A TWS headset testing device and method
Through automated TWS headphone testing devices and methods, testing strategies are formulated using big data, which solves the problems of high labor costs and lack of targetedness in traditional testing, and achieves efficient and accurate automated testing.
CN114662284BActive Publication Date: 2025-03-18SHENZHEN BAITAI IND CO LTD
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Patent Information
- Application Number
- CN202210193780.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-03-01
- Publication Date
- 2025-03-18
- Estimated Expiration
- 2042-03-01
AI Technical Summary
Technical Problem
Traditional TWS headphone testing requires manual selection of test items and summary results, which are costly and lack targeted.
Method used
Design an automated TWS headphone testing device and method, and realize automatic test and result summary by obtaining headphone attribute information, using big data to preprocess and formulate testing strategies.
Benefits of technology
It greatly reduces labor costs, realizes automated testing, and can formulate appropriate testing strategies for different models and batches of TWS head mechanisms, improving testing efficiency and accuracy.
✦ Generated by Eureka AI based on patent content.
Abstract
The present invention provides a TWS headset testing device and method, wherein the device includes: an acquisition module, used to acquire the attribute information corresponding to the TWS headset to be tested, and at the same time, based on the attribute information, acquire the usage big data; a preprocessing module, used to preprocess the usage big data; a formulation module, used to formulate an appropriate test strategy based on the preprocessing result; a testing module, used to perform corresponding tests on the TWS headset in a shielding box based on the test strategy, and summarize the test results. The TWS headset testing device and method of the present invention can automatically test the TWS headset, without the need to manually select test items and perform corresponding tests, and without the need to manually summarize the test results, which greatly reduces the labor cost. At the same time, based on the use of big data, a suitable test strategy is formulated to test the TWS headset in a targeted manner.
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