Whole-temperature-range thermoelectric-field transmission electron microscope in-situ sample rod
An electron microscope and sample rod technology, applied in scanning probe technology, instruments, etc., can solve the problems of large heating area, large temperature drift, inaccurate temperature detection, etc., and achieve real-time accurate temperature detection, uniform temperature distribution, and reduced temperature. The effect of thermal drift
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[0029] The present invention will be further described below in conjunction with the accompanying drawings of the description.
[0030] Such as Figure 1-3 As shown, it is a specific embodiment of the present invention. In this implementation, the in-situ sample rod of the thermoelectric two-field transmission electron microscope in the full temperature zone includes a DEWAR fixed ring 1, an upper part of the DEWAR outer tank 2, a lower part of the DEWAR outer tank 3, and a guide pin 4. Sample rod shell 5, sealing ring 6, fixing piece 7, sample rod head 8, upper part of DEWAR inner tank 9, lower part of DEWAR inner tank 10, heating module 11, fixing plate 12, vacuum electrical connector 13, wire hole 14, sample Rod inner rod 15, PCB adapter board 16 and in-situ test chip 17; the upper part 2 of the DEWAR outer tank is sealed and connected with the lower part 3 of the DEWAR outer tank, and the upper part 9 of the DEWAR inner tank passes through the DEWAR fixing ring 1 and the u...
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