Optical free-form surface cascade null interferometry device and measurement method
Patent Information
- Application Number
- CN202311296190.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-10-08
- Publication Date
- 2026-10-16
- Estimated Expiration
- 2043-10-08
AI Technical Summary
[0005]为了克服上述现有技术的缺点,本发明的目的在于提供一种光学自由曲面级联零位干涉测量装置及测量方法,以解决现有技术无法对大曲率、大口径、非对称大像差的光学自由曲面进行全场、高精度、非接触检测的技术难题
[0035] This invention discloses a cascaded null-position interferometry device for optical freeform surfaces. A standard plane wave is modulated on its wavefront using cascaded adjustable phase elements (deformable mirror and liquid crystal spatial light modulator) under feedback control. The system monitors and controls the wavefront modulation amount generated by each stage of adjustable phase elements, thereby superimposing to generate a large-curvature reference wavefront. Another standard plane wave illuminates the large-curvature optical freeform surface, and the large-curvature wavefront generated after reflection serves as the object wavefront. Through feedback control of the multi-stage adjustable phase elements, the reference wavefront and the object wavefront are matched to the greatest extent, achieving null-position interferometry. The two wavefronts interfere on the surface of a CCD detector. The small phase difference remaining after matching the object wavefront and the reference wavefront produces easily demodulated sparse interference fringes. By comprehensively utilizing the sparse interference fringe information and the modulation amount information of the wavefront by the cascaded adjustable phase elements, the surface shape information of the measured freeform surface can be reconstructed in reverse.