Hard-cut measurement circuit and method for dynamic resistance of GaN power tube

By designing a hard cutting measurement circuit, using high-voltage output circuit, high-speed driving circuit and synchronous program control circuit, the rapid and effective measurement of the dynamic resistance of the gallium nitride power tube is achieved, and the problem of the inability to measure dynamic resistance in the existing technology is solved, and the research ability of the working characteristics of the gallium nitride power tube is improved.

CN110794281BActive Publication Date: 2025-03-28BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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Patent Information

Application Number
CN201911143046.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2019-11-20
Publication Date
2025-03-28
Estimated Expiration
2039-11-20

AI Technical Summary

Technical Problem

The prior art cannot effectively measure the dynamic resistance of gallium nitride power tubes under dynamic operation, which affects the study of their working characteristics.

Method used

A hard cutting measurement circuit is designed, including high-voltage output circuit, high-speed driving circuit, synchronous program control circuit, voltage sampling circuit and current sampling circuit. Through fast high-voltage switching and timing synchronization control, the voltage and current value of the gallium nitride power tube under dynamic operation is measured, thereby calculating the dynamic resistance.

Benefits of technology

It realizes fast and effective measurement of dynamic resistance of gallium nitride power tube, supports high-voltage switching speed to within 1 microsecond, and can measure the characteristics of dynamic resistance changes within 10us.

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Abstract

The present invention provides a hard-cut measurement circuit and method for the dynamic resistance of a gallium nitride power tube, comprising: a main circuit connected between the drain and source of the gallium nitride power tube to be measured, the main circuit comprising a current sampling circuit and a high-voltage output circuit connected in series, the high-voltage output circuit is used to provide instantaneous high voltage between the drain and source of the gallium nitride power tube through the main circuit; a high-speed drive circuit that provides a driving voltage to the gate of the gallium nitride power tube to be measured; a synchronous program control circuit that provides synchronous control signals of set timings for the high-speed drive circuit and the high-voltage output circuit, respectively, and controls the driving voltage and the instantaneous high voltage to be synchronously supplied and disconnected according to the timing; a voltage sampling circuit that is connected in parallel to both ends of the drain and source of the gallium nitride power tube to be measured. The present invention can realize rapid high-voltage switching, and supports synchronous control at multiple moments, and can effectively measure the dynamic resistance of the gallium nitride power tube under dynamic working conditions.
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