A device and method for calibrating step response characteristics of a resistance strain gauge

High-speed electronic switches and step attenuators generate high anti-interference step strain waveforms of any amplitude, and use software equivalent sampling technology to achieve efficient step response calibration of resistance strain meter, solving the problems of waveform distortion and uncontrollable amplitude under small and medium-sized step amplitudes in the prior art.

CN114508995BActive Publication Date: 2025-03-28BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
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Patent Information

Application Number
CN202210064879.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-20
Publication Date
2025-03-28
Estimated Expiration
2042-01-20

AI Technical Summary

Technical Problem

In the case of small step amplitude, the step waveform overshoot oscillation distortion is large, and it is impossible to perform normal measurement and calibration. At the same time, the step amplitude is limited by the circuit principle structure and cannot be controlled arbitrarily.

Method used

The stable and reliable high-speed electronic switch generates periodic high-impact and simulated large-strain original resistance step waveforms, and the strain waveform is stepped through the step attenuator to generate an analog step strain excitation response signal of any amplitude. At the same time, software equivalent sampling is used to achieve equivalent high-speed sampling at low sampling rates, and an effective step response characteristic curve is obtained.

Benefits of technology

It realizes high-impairment and arbitrarily controllable amplitude step response calibration of resistance strain meter, solves the problem of waveform distortion under small step amplitude, and effectively excites and calibrates various resistance strain meter step response characteristics within a wider frequency range and wider amplitude range.

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Abstract

The present invention discloses a device and method for calibrating the step response characteristics of a resistance strain gauge, which belongs to the field of strain electrical measurement and metrology testing technology. The present invention generates a periodic simulated large strain original resistance step waveform with high anti-interference characteristics through a stable and reliable high-speed electronic switch, generates an original high anti-interference simulated large strain step excitation, and performs step-by-step regulation on the strain waveform through a step attenuator to generate a simulated step strain excitation response signal of any amplitude, which has the same high anti-interference characteristics as the high anti-interference simulated large strain; realizes equivalent high-speed sampling at a low sampling rate in a software equivalent sampling mode to obtain an effective step response characteristic curve; combines dynamic calibration theory and method to realize metrological calibration of the dynamic characteristics of the resistance strain gauge.
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