Ultra-fast transmission electron microscope system and use method thereof

An electron microscope, an ultrafast technique used in areas such as material analysis using radiation diffraction, capable of solving problems such as limited intensity

Active Publication Date: 2017-05-10
INST OF PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

[0005] At present, the time resolution of the transmission electron microscope used is mainly controlled by the recording rate of the recording system (that is, t

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  • Ultra-fast transmission electron microscope system and use method thereof
  • Ultra-fast transmission electron microscope system and use method thereof
  • Ultra-fast transmission electron microscope system and use method thereof

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Embodiment Construction

[0036] The present invention will be further illustrated by specific examples below, but it should be understood that these examples are only used for more detailed description, and should not be construed as limiting the present invention in any form.

[0037] This section provides a general description of the materials and test methods used in the tests of the present invention. While many of the materials and methods of manipulation which are employed for the purposes of the invention are well known in the art, the invention has been described here in as much detail as possible. It will be apparent to those skilled in the art that, in the context and context, the materials used and methods of operation used in the present invention are known in the art unless otherwise indicated.

[0038] Below, the ultrafast transmission electron microscope system and its usage method of the present invention will be further described in conjunction with the accompanying drawings and speci...

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Abstract

The invention provides an ultra-fast transmission electron microscope system which comprises an ultra-fast laser system, an electronic gun, an illuminating system, an imaging system, a sample chamber, a detector and a vacuum device, the ultra-fast transmission electron microscope system can particularly test ultra-fast structure change processes of samples under different laser parameters and environmental temperature, the different laser parameters include different excitation wavelengths, pulse width, laser power, repetitive frequency, sample temperature and the like, acquired signals comprise diffraction, microscopic images, energy loss spectroscopy and the like, and the ultra-fast structure change processes are analyzed by analyzing position and strength of diffraction peaks, image contrast change and the like.

Description

technical field [0001] The invention relates to a transmission electron microscope system, in particular to an ultrafast transmission electron microscope system and a method for using the electron microscope system. Background technique [0002] Transmission electron microscope, referred to as transmission electron microscope, projects the accelerated and focused electron beam onto a very thin sample, and the electrons collide with the atoms in the sample to change their direction, thereby producing solid angle scattering. The size of the scattering angle is related to the density of the sample, The thickness is related, so images with different brightness and darkness can be formed, and the images will be displayed on imaging devices (such as fluorescent screens, films, or photosensitive coupling components) after zooming in and focusing. [0003] Since the invention of the transmission electron microscope in the 1930s, the spatial resolution of the transmission electron mi...

Claims

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Application Information

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IPC IPC(8): G01N23/20
Inventor 李建奇孙帅帅杨槐馨田焕芳曹高龙李中文李星元
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
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