler based on a transmission line model dual-suppression structure and a design method, and belongs to the technical field of accelerator physics and superconducting high frequency. The method comprises the following steps: determining the fundamental mode frequency, high-order mode frequency band and no-load quality factor Qe requirements of the superconducting cavity; establishing an equivalent transmission line model comprising two parallel resonant fundamental mode suppression structures; optimizing a transmission curve through a normalized scattering matrix theory; converting the optimized transmission line model into a three-dimensional structure and further optimizing the three-dimensional structure; carrying out overall modeling with the superconducting cavity to calculate a no-load quality factor Qe; secondary electron multiplication effect simulation analysis is carried out; carrying out thermal load analysis by adopting an iterative process; and finally, mechanical design is completed. The dual-suppression structure is adopted, the fundamental mode suppression bandwidth is greatly improved, deep suppression of a fundamental mode is achieved, pre-tuning is not needed, the integration cost of the superconducting module is remarkably reduced, the assembly efficiency is improved, and the operation risk is reduced.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI

Optical device parameter measurement method, medium and system based on combination of mathematics and physics

The invention relates to an optical device parameter measurement method, medium and system based on combination of mathematics and physics, and relates to the technical field of photoelectric testing, and the method comprises the steps: building a physical field simulation model of an optical device, and obtaining port electromagnetic field distribution; performing surface integration on the port electromagnetic field by utilizing waveguide mode orthogonality to obtain frequency domain complex amplitude of each port; and calculating a scattering matrix according to the frequency domain complex amplitude, and extracting optical device parameters. According to the optical device parameter measurement method provided by the invention, the extracted parameters not only can reflect the physical characteristics of the optical device, but also can be accurately fitted and optimized through a mathematical algorithm, so that the accuracy and efficiency of parameter extraction are improved.
Owner:上海芯源创新中心

A method for establishing a surface quality identification model based on a scattering matrix and application thereof

The application provides a surface quality recognition model based on a scattering matrix and an application thereof, and belongs to the field of optical detection.The method comprises the following steps: classifying the surface quality of a plurality of samples and obtaining the scattering light intensity and electric field intensity corresponding to each sample; performing normalization processing on the scattering light intensity of each sample to obtain the corresponding scattering matrix; performing visual processing on each scattering matrix according to the relationship between the scattering light intensity and the electric field intensity, thereby obtaining a plurality of updated scattering matrices; marking each updated scattering matrix according to the surface quality category of the sample, thereby obtaining a data set; and training a deep learning model using the data set to obtain a surface quality recognition model.The application can obtain the spatial distribution results of multiple incident angles and scattering angles, and can avoid the problem that the order of magnitude difference between the input data and the output data of the scattering light intensity is large, thereby causing a large prediction error, and finally obtain a surface quality recognition model with high accuracy.
Owner:HUAZHONG UNIV OF SCI & TECH

Dynamic injection method and system for polarization scattering data of spherical aerosol

The invention discloses a dynamic injection method and system for polarization scattering data of spherical aerosol, and relates to the technical field of atmospheric remote sensing. The method comprises the following steps: receiving a continuously changing micro-physical parameter group of aerosol; substituting into a particle size distribution model, and calculating an original scattering matrix in a Stokes observation space in real time based on a Mie scattering theory; mapping the original scattering matrix to a calculation space with diagonalization features through a base conversion protocol so as to extract independent features of the polarized components; performing structured packaging on the scattering data subjected to the substrate conversion processing according to the memory layout of the target engine; and injecting the encapsulated data into a computing kernel of the target engine in a forward simulation process of the target engine by adopting a memory dynamic coverage technology. The method aims at solving the problem that stratosphere aerosol polarization scattering interference is difficult to accurately eliminate, polarization independent characteristics are extracted through physical symmetry explicit substrate diagonalization conversion, simulation efficiency is improved, and system errors introduced by model distortion are eliminated.
Owner:HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES