Measurement device and method based on photon number resolving detector

Abstract

This invention provides a measurement device and method based on a photon number-resolution detector. The measurement device includes a sample holder, a coherent light source, and a photon number-resolution detector. The sample holder is configured to receive a sample and to accommodate the sample for chemical reactions, temperature regulation, and mechanical and motion state control. The coherent light source is configured to emit incident light onto the sample on the sample holder. The photon number-resolution detector is configured to measure and statistically analyze the transmitted, reflected, and scattered light data of the sample passing through the sample holder to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light. This invention's measurement device and method utilize a photon number-resolution detector to measure the chemical composition, reaction process, temperature, mechanical and motion state of a sample, thus expanding the application range of photon number-resolution detectors.

Description

Technical Field

[0001] This invention relates to the field of photon number-resolved detector technology, and more particularly to a measurement device and method based on a photon number-resolved detector. Background Technology

[0002] With the rapid development of optical detection technology, the measurement and analysis of the characteristics of weak light has become possible. Photon number-resolved detectors (PDDs) are the primary measurement devices. When weak light is incident on a PDD, it generates a corresponding response signal based on the different photon numbers, enabling the analysis of the statistical characteristics of the incident light. Currently, PDDs, with their photon number resolution capability, are widely used in quantum communication, lidar, and other fields. However, the application of PDDs in the measurement field is relatively limited in existing technologies. Summary of the Invention

[0003] This invention provides a measurement device and method based on a photon number-resolved detector, which solves the problem that the application of photon number-resolved detectors in the field of measurement is relatively limited in the prior art.

[0004] In a first aspect, the present invention provides a measurement device based on a photon number-resolved detector, comprising:

[0005] The sample holder is configured to receive a sample and is also configured to contain the sample for chemical reactions, regulate the temperature of the sample, and regulate the mechanical and motion states of the sample.

[0006] A coherent light source is configured to emit incident light toward the sample on the sample holder;

[0007] A photon number-resolved detector is configured to measure and statistically analyze data of transmitted, reflected, and scattered light passing through the sample on the sample holder to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light.

[0008] According to the measurement device based on a photon number-resolved detector provided by the present invention, the sample holder includes a sample stage and a temperature adjustment module. The sample stage is configured to hold the sample, and the temperature adjustment module is disposed on the sample stage and configured to adjust the temperature of the sample on the sample stage.

[0009] According to the measurement device based on a photon number-resolved detector provided by the present invention, the temperature adjustment module is configured to apply one or more of current, voltage, sound field, magnetic field and electromagnetic wave to the sample on the sample stage to adjust the temperature of the sample.

[0010] According to the measurement device based on a photon number-resolution detector provided by the present invention, the sample holder further includes a motion mechanism connected to the sample stage, and the motion mechanism is configured to drive the sample stage to perform at least one of vibration, rotation, and translation.

[0011] According to the measurement device based on a photon number-resolved detector provided by the present invention, the sample holder further includes a loading mechanism disposed on the sample stage, the loading mechanism being configured to perform compression and / or stretching loading operations on the sample on the sample stage.

[0012] According to the measurement device based on a photon number-resolved detector provided by the present invention, the coherent light source is a laser or a narrowband filtered light-emitting diode.

[0013] The measurement device based on a photon number-resolution detector provided by the present invention is any one of a superconducting phase transition edge sensor, a superconducting nanowire array, a microwave dynamic inductive detector, a time-division multiplexed photon number-resolution detector, a frequency-division multiplexed photon number-resolution detector, a differential detection photon number-resolution detector, and a spatial array photon number-resolution detector.

[0014] According to the measurement apparatus based on a photon number-resolved detector provided by the present invention, both the coherent light source and the photon number-resolved detector are configured to be movable relative to the sample holder to adjust the relative positions of the coherent light source and the photon number-resolved detector with respect to the sample holder.

[0015] Secondly, the present invention also provides a measurement method based on a photon number-resolution detector, and a measurement device based on a photon number-resolution detector as described in any of the above claims, comprising the following steps:

[0016] Place the sample on the sample holder and perform one or more operations, such as controlling the chemical reaction of the sample, adjusting the sample temperature, or adjusting the mechanical and motion state of the sample.

[0017] Control the coherent light source to emit incident light onto the sample on the sample holder;

[0018] Data on transmitted light, reflected light, and scattered light passing through the sample, measured by a photon number-resolved detector, are acquired, statistically analyzed, and the photon statistical characteristics of the transmitted light, reflected light, and scattered light are obtained.

[0019] The photon statistical properties of the obtained transmitted light, reflected light, and scattered light are analyzed to obtain one or more of the correspondences between the chemical composition and reaction conditions, temperature, mechanical and motion states of the sample and the photon statistical properties of the transmitted light, reflected light, and scattered light.

[0020] The measurement method based on a photon number-resolved detector provided by the present invention further includes the following steps:

[0021] Place the sample on the sample holder;

[0022] Control the coherent light source to emit incident light onto the sample on the sample holder;

[0023] Data on transmitted light, reflected light, and scattered light passing through the sample, measured by a photon number-resolved detector, are acquired, statistically analyzed, and the photon statistical characteristics of the transmitted light, reflected light, and scattered light are obtained.

[0024] Based on the correspondence between the chemical composition and reaction process, temperature, mechanical and motion state of the sample and the photon statistical characteristics of transmitted light, reflected light and scattered light, the obtained photon statistical characteristics of transmitted light, reflected light and scattered light are analyzed to obtain one or more of the current chemical composition and reaction process, temperature, mechanical and motion state of the sample.

[0025] The present invention provides a measurement device and method based on a photon number-resolution detector. A sample holder receives a sample, and a coherent light source emits incident light towards the sample. Utilizing the photon number-resolution detector's ability to perform photon statistics, the device measures, statistically analyzes, and obtains the photon statistical characteristics of the transmitted, reflected, and scattered light passing through the sample. This enables the measurement of the sample's chemical composition, reaction process, temperature, mechanical properties, and motion state based on the photon number-resolution detector. Furthermore, the adjustable function of the sample holder allows for... The sample is subjected to various conditions, including different temperatures, mechanical and motion states, chemical compositions, and reaction processes. A photon number-resolved detector (PDD) is used to measure the transmitted, reflected, and scattered light data passing through the sample under these conditions. The data is then statistically analyzed to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light. This allows for the measurement of the correspondence between the sample's chemical composition and reaction process, temperature, mechanical and motion states, and the photon statistical characteristics of the transmitted, reflected, and scattered light, based on the PDD. The measurement device and method based on the PDD of this invention expands the application range of PDDs and effectively solves the problem of the limited application of PDDs in the measurement field in existing technologies. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0027] Figure 1 This is a schematic diagram of the structure of the measurement device based on a photon number-resolved detector provided by the present invention;

[0028] Figure 2 This is a schematic flowchart of the measurement method based on a photon number-resolved detector provided by the present invention.

[0029] Figure label:

[0030] 1: Sample stage; 2: Coherent light source; 3: Photon number-resolved detector; 200: Sample. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0032] like Figure 1 As shown, the measurement device based on a photon number-resolution detector of the present invention includes a sample holder 1, a coherent light source 2, and a photon number-resolution detector 3. The sample holder 1 is configured to receive a sample 200 and is also configured to accommodate the sample 200 for chemical reactions, regulate the temperature of the sample 200, and regulate the mechanical and motion states of the sample 200. The coherent light source 2 is configured to emit incident light onto the sample 200 on the sample holder 1. The photon number-resolution detector 3 is configured to measure and statistically analyze the data of transmitted light, reflected light, and scattered light passing through the sample 200 on the sample holder 1 to obtain the photon statistical characteristics of the transmitted light, reflected light, and scattered light.

[0033] In this embodiment, sample holder 1 is used to receive sample 200, which can be solid, liquid, or gas, and can be mounted, placed, or contained on sample holder 1. Coherent light source 2 is used to emit incident light toward sample 200 on sample holder 1; photon number-resolution detector 3 has the characteristic of performing photon statistics. Photon statistics reflect the characteristics of the light field through the statistical distribution of photon numbers. Here, the data measured by photon number-resolution detector 3 includes voltage and current, etc., and photon statistical characteristics are obtained by statistically analyzing the voltage and current data. The photon number-resolution detector 3 is used to measure, statistically analyze, and obtain the photon statistical characteristics of the transmitted, reflected, and scattered light passing through sample 200, thereby obtaining the photon statistical characteristics of the transmitted, reflected, and scattered light passing through the sample.

[0034] Sample 200 can react with a certain chemical substance, and sample holder 1 can accommodate sample 200 to carry out the chemical reaction. Furthermore, there is a specific correspondence between the chemical composition and reaction process of sample 200 and the photon statistical characteristics of the transmitted, reflected, and scattered light passing through sample 200. When the correspondence between the chemical composition and reaction process of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is known, sample 200 is placed on sample holder 1, and incident light emitted by coherent light source 2 irradiates sample 200. The data of transmitted, reflected, and scattered light passing through sample 200 are measured using photon number-resolved detector 3 and statistically analyzed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. Then, based on the known correspondence, the composition, concentration, and reaction process of the chemical substance in sample 200 are further obtained. When the correspondence between the chemical composition and reaction process of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, sample 200 is placed on sample holder 1, and sample 200 is controlled to perform chemical reactions and other operations. Incident light emitted by coherent light source 2 irradiates sample 200. Photon number-resolved detector 3 is used to measure the data of transmitted, reflected, and scattered light passing through sample 200 under different chemical compositions and reaction process conditions, and statistical analysis is performed to obtain the corresponding photon statistical characteristics of transmitted, reflected, and scattered light. Thus, the correspondence between the chemical composition and reaction process of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is obtained.

[0035] The optical properties of sample 200, such as transmittance, reflectance, scattering ratio, and refractive index, are sensitive to temperature. There is a specific correlation between the temperature of sample 200 and the photon statistical characteristics of the transmitted, reflected, and scattered light passing through it. Sample holder 1 also has a temperature adjustment function, enabling the adjustment of sample 200's temperature. When the correlation between sample 200's temperature and the photon statistical characteristics of transmitted, reflected, and scattered light is known, sample 200 is placed on sample holder 1, and incident light emitted from coherent light source 2 illuminates sample 200. A photon number-resolved detector 3 measures and statistically analyzes the data of transmitted, reflected, and scattered light passing through sample 200 to obtain the photon statistical characteristics. Then, based on the known correlation, the current temperature of sample 200 is further determined. When the relationship between the temperature of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, sample 200 is placed on sample holder 1, and the temperature of sample 200 is adjusted. Incident light emitted by coherent light source 2 is irradiated onto sample 200. The data of transmitted, reflected, and scattered light passing through sample 200 under different temperature conditions are measured by photon number-resolved detector 3 and statistically analyzed to obtain the corresponding photon statistical characteristics of transmitted, reflected, and scattered light. Thus, the relationship between the temperature of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is obtained.

[0036] The optical properties of sample 200, such as transmittance, reflectance, scattering ratio, and refractive index, are also sensitive to its mechanical and motion states. A specific correspondence exists between the mechanical and motion states of sample 200 and the photon statistical characteristics of the transmitted, reflected, and scattered light passing through it. Sample holder 2 can also adjust the mechanical and motion states of sample 200, thereby changing its optical properties such as transmittance, reflectance, scattering ratio, and refractive index. When the correspondence between the mechanical and motion states of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is known, sample 200 is placed on sample holder 1, and incident light emitted from coherent light source 2 illuminates sample 200. The data of transmitted, reflected, and scattered light from sample 200 are measured using photon number-resolved detector 3, and statistical analysis is performed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. Then, based on the known correspondence, the current mechanical and motion states of sample 200 are further obtained. When the correspondence between the mechanical and motion states of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, sample 200 is placed on sample holder 1, and the mechanical and motion states of sample 200 are adjusted. Incident light emitted by coherent light source 2 illuminates sample 200. The data of transmitted, reflected, and scattered light passing through sample 200 under different mechanical and motion states are measured by photon number-resolved detector 3 and statistically analyzed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. Thus, the correspondence between the mechanical and motion states of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is obtained.

[0037] The measurement device based on a photon number-resolution detector of the present invention receives a sample 200 through a sample holder 1 and emits incident light toward the sample 200 through a coherent light source 2. Utilizing the photon number-resolution detector 3, which can realize the photon statistical properties, the device measures and statistically analyzes the data of transmitted light, reflected light, and scattered light passing through the sample 200 to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light. Then, based on the known correspondence between the chemical composition and reaction process, temperature, mechanical and motion state of the sample 200 and the photon statistical characteristics of transmitted light, reflected light, and scattered light, the device obtains the current chemical composition and reaction process, temperature, mechanical and motion state of the sample 200, thereby realizing the measurement of the chemical composition and reaction process, temperature, mechanical and motion state of the sample 200 based on the photon number-resolution detector 3. Simultaneously, by setting the adjustable function of the sample holder 1, the sample 200 is subjected to different temperatures, mechanical and motion states, chemical compositions, and reaction processes. The transmitted, reflected, and scattered light data from the sample 200 under these conditions are measured using a photon number-resolution detector 3. The data are then statistically analyzed to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light. This allows for the determination of the correspondence between the chemical composition and reaction process, temperature, mechanical and motion state of the sample 200 and the photon statistical characteristics of the transmitted, reflected, and scattered light, based on the photon number-resolution detector 3. This invention's photon number-resolution detector-based measurement device expands the application range of the photon number-resolution detector 3, effectively solving the problem of the limited application of the photon number-resolution detector 3 in the measurement field in existing technologies.

[0038] Specifically, the coherent light source 2 is a laser or a narrowband-filtered light-emitting diode. Lasers and narrowband-filtered light-emitting diodes have stable power and good coherence characteristics, ensuring that the coherent light source 2 can provide incident light with stable power and good coherence characteristics.

[0039] Specifically, the photon number-resolved detector 3 is any one of the following: superconducting phase transition edge sensor, superconducting nanowire array, microwave dynamic inductive detector, time-division multiplexing photon number-resolved detector, frequency-division multiplexing photon number-resolved detector, differential detection photon number-resolved detector, and spatial array photon number-resolved detector.

[0040] In one embodiment, both the coherent light source 2 and the photon number-resolved detector 3 are configured to be movable relative to the sample holder 1 to adjust the relative positions of the coherent light source 2 and the photon number-resolved detector 3 with respect to the sample holder 1.

[0041] In this embodiment, by adjusting the relative positions of the coherent light source 2 and the photon number resolution detector 3 with the sample holder 1, the incident angle and incident position of the incident light emitted by the coherent light source 2 on the sample 200 can be adjusted, as can the receiving position and receiving angle of the transmitted light, reflected light and scattered light received by the photon number resolution detector 3 after passing through the sample 200. This is beneficial for adjusting the coherent light source 2 and the photon number resolution detector 3 to the optimal position with the highest measurement accuracy, and can be applied to the measurement of various types of samples 200, making it more flexible and applicable to a wider range of applications.

[0042] Specifically, the sample holder 1 includes a sample stage and a temperature control module. The sample stage is configured to hold a sample 200, and the temperature control module is located on the sample stage and configured to adjust the temperature of the sample 200 on the sample stage.

[0043] In this embodiment, the sample stage is used to install, place, or contain the sample 200. By setting a temperature adjustment module, the temperature of the sample 200 can be adjusted. In conjunction with the coherent light source 2 and the photon number-resolved detector 3, the data of transmitted light, reflected light, and scattered light passing through the sample 200 under different temperature conditions can be measured and statistically analyzed.

[0044] Specifically, the temperature control module includes at least one of an electric heating device, an acoustic heating device, and an electromagnetic heating device. The temperature control module adjusts the temperature of the sample 200 by means of electric heating, acoustic heating, electromagnetic heating, etc.

[0045] In one embodiment, the temperature control module can regulate the temperature of the sample 200 through heat exchange, such as radiation heat exchange, contact heat exchange, and convection heat exchange.

[0046] In another embodiment, the temperature control module is configured to apply one or more of current, voltage, sound field, magnetic field and electromagnetic wave to the sample 200 on the sample stage to adjust the temperature of the sample 200.

[0047] In this embodiment, the temperature of sample 200 is sensitive to external conditions such as current, voltage, sound field, magnetic field, or electromagnetic wave. One or more of these conditions are applied to sample 200 via a temperature regulation module to directly adjust its temperature. When the correspondence between the temperature of sample 200 and external conditions such as current, voltage, sound field, magnetic field, or electromagnetic wave is known, and the correspondence between the temperature of sample 200 and the photon statistical characteristics of transmitted light, reflected light, and scattered light is also known, sample 200 is placed on sample holder 1. Incident light emitted by coherent light source 2 illuminates sample 200. A photon number-resolved detector 3 measures and statistically analyzes the data of transmitted light, reflected light, and scattered light passing through sample 200 to obtain the photon statistical characteristics of the transmitted light, reflected light, and scattered light. Then, based on the known correspondence, the current temperature of sample 200 is obtained, and the intensity of external conditions such as current, voltage, sound field, magnetic field, and electromagnetic wave that change the temperature of sample 200 is further determined. When the relationship between the temperature of sample 200 and external conditions such as current, voltage, sound field, magnetic field, or electromagnetic waves is unknown, and / or the relationship between the temperature of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, sample 200 is placed on sample holder 1, and the intensity of external conditions such as current, voltage, sound field, magnetic field, and electromagnetic waves applied to sample 200 is adjusted. Incident light emitted by coherent light source 2 illuminates sample 200. The data of transmitted, reflected, and scattered light passing through sample 200 under different external intensity conditions are measured using photon number-resolved detector 3, and statistical analysis is performed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. This yields the relationship between the temperature of sample 200 and external conditions such as current, voltage, sound field, magnetic field, or electromagnetic waves, as well as the relationship between the temperature of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light. Thus, the application range of photon number-resolved detector 3 is further expanded, and its practicality is enhanced.

[0048] In one embodiment, the sample holder 1 further includes a motion mechanism connected to the sample stage, and the motion mechanism is configured to drive the sample stage to perform at least one of vibration, rotation, and translation.

[0049] In this embodiment, the optical properties of sample 200, such as transmittance, reflectance, scattering ratio, and refractive index, are sensitive to motion states such as vibration and rotation. By setting a motion mechanism, the sample stage is driven to perform at least one of vibration, rotation, and translation. Sample 200 is placed on the sample stage, and the sample stage drives sample 200 to perform vibration, rotation, or translation synchronously, thereby realizing the function of adjusting the motion state of sample 200 and making the optical properties of sample 200, such as transmittance, reflectance, scattering ratio, and refractive index, variable. When the correspondence between the motion states of sample 200, such as vibration, rotation, and translation, and the photon statistical characteristics of transmitted light, reflected light, and scattered light is unknown, sample 200 is placed on sample holder 1, and the motion states of sample 200, such as vibration, rotation, and translation, are adjusted by a motion mechanism. Incident light emitted by coherent light source 2 irradiates sample 200. The data of transmitted light, reflected light, and scattered light passing through sample 200 under different motion states are measured by photon number-resolved detector 3 and statistically analyzed to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light. Thus, the correspondence between the motion states of sample 200, such as vibration, rotation, and translation, and the photon statistical characteristics of transmitted light, reflected light, and scattered light is obtained.

[0050] In one embodiment, the sample holder 1 further includes a loading mechanism disposed on the sample stage, the loading mechanism being configured to perform compression and / or stretching loading operations on the sample 200 on the sample stage.

[0051] In this embodiment, the optical properties of sample 200, such as transmittance, reflectance, scattering ratio, and refractive index, are sensitive to mechanical states such as compression and stretching. By setting a loading mechanism, the sample 200 is subjected to compression and / or stretching, thereby adjusting the mechanical state of sample 200 and making its optical properties such as transmittance, reflectance, scattering ratio, and refractive index variable. When the correspondence between the mechanical states of sample 200 (compression, stretching, etc.) and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, sample 200 is placed on a sample stage, and its mechanical states (compression, stretching, etc.) are adjusted by the loading mechanism. Incident light emitted by coherent light source 2 illuminates sample 200. The data of transmitted, reflected, and scattered light passing through sample 200 under different mechanical states are measured by photon number-resolved detector 3 and statistically analyzed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light, thus obtaining the correspondence between the mechanical states of sample 200 (compression, stretching, etc.) and the photon statistical characteristics of transmitted, reflected, and scattered light.

[0052] Furthermore, the measurement device based on the photon number-resolution detector also includes a controller, which is connected to the photon number-resolution detector 3, the coherent light source 2, and the sample holder 1. The controller is used to control the operation and spatial position of the sample holder 1 and the coherent light source 2, as well as to acquire the data measured by the photon number-resolution detector 3 and perform statistical analysis to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light, and further analyze the photon statistical characteristics of transmitted light, reflected light, and scattered light.

[0053] In this embodiment, based on the actual measurement conditions required by the sample 200, the controller controls the operation of the sample holder 1 and the coherent light source 2. For example, it controls the movement of the sample holder 1 to adjust the mechanical and motion state of the sample 200, or controls the sample holder 1 to adjust the temperature of the sample 200, or controls the coherent light source 2 to emit incident light at a set power. By controlling the operation of the sample holder 1 and the coherent light source 2, measurements can be performed under different temperatures, different mechanical and motion states, different chemical compositions, and different reaction processes. Simultaneously, the controller acquires the data measured by the photon number-resolution detector 2 and performs statistical analysis to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light. By analyzing the photon statistical characteristics of transmitted, reflected, and scattered light, the current temperature, mechanical and motion state, chemical composition, and reaction process of sample 200 can be obtained. This enables the measurement of the chemical composition, reaction process, temperature, mechanical and motion state of sample 200 based on photon number-resolution detector 3, or the correspondence between the chemical composition, reaction process, temperature, mechanical and motion state of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light can be obtained. This enables the measurement of the correspondence between the chemical composition, reaction process, temperature, mechanical and motion state of sample 200 and the photon statistical characteristics of transmitted, reflected, and scattered light based on photon number-resolution detector 3.

[0054] On the other hand, such as Figure 2 As shown, based on the measurement device based on the photon number-resolution detector provided in the above embodiments, the measurement method based on the photon number-resolution detector of the present invention includes the following steps:

[0055] Step S10: Place the sample on the sample holder and perform one or more operations among controlling the chemical reaction of the sample, adjusting the sample temperature, and adjusting the mechanical and motion state of the sample.

[0056] Step S20: Control the coherent light source to emit incident light onto the sample on the sample holder;

[0057] Step S30: Obtain data on transmitted light, reflected light, and scattered light passing through the sample measured by the photon number-resolved detector, and perform statistical analysis to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light.

[0058] Step S40: Analyze the obtained photon statistical characteristics of transmitted light, reflected light and scattered light to obtain one or more of the correspondences between the chemical composition and reaction process, temperature, mechanical and motion states of the sample and the photon statistical characteristics of transmitted light, reflected light and scattered light.

[0059] In this embodiment, sample 200 is received by sample holder 1, and incident light is emitted towards sample 200 by coherent light source 2. The photon number-resolution detector 3 can realize the photon statistical characteristics. At the same time, by setting the adjustable function of sample holder 1, sample 200 is subjected to different conditions such as temperature, mechanical and motion state, chemical composition and reaction process. The photon number-resolution detector 3 is used to measure, statistically analyze and obtain the photon statistical characteristics of transmitted light, reflected light and scattered light passing through sample 200 under different conditions such as temperature, mechanical and motion state, chemical composition and reaction process, etc., to obtain the correspondence between chemical composition and reaction process, temperature, mechanical and motion state of sample 200 and photon statistical characteristics of transmitted light, reflected light and scattered light. Thus, the correspondence between chemical composition and reaction process, temperature, mechanical and motion state of sample 200 and photon statistical characteristics of transmitted light, reflected light and scattered light is obtained based on photon number-resolution detector 3. The measurement method based on the photon number-resolution detector of the present invention expands the application range of the photon number-resolution detector 3 and effectively solves the problem that the application of the photon number-resolution detector 3 in the measurement field is relatively limited in the prior art.

[0060] Furthermore, the measurement method based on a photon number-resolved detector also includes the following steps:

[0061] Step S50: Place the sample on the sample holder;

[0062] Step S60: Control the coherent light source to emit incident light onto the sample on the sample holder;

[0063] Step S70: Obtain data on transmitted light, reflected light, and scattered light passing through the sample measured by the photon number-resolved detector, and perform statistical analysis to obtain the photon statistical characteristics of transmitted light, reflected light, and scattered light.

[0064] Step S80: Based on the correspondence between the chemical composition and reaction process, temperature, mechanical and motion state of the sample and the photon statistical characteristics of transmitted light, reflected light and scattered light, analyze the obtained photon statistical characteristics of transmitted light, reflected light and scattered light to obtain one or more of the current chemical composition and reaction process, temperature, mechanical and motion state of the sample.

[0065] In this embodiment, the data of transmitted light, reflected light, and scattered light passing through sample 200 are measured, statistically analyzed, and obtained by using photon number-resolution detector 3. Then, based on the known correspondence between the chemical composition, reaction process, temperature, mechanical and motion state of sample 200 and the photon statistical characteristics of transmitted light, reflected light, and scattered light, the current chemical composition, reaction process, temperature, mechanical and motion state of sample 200 is obtained. This enables the measurement of the chemical composition, reaction process, temperature, mechanical and motion state of sample 200 based on photon number-resolution detector 3, further expanding the application range of photon number-resolution detector 3 and making it more practical.

[0066] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A measurement method based on a photon number-resolved detector, comprising a sample holder, a coherent light source, a sample stage, and a temperature control module, characterized in that, Includes the following steps: Place the sample on the sample holder and perform one or more operations, such as controlling the chemical reaction of the sample, adjusting the sample temperature, or adjusting the mechanical and motion state of the sample. Control the coherent light source to emit incident light onto the sample on the sample holder; Data on transmitted light, reflected light, and scattered light passing through the sample, measured by a photon number-resolved detector, are acquired, statistically analyzed, and the photon statistical characteristics of the transmitted light, reflected light, and scattered light are obtained. The photon statistical properties of the obtained transmitted light, reflected light, and scattered light are analyzed to obtain one or more of the correspondences between the chemical composition and reaction process, temperature, mechanical and motion states of the sample and the photon statistical properties of the transmitted light, reflected light, and scattered light. The sample holder includes a sample stage and a temperature control module. The sample stage is configured to hold the sample, and the temperature control module is disposed on the sample stage and configured to adjust the temperature of the sample on the sample stage. The photon number resolution detector is any one of the following: superconducting phase transition edge sensor, superconducting nanowire array, microwave dynamic inductive detector, time-division multiplexing photon number resolution detector, frequency-division multiplexing photon number resolution detector, differential detection photon number resolution detector, and spatial array photon number resolution detector. The temperature control module is configured to apply one or more of current, voltage, sound field, magnetic field and electromagnetic wave to the sample on the sample stage to adjust the temperature of the sample. The sample holder further includes a motion mechanism connected to the sample stage, and the motion mechanism is configured to drive the sample stage to perform at least one of vibration, rotation, and translation. The sample holder further includes a loading mechanism disposed on the sample stage, and the loading mechanism is configured to perform compression and / or stretching loading operations on the sample on the sample stage. Both the coherent light source and the photon number-resolved detector are configured to move relative to the sample holder to adjust their relative positions to the sample holder. By adjusting the relative positions of the coherent light source and the photon number-resolution detector with the sample holder, the incident angle and incident position of the incident light emitted by the coherent light source on the sample can be adjusted, as well as the receiving position and receiving angle of the photon number-resolution detector receiving the transmitted light, reflected light and scattered light that have passed through the sample. This is beneficial for adjusting the coherent light source and the photon number-resolution detector to the optimal position with the highest measurement accuracy, and can be applied to the measurement of various types of samples. The sample holder includes a sample stage and a temperature control module. The sample stage is configured to hold a sample, and the temperature control module is located on the sample stage and configured to adjust the temperature of the sample on the sample stage. The sample stage is used to install, place, or contain samples. By setting a temperature control module, it can adjust the sample temperature. In conjunction with a coherent light source and a photon number-resolved detector, it can measure and statistically analyze the data of transmitted light, reflected light, and scattered light passing through the sample under different temperature conditions. The temperature control module includes at least one of an electric heating device, an acoustic heating device, and an electromagnetic heating device. The temperature control module regulates the sample temperature through electric heating, acoustic heating, and electromagnetic heating. The temperature control module can regulate the temperature of the sample through heat exchange; The temperature control module is configured to apply one or more of current, voltage, sound field, magnetic field and electromagnetic wave to the sample on the sample stage to adjust the temperature of the sample. The sample temperature is sensitive to external conditions such as current, voltage, sound field, magnetic field, or electromagnetic waves. A temperature control module applies one or more of these external conditions to the sample to directly regulate its temperature. When the correspondence between the sample temperature and these external conditions (current, voltage, sound field, magnetic field, or electromagnetic waves) is known, and the correspondence between the sample temperature and the photon statistical characteristics of transmitted, reflected, and scattered light is also known, the sample is placed on a sample holder, and incident light emitted from a coherent light source illuminates the sample. A photon number-resolved detector measures and statistically analyzes the data of transmitted, reflected, and scattered light passing through the sample to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light. Then, based on the known correspondences, the current temperature of the sample is obtained, and further, the current, voltage, sound field, magnetic field, and electromagnetic waves that change the sample temperature are determined. The intensity of external conditions such as field and electromagnetic waves; when the correspondence between the sample temperature and external conditions such as current, voltage, sound field, magnetic field or electromagnetic waves is unknown, and / or the correspondence between the sample temperature and the photon statistical characteristics of transmitted light, reflected light and scattered light is unknown, the sample is placed on the sample holder, and the intensity of external conditions such as current, voltage, sound field, magnetic field and electromagnetic waves applied to the sample is adjusted. The incident light emitted by the coherent light source irradiates the sample. The data of transmitted light, reflected light and scattered light passing through the sample under different external intensity conditions are measured by a photon number-resolved detector and statistically analyzed to obtain the photon statistical characteristics of transmitted light, reflected light and scattered light. Thus, the correspondence between the sample temperature and external conditions such as current, voltage, sound field, magnetic field or electromagnetic waves, as well as the correspondence between the sample temperature and the photon statistical characteristics of transmitted light, reflected light and scattered light are obtained. The sample holder also includes a motion mechanism connected to the sample stage, and the motion mechanism is configured to drive the sample stage to perform at least one of vibration, rotation, and translation. The optical properties of a sample, such as transmittance, reflectance, scattering ratio, and refractive index, are sensitive to vibration and rotation. By setting up a motion mechanism, the sample stage is driven to undergo at least one of vibration, rotation, or translation. The sample is placed on the sample stage, and the sample stage drives the sample to vibrate, rotate, or translate synchronously, making the optical properties of the sample variable. When the correspondence between the sample's vibration, rotation, and translation and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, the sample is placed on a sample holder, and the motion mechanism is used to adjust the sample's vibration, rotation, and translation. Incident light emitted by a coherent light source illuminates the sample. A photon number-resolved detector is used to measure and statistically analyze the data of transmitted, reflected, and scattered light passing through the sample under different motion states to obtain the photon statistical characteristics of transmitted, reflected, and scattered light, thereby obtaining the correspondence between the sample's vibration, rotation, and translation and the photon statistical characteristics of transmitted, reflected, and scattered light. The sample holder also includes a loading mechanism disposed on the sample stage, which is configured to perform compression and / or stretching loading operations on the sample on the sample stage. The optical properties of a sample, such as transmittance, reflectance, scattering ratio, and refractive index, are sensitive to mechanical states such as compression and stretching. By setting up a loading mechanism, the sample can be subjected to compression and / or stretching loading operations, thereby achieving the function of adjusting the mechanical state of the sample and making the optical properties of the sample, such as transmittance, reflectance, scattering ratio, and refractive index, variable. When the correspondence between the mechanical state of a sample under compression and stretching and the photon statistical characteristics of transmitted, reflected, and scattered light is unknown, the sample is placed on a sample stage, and the mechanical state of compression and stretching of the sample is adjusted by a loading mechanism. Incident light emitted by a coherent light source irradiates the sample. The data of transmitted, reflected, and scattered light passing through the sample under different mechanical states are measured by a photon number-resolved detector and statistically analyzed to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. Thus, the correspondence between the mechanical state of compression and stretching of the sample and the photon statistical characteristics of transmitted, reflected, and scattered light is obtained. The measurement device based on the photon number resolution detector also includes a controller, which is connected to the photon number resolution detector, the coherent light source and the sample holder. The controller is used to control the operation and spatial position of the sample holder and the coherent light source, as well as to acquire the data measured by the photon number resolution detector and perform statistical analysis to obtain the photon statistical characteristics of transmitted light, reflected light and scattered light, and further analyze the photon statistical characteristics of transmitted light, reflected light and scattered light. Based on the actual measurement conditions required by the sample, the controller controls the operation of the sample holder and the coherent light source. It controls the movement of the sample holder to adjust the mechanical and motion state of the sample, or controls the sample holder to adjust the sample temperature, or controls the coherent light source to emit incident light at a set power. By controlling the operation of the sample holder and the coherent light source, measurements can be performed under different temperatures, mechanical and motion states, chemical compositions, and reaction processes. Simultaneously, the controller acquires and statistically analyzes the data measured by the photon number-resolved detector to obtain the photon statistical characteristics of transmitted, reflected, and scattered light. By analyzing the photon statistical properties of light and scattered light, we can obtain the current temperature, mechanical and motion state, chemical composition and reaction process of a sample. This enables the measurement of the chemical composition, reaction process, temperature, mechanical and motion state of a sample based on a photon number-resolution detector, or the correspondence between the chemical composition, reaction process, temperature, mechanical and motion state of a sample and the photon statistical properties of transmitted light, reflected light and scattered light.

2. The measurement method based on a photon number-resolved detector according to claim 1, characterized in that, include: The sample holder is configured to receive a sample and is also configured to contain the sample for chemical reactions, regulate the temperature of the sample, and regulate the mechanical and motion states of the sample. A coherent light source is configured to emit incident light toward the sample on the sample holder; A photon number-resolved detector is configured to measure and statistically analyze data of transmitted, reflected, and scattered light passing through the sample on the sample holder to obtain the photon statistical characteristics of the transmitted, reflected, and scattered light.

3. The measurement method based on a photon number-resolved detector according to claim 1, characterized in that, The coherent light source is a laser or a narrowband filtered light-emitting diode.

4. The measurement method based on a photon number-resolved detector according to claim 1, characterized in that, Both the coherent light source and the photon number-resolved detector are configured to move relative to the sample holder to adjust their relative positions with respect to the sample holder.

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