8 results about "Bias tee" patented technology

A non-interferometric thin film lithium niobate electro-optical modulator for data transmission including a laser, configured to generate an input continuous wave light beam; a non-interferometric thin film lithium niobate modulator including an optical waveguide situated along with the coplanar transmission lines and the DC bias conductors. The propagation constant of the optical waveguide is tuned and modulated by the RF data signal and the DC bias voltage traveling on the coplanar transmission lines and the DC bias conductors. The modulator can be tuned at quadrature point by the DC bias voltage. The optical power can be modulated by the RF data signal travelling on the coplanar transmission line; a low noise RF amplifier for data signal amplification; and a bias tee for combining the data signal and DC bias voltage and send them to the coplanar transmission lines.

In the present invention, DAC by means of an R-2R ladder circuit is used in a variable resistance circuit 10b of a low frequency correction circuit 10 to control a control signal of the variable resistance circuit 10b, whereby it becomes possible to correct a low frequency signal component of a pulse signal attenuated in a transmission line from a pulse generator 110 to a bias tee 130 and to supply, to a quantum bit, a DC offset signal added by an addition circuit 10d of the low frequency correction circuit 10. Furthermore, by using the DAC by means of the R-2R ladder circuit in the variable resistance circuit 10b, it is possible to prevent the DC offset signal from changing even when the resistivity of the variable resistance circuit 10b is made to be variable.

A test and measurement system includes a device under test (DUT) interface structured to couple to first and second DUTs that are coupled to form a half bridge circuit. A characterization circuit is controlled to perform static testing and dynamic testing of the first and second DUTs. The characterization circuit includes a solid-state bias tee including the first DUT and a first drive voltage generator that provides a DC pulse signal and AC signal on a gate node of the first DUT to cause the first DUT to supply current and voltage signals to the second DUT for static and dynamic characterization of the second DUT. One characterization circuit can generate, at the same time, the gate charge characterization parameters for one DUT and reverse current path (e.g., body diode) characterization of another DUT.

The invention provides a double-optical-comb signal optical frequency calibration system, and relates to the technical field of optical measurement. The system comprises a bias tee joint, a calibration signal generation module and a frequency resolving module, wherein the calibration signal generation module is composed of a laser, an optical loop and a double-optical-comb unit, and an optical reference signal and comb teeth of an optical frequency comb to be calibrated generate a radio frequency calibration signal in a beat frequency mode; and the frequency resolving module mixes the radio frequency calibration signal with the equidistant radio frequency reference signal generated by the comb signal generator through the mixer, and the optical frequency of the optical frequency comb to be calibrated is determined by the signal calculating unit in combination with the time domain pulse signal collected by the oscilloscope after the frequency is filtered by the band-pass filter. The optical frequency calibration device realizes high-precision and continuous-coverage optical frequency calibration of middle-infrared band double-optical-comb signals, is simple in structure and high in measurement precision, and is suitable for scenes of gas detection, environment monitoring, spectral analysis and the like.

The invention discloses a beam longitudinal distribution measuring device and method, and the device comprises a signal generation unit, a bias three-way device, an electro-optic intensity modulator, a light transmitting unit, a light receiving unit, and a signal processing unit. The inner conductor of the Faraday cup is configured to generate a high-speed voltage signal when the charged particle beam bombards the inner conductor through the opening; the bias three-way device is used for transmitting a high-speed voltage signal; the electro-optic intensity modulator is used for receiving the high-speed voltage signal and an output light signal output by the light emitting unit and outputting a modulated light signal; the light receiving unit is used for receiving the modulated light signal and converting the modulated light signal into a modulated electric signal; and the signal processing unit is used for collecting the modulation electric signal, converting the modulation electric signal into a particle beam digital signal and displaying beam longitudinal distribution of the charged particle beam in real time. High-frequency signal distortion and signal-to-noise ratio reduction in the transmission process are prevented, and the precision of beam longitudinal shape measurement is ensured.

A test and measurement system includes a device under test (DUT) interface structured to couple to first and second DUTs that are coupled to form a half bridge circuit. A characterization circuit is controlled to perform static testing and dynamic testing of the first and second DUTs. The characterization circuit includes a solid-state bias tee including the first DUT and a first drive voltage generator that provides a DC pulse signal and AC signal on a gate node of the first DUT to cause the first DUT to supply current and voltage signals to the second DUT for static and dynamic characterization of the second DUT. One characterization circuit can generate, at the same time, the gate charge characterization parameters for one DUT and reverse current path (e.g., body diode) characterization of another DUT.

Aspects of the subject disclosure may include, for example, a differential biasing device that includes first and second bias tees having respective high-frequency biased terminals, high-frequency unbiased terminals and biasing terminals. The first and second bias tees can be configured at least partially on and / or within different layers of a substrate to facilitate a compact configuration. The layers can include surface layers and / or internal layers that enable an overlapping of at least portions of the first and second bias tees. Other embodiments are disclosed.