Self-checking circuit for a fault arc detection device and fault arc self-checking method

Abstract

The application provides a self-checking circuit and a self-checking method for a fault arc detection device, the self-checking circuit for the fault arc detection device comprises: a high-frequency self-checking circuit and a low-frequency self-checking circuit; the high-frequency self-checking circuit comprises a filtering circuit and a first self-checking circuit, the filtering circuit filters the influence of a load power frequency circuit on a fault arc circuit in the case of power-on with the load, and the first self-checking circuit performs high-frequency self-checking on the fault arc circuit in the case of power-on with the load; the low-frequency self-checking circuit comprises a second self-checking circuit, and the second self-checking circuit performs low-frequency self-checking on the fault arc circuit in the case of power-on with the load. The self-checking circuit for the fault arc detection device solves the problem of low self-checking accuracy in the case of power-off. Through the high-frequency self-checking circuit and the low-frequency self-checking circuit, low-frequency and high-frequency signal self-checking is performed on the to-be-tested circuit in the case of power-on with the load, the filtering circuit excludes the influence of the low-frequency signal when detecting the high-frequency signal, and the self-checking accuracy is high.

Description

Technical Field

[0001] This invention belongs to the field of power electrical equipment technology, specifically relating to a self-testing circuit and a self-testing method for fault arc detection devices. Background Technology

[0002] An electric arc is a gas ionization discharge phenomenon, and also a form of plasma. Electric arcs are characterized by very high temperatures, very low currents, and short durations. When an electric arc is generated, it releases a large amount of heat, potentially igniting surrounding flammable and explosive materials, causing a fire or even an explosion. Electric arcs on circuits can be divided into two types: normal operating arcs, called "good arcs," and faulty arcs, called "bad arcs."

[0003] Arc fault detection devices can detect arc faults generated on power lines, thus preventing the hazards caused by these arc faults. Existing arc fault detection devices require self-testing before and after use, but the current self-testing methods are limited and performed under power-off conditions, failing to eliminate the influence of the load's power frequency, making it difficult to accurately determine the functionality of the arc fault detection device. Summary of the Invention

[0004] The purpose of this invention is to overcome the defects in the prior art and provide a self-testing circuit and a self-testing method for a fault arc detection device. This solves the problem that the existing self-testing circuits for fault arc detection devices can only perform self-testing when the power is off, cannot eliminate the influence of the load power frequency, and have low self-testing accuracy.

[0005] To achieve the above objectives, the present invention provides a self-test circuit for a fault arc detection device, comprising: a high-frequency self-test circuit and a low-frequency self-test circuit;

[0006] The high-frequency self-test circuit includes a filter circuit and a first self-test circuit. The filter circuit is used to filter out the influence of the load power frequency circuit on the fault arc circuit under load and power-on conditions. The first self-test circuit is used to perform high-frequency self-test on the fault arc circuit under load and power-on conditions.

[0007] The low-frequency self-test circuit includes a second self-test circuit, which is used to perform a low-frequency self-test on a faulty arc circuit under load and power-on conditions.

[0008] Optionally, it may also include a control chip, a first circuit board, and a second circuit board;

[0009] The first circuit board and the second circuit board are connected vertically.

[0010] The control chip, high-frequency self-test circuit, and low-frequency self-test circuit are mounted on the first circuit board.

[0011] Furthermore, it also includes power supply circuitry;

[0012] The power supply circuit is connected to the second circuit board.

[0013] Furthermore, the power supply circuit includes a power supply voltage conversion circuit, a communication power supply voltage circuit, and a protection circuit.

[0014] Optionally, a communication selection circuit may also be included;

[0015] The communication selection circuit is connected to the port corresponding to the communication selection circuit on the control chip, and the communication selection circuit is disposed on the second circuit board.

[0016] Furthermore, the communication selection circuit includes a CAN communication circuit, a 485 communication circuit, and a protection circuit.

[0017] Optionally, the filter circuit includes a connected group of capacitors and a group of resistors.

[0018] Furthermore, it also includes audible and visual alarm circuits.

[0019] Optionally, the audible and visual alarm circuit includes an indicator light alarm circuit and a buzzer alarm circuit.

[0020] Optionally, a reset button circuit and a self-test start button circuit may also be included;

[0021] The reset button circuit and the self-test start button circuit are respectively connected to their corresponding interfaces on the control chip.

[0022] This invention provides a fault arc self-testing method, in which a simulated pulse signal is input to the input terminal of a fault arc detection device, and the device undergoes self-testing through a high-frequency self-testing circuit, a low-frequency self-testing circuit, and an audible and visual alarm circuit while powered on.

[0023] During high-frequency self-testing, the low-frequency pulse signal of the load is filtered by the filter circuit.

[0024] This invention discloses a self-testing circuit and method for a fault arc detection device. The high-frequency self-testing circuit includes a filter circuit and a first self-testing circuit. The filter circuit filters out the influence of the load power frequency circuit on the fault arc circuit under load. The first self-testing circuit performs a high-frequency self-test on the fault arc circuit under load. The low-frequency self-testing circuit includes a second self-testing circuit, which performs a low-frequency self-test on the fault arc circuit under load. A simulated fault arc pulse signal is transmitted to the input of the self-testing circuit for the fault arc detection device. The simulated pulse signal, through the high-frequency and low-frequency self-testing circuits, performs high-frequency and low-frequency self-tests on the fault arc circuit of the fault arc detection device under load. The filter circuit of the high-frequency self-testing circuit eliminates the influence of the low-frequency signal during the high-frequency self-test under load. Finally, the fault arc detection device is judged by comparing the output pulse signal with the simulated signal. The self-testing accuracy of the arc detection device is high. Attached Figure Description

[0025] Figure 1 A circuit diagram of a high-frequency self-test circuit provided in an embodiment of the present invention;

[0026] Figure 2 A circuit diagram of a low-frequency self-test circuit provided in an embodiment of the present invention;

[0027] Figure 3 A circuit diagram of the control chip provided in an embodiment of the present invention;

[0028] Figure 4 A circuit diagram of a power supply voltage conversion circuit provided in an embodiment of the present invention;

[0029] Figure 5 A circuit diagram of a communication power supply voltage circuit provided in an embodiment of the present invention;

[0030] Figure 6 A circuit diagram of a protection circuit for a power supply circuit provided in an embodiment of the present invention;

[0031] Figure 7 A circuit diagram of a CAN communication circuit provided in an embodiment of the present invention;

[0032] Figure 8 A circuit diagram of a 485 communication circuit provided in an embodiment of the present invention;

[0033] Figure 9 A circuit diagram of an indicator light alarm circuit provided in an embodiment of the present invention;

[0034] Figure 10 A circuit diagram of a buzzer alarm circuit provided in an embodiment of the present invention;

[0035] Figure 11 A circuit diagram of a reset button circuit provided in an embodiment of the present invention;

[0036] Figure 12 The circuit diagram is provided for the self-test start button circuit in an embodiment of the present invention.

[0037] 11. High-frequency self-test circuit; 12. Low-frequency self-test circuit; 13. Control chip; 14. Power supply circuit; 15. Communication selection circuit; 16. Audible and visual alarm circuit; 17. Reset button circuit; 18. Self-test start button circuit; 111. Filter circuit; 112. First self-test circuit; 113. Capacitor group; 114. Resistor group; 121. Second self-test circuit; 141. Power supply voltage conversion circuit; 142. Communication power supply voltage circuit; 143. Protection circuit; 151. CAN communication circuit; 152. 485 communication circuit; 161. Indicator light alarm circuit; 162. Buzzer alarm circuit. Detailed Implementation

[0038] The self-testing circuit and self-testing method for the fault arc detection device of the present invention will be described in detail below with reference to the accompanying drawings.

[0039] Figure 1 A circuit diagram of a high-frequency self-test circuit provided in an embodiment of the present invention; Figure 2 A circuit diagram of a low-frequency self-test circuit provided in an embodiment of the present invention; Figure 3 A circuit diagram of the control chip provided in an embodiment of the present invention; Figure 4 A circuit diagram of a power supply voltage conversion circuit provided in an embodiment of the present invention; Figure 5 A circuit diagram of a communication power supply voltage circuit provided in an embodiment of the present invention; Figure 6 A circuit diagram of a protection circuit for a power supply circuit provided in an embodiment of the present invention; Figure 7 A circuit diagram of a CAN communication circuit provided in an embodiment of the present invention; Figure 8 A circuit diagram of a 485 communication circuit provided in an embodiment of the present invention; Figure 9 A circuit diagram of an indicator light alarm circuit provided in an embodiment of the present invention; Figure 10 A circuit diagram of a buzzer alarm circuit provided in an embodiment of the present invention; Figure 11 A circuit diagram of a reset button circuit provided in an embodiment of the present invention; Figure 12 The circuit diagram is provided for the self-test start button circuit in an embodiment of the present invention.

[0040] like Figures 1-12As shown, Embodiment 1 of the present invention provides a self-test circuit for a fault arc detection device, including: a high-frequency self-test circuit 11 and a low-frequency self-test circuit 12; the high-frequency self-test circuit 11 includes a filter circuit 111 and a first self-test circuit 112, the filter circuit 111 is used to filter out the influence of the load power frequency circuit on the fault arc circuit under load, and the first self-test circuit 112 is used to perform high-frequency self-test on the fault arc circuit under load; the low-frequency self-test circuit 12 includes a second self-test circuit 121, the second self-test circuit 121 is used to perform low-frequency self-test on the fault arc circuit under load.

[0041] The simulated fault arc pulse signal is sent to the input terminal of the self-test circuit of the fault arc detection device. The simulated pulse signal passes through the high-frequency self-test circuit 11 and the low-frequency self-test circuit 12 to perform high-frequency and low-frequency self-tests on the fault arc circuit of the fault arc detection device under load. The filter circuit 111 of the high-frequency self-test circuit 11 eliminates the influence of low-frequency signals during the high-frequency self-test under load. Finally, the fault arc detection device is judged by comparing the output pulse signal with the simulated signal. The self-test accuracy of the arc self-test device is high.

[0042] The self-testing circuit for the fault arc detection device provided by the present invention performs a self-test on the fault arc detection device under power-on and load conditions. It can also perform a self-test on the fault arc detection device sequentially through the high-frequency self-testing circuit 11 and the high-frequency self-testing circuit 12. It is worth mentioning that the high-frequency self-testing circuit 11 is provided with a filter circuit 111. The filter circuit 111 can eliminate the influence of low-frequency signals generated by the load and avoid the problem of poor accuracy of the self-testing results.

[0043] The low-frequency self-test circuit 12 can also be equipped with a filter circuit 111 to eliminate the influence of high-frequency signals generated by the load under power-on conditions, thereby avoiding the problem of poor accuracy of self-test results. It is worth mentioning that the filtering of the low-frequency self-test circuit 12 can be software filtering, which removes the influence of high-frequency signals through data algorithm analysis.

[0044] It is worth mentioning that the self-testing circuit for the fault arc detection device provided by the present invention can perform self-tests on both single-phase fault arc detection devices and three-phase fault arc detection devices.

[0045] Optionally, it also includes a control chip 13, a first circuit board and a second circuit board; the first circuit board and the second circuit board are connected vertically; the control chip 13, the high-frequency self-test circuit 11 and the low-frequency self-test circuit 12 are disposed on the first circuit board.

[0046] The various functional circuits of the arc self-testing device are connected by inserting the first circuit board and the second circuit board into each other. The chip, high-frequency self-testing circuit 11 and low-frequency self-testing circuit 12 are set on the first circuit board and can be connected to the power supply circuit 14 set on the second circuit board, so as to realize the smooth sequential self-testing of the entire self-testing circuit for the fault arc detection device.

[0047] The first circuit board and the second circuit board are arranged sequentially from top to bottom and are plugged into each other to enable the functional circuits fixed on the first circuit board and the second circuit board to be connected and to perform sequential functional tests.

[0048] Furthermore, it also includes a power supply circuit 14; the power supply circuit 14 is connected to the second circuit board.

[0049] The included power supply circuit 14 provides power to the self-test circuit of the entire fault arc detection device, so that the self-test operation of the self-test circuit of the fault arc detection device is performed under power.

[0050] Furthermore, the power supply circuit 14 includes a power supply voltage conversion circuit 141, a communication power supply voltage circuit 142, and a protection circuit 143.

[0051] The power supply voltage conversion circuit 141 is set to realize the conversion of power supply voltage to meet the power supply requirements of actual fault arc self-test operation; the communication power supply voltage circuit 142 is set to supply the power required for communication; the protection power supply is set to protect the power output and realize the stability of the power output.

[0052] Optionally, a communication selection circuit 15 is also included; the communication selection circuit 15 is connected to the port corresponding to the communication selection circuit 15 on the control chip 13, and the communication selection circuit 15 is disposed on the second circuit board.

[0053] By connecting the communication selection circuit 15 to the port corresponding to the communication selection circuit 15 on the control chip 13, the communication selection circuit 15 is set on the second circuit board, realizing the communication connection between the self-test circuit of the fault arc detection device and the external host computer display mechanism, and realizing the rapid transmission and display of the self-test results of the self-test circuit of the fault arc detection device.

[0054] Furthermore, the communication selection circuit 15 includes a CAN communication circuit 151, a 485 communication circuit 152, and a protection circuit 143.

[0055] By including the CAN communication circuit 151, the 485 communication circuit 152, and the protection circuit 143 in the communication selection circuit, the self-test circuit for the fault arc detection device can be adapted to the communication requirements under various communication protocols, thus meeting diverse usage needs.

[0056] Optionally, the filter circuit 111 includes a connected capacitor bank 113 and a resistor bank 114.

[0057] By including capacitor bank 113 and resistor bank 114 in the filter circuit 111, the capacitor bank 113 and resistor bank 114 can improve power quality and enhance communication reliability.

[0058] Furthermore, it also includes an audible and visual alarm circuit 16.

[0059] Optionally, the audible and visual alarm circuit 16 includes an indicator light alarm circuit 161 and a buzzer alarm circuit 162.

[0060] By setting up an indicator light alarm circuit 161 and a buzzer alarm circuit 162, when a faulty arc is detected by the faulty arc detection device, a light alarm and a buzzer alarm can be quickly issued. The alarm signal is obvious and the alarm effect is good.

[0061] Optionally, it also includes a reset button circuit 17 and a self-test start button circuit 18; the reset button circuit 17 and the self-test start button circuit 18 are respectively connected to their corresponding interfaces on the control chip 13.

[0062] The reset button circuit 17 is activated when the manual reset button is pressed, enabling the reset operation of the self-test circuit of the fault arc detection device and allowing for multiple cyclic reset operations. The self-test start button circuit 18 is activated when the manual self-test start button is pressed, enabling the self-test start of the self-test circuit of the fault arc detection device, achieving intelligent and rapid start-up and improving the performance.

[0063] The reset button and the self-test start button can be different colors to distinguish them.

[0064] The reset button and the self-test start button are both connected to the control chip 13, so that when the button is manually operated, the control chip 13 receives the signal and transmits the control signal to the reset button or the self-test start button to realize automatic control start and reset self-test.

[0065] The present invention provides a fault arc self-testing method, wherein a simulated pulse signal is input to the input terminal of the fault arc detection device, and the device undergoes self-testing through a high-frequency self-testing circuit 11, a low-frequency self-testing circuit 12, and an audible and visual alarm circuit 16 when powered on; during the high-frequency self-test, the low-frequency pulse signal of the load is filtered by a filtering circuit 111.

[0066] The present invention utilizes a self-testing circuit for a fault arc detection device to detect fault arcs in the fault arc detection device. The self-testing circuit for the fault arc detection device includes an audible and visual alarm circuit 16, a low-frequency self-testing circuit 12, and a high-frequency self-testing circuit 11.

[0067] Each circuit testing section is executed sequentially. Clicking the self-test start button enters the self-test start button circuit, and clicking the reset button enters the reset button circuit 17. After the self-test is completed, the flashing of the yellow fault indicator light indicates whether there is a fault in the current circuit and what the fault is, which facilitates on-site testing and maintenance of the equipment.

[0068] Audible and visual alarm circuit 16: The software self-test function enables all LEDs to flash 3 times and then remain lit, and enables the buzzer to sound for 1 second and then stop.

[0069] Low-frequency self-test circuit 12: The software self-test function generates a low-frequency simulated arc signal through the hardware test circuit. By analyzing and comparing the received simulated arc waveform, the low-frequency detection circuit of the current fault arc is judged to be normal.

[0070] High-frequency self-test circuit 11: The software self-test function generates a high-frequency simulated arc signal through the hardware test circuit. By analyzing and comparing the received simulated arc waveform, it determines whether the current fault arc high-frequency detection circuit is normal.

[0071] Information communication bus transmission circuit: The software self-test function can normally receive and send arc status data through the electrical fire alarm host or host computer.

[0072] Under normal operating conditions of the arc fault detection device and without disconnecting the power supply to the downstream circuit, the arc fault detection function is monitored online in real time using the set arc self-test circuit and software self-test function. This improves the product's testability and maintainability.

[0073] In summary, the present invention provides a self-testing circuit and a self-testing method for a fault arc detection device. The simulated fault arc pulse signal is transmitted to the input of the self-testing circuit of the fault arc detection device. The simulated pulse signal, through a high-frequency self-testing circuit 11 and a low-frequency self-testing circuit 12, performs high-frequency and low-frequency self-tests on the fault arc circuit of the fault arc detection device under load. Furthermore, the filtering circuit 111 of the high-frequency self-testing circuit 11 eliminates the influence of low-frequency signals during the high-frequency self-test under load. Finally, the fault arc detection device is judged by comparing the output pulse signal with the simulated signal. The self-testing accuracy of the arc detection device is high.

[0074] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A self-test circuit for a fault arc detection device, used to perform a self-test when the fault arc detection device is in operation and energized under load, characterized in that, include: The system includes a high-frequency self-test circuit and a low-frequency self-test circuit. The high-frequency self-test circuit comprises a filter circuit and a first self-test circuit. The filter circuit is used to filter out the influence of the load power frequency circuit on a faulty arc circuit under load. The first self-test circuit is used to perform a high-frequency self-test on the faulty arc circuit under load. The low-frequency self-test circuit includes a second self-test circuit, which is used to perform a low-frequency self-test on the faulty arc circuit under load. The filter circuit includes a connected capacitor bank and a resistor bank. The low-frequency self-test circuit is equipped with a first filter circuit, which is a software filter that removes the influence of high-frequency signals through data algorithm analysis. It also includes a control chip, a first circuit board, and a second circuit board; the first and second circuit boards are connected vertically; the control chip, the high-frequency self-test circuit, and the low-frequency self-test circuit are disposed on the first circuit board. It also includes a power supply circuit; the power supply circuit is connected to the second circuit board; It also includes a communication selection circuit; the communication selection circuit is connected to the port corresponding to the communication selection circuit on the control chip, and the communication selection circuit is disposed on the second circuit board.

2. The self-test circuit for a fault arc detection device according to claim 1, characterized in that, Therefore, power supply circuits include power voltage conversion circuits, communication power voltage circuits, and protection circuits.

3. The self-test circuit for a fault arc detection device according to claim 1, characterized in that, The communication selection circuit includes a CAN communication circuit and a 485 communication circuit.

4. The self-test circuit for a fault arc detection device according to claim 1, characterized in that, It also includes audible and visual alarm circuits.

5. The self-test circuit for a fault arc detection device according to claim 4, characterized in that, The audible and visual alarm circuit includes an indicator light alarm circuit and a buzzer alarm circuit.

6. The self-test circuit for a fault arc detection device according to claim 1, characterized in that, It also includes a reset button circuit and a self-test start button circuit; the reset button circuit and the self-test start button circuit are respectively connected to their corresponding interfaces on the control chip.

7. A method for self-detection of fault arcs, characterized in that, Based on the self-test circuit for the fault arc detection device according to any one of claims 1-6, a simulated pulse signal is input to the input terminal of the fault arc detection device. Under the condition of being powered on with a load, the device undergoes self-testing through a high-frequency self-test circuit, a low-frequency self-test circuit, and an audible and visual alarm circuit. During the high-frequency self-test, the low-frequency pulse signal of the load is filtered through a filtering circuit.

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