Device for diagnosing internal insulation failure of functional structures using coupled microwave plasma

Abstract

The present invention discloses a device for coupling the internal insulation failure state of a microwave plasma diagnosis functional structure, comprising a conductor closed cavity; a first microwave waveguide is arranged in one of the first through holes or the second through holes; a second microwave waveguide is arranged in another first through hole or the second through hole; a first insulating medium is arranged in the conductor closed cavity; a microwave transmission and discharge channel is composed of a wave-transmitting insulating medium material, and its electromagnetic wave transmittance is greater than 60% at 2-26.5 GHz, and the first interface formed by the first insulating medium and the two is not provided with an air gap; a first end electrode and a second end electrode are arranged oppositely and spaced in the microwave transmission and discharge channel, and the second interface formed between the first end electrode and the inner wall of the microwave transmission and discharge channel is not provided with an air gap, and an air gap exists between the first end electrode and the second end electrode to form a simulated internal insulation failure discharge space. The diagnosis and calibration information of the dispersion characteristics of the discharge plasma is provided by microwave transmission.

Description

Technical Field

[0001] The invention belongs to the technical field of calibrating and inspecting internal insulation failure detection devices using simulators, and particularly relates to a device for diagnosing internal insulation failure states of functional structures using coupled microwave plasma. Background Technology

[0002] Electrical equipment used in various fields, especially high-voltage equipment, all have a certain degree of insulation design in their structure. Electrical insulation structures include external insulation structures and / or internal insulation structures. Internal insulation structures consist of a solid dielectric wrapped around the surface of the high-voltage conductor. They have high insulation strength and are less affected by the environment, thus their lifespan and reliability are significantly better than external insulation structures. However, local leakage current and even short-circuit breakdown of the solid dielectric still exist in large numbers in internal insulation products.

[0003] Because it's difficult to directly image and troubleshoot using traditional optical methods for detecting abnormal emissions from external insulation, maintenance personnel typically only investigate and repair problems after they occur, resulting in significant economic losses. Alternatively, periodically replacing all parts would lead to unnecessary resource waste and extremely high operating costs.

[0004] Because the characteristic signals of plasma processes within the internal insulation structure are difficult to transmit effectively to the external space, there are currently no effective methods or devices for detecting the state or characteristics of plasma generated by abnormal discharges in the internal insulation. Therefore, it is necessary to research and develop a device for detecting the state of plasma generated by internal insulation failure. Summary of the Invention

[0005] In view of at least one of the above-mentioned technical problems, an object of the present invention is to provide a device for diagnosing internal insulation failure status of a functional structure by coupling microwave plasma.

[0006] The technical solution of the present invention is:

[0007] The object of the present invention is to provide a device for diagnosing internal insulation failure status of a functional structure by coupling microwave plasma, comprising:

[0008] A conductor closed cavity, wherein a first through hole is respectively formed on one set of opposite side surfaces and a second through hole is respectively formed on another set of opposite side surfaces;

[0009] A first simulated electrode comprising a first end electrode;

[0010] a second simulated electrode comprising a second end electrode;

[0011] A first microwave waveguide is disposed within one of the first or second through holes;

[0012] a second microwave waveguide disposed in another one of the first through hole or the second through hole;

[0013] A first insulating medium is disposed within the conductor's enclosed cavity;

[0014] The microwave transmission channel is made of a microwave-transparent insulating medium material, and its electromagnetic wave transmittance is greater than 60% in the range of 2~26.5GHz. It passes through the first insulating medium and the first interface formed between the two does not have an air gap.

[0015] The first end electrode and the second end electrode are disposed opposite to each other and spaced apart in the microwave transmission channel, and the second interface formed between them and the inner wall of the microwave transmission channel has no air gap. There is an air gap between the first end electrode and the second end electrode to form a simulated internal insulation failure discharge space.

[0016] Preferably, the second interface is provided with a second insulating medium.

[0017] Preferably, the second insulating medium is composed of a liquid or paste-like insulating material.

[0018] Preferably, the first insulating medium is composed of a solid or liquid material.

[0019] Preferably, the first microwave waveguide and the second microwave waveguide are symmetrically arranged on both sides of the simulated internal insulation failure discharge space.

[0020] Preferably, the simulated internal insulation failure discharge space forms a resonant cavity in the operating bands of the first and second microwave waveguides.

[0021] Preferably, the quality factor and resonant frequency of the resonant cavity are controlled by controlling the surface structure and relative distance between the first end electrode and the second end electrode.

[0022] Preferably, the first analog electrode further includes a first shielded insulating wire, and the second analog electrode further includes a second shielded insulating wire.

[0023] Preferably, the two ends of the microwave transmission channel are respectively inserted into the two second through holes or the first through hole.

[0024] Preferably, the extension direction of the microwave transmission channel coincides with the line connecting the axes of the two second through holes or the two first through holes.

[0025] Compared with the prior art, the advantages of the present invention are:

[0026] The device for simulating the internal insulation failure state of the coupled microwave plasma diagnostic functional structure of the present invention, by setting a microwave-transmitting amplification channel, forms a simulated internal insulation failure discharge space within the channel. When using the device, discharge plasma is generated within the simulated internal insulation failure discharge space. Through the microwave transmission characteristics of the microwave-transmitting amplification channel, the state of the plasma is transmitted to the external space using a first microwave waveguide and a second microwave waveguide. This allows the device to provide a test object for internal insulation detection while simulating the amplification state, and simultaneously provides diagnostic and calibration information on the dispersion characteristics of the amplified plasma through microwave transmission. This solves the technical problem in the current field of internal insulation failure detection that it is impossible to provide effective information on the dispersion characteristics of insulation failure plasma during testing experiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The present invention will be further described below with reference to the accompanying drawings and embodiments:

[0028] Figure 1 A schematic diagram of the explosion structure of a device for a coupled microwave plasma diagnostic functional structure in an internal insulation failure state according to an embodiment of the present invention;

[0029] Figure 2 This is a cross-sectional schematic diagram of the device for the internal insulation failure state of the coupled microwave plasma diagnostic functional structure according to an embodiment of the present invention.

[0030] Figure 3 This is a three-dimensional structural diagram of a device for assessing the internal insulation failure state of a microwave plasma diagnostic functional structure according to an embodiment of the present invention.

[0031] Among them, 10 is a conductor-sealed cavity; 11 is a first through hole; 12 is a second through hole; 20 is a first insulating medium; 30 is a microwave transmission channel; 40 is a first simulated electrode; 41 is a first end electrode; 42 is a first shielded insulating wire; 50 is a second simulated electrode; 51 is a second end electrode; 52 is a second shielded insulating wire; 60 is a first microwave waveguide; 70 is a second microwave waveguide; and 80 is a simulated internal insulation failure discharge space. Implementation Method

[0032] To make the objectives, technical solutions, and advantages of the present invention more clearly understood, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present invention. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present invention.

[0033] See also Figures 1 to 3The device for detecting internal insulation failure of the coupled microwave plasma diagnostic functional structure according to an embodiment of the present invention includes a conductor-enclosed cavity 10, a first analog electrode 40, a second analog electrode 50, a first microwave waveguide 60, a second microwave waveguide 70, a first insulating medium 20, and a microwave transmission amplification channel 30.

[0034] like Figures 1 to 3 As shown, the conductor-sealed cavity 10 is a square main structure with an internal cavity and two sets of through holes on each of its two opposing sides. Specifically, two opposing first through holes 11 communicating with the internal cavity are respectively opened on one set of opposing sides of the conductor-sealed cavity 10, and two opposing second through holes 12 communicating with the internal cavity are respectively opened on the other set of opposing sides. More specifically, as... Figure 1As shown, the conductor-enclosed cavity 10 has first through holes 11 on its upper and lower sides, and second through holes 12 on its left and right sides. A first insulating medium 20 is disposed within the conductor-enclosed cavity 10, and corresponding to the two first through holes 11, vertically extending clearance through holes are formed on the first insulating medium 20. The microwave transmission and amplification channel 30 is an axially hollow tube made of a microwave-transparent insulating medium material with an electromagnetic wave transmittance greater than 60% in the range of 2-26.5 GHz. The microwave transmission and amplification channel 30 passes through the clearance through holes of the first insulating medium 20, with its axial ends inserted into the two first through holes 11, forming a first interface without an air gap. A first microwave waveguide 60 and a second microwave waveguide 70 are respectively inserted into the two second through holes 12. The first simulated electrode 40 includes a first end electrode 41, and the second simulated electrode 50 includes a second end electrode 51. The first end electrode 41 and the second end electrode 51 are vertically opposite each other and are both inserted into the axial ends of the microwave-transmitting amplification channel 30, with an air gap between them to form a simulated internal insulation failure discharge space 80. A second interface is formed between the first end electrode 41, the second end electrode 51, and the inner wall of the microwave-transmitting amplification channel 30, and no air gap is provided at the second interface. This embodiment of the invention, by setting up a microwave-transmitting amplification channel 30, forms a simulated internal insulation failure discharge space 80 within the channel. When using the device, discharge plasma is generated within the simulated internal insulation failure discharge space 80. Through the microwave transmission characteristics of the microwave-transmitting amplification channel 30, the state of the plasma is transmitted to the external space using the first microwave waveguide 60 and the second microwave waveguide 70. This allows for the provision of a test object for internal insulation detection in a simulated amplification state, while simultaneously providing diagnostic and calibration information on the dispersion characteristics of the amplified plasma through microwave transmission. This solves the technical problem in the current field of internal insulation failure detection where effective information on the dispersion characteristics of insulation failure plasma cannot be provided during testing experiments. As an alternative embodiment, the through holes on the upper and lower sides of the conductor-enclosed cavity 10 are second through holes 12, and the through holes on the left and right sides are first through holes 11. The first microwave waveguide 60 and the second microwave waveguide 70 are disposed in the two first through holes 11. That is, the axial ends of the microwave transmission channel 30 are respectively inserted into the two second through holes 12. As another alternative embodiment, the two first through holes 11 are formed on the upper and lower sides of the conductor-enclosed cavity 10, and the two second through holes 12 are formed on the front and rear sides of the conductor-enclosed cavity 10; or the two first through holes 11 are formed on the left and right sides of the conductor-enclosed cavity 10, and the two second through holes 12 are formed on the front and rear sides of the conductor-enclosed cavity 10.

[0035] According to some preferred embodiments of the present invention, the first insulating medium 20 can be a conventional solid or liquid insulating medium. A liquid insulating medium is preferred, as it fills the air gap and also serves as a lubricant.

[0036] According to some preferred embodiments of the present invention, a liquid or paste-like second insulating medium is further provided at the second interface. The provision of the second insulating medium can effectively fill and avoid the air gap at the second interface, and can also play a lubricating role, which facilitates the installation of the first analog electrode 40, the second analog electrode 50 and the microwave transmission amplification channel 30.

[0037] According to some preferred embodiments of the present invention, the first microwave waveguide 60 and the second microwave waveguide 70 are symmetrically arranged on both sides of the simulated internal insulation failure discharge space 80. Preferably, the simulated internal insulation failure discharge space 80 formed between the first end electrode 41 and the second end electrode 51 constitutes a resonant cavity in the operating band of the first microwave waveguide 60 and the second microwave waveguide 70, i.e., 2~26.5GHz. During use, the quality factor and resonant frequency of the resonant cavity can be controlled by controlling the surface structure and relative distance of the first end electrode 41 and the second end electrode 51. The specific control principle is not described or limited, and can be easily understood and implemented by those skilled in the art; it is not an innovation of the present invention.

[0038] According to some preferred embodiments of the present invention, such as Figure 2 As shown, the extension direction of the microwave transmission channel 30 coincides with the line connecting the axes of the two second through holes 12 or the first through hole 11. This facilitates manufacturing and also facilitates the installation of the microwave transmission channel 30, the first analog electrode 40, and the second analog electrode 50.

[0039] According to some preferred embodiments of the present invention, such as Figure 1 and Figure 2 As shown, the first analog electrode 40 further includes a first shielded insulating wire 42, and the second analog electrode 50 further includes a second shielded insulating wire 52. The structures of the first shielded insulating wire 42 and the second shielded insulating wire 52 are not described or limited, but are conventional shielded insulating wire structures, such as including a conductor, a solid insulation layer, and a metal shielding layer from the inside out.

[0040] It should be understood that the specific embodiments described above are merely illustrative or explanatory of the principles of the invention and do not constitute a limitation thereof. Therefore, any modifications, equivalent substitutions, improvements, etc., made without departing from the spirit and scope of the invention should be included within the protection scope of the invention. Furthermore, the appended claims are intended to cover all variations and modifications falling within the scope and boundaries of the appended claims, or equivalent forms of such scope and boundaries.

Claims

1. A device for diagnosing internal insulation failure status of a functional structure by coupling microwave plasma, characterized in that: include: A conductor closed cavity, wherein a first through hole is respectively opened on a group of opposite sides thereof and a second through hole is respectively opened on another group of opposite sides thereof; A first simulated electrode including a first end electrode; A second simulated electrode including a second end electrode; A first microwave waveguide, which is disposed in one of the first through hole or the second through hole; a second microwave waveguide, which is disposed in another of the first through hole or the second through hole; A first insulating medium, which is disposed in the conductor closed cavity; The microwave transmission channel is made of a wave-transmitting insulating medium material, and its electromagnetic wave transmittance is greater than 60% in the range of 2 to 26.5 GHz. The channel is inserted into the first insulating medium, and no air gap is provided at the first interface formed between the two. The first end electrode and the second end electrode are arranged opposite to each other and spaced apart in the microwave-transmitting isolation channel, and a second interface formed between the first end electrode and the inner wall of the microwave-transmitting isolation channel has no air gap, and an air gap exists between the first end electrode and the second end electrode to form a simulated internal insulation failure discharge space; the first microwave waveguide and the second microwave waveguide are symmetrically arranged on both sides of the simulated internal insulation failure discharge space.

2. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1, characterized in that: The second interface is provided with a second insulating medium.

3. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 2, characterized in that: The second insulating medium is composed of liquid or paste-like insulating material.

4. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1, characterized in that: The first insulating medium is composed of solid or liquid material.

5. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1, characterized in that: The simulated internal insulation failure discharge space forms a resonant cavity in the working bands of the first microwave waveguide and the second microwave waveguide.

6. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 5, characterized in that: The quality factor and the resonant frequency of the resonant cavity are controlled by controlling the surface structure and the relative distance between the first end electrode and the second end electrode.

7. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1, characterized in that: The first simulated electrode further includes a first shielded insulated wire, and the second simulated electrode further includes a second shielded insulated wire.

8. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1, characterized in that: When the first microwave waveguide and the second microwave waveguide are arranged in the two first through holes, the two ends of the microwave transmission channel are respectively inserted in the two second through holes; When the first microwave waveguide and the second microwave waveguide are arranged in the two second through holes, the two ends of the microwave transmission channel are respectively inserted in the two first through holes.

9. The device for diagnosing internal insulation failure status of a functional structure coupled to microwave plasma according to claim 1 or 8, characterized in that: When the two ends of the microwave transmission channel are respectively inserted into the two second through holes, the extension direction of the microwave transmission channel coincides with the line connecting the axes of the two second through holes; When the two ends of the microwave transmission channel are respectively inserted into the two first through holes, the extension direction of the microwave transmission channel coincides with the line connecting the axes of the two first through holes.

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