A method and device for diagnosing transformer short circuit fault

Abstract

The present invention provides a transformer short-circuit fault diagnosis method and device. The transformer includes a three-phase winding, which is a three-phase independent winding. An AC voltage is provided for excitation of any phase transformer winding, and any phase winding of the other two phases is short-circuited, and the remaining phase winding is used as the phase winding to be tested. The method includes: measuring the induced voltage of the primary winding in the phase winding to be tested to obtain a first induced voltage; measuring the induced voltage of the secondary winding in the phase winding to be tested to obtain a second induced voltage; using the ratio of the first induced voltage to the second induced voltage as the actual voltage ratio; and determining the location of the short-circuit fault according to the actual voltage ratio and the designed turns ratio. The present invention can quickly determine the location of the short-circuit fault and improve the maintenance efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of fault detection, and in particular to a transformer short-circuit fault diagnosis method and device. Background Art

[0002] Transformers have various structural designs depending on their uses, but the design principle is based on electromagnetic induction, so the winding turns ratio is measured using a traditional ratio tester. Transformer ratio testers can measure the ratio of a fault-free transformer accurately and quickly, but for transformers with short-circuited turns, the measurement results have large deviations, or even only show overcurrent protection.

[0003] The overall wiring volume of special transformers is large and the wiring is complicated. After the coils, cores, tapping wires and various connecting leads are all assembled in place, if a short circuit abnormality occurs during the transformer body ratio test due to bumps during coil set operation or later wiring errors, it is very difficult to use a traditional transformer ratio tester to determine the location of such faulty coils. It requires the use of a variety of other instruments for multi-faceted testing, and professional estimation and processing of the measurement results. It requires technicians with rich professional theoretical knowledge and practical experience, and it takes a long time to deal with the fault, resulting in low maintenance efficiency. Summary of the invention

[0004] The embodiment of the present invention provides a transformer short-circuit fault diagnosis method and device to solve the problem that the short-circuit fault location cannot be quickly determined after the existing transformer is assembled, and the maintenance efficiency is low.

[0005] In a first aspect, an embodiment of the present invention provides a transformer short-circuit fault diagnosis method, wherein the transformer includes a three-phase winding, the three-phase winding is a three-phase independent winding, an AC voltage is provided for excitation of any phase transformer winding, and any phase winding of the other two phases is short-circuited, and the remaining phase winding is used as the phase winding to be tested, and the transformer short-circuit fault diagnosis method includes:

[0006] Measuring the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage;

[0007] Measuring the induced voltage of the secondary winding in the phase winding to be measured to obtain a second induced voltage;

[0008] taking a ratio of the first induced voltage to the second induced voltage as an actual voltage ratio;

[0009] The location where the short circuit fault occurs is determined according to the actual voltage ratio and the designed turns ratio; the designed turns ratio is the ratio of the number of turns of the primary winding coil to the number of turns of the secondary winding coil.

[0010] In a possible implementation, determining the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio includes:

[0011] If the actual voltage ratio is less than the designed turns ratio, it is determined that a short circuit fault occurs in the primary winding;

[0012] If the actual voltage ratio is greater than the designed turns ratio, it is determined that a short circuit fault occurs in the secondary winding;

[0013] If the actual voltage ratio is equal to the designed turns ratio, it is determined that there is no short circuit fault.

[0014] In a possible implementation, the AC voltage is a maximum voltage that does not cause overcurrent within a range of greater than or equal to 0 V and less than or equal to 220 V.

[0015] In a possible implementation manner, the number of coil turns of the primary winding is greater than the number of coil turns of the secondary winding.

[0016] In a possible implementation manner, after determining the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio, the method further includes:

[0017] The equivalent short-circuit turns are calculated according to the actual voltage ratio and the location where the short-circuit fault occurs.

[0018] In a possible implementation, calculating the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs includes:

[0019] When a short circuit fault occurs in the primary winding, according to Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns;

[0020] When a short circuit fault occurs in the secondary winding, according to The equivalent short-circuit turns are calculated, wherein U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns.

[0021] In a second aspect, an embodiment of the present invention provides a transformer short circuit fault diagnosis device, comprising:

[0022] An excitation unit, used for providing AC voltage excitation for any phase transformer winding;

[0023] A primary measuring unit, used to measure the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage;

[0024] A secondary measuring unit, used for measuring the induced voltage of the secondary winding in the phase winding to be measured, to obtain a second induced voltage;

[0025] a logic unit, configured to calculate a ratio of the first induced voltage to the second induced voltage to obtain an actual voltage ratio;

[0026] The logic unit is further used to determine the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio.

[0027] In a possible implementation, the logic unit is further configured to calculate an equivalent short-circuit number of turns according to the actual voltage ratio and the location where the short-circuit fault occurs.

[0028] In a possible implementation, the AC voltage provided by the excitation unit is a maximum voltage that does not cause overcurrent within a range of greater than or equal to 0 V and less than or equal to 220 V.

[0029] In a possible implementation manner, the number of turns of the primary winding measured by the primary measurement unit is greater than the number of turns of the secondary winding measured by the secondary measurement unit.

[0030] The embodiment of the present invention provides a transformer short-circuit fault diagnosis method and device, which measures the induced voltage of the primary winding in the phase winding to be tested to obtain a first induced voltage; measures the induced voltage of the secondary winding in the phase winding to be tested to obtain a second induced voltage; uses the ratio of the first induced voltage to the second induced voltage as the actual voltage ratio; determines the location of the short-circuit fault according to the actual voltage ratio and the designed turns ratio; can quickly determine the short-circuit fault location and improve maintenance efficiency. At the same time, this solution is simple and fast, and can be widely promoted in practical applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0032] Figure 1 is a flow chart of an implementation method of a transformer short-circuit fault diagnosis method provided by an embodiment of the present invention;

[0033] Figure 2 is a diagnostic schematic diagram of a transformer short-circuit fault diagnostic method provided by an embodiment of the present invention;

[0034] Figure 3 is a flow chart of an implementation method of a transformer short-circuit fault diagnosis method provided by another embodiment of the present invention;

[0035] Figure 4 is a schematic structural diagram of a transformer short-circuit fault diagnosis device provided by an embodiment of the present invention;

[0036] Figure 5 is a schematic diagram of a terminal provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0037] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.

[0038] In order to make the purpose, technical solutions and advantages of the present invention more clear, specific embodiments will be described below in conjunction with the accompanying drawings.

[0039] Figure 1 A flowchart of a transformer short circuit fault diagnosis method according to an embodiment of the present invention, wherein Figure 2 The transformer includes three-phase windings. Before fault diagnosis, the corner joints between the three-phase windings need to be disconnected to form three-phase independent windings to avoid crosstalk between the three-phase windings. Provide AC voltage excitation to any phase transformer winding, and short-circuit any phase winding of the other two phases, and use the remaining phase winding as the phase winding to be tested.

[0040] It should be noted that any phase winding includes two sets of coils. When exciting any phase transformer winding, one set of coils can be arbitrarily selected to provide an AC voltage to it. Based on the principle of electromagnetic induction, the more turns a coil has, the greater the induced electromotive force is, and the more stable the magnetic flux of the magnetic circuit is. As a preferred method, a set of coils with relatively more turns can be selected to provide an AC voltage to it. For example, Figure 2 As shown, an AC voltage is provided to the AB terminal, and the A and B terminals are respectively the first and last terminals of a coil with relatively more turns.

[0041] In order to meet the excitation needs while avoiding causing overcurrent protection, when providing AC voltage to any phase transformer winding, its AC voltage value is greater than or equal to 0V and less than or equal to the maximum voltage that does not cause overcurrent in the range of 220V.

[0042] Shorting one of the phase windings can force the magnetic flux to flow through the magnetic circuit of the phase to be measured, so that the induced voltage can be measured on the phase winding to be measured. When shorting the winding, any set of coils in the winding can be selected for shorting, and no specific limitation is made here.

[0043] The transformer short circuit fault diagnosis method is described in detail as follows:

[0044] Step 101, measuring the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage.

[0045] Optionally, a group of windings with relatively more turns in the winding to be tested is regarded as the primary winding. Figure 2 , A1 and B1 are the first and last terminals of the primary winding respectively, and the voltage across A1 and B1 is measured to obtain the first induced voltage.

[0046] Step 102, measuring the induced voltage of the secondary winding in the phase winding to be measured to obtain a second induced voltage.

[0047] Optionally, a group of windings with relatively fewer turns in the winding to be tested can be considered as secondary windings. Figure 2 , A2 and B2 are the first and last terminals of the primary winding respectively, and the voltage across A2 and B2 is measured to obtain the second induced voltage.

[0048] Step 103: taking the ratio of the first induced voltage to the second induced voltage as the actual voltage ratio.

[0049] Step 104, determining the location of the short circuit fault according to the actual voltage ratio and the designed turns ratio, wherein the designed turns ratio is the ratio of the number of turns of the primary winding coil to the number of turns of the secondary winding coil.

[0050] Optionally, if the actual voltage ratio is less than the designed turns ratio, it is determined that a short circuit fault occurs in the primary winding;

[0051] If the actual voltage ratio is greater than the designed turns ratio, it is determined that a short circuit fault has occurred in the secondary winding;

[0052] If the actual voltage ratio is equal to the designed turns ratio, it is determined that there is no short circuit fault.

[0053] According to the principle of electromagnetic induction, Among them, K1 is the actual voltage ratio, U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding, n2 is the number of turns of the secondary winding, and K is the designed turns ratio.

[0054] If a short circuit occurs in the primary winding, it can be regarded as the number of turns in the primary winding is reduced by n turns compared with the normal situation. Where n is the equivalent short-circuit turns.

[0055] If a short circuit occurs in the secondary winding, it can be regarded as the number of turns in the primary winding is reduced by n turns compared with the normal situation.

[0056] For special transformer windings with complex structures, independent excitation ratio checks are carried out in sequence to quickly confirm the primary winding or secondary winding where the fault point is located, so that the fault point can be found quickly and specifically.

[0057] Optional, such as Figure 3 As shown, after this step, the method further includes step 105, calculating the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs. By calculating the equivalent short-circuit turns, the short-circuit ring position can be further quickly and accurately located. At the same time, it is helpful for maintenance personnel to formulate maintenance plans according to different short-circuit turns to further improve maintenance efficiency.

[0058] When a short circuit fault occurs in the primary winding, Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns;

[0059] When a short circuit fault occurs in the secondary winding, according to Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns.

[0060] In this technical solution, the winding with short-circuit fault on the phase to be tested is divided into a faulty part n and a non-faulty part n1-n or n2-n, and the magnetic flux of the magnetic circuit is provided by the current ampere-turns of the excitation winding and the current ampere-turns of the short-circuit part. This makes it possible to directly determine the location of the short-circuit fault based on the principle of electromagnetic induction.

[0061] The embodiment of the present invention measures the induced voltage of the primary winding in the phase winding to be tested to obtain a first induced voltage; measures the induced voltage of the secondary winding in the phase winding to be tested to obtain a second induced voltage; uses the ratio of the first induced voltage to the second induced voltage as the actual voltage ratio; determines the location of the short-circuit fault according to the actual voltage ratio and the designed turns ratio; and can quickly determine the location of the short-circuit fault and improve maintenance efficiency. At the same time, the solution is simple and fast and can be widely promoted in practical applications.

[0062] It should be understood that the order of execution of the steps in the above embodiment does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present invention.

[0063] The following is an embodiment of the device of the present invention. For details not described in detail therein, reference may be made to the corresponding method embodiment described above.

[0064] Figure 4The structure diagram of the transformer short circuit fault diagnosis device provided by the embodiment of the present invention is shown. For the convenience of description, only the part related to the embodiment of the present invention is shown, which is described in detail as follows:

[0065] like Figure 4 As shown, the transformer short-circuit fault diagnosis device 4 includes: an excitation unit 41 , a primary measurement unit 42 , a secondary measurement unit 43 and a logic unit 44 .

[0066] The excitation unit 41 is used to provide AC voltage excitation for any phase transformer winding.

[0067] Transformers with different fault levels require different excitation voltages. In a possible implementation, the excitation unit 41 is used to provide a continuously adjustable AC voltage to meet the excitation needs of transformers with different fault levels. In order to meet the excitation needs while avoiding causing overcurrent protection, the AC voltage provided by the excitation unit 41 is a maximum voltage that does not cause overcurrent within a range of greater than or equal to 0V and less than or equal to 220V.

[0068] To meet actual working needs, the excitation unit 41 may be an external independent adjustable AC power supply, or an excitation device integrated in the transformer short circuit fault diagnosis device, which is not specifically limited here.

[0069] The primary measuring unit 42 is used to measure the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage;

[0070] In a possible implementation, a group of windings with relatively more turns in the windings to be measured is regarded as a primary winding. The primary measurement unit 42 may be configured with a metal connector for connecting the ends of the primary winding coil to measure the induced voltage.

[0071] The secondary measuring unit 43 is used to measure the induced voltage of the secondary winding in the phase winding to be measured to obtain a second induced voltage.

[0072] In a possible implementation, a group of windings with relatively fewer turns in the windings to be measured is regarded as a secondary winding. The secondary measurement unit 43 may be equipped with a metal connector for connecting the ends of the secondary winding coils to measure the induced voltage.

[0073] The metal connector is any connector that can be connected to the ends of the coil and is conductive, such as a wire clamp.

[0074] The logic unit 44 is used to calculate the ratio of the first induced voltage to the second induced voltage to obtain an actual voltage ratio;

[0075] The logic unit 44 is further used to determine the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio.

[0076] In a possible implementation, the logic unit 44 is used to determine the location where the short circuit fault occurs according to a comparison result between the actual voltage ratio and the designed turns ratio.

[0077] If the actual voltage ratio is less than the designed turns ratio, it is determined that a short circuit fault has occurred in the primary winding;

[0078] If the actual voltage ratio is greater than the designed turns ratio, it is determined that a short circuit fault has occurred in the secondary winding;

[0079] If the actual voltage ratio is equal to the designed turns ratio, it is determined that there is no short circuit fault.

[0080] In a possible implementation, the logic unit 44 is further configured to calculate the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs.

[0081] When a short circuit fault occurs in the primary winding, Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns;

[0082] When a short circuit fault occurs in the secondary winding, according to Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns.

[0083] In the embodiment of the present invention, an excitation unit 41 is used to provide AC voltage excitation to any phase transformer winding; a primary measurement unit 42 is used to measure a first induced voltage of the primary winding in the phase winding to be measured; a secondary measurement unit 43 is used to measure a second induced voltage of the secondary winding in the phase to be measured; a logic unit 44 is used to calculate an actual voltage ratio between the first induced voltage and the second induced voltage, and to determine the location of the short-circuit fault according to the actual voltage ratio and the designed turns ratio, so as to quickly determine the location of the short-circuit fault and improve maintenance efficiency. At the same time, the present solution is simple and fast and can be widely promoted in practical applications.

[0084] Figure 5 is a schematic diagram of a terminal provided by an embodiment of the present invention. Figure 5 As shown, the terminal 5 of this embodiment includes: a processor 50, a memory 51, and a computer program 52 stored in the memory 51 and executable on the processor 50. When the processor 50 executes the computer program 52, the steps in the above-mentioned transformer short-circuit fault diagnosis method embodiments are implemented, for example Figure 1 Alternatively, when the processor 50 executes the computer program 52, the functions of each module / unit in the above-mentioned device embodiments are realized, for example, Figure 4The functions of the units 41 to 44 are shown.

[0085] Exemplarily, the computer program 52 may be divided into one or more modules / units, which are stored in the memory 51 and executed by the processor 50 to implement the present invention. The one or more modules / units may be a series of computer program instruction segments capable of implementing specific functions, which are used to describe the execution process of the computer program 52 in the terminal 5. For example, the computer program 52 may be divided into Figure 4 Units 41 to 44 are shown.

[0086] The terminal 5 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The terminal 5 may include, but is not limited to, a processor 50 and a memory 51. Those skilled in the art will appreciate that Figure 5 It is only an example of terminal 5 and does not constitute a limitation on terminal 5. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the terminal may also include input and output devices, network access devices, buses, etc.

[0087] The processor 50 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0088] The memory 51 may be an internal storage unit of the terminal 5, such as a hard disk or memory of the terminal 5. The memory 51 may also be an external storage device of the terminal 5, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the terminal 5. Further, the memory 51 may also include both an internal storage unit of the terminal 5 and an external storage device. The memory 51 is used to store the computer program and other programs and data required by the terminal. The memory 51 may also be used to temporarily store data that has been output or is to be output.

[0089] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0090] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0091] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0092] In the embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device / terminal embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0093] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0094] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0095] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned transformer short-circuit fault diagnosis method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practices in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practices, computer-readable media does not include electrical carrier signals and telecommunication signals.

[0096] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A transformer short circuit fault diagnosis method, characterized in that: The transformer comprises a three-phase winding, the corner contacts between the three-phase windings are disconnected to form three-phase independent windings, an AC voltage is provided for excitation of any phase transformer winding, and any phase winding of the other two phases is short-circuited, and the remaining phase winding is used as the phase winding to be tested, and any phase winding comprises two groups of coils, and when an AC voltage is provided for excitation of any phase transformer winding, a group of coils with a relatively large number of coil turns is selected, and an AC voltage is provided to the group of coils; The transformer short-circuit fault diagnosis method comprises: Measuring the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage; Measuring the induced voltage of the secondary winding in the phase winding to be measured to obtain a second induced voltage; taking a ratio of the first induced voltage to the second induced voltage as an actual voltage ratio; Determine the location of the short circuit fault according to the actual voltage ratio and the designed turns ratio; the designed turns ratio is the ratio of the number of turns of the primary winding coil to the number of turns of the secondary winding coil; The step of determining the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio includes: If the actual voltage ratio is less than the designed turns ratio, it is determined that a short circuit fault occurs in the primary winding; If the actual voltage ratio is greater than the designed turns ratio, it is determined that a short circuit fault occurs in the secondary winding; If the actual voltage ratio is equal to the designed turns ratio, it is determined that there is no short circuit fault; The AC voltage is the maximum voltage that does not cause overcurrent within a range of greater than or equal to 0V and less than or equal to 220V; After determining the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio, the method further includes: Calculating the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs; The calculating the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs includes: When a short circuit fault occurs in the primary winding, according to Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns; When a short circuit fault occurs in the secondary winding, according to The equivalent short-circuit turns are calculated, wherein U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns.

2. The transformer short circuit fault diagnosis method according to claim 1, characterized in that: The number of turns of the primary winding is greater than the number of turns of the secondary winding.

3. A transformer short circuit fault diagnosis device, characterized in that: include: An excitation unit, used for providing AC voltage excitation for any phase transformer winding; A primary measuring unit, used to measure the induced voltage of the primary winding in the phase winding to be measured to obtain a first induced voltage; A secondary measuring unit, used for measuring the induced voltage of the secondary winding in the phase winding to be measured, to obtain a second induced voltage; a logic unit, configured to calculate a ratio of the first induced voltage to the second induced voltage to obtain an actual voltage ratio; The logic unit is further used to determine the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio; The step of determining the location where the short circuit fault occurs according to the actual voltage ratio and the designed turns ratio includes: If the actual voltage ratio is less than the designed turns ratio, it is determined that a short circuit fault occurs in the primary winding; If the actual voltage ratio is greater than the designed turns ratio, it is determined that a short circuit fault occurs in the secondary winding; If the actual voltage ratio is equal to the designed turns ratio, it is determined that there is no short circuit fault; The AC voltage provided by the excitation unit is a maximum voltage within a range of greater than or equal to 0V and less than or equal to 220V that does not cause overcurrent; The logic unit is further used to calculate the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs; The calculating the equivalent short-circuit turns according to the actual voltage ratio and the location where the short-circuit fault occurs includes: When a short circuit fault occurs in the primary winding, Calculate the equivalent short-circuit turns, where U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns; When a short circuit fault occurs in the secondary winding, according to The equivalent short-circuit turns are calculated, wherein U1 is the first induced voltage, U2 is the second induced voltage, n1 is the number of turns of the primary winding coil, n2 is the number of turns of the secondary winding coil, and n is the equivalent short-circuit turns.

4. The transformer short-circuit fault diagnosis device according to claim 3, characterized in that: include: The number of turns of the primary winding measured by the primary measuring unit is greater than the number of turns of the secondary winding measured by the secondary measuring unit.

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