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40 results about "Pulse radiation" patented technology

X-ray radiation field detecting device and X-ray radiation field detecting method based on semiconductor laser device

The invention belongs to the field of pulse radiation detection, and particularly relates to an X-ray radiation field detecting device and an X-ray radiation field detecting method based on a semiconductor laser device. The detecting device comprises a radiation detector and laser power measuring and recording equipment. The radiation detector is in optical path connection with the laser power measuring and recording equipment through an optical fiber or a laser focusing and transmitting device. The radiation detector comprises the semiconductor laser device and an external power supply for supplying pre-bias current to the semiconductor laser. The current which is supplied by the external power supply is larger than or equal with the threshold current of the semiconductor laser. The X-ray radiation field detecting device performs direct modulation on active-region carriers of the semiconductor layer by means of X-ray, thereby realizing disturbance on output power of the semiconductor laser. X-ray pulse information is finally acquired through measuring change of an output laser signal. The X-ray radiation field detecting device based on the X-ray radiation field detecting method has advantages of simple structure, low cost, ultra-short response time, etc. Furthermore laser is used as a signal characteristic.
Owner:NORTHWEST INST OF NUCLEAR TECH

Ultrahigh frequency electromagnetic pulse sensor characteristic calibration method and system

The invention discloses an ultrahigh frequency electromagnetic pulse sensor characteristic calibration method and system, and belongs to the technical field of sensor characteristic calibration. According to the ultrahigh-frequency electromagnetic pulse sensor characteristic calibration method based on the single-cone antenna, a mirror single-cone calibration system is formed by constructing a high-power subnanosecond leading-edge pulse source and the mirror single-cone antenna, the high-power subnanosecond leading-edge pulse source is an all-solid-state pulse source based on an avalanche transistor, and the mirror single-cone antenna is an all-solid-state pulse source based on an avalanche transistor. The ultrahigh-frequency electromagnetic pulse sensor calibration device can be used for realizing calibration of an ultrahigh-frequency electromagnetic pulse sensor, so that the leading edge of an output pulse reaches a hundred ps magnitude and the peak voltage reaches a kV magnitude, a high-field-intensity subnanosecond electromagnetic pulse standard field environment can be generated, and calibration of a high-amplitude fast-leading-edge ultrahigh-frequency electromagnetic pulse sensor can be realized. Therefore, the GIS comprehensive pulse radiation environment measurement level is greatly improved, the calibration problem of the high-amplitude fast-leading-edge ultrahigh-frequency electromagnetic pulse measurement sensor is solved, and the scheme is simple, practical, feasible and convenient to implement.
Owner:ELECTRIC POWER RES INST OF STATE GRID ZHEJIANG ELECTRIC POWER COMAPNY +1

Measuring method of up-conversion intermediate energy level lifetime of erbium ions

InactiveCN101788485BAvoiding Double Beam ProblemsAvoid Fast Ion Beam Laser TechnologyFluorescence/phosphorescencePulse radiationUp conversion
The invention discloses a measuring method of up-conversion intermediate energy level lifetime of erbium ions and relates to the measuring method of fluorescence lifetime, and the measuring method can solve the problems that the existing measuring method of the infrared fluorescence lifetime needs an expensive infrared detector, the testing process is complicated, double beams and the delay change between the double beams need to be introduced, and the testing difficulty is great. The method adopts a delay signal generator, a short pulse laser, a high voltage pulse generator, an enhanced charge-coupled device and a grating spectrometer for constituting a testing system, and fluorescence emitted by a tested material by pulse radiation enters into the spectrometer for testing the light intensity; and the corresponding visible light intensities under different excitation frequencies are measured under the condition of keeping the single pulse energy unchanged, an I-1 / f relation map is drawn out, then fitting is carried out by utilizing the formula, and the fitted tau is the up-conversion intermediate energy level lifetime. The single beam is adopted and the visible light detector is used for measuring the infrared energy level fluorescence lifetime, the measuring process is simple, and the measuring method can be used for measuring the fluorescence lifetime of Er3+ doped materials.
Owner:HARBIN INST OF TECH
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