Impedance testing apparatus, system, method and electronic device
By introducing variable electrical parameters and multiplexer circuits into the impedance testing equipment, the problem of inaccuracy caused by fixed electrical parameters in the existing technology is solved, and efficient impedance testing that can flexibly adapt to different equipment is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CONTEMPORARY AMPEREX TECHNOLOGY CO LTD
- Filing Date
- 2023-11-16
- Publication Date
- 2026-06-12
AI Technical Summary
In existing technologies, impedance testing equipment cannot flexibly adjust electrical parameters, resulting in the inability to reproduce actual usage conditions and affecting testing accuracy and efficiency.
The test module receives test commands through the communication module, outputs variable electrical parameter signals, and detects the electrical parameters of the device under test. Combined with the multiplexer circuit and precision power supply unit, impedance testing of multiple devices under test can be achieved.
It enables flexible adjustment of electrical parameters according to actual needs, improving the accuracy and efficiency of impedance testing, and is suitable for different types of devices under test.
Smart Images
Figure CN117405977B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of testing technology, and in particular to an impedance testing device, system, method and electronic equipment. Background Technology
[0002] To improve the safety and stability of electrical appliances, it is necessary to inspect them when abnormalities occur.
[0003] The impedance of equipment in an electrical appliance may cause malfunctions in the appliance, so it is necessary to test the impedance of the equipment and therefore a device capable of testing impedance is needed. Summary of the Invention
[0004] This application provides an impedance testing device, system, method, and electronic device that can perform impedance testing on the device under test.
[0005] In a first aspect, this application provides an impedance testing device, comprising: a communication module connected to a test module, configured to receive a test command for a target device under test and send the test command to the test module, the test command carrying a first electrical parameter, the first electrical parameter changing with the target device under test; and a test module connected to both the communication module and the target device under test, configured to output a test signal corresponding to the first electrical parameter to the target device under test, detect a second electrical parameter of the target device under test, and determine the impedance of the target device under test based on the second electrical parameter.
[0006] Therefore, the communication module in the impedance testing equipment can receive test commands for the target device under test (DUT) and send these commands to the test module within the equipment. These commands carry a first electrical parameter that changes with the DUT. The test module can output a test signal to the DUT based on this first electrical parameter and detect a second electrical parameter of the DUT. Then, the impedance of the DUT can be determined based on the second electrical parameter. In this way, impedance can be tested using this impedance testing equipment.
[0007] In some embodiments, the first electrical parameter is obtained by searching for the electrical parameter corresponding to the target device under test (DUT) identifier from a preset correspondence between DUT identifiers and electrical parameters. The target DUT identifier is the identifier of the target DUT.
[0008] In this way, by determining the first electrical parameter corresponding to the target device under test (DUT) identifier through the preset correspondence between the DUT identifier and electrical parameters, the electrical parameters corresponding to the target DUT can be determined quickly and accurately, so as to test the target DUT.
[0009] In some embodiments, the first electrical parameter is determined based on user input.
[0010] Therefore, the first electrical parameters required for testing different devices under test may be different. The first electrical parameters can be flexibly set by user input, thereby meeting the testing needs of different devices under test.
[0011] In some embodiments, the test module includes: a processing unit connected to a communication module and a power supply unit, respectively, for receiving test instructions sent by the communication module, generating a first control signal based on a first electrical parameter, and sending the first control signal to the power supply unit; a power supply unit connected to the target device under test, for outputting a test signal to the target device under test based on the first control signal; a detection unit connected to the target device under test and the processing unit, respectively, for detecting a second electrical parameter of the target device under test after the test signal is turned on, and sending the second electrical parameter to the processing unit; the processing unit is further configured to determine the impedance of the target device under test based on the second electrical parameter.
[0012] Thus, the processing unit controls the power supply unit to output a test signal to the target device under test. Then, the detection unit detects the second electrical parameter of the target device under test after the test signal is turned on and sends it to the processing unit. The processing unit can then accurately determine the impedance of the target device under test based on the second electrical parameter.
[0013] In some embodiments, the detection unit is further configured to detect a third electrical parameter of the target device under test after the test signal is turned on, and send the third electrical parameter to the processing unit; the processing unit is further configured to correct the test signal output by the power supply unit to the target device under test when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, so that the difference between the third electrical parameter and the first electrical parameter does not exceed the preset threshold.
[0014] Thus, by detecting the third electrical parameter of the target device under test after the test signal is turned on through the detection unit and sending it to the processing unit, and then by correcting the test signal output by the power supply unit to the target device under test when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, the accuracy of the test signal output to the target device under test can be improved, thereby improving the accuracy of impedance testing.
[0015] In some embodiments, the test instruction also carries an identifier of the target device under test (DUT), and the test module further includes: a multiplexer circuit, which is connected to the processing unit, the power supply unit, the detection unit, and multiple DUTs respectively; the processing unit is further configured to generate a second control signal based on the identifier of the target DUT and send the second control signal to the multiplexer circuit; the multiplexer circuit is configured to control the connection between the DUT corresponding to the second control signal and the power supply unit, and to control the connection between the DUT corresponding to the second control signal and the detection unit.
[0016] Thus, impedance testing of multiple devices under test can be performed simultaneously using a multiplexer circuit, improving testing efficiency.
[0017] In some embodiments, the multiplexer circuit includes a plurality of first multiplexer switch units and a plurality of second multiplexer switch units; the first multiplexer switch unit has a first terminal and a second terminal, the first terminal of the first multiplexer switch unit is used to connect to the device under test, and the second terminal of the first multiplexer switch unit is connected to a processing unit and a power supply unit respectively; the second multiplexer switch unit has a first terminal and a second terminal, the first terminal of the second multiplexer switch unit is used to connect to the device under test, and the second terminal of the second multiplexer switch unit is connected to a processing unit and a detection unit respectively.
[0018] In this way, impedance testing of multiple devices under test can be performed simultaneously using multiple switches. The circuit is simple and the cost is relatively low.
[0019] In some embodiments, the power supply unit includes: a current source unit connected to the processing unit and the target device under test, respectively, for outputting current to the target device under test based on a first control signal; and / or a voltage source unit connected to the processing unit and the target device under test, respectively, for outputting voltage to the target device under test based on the first control signal.
[0020] Thus, by outputting a constant current to the target device under test through the current source unit, the impedance testing equipment can be made suitable for constant current testing scenarios, and by outputting a constant voltage to the target device under test through the voltage source unit, the impedance testing equipment can be made suitable for constant voltage testing scenarios.
[0021] In some embodiments, the test instruction also carries an electrical parameter range, which varies with the target device under test, and the detection unit is also used to detect a second electrical parameter of the target device under test based on the electrical parameter range.
[0022] In this way, the range of the detection unit for detecting the second electrical parameter can be flexibly adjusted based on the target device under test.
[0023] Secondly, this application provides an impedance testing system, comprising: an impedance testing device and an industrial control computer as shown in any embodiment of the first aspect; the industrial control computer is used to receive a first electrical parameter that varies with the target device under test, and to send a test command for the target device under test to a communication module in the impedance testing device, the test command carrying the first electrical parameter; the impedance testing device is used to send the test command to the test module through the communication module, so that the test module outputs a test signal to the target device under test according to the first electrical parameter, and detects a second electrical parameter of the target device under test, and determines the impedance of the target device under test according to the second electrical parameter.
[0024] Therefore, the industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command carrying the first electrical parameter to the communication module in the impedance testing equipment. The communication module can then send this test command to the testing module, which can output a test signal to the DUT based on the first electrical parameter and detect a second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT can be determined. In this way, the impedance of the DUT can be tested.
[0025] Thirdly, this application provides an impedance testing method applied to an impedance testing system as shown in any embodiment of the second aspect. The method includes: receiving a first electrical parameter that varies with the target device under test via an industrial control computer; sending a test command for the target device under test to a communication module in the impedance testing device, the test command carrying the first electrical parameter; sending the test command to a test module in the impedance testing device via the communication module; outputting a test signal to the target device under test via the test module based on the first electrical parameter; detecting a second electrical parameter of the target device under test; and determining the impedance of the target device under test based on the second electrical parameter.
[0026] Therefore, an industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command to the communication module in the impedance testing equipment. The communication module then transmits the test command to the test module in the impedance testing equipment. The test module outputs a test signal to the DUT based on the first electrical parameter carried in the test command, and detects the second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT is determined. In this way, the impedance of the DUT can be tested.
[0027] In some embodiments, the test module outputs a test signal to the target device under test (DUT) based on a first electrical parameter, detects a second electrical parameter of the DUT, and determines the impedance of the DUT based on the second electrical parameter. This includes: generating a first control signal based on the first electrical parameter through a processing unit in the test module and sending the first control signal to a power supply unit in the test module; outputting a test signal to the DUT based on the first control signal through the power supply unit; detecting the second electrical parameter of the DUT after the test signal is turned on through a detection unit in the test module and sending the second electrical parameter to the processing unit; and determining the impedance of the DUT based on the second electrical parameter through the processing unit.
[0028] Thus, the processing unit controls the power supply unit to output a test signal to the target device under test. Then, the detection unit detects the second electrical parameter of the target device under test after the test signal is turned on and sends it to the processing unit. The processing unit can then accurately determine the impedance of the target device under test based on the second electrical parameter.
[0029] In some embodiments, the test command also carries an identifier of the target device under test. Before the power supply unit outputs a test signal to the target device under test based on the first control signal, the method further includes: generating a second control signal based on the identifier of the target device under test by the processing unit, sending the second control signal to the multiplexer circuit in the test module; controlling the connection between the device under test corresponding to the second control signal and the power supply unit by the multiplexer circuit, and controlling the connection between the device under test corresponding to the second control signal and the detection unit.
[0030] Thus, impedance testing of multiple devices under test can be performed simultaneously using a multiplexer circuit, improving testing efficiency.
[0031] Fourthly, this application provides an impedance testing device applied to an impedance testing system as shown in any embodiment of the second aspect. The device includes: a first processing module, configured to receive a first electrical parameter that varies with the target device under test via an industrial control computer, and send a test command for the target device under test to a communication module in the impedance testing device, the test command carrying the first electrical parameter; a second processing module, configured to send the test command to a test module in the impedance testing device via the communication module; and a third processing module, configured to output a test signal to the target device under test via the test module based on the first electrical parameter, detect a second electrical parameter of the target device under test, and determine the impedance of the target device under test based on the second electrical parameter.
[0032] Therefore, an industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command to the communication module in the impedance testing equipment. The communication module then transmits the test command to the test module in the impedance testing equipment. The test module outputs a test signal to the DUT based on the first electrical parameter carried in the test command, and detects the second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT is determined. In this way, the impedance of the DUT can be tested.
[0033] Fifthly, this application provides an electronic device, the device comprising: a processor and a memory storing computer program instructions; the processor, when executing the computer program instructions, implements the impedance testing method as shown in any embodiment of the third aspect.
[0034] In a sixth aspect, this application provides a computer storage medium storing computer program instructions, which, when executed by a processor, implement the impedance testing method shown in any embodiment of the third aspect.
[0035] In a seventh aspect, embodiments of this application provide a computer program product in which instructions, when executed by a processor of an electronic device, cause the electronic device to perform the impedance testing method shown in any embodiment of the third aspect.
[0036] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description
[0037] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiments below. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this application. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:
[0038] Figure 1 This is one of the structural schematic diagrams of an impedance testing device provided in some embodiments of this application;
[0039] Figure 2 This is a second schematic diagram of the structure of an impedance testing device provided in some embodiments of this application;
[0040] Figure 3 This is the third schematic diagram of the structure of an impedance testing device provided in some embodiments of this application;
[0041] Figure 4 Fourth schematic diagram of an impedance testing device provided in some embodiments of this application;
[0042] Figure 5 Fifth schematic diagram of an impedance testing device provided in some embodiments of this application;
[0043] Figure 6 This is one of the structural schematic diagrams of an impedance testing system provided in some embodiments of this application;
[0044] Figure 7 This is a second schematic diagram of the structure of an impedance testing system provided in some embodiments of this application;
[0045] Figure 8 This is the third schematic diagram of an impedance testing system provided in some embodiments of this application;
[0046] Figure 9 A schematic flowchart illustrating an impedance testing method provided in some embodiments of this application;
[0047] Figure 10This application provides a schematic diagram of the structure of an impedance testing device according to some embodiments;
[0048] Figure 11 This is a schematic diagram of the structure of an electronic device provided in some embodiments of this application. Detailed Implementation
[0049] The embodiments of the technical solution of this application will now be described in detail with reference to the accompanying drawings. These embodiments are only used to more clearly illustrate the technical solution of this application and are therefore merely examples, and should not be used to limit the scope of protection of this application.
[0050] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.
[0051] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.
[0052] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0053] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.
[0054] In the description of the embodiments of this application, the term "multiple" refers to two or more (including two), similarly, "multiple sets" refers to two or more (including two sets), and "multiple pieces" refers to two or more (including two pieces).
[0055] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.
[0056] The impedance testing equipment, system, method, and electronic equipment provided in the embodiments of this application will be described in detail below.
[0057] Figure 1 This is a schematic diagram of the impedance test circuit provided in some embodiments of this application, such as... Figure 1 As shown, the impedance test circuit 100 may include a communication module 110 and a test module 120.
[0058] The communication module 110 is connected to the test module 120 and can be used to receive test commands for the target device under test 310 and send the test commands to the test module 120.
[0059] The test module 120 is connected to the communication module 110 and the target device under test 310 respectively. It can be used to output test signals to the target device under test 310 according to the first electrical parameters, detect the second electrical parameters of the target device under test 310, and determine the impedance of the target device under test 310 according to the second electrical parameters.
[0060] Here, the test command may carry a first electrical parameter. The first electrical parameter may include voltage or current. The first electrical parameter may vary depending on the target device under test.
[0061] In some embodiments of this application, the first electrical parameter may be obtained by searching for the electrical parameter corresponding to the target device under test (DUT) identifier from a preset correspondence between the DUT identifier and electrical parameters, wherein the target DUT identifier may be the identifier of the target DUT.
[0062] For example, a pre-defined correspondence between the device under test (DUT) identifier and electrical parameters can be established, such as: DUT identifier A corresponds to electrical parameter a, DUT identifier B corresponds to electrical parameter b, and DUT identifier C corresponds to electrical parameter c. If the target DUT identifier is B, then based on the above correspondence, the electrical parameter corresponding to the target DUT identifier B can be determined to be b, and therefore the first electrical parameter can be determined to be b.
[0063] In this way, by determining the first electrical parameter corresponding to the target device under test (DUT) identifier through the preset correspondence between the DUT identifier and electrical parameters, the electrical parameters corresponding to the target DUT can be determined quickly and accurately, so as to test the target DUT.
[0064] Furthermore, in some embodiments of this application, the first electrical parameter may be determined based on user input.
[0065] Here, the first electrical parameter can be an electrical parameter input by the user.
[0066] Therefore, the first electrical parameters required for testing different devices under test may be different. The first electrical parameters can be flexibly set by user input, thereby meeting the testing needs of different devices under test.
[0067] The second electrical parameter can include voltage and current. Impedance can be equal to the ratio of voltage to current.
[0068] The test signal can be a constant voltage or a constant current, and the specific voltage or current value can be determined based on the first electrical parameter.
[0069] The test command can be sent from the industrial control computer 200 to the communication module 110. The industrial control computer 200 can be a host computer.
[0070] The communication method between the industrial control computer 200 and the communication module 110 may include, but is not limited to, at least one of the following: Transmission Control Protocol (TCP), Universal Serial Bus (USB), General Purpose Interface Bus (GPIB), serial port, etc.
[0071] The target device under test 310 can be any device with impedance. For example, the target device under test 310 can be a resistor.
[0072] Specifically, the industrial control computer 200 can send a test command to the target device under test 310 to the communication module 110. The test command can carry a first electrical parameter that changes with the target device under test. The communication module 110 can send the test command to the test module 120. The test module 120 can output a test signal to the target device under test 310 according to the first electrical parameter, detect the second electrical parameter of the target device under test 310, and then determine the impedance of the target device under test 310 according to the second electrical parameter.
[0073] Therefore, the communication module in the impedance testing equipment can receive test commands for the target device under test (DUT) and send these commands to the test module within the equipment. These commands carry a first electrical parameter that changes with the DUT. The test module can output a test signal to the DUT based on this first electrical parameter and detect a second electrical parameter of the DUT. Then, the impedance of the DUT can be determined based on the second electrical parameter. In this way, impedance can be tested using this impedance testing equipment.
[0074] In related technologies, testing is typically based on fixed electrical parameters. These parameters cannot be adjusted according to changes in the application circuit. During failure analysis, the fixed electrical parameters may differ significantly from those used in actual applications, making it impossible to reproduce market phenomena. For example, most current impedance testing instruments output fixed voltages or currents, such as 5V / 10V / 20V and 100uA / 1mA / 10mA / 100mA / 1A, etc. However, in actual use, the voltage may be 1.8V / 3.3V / 5V, etc., and the current may be 103uA / 1.1mA / 11mA / 105mA / 1.3A, etc.
[0075] The first electrical parameter in this embodiment can change with the target device under test, so it can be flexibly adjusted, simulate actual usage conditions for relevant tests, and be subjected to more stringent tests based on actual analysis of influencing factors.
[0076] In some embodiments of this application, such as Figure 2 As shown, the test module 120 may include a processing unit 121, a power supply unit 122, and a detection unit 123.
[0077] The processing unit 121 is connected to the communication module 110 and the power supply unit 122 respectively. It can be used to receive the test command sent by the communication module 110, generate the first control signal based on the first electrical parameters, and send the first control signal to the power supply unit 122.
[0078] The power supply unit 122 is connected to the target device under test 310 and can be used to output test signals to the target device under test 310 based on the first control signal.
[0079] The detection unit 123 is connected to the target device under test 310 and the processing unit 121 respectively. It can be used to detect the second electrical parameter of the target device under test 310 after the test signal is turned on, and send the second electrical parameter to the processing unit 121.
[0080] The processing unit 121 can also be used to determine the impedance of the target device under test 310 based on the second electrical parameter.
[0081] Here, the processing unit 121 can be a main control chip, for example, it can be a microcontroller unit (MCU).
[0082] The communication module 110 can communicate with the processing unit 121, the processing unit 121 can communicate with the power supply unit 122, and the processing unit 121 can communicate with the detection unit 123 through on-board inter-chip communication. The on-board inter-chip communication method can include, but is not limited to, at least one of the following: Inter-Integrated Circuit (IIC), Serial Peripheral Interface (SPI), Universal Asynchronous Receiver / Transmitter (UART).
[0083] Specifically, the processing unit 121 can receive the test command sent by the communication module 110, generate a first control signal based on the first electrical parameter, and send the first control signal to the power supply unit 122. The power supply unit 122 can output a test signal to the target device under test 310 based on the first control signal. The detection unit 123 can detect the second electrical parameter of the target device under test 310 after the test signal is turned on, and send the second electrical parameter to the processing unit 121. Then, the processing unit 121 can determine the impedance of the target device under test 310 based on the second electrical parameter.
[0084] For example, the user can pre-set multiple test options on the industrial control computer 200. Each test option corresponds to one or more devices under test and the first electrical parameter corresponding to the device under test. When the user selects a test option on the industrial control computer 200, the processing unit 121 can output a first control signal based on the test option. For example, the multiple test options can be two-wire test resistors or four-wire test resistors.
[0085] Thus, the processing unit controls the power supply unit to output a test signal to the target device under test. Then, the detection unit detects the second electrical parameter of the target device under test after the test signal is turned on and sends it to the processing unit. The processing unit can then accurately determine the impedance of the target device under test based on the second electrical parameter.
[0086] In some embodiments of this application, the detection unit 123 may also be used to detect the third electrical parameter of the target device under test 310 after the test signal is turned on, and send the third electrical parameter to the processing unit 121;
[0087] The processing unit 121 can also be used to correct the test signal output by the power supply unit 122 to the target device under test 310 when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, so that the difference between the third electrical parameter and the first electrical parameter does not exceed the preset threshold.
[0088] Here, the third electrical parameter can include voltage or current. If the first electrical parameter is voltage, then the third electrical parameter can be voltage; if the first electrical parameter is current, then the third electrical parameter can be current.
[0089] The preset threshold can be set according to actual needs.
[0090] Specifically, the detection unit 123 can detect the third electrical parameter of the target device under test 310 after the test signal is turned on, and send the third electrical parameter to the processing unit 121. The processing unit 121 can correct the test signal output by the power supply unit 122 to the target device under test 310 when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, so that the difference between the third electrical parameter and the first electrical parameter does not exceed the preset threshold.
[0091] Thus, by detecting the third electrical parameter of the target device under test after the test signal is turned on through the detection unit and sending it to the processing unit, and then by correcting the test signal output by the power supply unit to the target device under test when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, the accuracy of the test signal output to the target device under test can be improved, thereby improving the accuracy of impedance testing.
[0092] In some embodiments of this application, such as Figure 3 As shown, the test command also carries the identifier of the target device under test 310, and the test module 120 also includes:
[0093] The multiplexer circuit 124 is connected to the processing unit 121, the power supply unit 122, the detection unit 123, and multiple devices under test, respectively.
[0094] Processing unit 121 can also be used to generate a second control signal based on the identifier of the target device under test 310 and send the second control signal to multiplexer circuit 124;
[0095] The multiplexer circuit 124 can be used to control the conduction between the device under test corresponding to the second control signal and the power supply unit 122, and to control the conduction between the device under test corresponding to the second control signal and the detection unit 123.
[0096] Here, the identifier of the target device under test 310 can change depending on the target device under test. The target device under test 310 may be included among multiple devices under test.
[0097] Specifically, the industrial control computer 200 can determine the identifier of the target device under test 310 based on user input and send a test command carrying the identifier of the target device under test 310 to the communication module 110. The communication module 110 can send the test command to the processing unit 121. The processing unit 121 can generate a second control signal based on the identifier of the target device under test 310 and send the second control signal to the multiplexer circuit 124. Then, the multiplexer circuit 124 can control the connection between the device under test corresponding to the second control signal and the power supply unit 122, and control the connection between the device under test corresponding to the second control signal and the detection unit 123.
[0098] The number of target devices under test 310 can be one or more. When there are multiple target devices under test 310, the processing unit 121 can control the multiplexer circuit 124 to automatically poll and test multiple target devices under test 310.
[0099] Thus, impedance testing of multiple devices under test can be performed simultaneously using a multiplexer circuit, improving testing efficiency.
[0100] In some embodiments of this application, such as Figure 4 As shown, the multiplexer circuit 124 may include: a plurality of first multiplexer switch units 1241 and a plurality of second multiplexer switch units 1242.
[0101] The first multiplexer unit 1241 has a first terminal and a second terminal. The first terminal of the first multiplexer unit 1241 can be used to connect to the device under test, and the second terminal of the first multiplexer unit 1241 is connected to the processing unit 121 and the power supply unit 122 respectively.
[0102] The second multiplexing switch unit 1242 has a first terminal and a second terminal. The first terminal of the second multiplexing switch unit 1242 can be used to connect to the device under test, and the second terminal of the second multiplexing switch unit 1242 is connected to the processing unit 121 and the detection unit 123 respectively.
[0103] Here, the processing unit 121 can control the four multiplexer units that need to be controlled using external input / output (I / O) ports, SPI communication or IIC communication. The multiplexer circuit 124 can be connected to multiple devices under test. The processing unit 121 can perform multi-channel impedance testing by switching test loops.
[0104] In this way, impedance testing of multiple devices under test can be performed simultaneously using multiple switches. The circuit is simple and the cost is relatively low.
[0105] In some embodiments of this application, the power supply unit may include:
[0106] A current source unit, connected to both the processing unit and the target device under test, can be used to output current to the target device under test based on a first control signal; and / or,
[0107] The voltage source unit is connected to the processing unit and the target device under test, respectively, and can be used to output voltage to the target device under test based on the first control signal.
[0108] Here, the current source unit can be a precision adjustable current source. The voltage source unit can be a precision adjustable voltage source.
[0109] Specifically, when the first electrical parameter includes current, the precision adjustable current source can output a constant current to the target device under test based on a first control signal. When the first electrical parameter includes voltage, the precision adjustable voltage source can output a constant voltage to the target device under test based on a first control signal.
[0110] Thus, by outputting a constant current to the target device under test through the current source unit, the impedance testing equipment can be made suitable for constant current testing scenarios, and by outputting a constant voltage to the target device under test through the voltage source unit, the impedance testing equipment can be made suitable for constant voltage testing scenarios.
[0111] In some embodiments of this application, such as Figure 5 As shown, the power supply unit 122 may include a voltage source unit 1221 and a current source unit 1222.
[0112] In some embodiments of this application, such as Figure 2 As shown, the test command can also carry the electrical parameter range, which can change with the change of the target device under test. The detection unit 123 can also be used to detect the second electrical parameter of the target device under test 310 based on the electrical parameter range.
[0113] Here, the electrical parameter range may include the current range and / or the voltage range.
[0114] Specifically, the industrial control computer 200 can determine the electrical parameter range based on the target device under test and send the electrical parameter range to the communication module 110. The communication module 110 can send the electrical parameter range to the processing unit 121. The processing unit 121 can control the detection unit 123 to detect the second electrical parameter of the target device under test 310 based on the electrical parameter range.
[0115] In this way, the range of the detection unit for detecting the second electrical parameter can be flexibly adjusted based on the target device under test.
[0116] Figure 6 This is a schematic diagram of the impedance testing system provided in some embodiments of this application.
[0117] like Figure 6 As shown, the impedance testing system 1000 may include: the impedance testing device 100 and the industrial control computer 200 as provided in any of the above embodiments.
[0118] The industrial control computer 200 can be used to receive the first electrical parameter that changes with the target device under test, and send a test command to the target device under test to the communication module in the impedance testing device 100. The test command can carry the first electrical parameter.
[0119] The impedance testing device 100 can be used to send test commands to the test module via the communication module, so that the test module outputs a test signal to the target device under test according to the first electrical parameter, detects the second electrical parameter of the target device under test, and determines the impedance of the target device under test according to the second electrical parameter.
[0120] In some embodiments of this application, such as Figure 7 As shown, the impedance testing system 1000 may further include a power supply system 400, which is connected to the impedance testing equipment 100 and the industrial control computer 200 respectively, and can be used to supply power to the impedance testing equipment 100 and the industrial control computer 200.
[0121] In some examples, such as Figure 8 As shown, the impedance testing system 1000 may include: impedance testing equipment 100, industrial control computer 200 and power supply system 400.
[0122] The impedance testing device 100 may include a communication module 110 and a testing module 120.
[0123] The test module 120 may include a processing unit 121, a power supply unit 122, a detection unit 123, and a multiplexer circuit 124.
[0124] The power supply unit 122 may include a voltage source unit 1221 and a current source unit 1222.
[0125] Specifically, the industrial control computer 200 is connected to the communication module 110, the communication module 110 is connected to the processing unit 121, the processing unit 121 is connected to the voltage source unit 1221, the current source unit 1222, the detection unit 123 and the multiplexer circuit 124 respectively, the voltage source unit 1221, the current source unit 1222 and the detection unit 123 are all connected to the multiplexer circuit 124, the multiplexer circuit 124 is connected to multiple devices under test, and the power supply system 400 is connected to the industrial control computer 200 and the impedance testing device 100 respectively.
[0126] Therefore, the industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command carrying the first electrical parameter to the communication module in the impedance testing equipment. The communication module can then send this test command to the testing module, which can output a test signal to the DUT based on the first electrical parameter and detect a second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT can be determined. In this way, the impedance of the DUT can be tested.
[0127] Figure 9 This is a schematic flowchart illustrating the impedance testing method provided in some embodiments of this application.
[0128] like Figure 9 As shown, this impedance testing method can be applied to the impedance testing system provided in any of the above embodiments, and the impedance testing method may include S910-S930:
[0129] S910 receives the first electrical parameter, which changes with the target device under test, via an industrial control computer, and sends a test command to the target device under test to the communication module in the impedance testing equipment.
[0130] The S920 sends test commands to the test module in the impedance testing equipment via the communication module.
[0131] S930 outputs a test signal to the target device under test based on the first electrical parameter through the test module, and detects the second electrical parameter of the target device under test, and determines the impedance of the target device under test based on the second electrical parameter.
[0132] The test command can carry the first electrical parameter. The user can input the first electrical parameter through the host computer software in the industrial control computer.
[0133] Therefore, an industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command carrying the first electrical parameter to the communication module in the impedance testing equipment. The communication module receives the test command from the industrial control computer and sends it to the test module in the impedance testing equipment. The test module outputs a test signal to the DUT based on the first electrical parameter and detects the second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT is determined. In this way, the impedance of the DUT can be tested.
[0134] In some embodiments of this application, S930 may include:
[0135] The processing unit in the test module generates a first control signal based on the first electrical parameters and sends the first control signal to the power supply unit in the test module.
[0136] The power supply unit outputs a test signal to the target device under test based on the first control signal.
[0137] The detection unit in the test module detects the second electrical parameter of the target device after the test signal is turned on, and sends the second electrical parameter to the processing unit.
[0138] The processing unit determines the impedance of the target device under test based on the second electrical parameter.
[0139] Thus, the processing unit controls the power supply unit to output a test signal to the target device under test. Then, the detection unit detects the second electrical parameter of the target device under test after the test signal is turned on and sends it to the processing unit. The processing unit can then accurately determine the impedance of the target device under test based on the second electrical parameter.
[0140] In some embodiments of this application, after the test module outputs a test signal to the target device under test based on the first electrical parameter, the method may further include:
[0141] The detection unit detects the third electrical parameter of the target device after the test signal is turned on, and sends the third electrical parameter to the processing unit.
[0142] When the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, the processing unit corrects the test signal output by the power supply unit to the target device under test, so that the difference between the third electrical parameter and the first electrical parameter does not exceed the preset threshold.
[0143] Thus, by detecting the third electrical parameter of the target device under test after the test signal is turned on through the detection unit and sending it to the processing unit, and then by correcting the test signal output by the power supply unit to the target device under test when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, the accuracy of the test signal output to the target device under test can be improved, thereby improving the accuracy of impedance testing.
[0144] In some embodiments of this application, the test command may also carry an identifier of the target device under test. Before the power supply unit outputs a test signal to the target device under test based on the first control signal, the method may further include:
[0145] The processing unit generates a second control signal based on the identifier of the target device under test and sends the second control signal to the multiplexer circuit in the test module.
[0146] The multiplexer circuit controls the connection between the device under test (DUT) corresponding to the second control signal and the power supply unit, as well as the connection between the DUT corresponding to the second control signal and the detection unit.
[0147] Thus, impedance testing of multiple devices under test can be performed simultaneously using a multiplexer circuit, improving testing efficiency.
[0148] In some embodiments of this application, outputting a test signal to the target device under test via a power supply unit based on a first control signal may include:
[0149] The current source unit outputs current to the target device under test based on the first control signal; and / or
[0150] The voltage source unit outputs voltage to the target device under test based on the first control signal.
[0151] Thus, by outputting a constant current to the target device under test through the current source unit, the impedance testing equipment can be made suitable for constant current testing scenarios, and by outputting a constant voltage to the target device under test through the voltage source unit, the impedance testing equipment can be made suitable for constant voltage testing scenarios.
[0152] In some embodiments of this application, the test command may also carry an electrical parameter range, which can change with the target device under test. Detecting the second electrical parameter of the target device under test after the test signal is turned on via the detection unit in the test module may include:
[0153] The detection unit detects the second electrical parameter of the target device after the test signal is turned on, based on the electrical parameter range.
[0154] In this way, the range of the detection unit for detecting the second electrical parameter can be flexibly adjusted based on the target device under test.
[0155] In some embodiments of this application, after determining the impedance of the target device under test based on the second electrical parameter, the method may further include:
[0156] The test module transmits the impedance of the target device under test to the communication module.
[0157] The communication module sends the impedance of the target device under test to the industrial control computer;
[0158] The impedance of the target device under test is displayed on the industrial control computer.
[0159] Here, the industrial control computer can display the impedance of the target device under test in real time.
[0160] Specifically, the industrial control computer can display the impedance of the target device under test through host computer software, and the host computer module can be developed using LabVIEW.
[0161] In this way, the impedance of the target device under test can be transmitted to the industrial control computer for real-time display via the communication module, so that users can view it in a timely manner.
[0162] In some embodiments of this application, displaying the impedance of the target device under test via an industrial control computer may include:
[0163] The impedance of the target device under test is stored in the flash memory and / or memory of the industrial control computer.
[0164] The impedance of the target device under test, read from flash memory and / or memory, is converted and decoded by an industrial control computer.
[0165] The impedance of the target device under test is displayed on the industrial control computer after conversion and decoding.
[0166] In this way, the impedance of the target device under test can be stored and displayed through an industrial control computer.
[0167] In some embodiments of this application, the method may further include:
[0168] The impedance test data is exported from the industrial control computer. The impedance test data includes the impedance of the target device under test.
[0169] Here, after the communication module transmits the impedance of the target device under test to the industrial control computer, it can first store it in flash memory, and then store the data stored in flash memory in memory. When it is necessary to display, the impedance of the target device under test can be read from flash memory or memory and converted and decoded to display the converted and decoded impedance of the target device under test.
[0170] In this way, users can export the impedance of the target device under test in real time via an industrial control computer.
[0171] In some embodiments of this application, the method may further include:
[0172] Impedance test data can be exported from an industrial control computer. This impedance test data may include the impedance of the target device under test.
[0173] Here, the impedance of the target device under test can be read from flash memory or memory and converted and decoded to export the converted and decoded impedance of the target device under test.
[0174] In this way, users can export the impedance of the target device under test in real time via an industrial control computer.
[0175] For further details on impedance testing methods, please refer to the embodiments of the impedance testing equipment described above, which will not be repeated here.
[0176] Based on the same inventive concept, this application also provides an impedance testing device. The following describes... Figure 10 The impedance testing device provided in the embodiments of this application will be described in detail.
[0177] Figure 10A schematic diagram of an impedance testing device provided in one embodiment of this application is shown.
[0178] like Figure 10 As shown, this impedance testing device can be applied to the impedance testing system provided in any of the above embodiments, and the impedance testing device may include:
[0179] The first processing module 1001 is used to receive a first electrical parameter that changes with the target device under test via an industrial control computer, and send a test command to the target device under test to the communication module in the impedance testing device, wherein the test command carries the first electrical parameter.
[0180] The second processing module 1002 is used to send the test command to the test module in the impedance testing device through the communication module.
[0181] The third processing module 1003 is used to output a test signal to the target device under test according to the first electrical parameter through the test module, and to detect the second electrical parameter of the target device under test, and to determine the impedance of the target device under test according to the second electrical parameter.
[0182] Therefore, an industrial control computer can receive a first electrical parameter that changes with the target device under test (DUT), and send a test command to the communication module in the impedance testing equipment. The communication module then transmits the test command to the test module in the impedance testing equipment. The test module outputs a test signal to the DUT based on the first electrical parameter carried in the test command, and detects the second electrical parameter of the DUT. Based on the second electrical parameter, the impedance of the DUT is determined. In this way, the impedance of the DUT can be tested.
[0183] In some embodiments of this application, the third processing module 1003 may include:
[0184] The first processing submodule is used to generate a first control signal based on the first electrical parameters through the processing unit in the test module, and send the first control signal to the power supply unit in the test module;
[0185] The second processing submodule is used to output the test signal to the target device under test based on the first control signal through the power supply unit.
[0186] The third processing submodule is used to detect the second electrical parameter of the target device under test after the test signal is turned on through the detection unit in the test module, and send the second electrical parameter to the processing unit.
[0187] The fourth processing submodule is used to determine the impedance of the target device under test based on the second electrical parameters through the processing unit.
[0188] In some embodiments of this application, the test instruction also carries an identifier of the target device under test, and the impedance testing device may further include:
[0189] The fourth processing module is used to generate a second control signal based on the identifier of the target device under test by the processing unit before the power supply unit outputs the test signal to the target device under test based on the first control signal, and send the second control signal to the multiplexer circuit in the test module.
[0190] The fifth processing module is used to control the connection between the device under test corresponding to the second control signal and the power supply unit through the multiplexer circuit, and to control the connection between the device under test corresponding to the second control signal and the detection unit.
[0191] Figure 11 A schematic diagram of the structure of an electronic device provided in one embodiment of this application is shown.
[0192] like Figure 11 As shown, the electronic device 11 is a structural diagram of an exemplary hardware architecture of an electronic device that implements the impedance testing method and impedance testing apparatus according to the embodiments of this application. This electronic device may refer to the electronic device in the embodiments of this application.
[0193] The electronic device 11 may include a processor 1101 and a memory 1102 storing computer program instructions.
[0194] Specifically, the processor 1101 may include a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits that can be configured to implement the embodiments of this application.
[0195] Memory 1102 may include mass storage for data or instructions. For example, and not limitingly, memory 1102 may include a hard disk drive (HDD), floppy disk drive, flash memory, optical disk, magneto-optical disk, magnetic tape, or Universal Serial Bus (USB) drive, or a combination of two or more of these. Where appropriate, memory 1102 may include removable or non-removable (or fixed) media. Where appropriate, memory 1102 may be internal or external to the integrated gateway disaster recovery device. In a particular embodiment, memory 1102 is non-volatile solid-state memory. In a particular embodiment, memory 1102 may include read-only memory (ROM), random access memory (RAM), disk storage media device, optical storage media device, flash memory device, electrical, optical, or other physical / tangible memory storage device. Therefore, typically, memory 1102 includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to one aspect of this application.
[0196] The processor 1101 reads and executes computer program instructions stored in the memory 1102 to implement any of the impedance testing methods in the above embodiments.
[0197] In one example, the electronic device may also include a communication interface 1103 and a bus 1104. Wherein, as... Figure 11 As shown, the processor 1101, memory 1102, and communication interface 1103 are connected through bus 1104 and complete communication with each other.
[0198] The communication interface 1103 is mainly used to realize communication between various modules, devices, units and / or equipment in the embodiments of this application.
[0199] Bus 1104 includes hardware, software, or both, that couples components of an electronic device together. For example, and not limitingly, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Enhanced Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), HyperTransport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an Infinite Bandwidth Interconnect, a Low Pin Count (LPC) bus, a memory bus, a Microchannel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local (VLB) bus, or other suitable buses, or combinations of two or more of these. Where appropriate, bus 1104 may include one or more buses. Although specific buses are described and illustrated in embodiments of this application, any suitable bus or interconnect is contemplated herein.
[0200] The electronic device can perform the impedance testing method in the embodiments of this application, thereby achieving a combination Figures 9 to 10 The impedance testing method and apparatus are described.
[0201] Furthermore, in conjunction with the impedance testing methods described in the above embodiments, this application embodiment can provide a computer storage medium for implementation. This computer storage medium stores computer program instructions; when these computer program instructions are executed by a processor, they implement any of the impedance testing methods described in the above embodiments.
[0202] It should be clarified that this application is not limited to the specific configurations and processes described above and shown in the figures. For the sake of brevity, detailed descriptions of known methods are omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of this application is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications, and additions, or change the order of steps, after understanding the spirit of this application.
[0203] The functional blocks shown in the above-described structural diagram can be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, they can be, for example, electronic circuits, application-specific integrated circuits (ASICs), appropriate firmware, plug-ins, function cards, etc. When implemented in software, the elements of this application are programs or code segments used to perform the required tasks. Programs or code segments can be stored on a machine-readable medium or transmitted over a transmission medium or communication link via data signals carried on a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, radio frequency (RF) links, etc. Code segments can be downloaded via computer networks such as the Internet, intranets, etc.
[0204] It should also be noted that the exemplary embodiments mentioned in this application describe methods or systems based on a series of steps or apparatus. However, this application is not limited to the order of the above steps; that is, the steps can be performed in the order mentioned in the embodiments, or in a different order, or several steps can be performed simultaneously.
[0205] The aspects of this application have been described above with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It should be understood that each block in the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that these instructions, executable via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable logic circuit. It is also understood that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can also be implemented by dedicated hardware performing the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.
[0206] Although this application has been described with reference to preferred embodiments, various modifications can be made thereto and components can be replaced with equivalents without departing from the scope of this application. In particular, the technical features mentioned in the various embodiments can be combined in any manner, provided there is no structural conflict. This application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.
Claims
1. An impedance testing device, characterized in that, include: A communication module, connected to a test module, is used to receive test commands for a target device under test (DUT) and send the test commands to the test module. The test commands carry a first electrical parameter, which changes with the target DUT. The first electrical parameter is obtained by finding the electrical parameter corresponding to the target DUT identifier from a preset correspondence between DUT identifiers and electrical parameters. The target DUT identifier is the identifier of the target DUT. The test module is connected to the communication module and the target device under test, respectively, and is used to output a test signal corresponding to the first electrical parameter to the target device under test, detect the second electrical parameter of the target device under test, and determine the impedance of the target device under test based on the second electrical parameter.
2. The impedance testing device according to claim 1, characterized in that, The first electrical parameter is determined based on user input.
3. The impedance testing device according to claim 1, characterized in that, The testing module includes: The processing unit is connected to the communication module and the power supply unit respectively, and is used to receive the test command sent by the communication module, generate a first control signal based on the first electrical parameters, and send the first control signal to the power supply unit. The power supply unit is connected to the target device under test and is used to output the test signal to the target device under test based on the first control signal; The detection unit is connected to the target device under test and the processing unit respectively, and is used to detect the second electrical parameter of the target device under test after the test signal is turned on, and send the second electrical parameter to the processing unit; The processing unit is also used to determine the impedance of the target device under test based on the second electrical parameter.
4. The impedance testing device according to claim 3, characterized in that, The detection unit is also used to detect a third electrical parameter of the target device under test after the test signal is turned on, and send the third electrical parameter to the processing unit; The processing unit is further configured to, when the difference between the third electrical parameter and the first electrical parameter exceeds a preset threshold, correct the test signal output by the power supply unit to the target device under test, so that the difference between the third electrical parameter and the first electrical parameter does not exceed the preset threshold.
5. The impedance testing device according to any one of claims 3-4, characterized in that, The test command also carries the identifier of the target device under test, and the test module further includes: a multiplexer circuit, which is connected to the processing unit, the power supply unit, the detection unit and multiple devices under test respectively; The processing unit is also configured to generate a second control signal based on the identifier of the target device under test, and send the second control signal to the multiplexer circuit. The multiplexer circuit is used to control the connection between the device under test corresponding to the second control signal and the power supply unit, and to control the connection between the device under test corresponding to the second control signal and the detection unit.
6. The impedance testing device according to claim 5, characterized in that, The multiplexer circuit includes multiple first multiplexer switch units and multiple second multiplexer switch units; The first multiplexer unit has a first terminal and a second terminal. The first terminal of the first multiplexer unit is used to connect to the device under test, and the second terminal of the first multiplexer unit is connected to the processing unit and the power supply unit respectively. The second multiplexing switch unit has a first terminal and a second terminal. The first terminal of the second multiplexing switch unit is used to connect to the device under test, and the second terminal of the second multiplexing switch unit is connected to the processing unit and the detection unit respectively.
7. The impedance testing device according to claim 3, characterized in that, The power supply unit includes: A current source unit, connected to both the processing unit and the target device under test, is used to output current to the target device under test based on the first control signal; and / or, A voltage source unit is connected to both the processing unit and the target device under test, and is used to output voltage to the target device under test based on the first control signal.
8. The impedance testing device according to claim 3, characterized in that, The test command also carries an electrical parameter range, which changes with the target device under test. The detection unit is also used to detect a second electrical parameter of the target device under test based on the electrical parameter range.
9. An impedance testing system, characterized in that, include: The impedance testing equipment and industrial control computer as described in any one of claims 1-8; The industrial control computer is used to receive a first electrical parameter that changes with the target device under test, and to send a test command to the target device under test to the communication module in the impedance testing device. The test command carries the first electrical parameter. The impedance testing device is used to send the test command to the test module through the communication module, so that the test module outputs a test signal to the target device under test according to the first electrical parameter, detects the second electrical parameter of the target device under test, and determines the impedance of the target device under test according to the second electrical parameter.
10. An impedance testing method, characterized in that, Applied to the impedance testing system as described in claim 9, the method comprises: The industrial control computer receives a first electrical parameter that changes with the target device under test, and sends a test command to the communication module in the impedance testing equipment, the test command carrying the first electrical parameter. The test command is sent to the test module in the impedance testing device via the communication module. The test module outputs a test signal to the target device under test based on the first electrical parameter, detects the second electrical parameter of the target device under test, and determines the impedance of the target device under test based on the second electrical parameter.
11. The method according to claim 10, characterized in that, The step of outputting a test signal to the target device under test (DUT) based on the first electrical parameter through the test module, detecting the second electrical parameter of the target DUT, and determining the impedance of the target DUT based on the second electrical parameter includes: The processing unit in the test module generates a first control signal based on the first electrical parameter and sends the first control signal to the power supply unit in the test module. The power supply unit outputs the test signal to the target device under test based on the first control signal. The detection unit in the test module detects the second electrical parameter of the target device under test after the test signal is turned on, and sends the second electrical parameter to the processing unit. The processing unit determines the impedance of the target device under test based on the second electrical parameter.
12. The method according to claim 11, characterized in that, The test command also carries the identifier of the target device under test. Before the test signal is output to the target device under test by the power supply unit based on the first control signal, the method further includes: The processing unit generates a second control signal based on the identifier of the target device under test and sends the second control signal to the multiplexer circuit in the test module. The multiplexer circuit controls the connection between the device under test corresponding to the second control signal and the power supply unit, and also controls the connection between the device under test corresponding to the second control signal and the detection unit.
13. An electronic device, characterized in that, The device includes: a processor and a memory storing computer program instructions; When the processor executes the computer program instructions, it implements the impedance testing method as described in any one of claims 10-12.