A circular defect reconstruction method based on circumferential guided wave time domain inverse scattering method
Through the circular defect reconstruction method based on the circumferential guide wave time domain inverse scattering method, the problem of difficulty in quantitative detection of circumferential defects in the pipeline section in the prior art is solved, and the accurate reconstruction of defect position and shape is achieved, and the accuracy of defect detection is improved.
Patent Information
- Application Number
- CN202211542116.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-02
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2042-12-02
AI Technical Summary
It is difficult to quantitatively detect the position and shape of circumferential defects in the pipeline cross-section, especially in the detection of defects in three-dimensional pipelines.
The circular defect reconstruction method based on the circumferential guide wave time domain inverse scattering method is adopted. By solving the incident wave field and time domain Green function of the defect-free ring, the boundary integral equation of the time domain scattering wave field is derived, and the Bonn approximation is introduced to reconstruct the position and shape of the defect.
The accurate position and shape of defects in the ring is realized, and the defect information can be directly solved without knowing the approximate position of the defect, which improves the accuracy of defect detection.