A rail eddy current flaw detection device

Abstract

The invention discloses a rail eddy current flaw detection device, comprising a frame, a rail head tread flaw detection landing gear, a rail head side flaw detection landing gear, a rail head arc area flaw detection landing gear, a rail bottom side flaw detection landing gear and a rail bottom flaw detection landing gear, wherein the rail head tread flaw detection landing gear is provided with an HT eddy current probe that can be aligned with one side of the rail head tread, the rail head side flaw detection landing gear is provided with an H eddy current probe that can be aligned with one side of the rail head, the rail head arc area flaw detection landing gear is provided with an HC eddy current probe that can be aligned with one side of the arc area, the rail bottom side flaw detection landing gear is provided with an FC eddy current probe that can be aligned with one side of the rail bottom, and the rail bottom flaw detection landing gear is provided with an F probe that can be aligned with the rail bottom. The beneficial effects of the invention are as follows: the scheme utilizes a plurality of flaw detection brackets to drive eddy current probes to be distributed on both sides of the rail head, both sides of the rail head tread, both sides of the rail head arc area, both sides of the rail bottom side and below the rail bottom, so as to realize multi-directional comprehensive flaw detection and improve the flaw detection accuracy.

Description

Technical Field

[0001] The invention relates to the technical field of eddy current flaw detection, in particular to a rail eddy current flaw detection device. Background Art

[0002] Eddy current testing is a non-destructive testing technology that uses an AC electromagnetic coil to induce eddy currents on the surface of metal components. It is suitable for defect detection of conductive materials, including ferromagnetic and non-ferromagnetic metal materials. Due to eddy current testing, the coil and the component are not required to be in close contact during detection, nor is it necessary to fill the space between the coil and the component with coupling agent, which makes it easy to realize automatic inspection. However, eddy current testing is only applicable to conductive materials and can only detect defects on the surface or near the surface layer, which is inconvenient to use for components with complex shapes. The detection depth and detection sensitivity are also contradictory. Before conducting the test, it is necessary to make a comprehensive consideration based on the material, surface state, and detection standard of the object to be tested. When using a through-type coil for detection, the specific position of the defect on the circumference cannot be determined. Summary of the invention

[0003] In order to overcome the deficiencies of the prior art, the object of the present invention is to provide a rail eddy current flaw detection device for realizing all-round flaw detection of the rail and improving the flaw detection accuracy and efficiency.

[0004] The present invention is realized by the following technical scheme: a rail eddy current flaw detection device comprises a frame, two rail head tread flaw detection landing gears arranged on the frame, two rail head side flaw detection landing gears arranged on the frame, two rail head circular arc area flaw detection landing gears arranged on the frame, two rail bottom side flaw detection landing gears arranged on the frame and a rail bottom flaw detection landing gear arranged on the frame, wherein the rail head tread flaw detection landing gear is provided with an HT eddy current probe which can be aligned with one side of the rail head tread, the rail head side flaw detection landing gear is provided with an H eddy current probe which can be aligned with one side of the rail head, the rail head circular arc area flaw detection landing gear is provided with an HC eddy current probe which can be aligned with one side of the circular arc area, the rail bottom side flaw detection landing gear is provided with an FC eddy current probe which can be aligned with one side of the rail bottom, and the rail bottom flaw detection landing gear is provided with an F probe which can be aligned with the rail bottom.

[0005] Furthermore, in order to better realize the present invention, the rail head and tread flaw detection landing gear includes an HT mechanical arm, an HT horizontal axis arranged in the HT mechanical arm, an HT mounting seat slidably arranged on the HT horizontal axis, an HT lifting axis arranged on the HT mounting seat, an HT probe mounting plate slidably arranged on the HT lifting axis, and an HT eddy current probe arranged on the HT probe mounting plate and aligned with the rail head and tread, and the HT probe mounting plate is provided with a probe adjustment device that is transmission-connected to the HT eddy current probe.

[0006] Furthermore, in order to better realize the present invention, the probe adjustment device includes an adjustment shell arranged on the HT probe mounting plate, an adjustment seat arranged on the HT probe mounting plate and located above the adjustment shell, and an adjustment threaded rod arranged in the adjustment shell and passing through the adjustment seat, the adjustment threaded rod is threadedly connected with an HT adjustment nut, and the HT eddy current probe is connected to the HT adjustment nut.

[0007] Furthermore, in order to better realize the present invention, the rail head side flaw detection landing gear includes an H mechanical arm, an H horizontal axis arranged in the H mechanical arm, an H mounting seat slidably arranged on the H horizontal axis, an H lifting axis arranged on the H mounting seat, an H probe mounting plate slidably arranged on the H lifting axis, and an H eddy current probe arranged on the H probe mounting plate and aligned with the rail head side.

[0008] Furthermore, in order to better realize the present invention, an H positioning support is connected below the H probe mounting plate, and an H horizontal positioning wheel with a horizontal axis is rotatably provided on the H positioning support, and an H vertical positioning wheel with a vertical axis is rotatably provided on the H positioning support. The H horizontal positioning wheel and the H vertical positioning wheel can be rollingly connected to the rail at the same time.

[0009] Furthermore, in order to better realize the present invention, the rail head arc area flaw detection landing gear includes an HC mechanical arm, an HC horizontal axis arranged in the HC mechanical arm, an HC mounting seat slidably arranged on the HC horizontal axis, an HC lifting axis arranged on the HC mounting seat, an HC probe mounting plate connecting seat slidably arranged on the HC lifting axis, an HC sliding shaft slidably arranged in the HC mounting seat and connected to the HC probe mounting plate connecting seat, an HC positioning support arranged on the HC sliding shaft, and an HC probe mounting structure arranged on the HC positioning support.

[0010] Furthermore, in order to better realize the present invention, the HC positioning support is rotatably provided with an HC horizontal positioning wheel with a horizontal axis, and the HC positioning support is rotatably provided with an HC vertical positioning wheel with a vertical axis, and the HC horizontal positioning wheel and the HC vertical positioning wheel can be rollingly connected to the rail at the same time.

[0011] Furthermore, in order to better realize the present invention, the rail bottom side flaw detection landing gear includes a FC mechanical arm, a FC sliding shaft arranged in the FC mechanical arm along the horizontal direction, a FC base slidably arranged on the FC sliding shaft, a FC vertical shaft slidably arranged on the FC base along the vertical direction, and a FC probe mounting base arranged at the top of the FC vertical shaft and used to install the FC eddy current probe.

[0012] Furthermore, in order to better realize the present invention, the bottom end of the FC vertical axis is connected to a FC vertical axis support seat, a cylinder is arranged between the FC vertical axis support seat and the FC base, the cylinder body of the cylinder is connected to the FC vertical axis support seat, and the piston rod of the cylinder is transmission-connected to the FC base.

[0013] Furthermore, in order to better realize the present invention, the rail bottom flaw detection landing gear includes an F mechanical arm, an F horizontal sliding shaft arranged in the F mechanical arm, an F slide seat slidably arranged on the F horizontal sliding shaft, an F vertical sliding shaft slidably arranged in the F slide seat along the vertical direction, an F base arranged at the bottom of the F vertical sliding shaft, an F mounting plate arranged on the F base, an F probe mounting seat arranged on the F mounting plate, and an F probe arranged on the F probe mounting seat, the F base is provided with an F cylinder transmission-connected to the F probe mounting seat, and an F spring is connected between the F base and the F slide seat.

[0014] The beneficial effects achieved by this program are:

[0015] This solution utilizes multiple flaw detection brackets to drive eddy current probes distributed on both sides of the rail head, both sides of the rail head tread, both sides of the rail head arc area, both sides of the rail bottom side and below the rail bottom, which can realize multi-directional comprehensive flaw detection and is conducive to improving the flaw detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the structure of this scheme;

[0017] Figure 2 It is a three-dimensional schematic diagram of the landing gear for rail head and tread flaw detection;

[0018] Figure 3 for Figure 2 Right view of;

[0019] Figure 4 for Figure 2 The main view;

[0020] Figure 5 for Figure 2 A magnified image of point A;

[0021] Figure 6 for Figure 2 A magnified view of point B;

[0022] Figure 7 It is a three-dimensional schematic diagram of the landing gear for side flaw detection of the rail head;

[0023] Figure 8 for Figure 7 Right view of;

[0024] Fig. 9 for Figure 7 The main view;

[0025] Fig.10 for Figure 7 A magnified image of point A;

[0026] Fig.11 for Fig. 9 A magnified view of point B;

[0027] Fig.12 It is a three-dimensional schematic diagram of the landing gear for flaw detection in the arc area of ​​the rail head;

[0028] Fig.13 for Fig.12 Right view of;

[0029] Fig.14 for Fig.12 The main view;

[0030] Fig.15 for Fig.12 A magnified image of point A;

[0031] Fig.16 It is a three-dimensional schematic diagram of the landing gear for flaw detection on the bottom side of the rail;

[0032] Fig.17 for Fig.16 A magnified image of point A;

[0033] Fig.18 A three-dimensional schematic diagram of this scheme;

[0034] Fig.19 This is a schematic diagram of the structure of this scheme;

[0035] Among them, 11-HT mechanical arm, 12-HT external board, 13-HT mounting seat, 14-HT horizontal axis, 15-HT probe mounting plate, 16-probe adjustment device, 161-adjustment shell, 162-adjustment seat, 163-adjustment threaded rod, 19-HT eddy current probe, 110-HT probe mounting plate drive structure, 1101-HT probe mounting plate connecting seat, 1102-HT adjustment plate, 1103-HT linkage protrusion, 1104-HT waist hole, 1105-HT mounting plate locking screw, 1106-HT mounting plate pressure plate, 1107-HT adjustment nut, 1108-HT adjustment screw, 1109-HT adjustment protrusion, 112-HT lifting shaft, 1121-HT spring, 113-HT lift, 115-HT horizontal drive structure, 116- HT slide shaft, 117-HT slide shaft mounting seat, 119-HT positioning support, 120-HT vertical positioning wheel, 121-HT horizontal positioning wheel, 122-HT lifting sleeve;

[0036] 21-H mechanical arm, 22-H external plate, 23-H mounting seat, 24-H horizontal axis, 25-H probe mounting plate, 29-H eddy current probe, 210-H probe mounting plate driving structure, 2101-H probe mounting plate connecting seat, 2102-H adjustment plate, 2103-H linkage convex block, 2104-H waist-shaped hole, 2105-H mounting plate locking screw, 2106-H mounting plate pressure plate, 2107-H adjusting nut, 2108-H adjusting screw, 2109-H adjusting convex block, 212-H lifting shaft, 2121-H spring, 213-H lift, 215-H horizontal driving structure, 216-H sliding shaft, 217-H sliding shaft mounting seat, 219-H positioning support, 220-H vertical positioning wheel, 221-H horizontal positioning wheel, 222-H lifting sleeve;

[0037] 31-HC mechanical arm, 32-HC external plate, 33-HC mounting seat, 34-HC horizontal axis, 35-HC probe mounting plate, 351-HC probe mounting seat, 352-HC adjustment slide seat, 353-HC probe adjustment screw, 354-HC probe support block, 355-HC probe mounting rod, 356-HC probe adjustment roller, 39-HC eddy current probe, 310-HC probe mounting plate drive structure, 3101-HC probe mounting plate connecting seat, 312-HC lifting shaft, 3121-HC spring, 313-HC lift, 315-HC horizontal driving structure, 316-HC sliding shaft, 317-HC sliding shaft mounting seat, 319-HC positioning support, 320-HC vertical positioning wheel, 321-HC horizontal positioning wheel, 322-HC lifting sleeve;

[0038] 41-FC mechanical arm, 42-FC external plate, 43-FC sliding shaft, 44-FC base, 45-FC cylinder, 46-FC vertical shaft support seat, 47-FC vertical shaft, 48-FC probe mounting seat, 49-FC vertical roller, 410-FC horizontal roller, 411-FC horizontal drive structure, 412-FC spring, 4121-FC adjustment base, 4122-FC adjustment slide seat, 4123-FC adjustment screw, 4124-FC adjustment rod, 4125-FC roller limit seat, 4126-FC limit roller;

[0039] 51-F robotic arm, 52-F horizontal slide shaft, 53-H external plate, 54-F slide seat, 541-F vertical slide shaft, 55-F roller frame, 551-F rail bottom roller, 552-F rail bottom side roller, 553-F base, 56-F mounting plate, 561-F connecting rod, 562-F connecting rod support, 57-F connecting plate, 58-F probe mounting seat, 59-F probe mounting plate, 591-F probe adjustment seat, 592-F wedge block, 593-F threaded adjustment rod, 510-F cylinder, 511-F cylinder support, 512-F cylinder support limit seat, 513-F connecting plate guide wheel, 515-F spring, 516-F probe, 6-frame, 7-track. DETAILED DESCRIPTION

[0040] The present invention is further described in detail below in conjunction with examples, but the embodiments of the present invention are not limited thereto.

[0041] Embodiment 1:

[0042] like Figure 1 As shown, in this embodiment, a rail eddy current flaw detection device includes a frame 6, two rail head tread flaw detection landing gears arranged on the frame 6, two rail head side flaw detection landing gears arranged on the frame 6, two rail head arc area flaw detection landing gears arranged on the frame 6, two rail bottom side flaw detection landing gears arranged on the frame 6 and a rail bottom flaw detection landing gear arranged on the frame 6, the rail head tread flaw detection landing gear is provided with an HT eddy current probe 19 that can be aligned with one side of the rail head tread, the rail head side flaw detection landing gear is provided with an H eddy current probe 29 that can be aligned with one side of the rail head, the rail head arc area flaw detection landing gear is provided with an HC eddy current probe 39 that can be aligned with one side of the arc area, the rail bottom side flaw detection landing gear is provided with an FC eddy current probe that can be aligned with one side of the rail bottom, and the rail bottom flaw detection landing gear is provided with an F probe 516 that can be aligned with the rail bottom.

[0043] During flaw detection, the rail is moved into the frame 6, and the driving structure on the rail head tread flaw detection landing gear is used to drive the HT eddy current probe 19 to move to both sides of the rail head tread, and the rail head side flaw detection landing gear is used to drive the H eddy current probe 29 to move to both sides of the rail head side, and the rail head arc area flaw detection landing gear is used to drive the HC eddy current probe 39 to move to both sides of the rail head arc area, and the rail bottom side flaw detection landing gear is used to drive the FC eddy current probe to move to both sides of the rail bottom side, and the rail bottom flaw detection landing gear is used to drive the F probe 516 to move below the rail bottom. After the HT eddy current probe 19, the H eddy current probe 29, the HC eddy current probe 39, the FC eddy current probe, and the F probe 516 are all moved into place, the probe is turned on and the rail is continued to be driven to move. During the movement of the rail, the probe performs flaw detection on the rail until the tail of the rail leaves the last probe.

[0044] In this embodiment, a track 7 is provided below the rack 6, so that the rack 6 is slidably arranged on the track 7, so that the relative position of the rack 6 and the track 7 can be adjusted. A limiting structure can be provided on the track 7, and the limiting structure is used to limit the extreme movement position of the rack 6 to prevent the rack 6 from derailing.

[0045] Embodiment 2:

[0046] like Figure 2 , Figure 3 , Figure 4 As shown, on the basis of the above embodiments, in this embodiment, the rail head tread flaw detection landing gear includes an HT mechanical arm 11, an HT horizontal axis 14 arranged in the HT mechanical arm 11, an HT mounting seat 13 slidably arranged on the HT horizontal axis 14, an HT lifting axis 112 arranged on the HT mounting seat 13, an HT probe mounting plate 15 slidably arranged on the HT lifting axis 112, and an HT eddy current probe 19 arranged on the HT probe mounting plate 15 and aligned with the rail head tread, and the HT probe mounting plate 15 is provided with a probe adjustment device 16 which is transmission-connected to the HT eddy current probe 19.

[0047] The HT mechanical arm 11 is fixedly mounted on the frame, and the position of the HT eddy current probe 19 is adjusted by the relative sliding of the HT horizontal axis 14 and the HT mounting seat 13, and the relative sliding of the HT lifting axis 112 and the HT probe mounting plate 15. When the rail needs to be inspected, the rail to be inspected is transported to the frame, and the HT eddy current probe 19 is aligned with the rail head tread of the rail by controlling the movement of the HT probe mounting plate 15. At this time, the HT eddy current probe 19 can be used to inspect the rail head tread. During the inspection process, the HT eddy current probe 19 and the rail are relatively moved along the length direction of the rail. The probe adjustment device 16 can be used to accurately adjust the relative position of the HT eddy current probe 19 and the rail, so that the HT eddy current probe 19 and the rail maintain the required position accuracy, so as to improve the inspection accuracy. After the tail end of the rail passes under the HT eddy current probe 19, the HT eddy current probe 19 is controlled to return to its original position.

[0048] HT external plates 12 are provided on both sides of the HT mechanical arm 11, and the HT external plates 12 are provided with HT horizontal driving structures 115 for driving the HT mounting seat 13 to move along the HT horizontal axis 14. In this embodiment, the HT horizontal driving structure 115 can adopt a lift, and the lift is used as a power source to control the relative sliding of the HT horizontal axis 14 and the HT mounting seat 13, so as to achieve the purpose of coarse adjustment. The HT horizontal driving structure 115 can be provided with a cylinder that is transmission-connected to the HT mounting seat 13. When the distance between the HT eddy current probe 19 and the rail reaches a certain range by adjusting the position of the HT mounting seat 13, the cylinder is used to push or pull the HT mounting seat 13 to achieve the purpose of precise adjustment.

[0049] Embodiment 3:

[0050] On the basis of the above embodiments, in this embodiment, the probe adjustment device 16 includes an adjustment shell 161 arranged on the HT probe mounting plate 15, an adjustment seat 162 arranged on the HT probe mounting plate 15 and located above the adjustment shell 161, and an adjustment threaded rod 163 arranged in the adjustment shell 161 and passing through the adjustment seat 162, the adjustment threaded rod 163 is threadedly connected with an HT adjustment nut, and the HT eddy current probe 19 is connected to the HT adjustment nut.

[0051] The adjustment seat 162 is used to limit the movement of the adjustment threaded rod 163. By rotating the adjustment threaded rod 163, the HT adjustment nut can be driven to move along the length direction of the adjustment threaded rod 163, so that the HT eddy current probe 19 can be driven to move as a whole by the HT adjustment nut, so as to facilitate the fine adjustment of the position of the HT eddy current probe 19 before detection, and ensure the relative position accuracy of the HT eddy current probe 19 and the rail during the detection process. The adjustment housing 161 can isolate and protect the internal structure, and prevent impurities from falling into the adjustment threaded rod 163 or the HT adjustment nut to aggravate wear or cause jamming.

[0052] Embodiment 4:

[0053] On the basis of the above embodiments, in this embodiment, an HT positioning support 119 is connected below the HT probe mounting plate 15, and an HT horizontal positioning wheel 121 with a horizontal axis is rotatably provided on the HT positioning support 119, and an HT vertical positioning wheel 120 with a vertical axis is rotatably provided on the HT positioning support 119, and the HT horizontal positioning wheel 121 and the HT vertical positioning wheel 120 can be simultaneously connected to the rail in a rolling manner.

[0054] When the HT probe mounting plate 15 is controlled to drive the HT eddy current probe 19 to move, the HT horizontal positioning wheel 121 contacts the upper surface of the rail, and the HT vertical positioning wheel 120 contacts the side of the rail head, so as to limit the HT eddy current probe 19, thereby effectively improving the relative position accuracy of the HT eddy current probe 19 and the rail, and when the HT eddy current probe 19 moves relative to the rail, the relative position accuracy of the HT eddy current probe 19 and the rail can be maintained, thereby avoiding the relative position of the HT eddy current probe 19 and the rail changing and affecting the detection accuracy.

[0055] Embodiment 5:

[0056] On the basis of the above embodiment, in this embodiment, an HT sliding shaft 116 is slidably provided on the HT mounting seat 13 in the vertical direction, and an HT sliding shaft mounting seat 117 connected to the HT probe mounting plate 15 is connected below the HT sliding shaft 116 .

[0057] By connecting the HT slide shaft mounting seat 117 to the HT probe mounting plate 15 and the HT slide shaft 116, the bottom of the HT probe mounting plate 15 can be supported, thereby improving the position accuracy and stability of the HT probe mounting plate 15. The HT slide shaft 116 is slidably connected to the HT mounting seat 13, and when the height position of the HT probe mounting plate 15 is adjusted, the movement of the HT probe mounting plate 15 can be guided and limited, thereby improving the movement accuracy of the HT probe mounting plate 15 and the movement accuracy of the HT eddy current probe 19.

[0058] The number of HT sliding shafts 116 can be two and they are symmetrically distributed on both sides of the HT lifting shaft 112 .

[0059] Embodiment 6:

[0060] On the basis of the above embodiment, in this embodiment, an HT lift 113 is slidably provided on the HT lift shaft 112, and the HT lift 113 is drivingly connected with an HT lift sleeve 122 sleeved on the HT lift shaft 112, and the HT probe mounting plate 15 is connected to the HT lift sleeve 122. The HT lift 113 is used as a power source for the up and down movement of the HT probe mounting plate 15, and the HT lift 113 is driven to move the HT probe mounting plate 15 up and down by the up and down movement of the HT lift 113 relative to the HT lift shaft 112, so that the overall height of the HT probe mounting plate 15 can be adjusted according to rails of different rail types.

[0061] Embodiment 7:

[0062] like Figure 5 , Figure 6 As shown, based on the above embodiment, in this embodiment, the HT probe mounting plate 15 is rotatably arranged on the HT slide shaft mounting seat 117. In this way, the angular deviation between the HT eddy current probe 19 and the rail head tread can be adjusted by rotating the HT probe mounting plate 15, so as to improve the position accuracy of the HT eddy current probe 19 and the rail, or adjust the angular deviation between the HT eddy current probe 19 and the rail according to the actual detection requirements.

[0063] In this embodiment, an HT probe mounting plate driving structure 110 for driving the HT probe mounting plate 15 to rotate is provided on the HT lifting sleeve 122. The HT probe mounting plate driving structure 110 includes an HT probe mounting plate connecting seat 1101 provided on the HT lifting sleeve 122, an HT adjusting plate 1102 provided on the HT probe mounting plate connecting seat 1101, an HT adjusting protrusion 1109 provided on the HT adjusting plate 1102, and two HT linkage protrusions 1103 provided on the HT probe mounting plate 15. The two HT linkage protrusions 1103 are respectively located on both sides of the HT adjusting protrusion 1109, and an HT adjusting screw 1108 penetrating the HT linkage protrusion 1103 and the HT adjusting protrusion 1109 is provided between the two HT linkage protrusions 1103.

[0064] The HT adjustment protrusion 1109 is provided with a groove, and the groove is provided with an HT adjustment nut 1107 threadedly connected to the HT adjustment screw 1108 .

[0065] The HT adjusting nut 1107 is rotated. Since the HT adjusting nut 1107 is restricted in the groove, the HT adjusting screw 1108 can be controlled to move left and right. The HT adjusting screw 1108 drives the HT probe mounting plate 15 to rotate through the HT linkage protrusion 1103, so as to achieve the purpose of adjusting the angle deviation between the HT eddy current probe 19 and the rail head tread. In this embodiment, anti-slip limit blocks can be set at both ends of the HT adjusting screw 1108 to prevent the HT adjusting screw 1108 from being detached from the HT linkage protrusion 1103.

[0066] The HT adjustment protrusion 1109 may be provided with a long hole or an open slot through which the HT adjustment screw 1108 can pass, thereby leaving space for the deflection of the HT adjustment screw 1108 .

[0067] The HT probe mounting plate connection seat 1101 is provided with a through hole for the HT sliding shaft 116 to pass through. The HT probe mounting plate connection seat 1101 can be used to limit and guide the upper part of the HT sliding shaft 116, and enhance the rigidity and stability of the upper part of the HT sliding shaft 116, so as to avoid the upper part of the HT sliding shaft 116 forming a cantilever structure and affecting the movement accuracy of the lower part.

[0068] In this embodiment, the HT probe mounting plate 15 is provided with an HT waist-shaped hole 1104 located below the HT linkage protrusion 1103, the HT adjustment plate 1102 is provided with an HT mounting plate locking screw 1105 that passes through the HT waist-shaped hole 1104 and is threadedly connected to the HT adjustment plate 1102, and an HT mounting plate pressing plate 1106 is provided between the HT mounting plate locking screw 1105 and the HT probe mounting plate 15. The HT waist-shaped hole 1104 provides space for the movement of the HT mounting plate locking screw 1105. When the HT probe mounting plate 15 is adjusted to a position, the HT mounting plate locking screw 1105 is locked, so that the HT mounting plate locking screw 1105 presses the HT mounting plate pressing plate 1106 onto the HT probe mounting plate 15, thereby preventing the HT probe mounting plate 15 from moving again. An angle scale can be provided above the HT waist-shaped hole 1104 described in this embodiment to facilitate precise adjustment.

[0069] In this embodiment, the HT lifting shaft 112 is provided with an HT spring 1121 between the HT mounting seat 13 and the HT lifting sleeve 122. When the HT probe mounting plate 15 is controlled to move up and down, the HT spring 1121 can be used to play a buffering role, and when the HT vertical positioning wheel 120 and the HT horizontal positioning wheel 121 are in contact with the rails respectively, they can play a vibration reduction role, thereby reducing the impact on the HT eddy current probe 19.

[0070] Embodiment 7:

[0071] like Figure 7 , Figure 8 , Fig. 9 As shown, in this embodiment, the rail head side flaw detection landing gear includes an H mechanical arm 21, an H horizontal axis 24 arranged in the H mechanical arm 21, an H mounting seat 23 slidably arranged on the H horizontal axis 24, an H lifting axis 212 arranged on the H mounting seat 23, an H probe mounting plate 25 slidably arranged on the H lifting axis 212, and an H eddy current probe 29 arranged on the H probe mounting plate 25 and aligned with the rail head side, and the H probe mounting plate 25 is provided with a probe adjustment device 26 that is transmission-connected to the H eddy current probe 29.

[0072] The H mechanical arm 21 is fixedly mounted on the frame, and the position of the H eddy current probe 29 is adjusted by the relative sliding of the H horizontal axis 24 and the H mounting seat 23, and the relative sliding of the H lifting axis 212 and the H probe mounting plate 25. When the rail needs to be inspected, the rail to be inspected is transported to a specific position in the frame. At this time, the H eddy current probe 29 can be aligned with the rail head side of the rail, and then the distance between the H eddy current probe 29 and the rail is adjusted to within the detectable range. At this time, the H eddy current probe 29 can be used to detect the rail head side. During the inspection process, the H eddy current probe 29 and the rail are relatively moved along the length direction of the rail. The probe adjustment device 26 can accurately adjust the relative position of the H eddy current probe 29 and the rail, so that the H eddy current probe 29 and the rail maintain the required position accuracy, so as to improve the inspection accuracy. After the tail end of the rail passes through the H eddy current probe 29, the H eddy current probe 29 is controlled to return to its original position.

[0073] H external plates 22 are provided on both sides of the H mechanical arm 21, and the H external plates 22 are provided with H horizontal driving structures 215 for driving the H mounting seat 23 to move along the H horizontal axis 24. In this embodiment, the H horizontal driving structure 215 can be a lift. The H horizontal driving structure 215 is provided with a cylinder that is transmission-connected to the H mounting seat 23. By pushing or pulling the H mounting seat 23 by the cylinder, the distance between the H eddy current probe 29 and the rail can be adjusted so that the distance between the H eddy current probe 29 and the rail meets the detection requirements. The lift is mainly used to control the approximate position of the H eddy current probe 29 and adjust the horizontal distance of the H eddy current probe 29 according to the rails of different rail types.

[0074] Embodiment 8:

[0075] On the basis of the above embodiments, in this embodiment, an H positioning support 219 is connected below the H probe mounting plate 25, and an H horizontal positioning wheel 221 with a horizontal axis is rotatably provided on the H positioning support 219, and an H vertical positioning wheel 220 with a vertical axis is rotatably provided on the H positioning support 219, and the H horizontal positioning wheel 221 and the H vertical positioning wheel 220 can be simultaneously connected to the rail in a rolling manner.

[0076] When the H probe mounting plate 25 is controlled to drive the H eddy current probe 29 to move, the H horizontal positioning wheel 221 contacts the upper surface of the rail, and the H vertical positioning wheel 220 contacts the side of the rail head, thereby limiting the H eddy current probe 29, thereby effectively improving the relative position accuracy of the H eddy current probe 29 and the rail, and when the H eddy current probe 29 moves relative to the rail, the relative position accuracy of the H eddy current probe 29 and the rail can be maintained, thereby avoiding the relative position of the H eddy current probe 29 and the rail changing and affecting the detection accuracy.

[0077] Embodiment 9:

[0078] On the basis of the above embodiment, in this embodiment, an H sliding shaft 216 is slidably provided on the H mounting seat 23 in the vertical direction, and an H sliding shaft mounting seat 217 connected to the H probe mounting plate 25 is connected below the H sliding shaft 216 .

[0079] By connecting the H-sliding shaft mounting seat 217 to the H-probe mounting plate 25 and the H-sliding shaft 216, the bottom of the H-probe mounting plate 25 can be supported, thereby improving the position accuracy and stability of the H-probe mounting plate 25. The sliding connection between the H-sliding shaft 216 and the H-mounting seat 23 can guide and limit the movement of the H-probe mounting plate 25 when the height position of the H-probe mounting plate 25 is adjusted, thereby improving the movement accuracy of the H-probe mounting plate 25 and the movement accuracy of the H eddy current probe 29.

[0080] The H sliding shafts 216 can be provided with two, and are symmetrically distributed on both sides of the H lifting shaft 212.

[0081] Embodiment 10:

[0082] On the basis of the above embodiment, in this embodiment, an H lift 213 is slidably provided on the H lift shaft 212, the H lift 213 is transmission-connected with an H lift sleeve 222 sleeved on the H lift shaft 212, and the H probe mounting plate 25 is connected with the H lift sleeve 222. Thus, the H probe mounting plate 25 is driven to move up and down by the up and down movement of the H lift 213 relative to the H lift shaft 212. The H lift 213 is mainly used to control the approximate position of the H eddy current probe 29 and adjust the vertical distance of the H eddy current probe 29 according to different rail types.

[0083] Embodiment 11:

[0084] like Fig.10 , Fig.11 As shown, based on the above embodiment, in this embodiment, the H probe mounting plate 25 is rotatably arranged on the H slide shaft mounting seat 217. This facilitates adjusting the angle deviation between the H eddy current probe 29 and the rail head side by rotating the H probe mounting plate 25, thereby facilitating improving the position accuracy of the H eddy current probe 29 and the rail, or adjusting the angle deviation between the H eddy current probe 29 and the rail according to the actual detection requirements.

[0085] In this embodiment, an H probe mounting plate driving structure 210 for driving the H probe mounting plate 25 to rotate is provided on the H lifting sleeve 222. The H probe mounting plate driving structure 210 includes an H probe mounting plate connecting seat 2101 provided on the H lifting sleeve 222, an H adjustment plate 2102 provided on the H probe mounting plate connecting seat 2101, an H adjustment protrusion 2109 provided on the H adjustment plate 2102, and two H linkage protrusions 2103 provided on the H probe mounting plate 25. The two H linkage protrusions 2103 are respectively located on both sides of the H adjustment protrusion 2109, and an H adjustment screw 2108 that passes through the H linkage protrusion 2103 and the H adjustment protrusion 2109 is provided between the two H linkage protrusions 2103.

[0086] The H adjustment protrusion 2109 is provided with a groove, and the H adjustment nut 2107 threadedly connected to the H adjustment screw 2108 is provided in the groove.

[0087] The H adjusting nut 2107 is rotated. Since the H adjusting nut 2107 is restricted in the groove, the H adjusting screw 2108 can be controlled to move left and right. The H adjusting screw 2108 drives the H probe mounting plate 25 to rotate through the H linkage protrusion 2103, so as to achieve the purpose of adjusting the angle deviation between the H eddy current probe 29 and the rail head side. In this embodiment, anti-slip limit blocks can be set at both ends of the H adjusting screw 2108 to prevent the H adjusting screw 2108 from being detached from the H linkage protrusion 2103.

[0088] The H adjustment protrusion 2109 may be provided with a long hole or an open slot through which the H adjustment screw 2108 can pass, thereby leaving space for the deflection of the H adjustment screw 2108 .

[0089] The H-probe mounting plate connection seat 2101 is provided with a through hole for the H-sliding shaft 216 to pass through. The H-probe mounting plate connection seat 2101 can be used to limit and guide the upper part of the H-sliding shaft 216, and enhance the rigidity and stability of the upper part of the H-sliding shaft 216, so as to avoid the upper part of the H-sliding shaft 216 forming a cantilever structure and affecting the movement accuracy of the lower part.

[0090] In this embodiment, the H probe mounting plate 25 is provided with an H waist-shaped hole 2104 located below the H linkage protrusion 2103, the H adjustment plate 2102 is provided with an H mounting plate locking screw 2105 that passes through the H waist-shaped hole 2104 and is threadedly connected to the H adjustment plate 2102, and an H mounting plate pressing plate 2106 is provided between the H mounting plate locking screw 2105 and the H probe mounting plate 25. The H waist-shaped hole 2104 provides space for the movement of the H mounting plate locking screw 2105. When the H probe mounting plate 25 is adjusted to a position, the H mounting plate locking screw 2105 is locked, so that the H mounting plate locking screw 2105 presses the H mounting plate pressing plate 2106 onto the H probe mounting plate 25, thereby preventing the H probe mounting plate 25 from moving again. An angle scale can be provided above the H waist-shaped hole 2104 described in this embodiment, thereby facilitating precise adjustment.

[0091] In this embodiment, the H lifting shaft 212 is provided with an H spring 2121 between the H mounting seat 23 and the H lifting sleeve 222. When the H probe mounting plate 25 is controlled to move up and down, the H spring 2121 can be used to play a buffering role, and when the H vertical positioning wheel 220 and the H horizontal positioning wheel 221 are in contact with the rail, they can play a vibration reduction role, thereby reducing the impact on the H eddy current probe 29.

[0092] Embodiment 12:

[0093] like Fig.12 , Fig.13 , Fig.14 As shown, in this embodiment, the rail head arc area flaw detection landing gear includes an HC mechanical arm 31, an HC horizontal axis 34 arranged in the HC mechanical arm 31, an HC mounting seat 33 slidably arranged on the HC horizontal axis 34, an HC lifting axis 312 arranged on the HC mounting seat 33, an HC probe mounting plate connecting seat 3101 slidably arranged on the HC lifting axis 312, an HC sliding shaft 316 slidably arranged in the HC mounting seat 33 and connected to the HC probe mounting plate connecting seat 3101, an HC positioning support 319 arranged on the HC sliding shaft 316, and an HC probe mounting structure arranged on the HC positioning support 319.

[0094] The HC mechanical arm 31 is fixedly mounted on the frame, and the position of the HC eddy current probe 39 is adjusted by the relative sliding of the HC horizontal axis 34 and the HC mounting seat 33 and the movement of the HC positioning support 319. When the rail needs to be inspected, the rail to be inspected is transported to the frame, and the movement of the HT probe mounting plate 15 is controlled to align the HC eddy current probe 39 with the rail head arc area of ​​the rail. At this time, the HC eddy current probe 39 can be used to inspect the rail head arc area. During the inspection process, the HC eddy current probe 39 and the rail are relatively moved along the length direction of the rail. The probe adjustment device 36 can be used to accurately adjust the relative position of the HC eddy current probe 39 and the rail, so that the HC eddy current probe 39 and the rail maintain the required position accuracy, so as to improve the inspection accuracy. After the tail end of the rail passes through the HC eddy current probe 39, the HC eddy current probe 39 is controlled to return to its original position.

[0095] HC external plates 32 are provided on both sides of the HC mechanical arm 31, and the HC external plates 22 are provided with HC horizontal driving structures 315 for driving the HC mounting seat 33 to move along the HC horizontal axis 34. In this embodiment, the HC horizontal driving structure 315 can adopt an elevator, and the elevator is used as a power source to control the relative sliding of the HC horizontal axis 34 and the HC mounting seat 33, so as to achieve the purpose of coarse adjustment. The HC horizontal driving structure 315 can be provided with a cylinder that is transmission-connected to the HC mounting seat 33. When the distance between the HC eddy current probe 39 and the rail reaches a certain range by adjusting the position of the HC mounting seat 33, the cylinder is used to push or pull the HC mounting seat 33 to achieve the purpose of precise adjustment.

[0096] Through the sliding connection between the HC sliding shaft 316 and the HC mounting seat 33, when the height position of the HC positioning support 319 is adjusted, it can play a guiding and limiting role in the movement of the HC positioning support 319, thereby improving the movement accuracy of the HC positioning support 319 and the movement accuracy of the HC eddy current probe.

[0097] The number of HC sliding shafts 316 can be two and they are symmetrically distributed on both sides of the HC lifting shaft 312 .

[0098] Embodiment 13:

[0099] On the basis of the above embodiment, in this embodiment, the HC lifting shaft 312 is slidably provided with an HC lift 313, the HC lift 313 is drivingly connected with an HC lift sleeve 322 sleeved on the HC lifting shaft 312, and the HC probe mounting plate 35 is connected with the HC lift sleeve 322. In this way, the HC lift 313 is moved up and down relative to the HC lifting shaft 312 to drive the HC probe mounting plate 35 to move up and down. The use of the HC lift sleeve 322 can increase the contact area between the HC lifting shaft 312 and the sliding component, which is conducive to dispersing the pressure on the HC lifting shaft 312, thereby reducing wear and preventing the HC lifting shaft 312 from being bent and deformed due to the pressure of the HC lift 313.

[0100] Embodiment 14:

[0101] like Fig.15 As shown, based on the above embodiment, in this embodiment, the HC probe mounting structure includes an HC probe mounting seat 351 arranged on the HC positioning support 319.

[0102] The HC probe mounting base 351 is used as the mounting base of the HC probe to ensure the stability of the HC probe.

[0103] In this embodiment, an HC adjustment slide 352 is slidably disposed below the HC probe mounting seat 351 , and the HC probe is mounted on the HC adjustment slide 352 , so that the position of the HC probe can be adjusted by sliding the HC adjustment slide 352 .

[0104] In this embodiment, the HC probe mounting seat 351 is rotatably provided with an HC probe adjusting screw 353 which is transmission-connected with the HC adjusting slide 352. The HC probe adjusting screw 353 is rotated to drive the HC adjusting slide 352 to move relative to the HC probe mounting seat 351. The HC probe adjusting screw 353 and the HC probe mounting seat 351 may be provided with a limiting structure for limiting the movement of the HC probe adjusting screw 353, so that the HC probe adjusting screw 353 and the HC probe mounting seat 351 can only rotate relative to each other, thereby ensuring the movement accuracy of the HC adjusting slide 352.

[0105] In this embodiment, the HC probe mounting seat 351 is provided with an HC probe mounting rod 355, and the HC probe mounting rod 355 is rotatably provided with an HC probe adjusting roller 356 that can be rollingly connected to the rail. The HC probe mounting seat 351 is provided with an HC probe supporting block 354 that is matched with the HC probe mounting rod 355 through a through-hole clearance, and the HC probe supporting block 354 is provided with a groove for placing the HC probe adjusting roller 356. During detection, the HC probe adjusting roller 356 is brought into contact with the rail, so that the distance between the HC probe and the rail can be controlled to avoid collision between the HC probe and the rail during the flaw detection process.

[0106] Embodiment 15:

[0107] On the basis of the above embodiment, in this embodiment, the HC lifting shaft 312 is sleeved with an HC spring 3121 located between the HC mounting seat 33 and the HC lifting sleeve 322 .

[0108] In this embodiment, the HC lifting shaft 312 is sleeved with an HC spring 3121 located between the HC mounting seat 33 and the HC lifting sleeve 322. When the HC probe mounting plate 35 is controlled to move up and down, the HC spring 3121 can be used to play a buffering role, and when the HC vertical positioning wheel 320 and the HC horizontal positioning wheel 321 are in contact with the rail respectively, they can play a vibration reduction role, thereby reducing the impact on the HC eddy current probe.

[0109] Embodiment 16:

[0110] like Fig.16 As shown, in this embodiment, the rail bottom side flaw detection landing gear includes a FC mechanical arm 41, a FC sliding shaft 43 arranged in the FC mechanical arm 41 along the horizontal direction, a FC base 44 slidably arranged on the FC sliding shaft 43, a FC vertical shaft 47 slidably arranged on the FC base 44 along the vertical direction, and an FC probe mounting seat 48 arranged at the top of the FC vertical shaft 47 and used for mounting a FC eddy current probe, wherein the FC eddy current probe can be aligned with the side of the bottom of the rail.

[0111] During detection, the FC eddy current probe is moved to the specified position by utilizing the relative sliding of the FC base 44 and the FC sliding shaft 43, and the relative sliding of the FC vertical shaft 47 and the FC base 44, and the rail is controlled to move into the frame. At this time, the FC eddy current probe can be aligned with the side of the rail bottom, so that detection can begin.

[0112] FC external plates 42 are provided on both sides of the FC mechanical arm 41. The FC external plates 42 are provided with FC horizontal driving structures 411 for driving the FC base 443 to move along the FC sliding shaft 43. In this embodiment, the FC horizontal driving structure 411 can be a lift. By using the lift as the power source for the relative sliding of the FC base 44 and the FC sliding shaft 43, the relative position of the FC eddy current probe and the horizontal direction of the rail can be roughly adjusted. After the rail is moved into place, the FC eddy current probe is pushed by the cylinder for accurate adjustment so that the distance between the FC eddy current probe and the rail meets the requirements of flaw detection. Another lift can also be used as the power source for the relative sliding of the FC vertical shaft 47 and the FC base 44, so as to roughly adjust the relative position of the FC eddy current probe and the rail in the vertical direction. And the position of the FC eddy current probe is adjusted according to the rails of different rail types.

[0113] Embodiment 17:

[0114] On the basis of the above embodiments, in this embodiment, the bottom end of the FC vertical axis 47 is connected to the FC vertical axis support seat 46, an FC cylinder 45 is arranged between the FC vertical axis support seat 46 and the FC base 44, the cylinder body of the FC cylinder 45 is connected to the FC vertical axis support seat 46, and the piston rod of the FC cylinder 45 is transmission-connected to the FC base 44.

[0115] In this way, the extension and retraction of the piston rod can be used to control the relative movement of the FC vertical axis 47 and the FC base 44, thereby accurately adjusting the relative position of the FC eddy current probe and the rail.

[0116] In this embodiment, an FC spring 412 is connected between the FC base 44 and the FC vertical axis support base 46. The FC spring 412 can play a role of buffering and vibration reduction when the FC vertical axis 47 and the FC base 44 move relative to each other, thereby reducing the vibration of the FC probe mounting base 48 and preventing the vibration from being transmitted to the FC probe and affecting the detection accuracy of the FC probe.

[0117] The FC vertical shafts 47 are provided with two and are symmetrically distributed on both sides of the FC cylinder 45 , and the FC springs 412 are provided with two and are symmetrically distributed on both sides of the FC cylinder 45 , which is beneficial to improve the stability of the FC vertical shaft support seat 46 and the FC probe mounting seat 48 .

[0118] Embodiment 18:

[0119] On the basis of the above embodiment, in this embodiment, a probe mounting structure for mounting a FC eddy current probe is provided on the FC probe mounting seat 48 .

[0120] like Fig.17As shown, the probe mounting structure includes an FC adjustment base 4121 arranged on the FC probe mounting base 48, and the FC eddy current probe is arranged on the FC adjustment base 4121. The FC adjustment base 4121 is used as the installation base of the FC probe, and the FC adjustment base 4121 is detachably connected to the FC probe mounting base 48, which can facilitate the installation and adjustment of the FC probe.

[0121] An FC adjustment slide 4122 is slidably disposed on the FC adjustment base 4121, and the FC eddy current probe is disposed on the FC adjustment slide 4122. Thus, the position of the FC eddy current probe and the relative position of the FC eddy current probe and the rail can be adjusted by relative sliding of the FC adjustment slide 4122 and the FC adjustment base 4121, so that the FC eddy current probe is located at a desired position for detection to improve detection accuracy.

[0122] In this embodiment, the FC adjustment base 4121 is provided with an FC adjustment screw 4123 which is transmission-connected to the FC adjustment slide 4122, and the FC adjustment base 4121 and the FC adjustment slide 4122 are installed in cooperation with each other through a dovetail groove. By rotating the FC adjustment screw 4123, the FC adjustment slide 4122 can be driven to move along the length direction of the FC adjustment screw 4123. The installation in cooperation with the dovetail groove can improve the stability and movement accuracy of the FC adjustment slide 4122.

[0123] In this embodiment, an FC adjustment rod 4124 is provided below the FC adjustment base 4121, and an FC limit roller 4126 capable of rolling connection with the rail is provided on the FC adjustment rod 4124. The FC limit roller 4126 contacts the rail to limit the distance between the FC eddy current probe and the rail, so that the FC eddy current probe and the rail can always maintain the same distance during the relative movement, thereby facilitating the improvement of the detection accuracy and preventing the FC eddy current probe from colliding with the rail and causing damage.

[0124] In this embodiment, an FC roller limiting seat 4125 through which the FC adjusting rod 4124 passes is provided below the FC adjusting base 4121, and a groove for mounting the FC limiting roller 4126 is provided on the FC roller limiting seat 4125. The FC roller limiting seat 4125 can limit and protect the FC adjusting rod 4124, increase the rigidity of the FC adjusting rod 4124, and prevent the FC adjusting rod 4124 from bending and deforming under pressure. It can also limit and protect the FC limiting roller 4126 to prevent the FC limiting roller 4126 from falling off.

[0125] Embodiment 19:

[0126] On the basis of the above-mentioned embodiments, in the present embodiment, an FC probe mounting base 48 is provided with an FC horizontal roller 410 and an FC vertical roller 49, which can be simultaneously connected to the rail in a rolling manner. During detection, the FC horizontal roller 410 can support the rail, and the FC vertical roller 49 can guide and limit the rail, so that the rail moves in the same direction, which is beneficial to improving the relative position accuracy and detection accuracy between the FC eddy current probe and the rail.

[0127] Embodiment 20:

[0128] like Fig.18 As shown, in this embodiment, the rail bottom flaw detection landing gear includes an F mechanical arm 51, an F horizontal sliding shaft 52 arranged in the F mechanical arm 51, an F slide seat 54 slidably arranged on the F horizontal sliding shaft 52, an F vertical sliding shaft 541 slidably arranged in the F slide seat 54 along the vertical direction, an F base 553 arranged at the bottom of the F vertical sliding shaft 541, an F mounting plate 56 arranged on the F base 553, an F probe mounting seat 58 arranged on the F mounting plate 56, and an F probe 516 arranged on the F probe mounting seat 58, and an F cylinder 510 is arranged on the F base 553 and is connected to the F probe mounting seat 58, and an F spring 515 is connected between the F base 553 and the F slide seat 54. The F spring 515 is used to apply a pulling force to the F base 553 to prevent the F base 553 from falling. During detection, the rail is controlled to move to a specified position in the frame, and the F mounting plate 56 is driven to move, so that the F probe 516 is driven to move to a certain distance below the bottom surface of the rail to start detection. The rail and the F probe 516 are controlled to move relative to each other until the tail of the rail leaves the coverage of the F probe 516. In this embodiment, a cylinder is provided between the F slide 54 and the F base 553, and the cylinder is used as a power source to drive the F vertical slide shaft 541 to slide in the F slide 54. A mounting seat can also be provided on the top of the F vertical slide shaft 541, and another cylinder is provided between the mounting seat and the F slide 54, so that the two cylinders can coordinate their actions to drive the relative movement of the F slide 54 and the F vertical slide shaft 541. H external plates 53 are provided on both sides of the F mechanical arm 51, and the H external plates 53 are used to connect with other structures.

[0129] Embodiment 21:

[0130] like Fig.19 As shown, based on the above embodiment, in this embodiment, an F connecting plate 57 is provided below the F mounting plate 56, and the F connecting plate 57 is rotatably connected to the F base 553. By making the F connecting plate 57 and the F base 553 rotate relative to each other, the angular deviation of the F mounting plate 56 in the vertical direction can be adjusted as needed, thereby adjusting the angular deviation between the F probe 516 and the rail.

[0131] In this embodiment, the lower surface of the F connecting plate 57 is an outwardly convex arc surface, and the F base 553 is provided with an inwardly concave arc surface with the same curvature as the lower surface of the F connecting plate 57. In this way, the contact area between the F connecting plate 57 and the F base 553 can be increased, thereby improving the stability of the F connecting plate 57 and improving the adjustment accuracy.

[0132] In this embodiment, the F mounting plate 56 is provided with an F connecting rod support 562, and the F connecting rod support 562 is hinged with an F connecting rod 561, and the F connecting rod 561 is hinged with the F sliding seat 54 through the F connecting rod rotating shaft; the F mounting plate 56 is provided with a through hole with a diameter larger than the F connecting rod rotating shaft, and the F connecting rod rotating shaft passes through the through hole. In this way, the F mounting plate 56 and the F sliding seat 54 can be connected through the F connecting rod 561, thereby improving the connection strength between the F mounting plate 56 and the F sliding seat 54, and improving the stability of the F mounting plate 56. By providing the through hole with a diameter larger than the F connecting rod rotating shaft on the F mounting plate 56, space can be provided for the rotation of the F mounting plate 56, avoiding the interference between the F mounting plate 56 and the F connecting rod rotating shaft.

[0133] Embodiment 22:

[0134] like Fig.18 , Fig.19 As shown, on the basis of the above embodiment, in this embodiment, the F base 553 is provided with a plurality of F connecting plate guide wheels 513 located on both sides of the F connecting plate 57. The F connecting plate guide wheels 513 on both sides of the F connecting plate 57 can clamp the bottom of the F connecting plate 57, thereby facilitating the improvement of the stability of the F connecting plate 57 and limiting the moving direction of the F connecting plate 57, thereby facilitating the improvement of the adjustment accuracy. The rolling connection can reduce the wear of the F connecting plate 57, and avoid the gap between the F connecting plate 57 and the F connecting plate guide wheels 513 caused by the wear of the F connecting plate 57, thereby affecting the accuracy.

[0135] Embodiment 23:

[0136] On the basis of the above embodiment, in this embodiment, an F cylinder support 511 is rotatably provided on the F base 553, the F cylinder 510 is provided on the F cylinder support 511, and F cylinder support limit seats 512 located on the F base 553 are provided on both sides of the F cylinder support 511. In this way, the F cylinder 510 has a rotation function, so that the F cylinder 510 can rotate synchronously with the F mounting plate 56, avoiding interference between the piston rod of the F mounting plate 56 and the F mounting plate 56.

[0137] Embodiment 24:

[0138] On the basis of the above embodiment, in this embodiment, an F probe mounting plate 59 for mounting an F probe 516 is slidably provided on the F probe mounting seat 58. An F probe adjustment seat 591 is provided on the F probe mounting seat 58, and an F wedge block 592 is slidably provided in the F probe adjustment seat 591. The F wedge block 592 is connected to the F probe mounting plate 59 through a wedge surface transmission, and an F threaded adjustment rod 593 threadedly connected to the F wedge block 592 is rotatably provided on the F probe adjustment seat 591. The F probe mounting plate 59 is used as the installation base of the F probe 516, and the F probe mounting plate 59 can be driven to move up and down by moving the F wedge block 592, so as to adjust the height of the F probe 516, so that the distance between the F probe 516 and the bottom of the rail can be adjusted as needed.

[0139] Embodiment 25:

[0140] On the basis of the above embodiment, in this embodiment, an F roller frame 55 is arranged above the F mounting plate 56, and an F rail bottom roller 551 capable of rolling connection with the rail bottom is rotatably arranged on the F roller frame 55, and an F rail bottom side roller 552 capable of rolling connection with the rail bottom side is rotatably arranged on the F roller frame 55. When the rail is moved into position, the F mounting plate 56 is controlled to move until the F rail bottom roller 551 contacts the rail bottom, and the F slide 54 is controlled to move until the F rail bottom side roller 552 contacts the rail bottom side. The F rail bottom roller 551 and the F rail bottom side roller 552 can improve the positioning accuracy of the F probe 516 and the relative position accuracy of the F rail bottom side roller 552 and the rail. During the detection process, the F rail bottom side roller 552 and the rail are always kept at the same distance, which is conducive to improving the detection accuracy.

[0141] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Any simple modification or equivalent change made to the above embodiment based on the technical essence of the present invention shall fall within the protection scope of the present invention.

Claims

1. A rail eddy current flaw detection device, characterized in that: It comprises a frame (6), two rail head tread flaw detection landing gears arranged on the frame (6), two rail head side flaw detection landing gears arranged on the frame (6), two rail head circular arc area flaw detection landing gears arranged on the frame (6), two rail bottom side flaw detection landing gears arranged on the frame (6), and a rail bottom flaw detection landing gear arranged on the frame (6), wherein the rail head tread flaw detection landing gears are provided with HT eddy current probes (19) that can be aligned with one side of the rail head tread, the rail head side flaw detection landing gears are provided with H eddy current probes (29) that can be aligned with one side of the rail head, the rail head circular arc area flaw detection landing gears are provided with HC eddy current probes (39) that can be aligned with one side of the circular arc area, the rail bottom side flaw detection landing gears are provided with FC eddy current probes that can be aligned with one side of the rail bottom, and the rail bottom flaw detection landing gears are provided with F probes (516) that can be aligned with the rail bottom; The rail head and tread flaw detection landing gear comprises an HT mechanical arm (11), an HT horizontal axis (14) arranged in the HT mechanical arm (11), an HT mounting seat (13) slidably arranged on the HT horizontal axis (14), an HT lifting axis (112) arranged on the HT mounting seat (13), an HT probe mounting plate (15) slidably arranged on the HT lifting axis (112), and an HT eddy current probe (19) arranged on the HT probe mounting plate (15) and aligned with the rail head and tread, wherein the HT probe mounting plate (15) is provided with a probe adjustment device (16) which is transmission-connected to the HT eddy current probe (19); The rail head side flaw detection landing gear comprises an H mechanical arm (21), an H horizontal shaft (24) arranged in the H mechanical arm (21), an H mounting seat (23) slidably arranged on the H horizontal shaft (24), an H lifting shaft (212) arranged on the H mounting seat (23), an H probe mounting plate (25) slidably arranged on the H lifting shaft (212), and an H eddy current probe (29) arranged on the H probe mounting plate (25) and aligned with the rail head side; The rail head arc area flaw detection landing gear comprises an HC mechanical arm (31), an HC horizontal shaft (34) arranged in the HC mechanical arm (31), an HC mounting seat (33) slidably arranged on the HC horizontal shaft (34), an HC lifting shaft (312) arranged on the HC mounting seat (33), an HC probe mounting plate connecting seat (3101) slidably arranged on the HC lifting shaft (312), an HC sliding shaft (316) slidably arranged in the HC mounting seat (33) and connected to the HC probe mounting plate connecting seat (3101), an HC positioning support (319) arranged on the HC sliding shaft (316), and an HC probe mounting structure arranged on the HC positioning support (319); The rail bottom side flaw detection landing gear comprises an FC mechanical arm (41), an FC sliding shaft (43) arranged in the FC mechanical arm (41) along the horizontal direction, an FC base (44) slidably arranged on the FC sliding shaft (43), an FC vertical shaft (47) slidably arranged on the FC base (44) along the vertical direction, and an FC probe mounting seat (48) arranged at the top end of the FC vertical shaft (47) and used for mounting an FC eddy current probe; The rail bottom flaw detection landing gear comprises an F mechanical arm (51), an F horizontal sliding shaft (52) arranged in the F mechanical arm (51), an F sliding seat (54) slidably arranged on the F horizontal sliding shaft (52), an F vertical sliding shaft (541) slidably arranged in the F sliding seat (54) along the vertical direction, an F base (553) arranged at the bottom of the F vertical sliding shaft (541), an F mounting plate (56) arranged on the F base (553), an F probe mounting seat (58) arranged on the F mounting plate (56), and an F probe (516) arranged on the F probe mounting seat (58); an F cylinder (510) drivingly connected to the F probe mounting seat (58) is arranged on the F base (553); and an F spring (515) is connected between the F base (553) and the F sliding seat (54).

2. The rail eddy current flaw detection device according to claim 1, characterized in that: The probe adjustment device (16) comprises an adjustment housing (161) arranged on the HT probe mounting plate (15), an adjustment seat (162) arranged on the HT probe mounting plate (15) and located above the adjustment housing (161), and an adjustment threaded rod (163) arranged in the adjustment housing (161) and passing through the adjustment seat (162), an HT adjustment nut being threadedly connected to the adjustment threaded rod (163), and the HT eddy current probe (19) being connected to the HT adjustment nut.

3. The rail eddy current flaw detection device according to claim 1, characterized in that: An H positioning support (219) is connected below the H probe mounting plate (25); an H horizontal positioning wheel (221) with a horizontal rotation axis is rotatably provided on the H positioning support (219); and an H vertical positioning wheel (220) with a vertical rotation axis is rotatably provided on the H positioning support (219); the H horizontal positioning wheel (221) and the H vertical positioning wheel (220) can be simultaneously connected to the rail in a rolling manner.

4. The rail eddy current flaw detection device according to claim 1, characterized in that: The HC positioning support (319) is rotatably provided with an HC horizontal positioning wheel (321) with a horizontal rotation axis, and the HC positioning support (319) is rotatably provided with an HC vertical positioning wheel (320) with a vertical rotation axis. The HC horizontal positioning wheel (321) and the HC vertical positioning wheel (320) can be simultaneously connected to the rail in a rolling manner.

5. The rail eddy current flaw detection device according to claim 1, characterized in that: The bottom end of the FC vertical shaft (47) is connected to an FC vertical shaft support seat (46); an FC cylinder (45) is arranged between the FC vertical shaft support seat (46) and the FC base (44); a cylinder body of the FC cylinder (45) is connected to the FC vertical shaft support seat (46); and a piston rod of the FC cylinder (45) is drivingly connected to the FC base (44).

Images