A double-slit interference experiment device

Abstract

The application belongs to the field of physical optical measurement, and particularly relates to a double-slit interference experiment device. The device comprises an optical platform, a first sheet element, a second sheet element, a first clamping groove, a second clamping groove and a micrometer. The first sheet element comprises spaced light-transmitting areas and non-light-transmitting areas. The second sheet element comprises spaced non-light-transmitting areas and light-transmitting areas. The two sheet elements are close to each other and are fixed on the first clamping groove and the second clamping groove respectively. The first clamping groove is fixed on the platform. The micrometer comprises a micrometer screw, a knob and a scale and is fixed on the platform. The end of the micrometer screw is connected with the end of the second clamping groove close to the fourth non-light-transmitting area. When the knob is rotated, the micrometer screw drives the second clamping groove to move along the axis of the micrometer screw. The light-transmitting areas and the non-light-transmitting areas of the two sheet elements are staggered to form a double slit. Compared with the prior art, the application has the advantages that the precise adjustment of the width of a single slit and the distance between double slits can be realized simultaneously, and the occurrence of the phenomenon of missing steps can be effectively avoided.

Description

Technical Field

[0001] This invention relates to the field of physical optical measurement, and in particular to a double-slit interference experimental apparatus. Background Technology

[0002] The double-slit interference experiment is one of the most classic and fundamental experiments in physical optics for verifying the wave nature of light. In the phenomenon observed in the double-slit interference experiment, the interference pattern typically obtained consists of parallel straight fringes with equal spacing, brightness, and width. This interference pattern is an idealized result, obtainable only when the slit width is infinitesimally small. However, in actual experiments, if the slit width is relatively narrow, the light intensity passing through the slits is weak, resulting in a less clear interference pattern. Therefore, in practical experiments, the slit width is usually relatively wide. The light intensity of the interference pattern gradually decreases from the center to both sides, indicating that the light intensity is affected by the slit width. Choosing an appropriate slit width based on the light source is a prerequisite for obtaining a good interference pattern. Furthermore, when the slit spacing is an integer multiple of the slit width, missing orders may appear in the interference results.

[0003] Currently, the double-slit width and spacing commonly used in experiments are fixed and non-adjustable. When the double-slit spacing and width are large, although the interference pattern fringes are wide, the light intensity attenuates rapidly. When the double-slit spacing and width are small, the interference fringes are too dense, making measurement difficult. Experiments often require the use of digital equipment such as cameras to measure data, which hinders students' understanding of the experimental principles and applications. Therefore, designing a double-slit interference device that effectively avoids missing stages while allowing for adjustable double-slit width and spacing is a problem that needs to be solved in this field. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art, such as the inability to adjust the double slit width and the double slit spacing, and the difficulty in avoiding missing stages, by providing a double slit interference experimental device.

[0005] The objective of this invention can be achieved through the following technical solutions:

[0006] According to a first aspect of the present invention, a double-slit interference experimental apparatus is provided, comprising an optical platform, and further comprising a first sheet element, a second sheet element, a first slot, a second slot, and a micrometer.

[0007] The first sheet element includes a first light-transmitting area, a first opaque area, a second light-transmitting area, and a second opaque area arranged sequentially. The second sheet element includes a third opaque area, a third light-transmitting area, and a fourth opaque area arranged sequentially. The first sheet element and the second sheet element are in close contact. The first sheet element is fixed to the first slot, which is fixed to the optical platform. The second sheet element is fixed to the second slot. The micrometer includes a micrometer screw, a knob, and a scale, and is fixed to the optical platform. The end of the micrometer screw is aligned with the end of the second slot near the fourth opaque area.

[0008] When the knob is rotated, the micrometer screw pushes the second slot, and the second slot moves along the axis of the micrometer screw; when the edges of the first light-transmitting area and the third opaque area are aligned, the projections of the first light-transmitting area and the third opaque area overlap, the projections of the first opaque area and the third light-transmitting area overlap, and the projections of the second light-transmitting area and the fourth opaque area overlap.

[0009] As a preferred technical solution, the optical platform is provided with a groove, in which an elastic element is placed. One end of the groove away from the micrometer is fixedly connected to one end of the elastic element, and the other end of the elastic element is fixedly connected to the second slot.

[0010] As a preferred technical solution, the micrometer is fixed to the optical platform by a mounting bracket.

[0011] As a preferred technical solution, the scale includes a fixed scale and a movable scale, and the knob includes a coarse adjustment knob and a fine adjustment knob.

[0012] As a preferred technical solution, the widths of the light-transmitting area and the opaque area of ​​the first sheet element are equal.

[0013] As a preferred technical solution, the width of the light-transmitting area is less than or equal to 1.5 mm.

[0014] As a preferred technical solution, the first sheet element is a glass sheet or a metal sheet, and the second sheet element has the same material and thickness as the first sheet element.

[0015] As a preferred technical solution, the opaque area of ​​the glass sheet is covered with an opaque film.

[0016] As a preferred technical solution, the light-transmitting area of ​​the metal sheet has a hollow structure, and the edge of the hollow structure has a blade structure.

[0017] As a preferred technical solution, the first card slot and the second card slot have the same structure and are arranged opposite to each other. The first card slot includes a base and a protrusion. The base is fixed on the optical platform, and the protrusion is fixed on the base. The difference in width between the base and the protrusion is equal to the thickness of the first sheet element.

[0018] Compared with the prior art, the present invention has the following beneficial effects:

[0019] 1. This invention employs two sheet-like elements with evenly spaced transparent and opaque areas, positioned close together. When the edges of the first transparent area and the third opaque area are aligned, their projections overlap. Similarly, the projections of the first transparent area and the third opaque area overlap, as do the projections of the first opaque area and the third transparent area. The projections of the second transparent area and the fourth opaque area also overlap. A micrometer is fixed to an optical platform, with the end of the micrometer screw aligned with the end of the second slot near the fourth opaque area. When the knob is rotated, the micrometer screw pushes the second slot, causing it to move along the axis of the micrometer screw. The button causes the micrometer screw to push the second slot and move the second sheet element. When the edges of the first transparent area and the third opaque area are misaligned, the edges of the second transparent area and the fourth opaque area are also misaligned, resulting in a double slit. When the light source passes through the two sheet elements, double-slit interference can be formed. At the same time, the width of the second opaque area is not limited, and the width of the single slit and the distance between the double slits can be precisely adjusted. Thus, during the experiment, the appropriate slit width and slit distance can be selected according to the wavelength of the light source to obtain a clearer interference pattern. The application measurement of the double-slit interference pattern can be realized without the need for digital equipment such as cameras and computers.

[0020] 2. This invention fixes the micrometer on an optical platform and allows the single slit width and double slit spacing values ​​for each adjustment to be obtained directly through the scale reading. At the same time, it avoids positions where the slit spacing is an integer multiple of the slit width, effectively preventing the occurrence of missing levels.

[0021] 3. The present invention provides a groove on the optical platform, which can accommodate an elastic element of its natural length. One end of the groove is fixed to one end of the elastic element, and the other end of the elastic element is fixed to the second slot. After the micrometer screw pushes the second slot, the second slot can be reset by turning the knob. The operation is simple and beneficial to teaching. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the device in an embodiment of the present invention;

[0023] Figure 2 This is a schematic diagram of the light-transmitting and opaque areas of two sheet-like elements in an embodiment of the present invention;

[0024] Figure 3This is a schematic diagram of the connection structure between the movable card slot and the optical platform in an embodiment of the present invention;

[0025] Figure 4 This is a schematic diagram of the card slot structure in an embodiment of the present invention;

[0026] Figure 5 This is a schematic diagram of the interference patterns generated under different slit widths and double slit spacings in an embodiment of the present invention;

[0027] The components are: 1. Optical platform; 2. First sheet element; 3. Second sheet element; 4. First slot; 5. Second slot; 6. Micrometer; 7. Fixture; 11. Groove; 12. Elastic element; 21. First light-transmitting area; 22. First opaque area; 23. Second light-transmitting area; 24. Second opaque area; 31. Third opaque area; 32. Third light-transmitting area; 33. Fourth opaque area; 41. Base; 42. Protrusion; 61. Micrometer screw; 62. Coarse adjustment knob; 63. Fine adjustment knob; 64. Fixed scale; 65. Movable scale. Detailed Implementation

[0028] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments. These embodiments are based on the technical solution of the present invention and provide detailed implementation methods and specific operating procedures. However, the scope of protection of the present invention is not limited to the following embodiments.

[0029] Example

[0030] like Figure 1 As shown, this embodiment provides a double-slit interference experimental apparatus, including an optical platform 1, a first sheet element 2, a second sheet element 3, a first slot 4, a second slot 5, and a micrometer 6. The first slot 4 is a fixed slot, and the second slot 5 is a movable slot.

[0031] The first sheet element 2 includes a first light-transmitting area 21, a first opaque area 22, a second light-transmitting area 23, and a second opaque area 24 arranged sequentially. The second sheet element 3 includes a third opaque area 31, a third light-transmitting area 32, and a fourth opaque area 33 arranged sequentially. The first sheet element 2 and the second sheet element 3 are in close contact. Figure 1 (This is for illustrative purposes only, to more clearly show the distribution of the light-transmitting and opaque areas of the two sheet-like elements). The first sheet-like element 2 is fixed on the first slot 4, which is fixed on the optical platform 1. The second sheet-like element 3 is fixed on the second slot 5 and can move with the movement of the second slot 5.

[0032] The first sheet element 2 and the second sheet element 3 are made of the same material and have the same thickness, and both are rectangular. Both sheet elements are made of glass, and the opaque areas of the glass sheets are achieved by adhering an opaque film. The thickness of both glass sheets is between 0 and 0.5 mm. Figure 2 As shown, the two sheet-like elements have the same height, both 25mm; the widths of the first translucent area 21 and the third opaque area 31 are both ≥1mm, the widths of the first opaque area 22, the second translucent area 23, the third translucent area 32, and the fourth opaque area 33 are all 1mm, and the width of the second opaque area 24 is 5mm. In practical applications, the width of the 1mm section can be changed as needed, ranging from 0-1.5mm. In this case, the single-slit width varies between 0 and 1.5mm, the double-slit spacing varies between 0 and 3mm, and other dimensions can be adjusted according to actual needs.

[0033] The micrometer 6 includes a micrometer screw 61, a coarse adjustment knob 62, a fine adjustment knob 63, a fixed scale 64, and a movable scale 65, and is fixed to the optical platform 1 by a mounting bracket 7. The end of the micrometer screw 61 is engaged with the end of the second slot 5 near the fourth opaque zone 33. The distance the second slot 5 moves can be obtained by reading the fixed scale 64 and the movable scale 65. The single slit width and double slit spacing values ​​for each adjustment are directly obtained by reading the scales, while avoiding positions where the slit spacing is an integer multiple of the slit width, effectively preventing the occurrence of missing grades.

[0034] like Figure 3 As shown, the optical platform 1 is also provided with a groove 11, in which an elastic element 12 is placed. One end of the groove 11 away from the micrometer 6 is fixedly connected to one end of the elastic element 12, and the other end of the elastic element 12 is fixedly connected to the second slot 5. The fixed connection can be achieved by fasteners such as screws. The elastic element 12 can be a spring, and the length of the groove 11 can accommodate the elastic element 12 in its naturally extended state. After rotating the coarse adjustment knob 62 or the fine adjustment knob 63 to push the micrometer screw 61 into the second slot 5, rotating the knob in the opposite direction allows the second slot 5 to automatically reset due to the adjustable stiffness of the elastic element 12, greatly improving the convenience of operation.

[0035] The first card slot 4 and the second card slot 5 have the same structure and are positioned opposite each other. Figure 4 The basic structures of the first slot 4 and the second slot 5 are shown. Taking the first slot 4 as an example, it includes a base 41 and a protrusion 42. The base 41 is fixed to the optical platform 1, and the protrusion 42 is fixed to the base 41. The difference in width between the base 41 and the protrusion 42 is equal to the thickness of the first sheet element 3. Correspondingly, the second slot 5 also includes a base and a protrusion. The ends of the bases of the two slots away from their respective protrusions are tightly attached, thereby ensuring that the first sheet element 2 and the second sheet element 3 are tightly attached to each other to ensure the accuracy of the double-slit experiment. In some cases, the difference in width may also be slightly greater than the thickness of the second sheet element 3.

[0036] When the edges of the first light-transmitting area 21 and the third opaque area 31 are aligned, the edge is the side edge away from the micrometer 6. The projections of the first light-transmitting area 21 and the third opaque area 31 overlap, the projections of the first opaque area 22 and the third light-transmitting area 32 overlap, and the projections of the second light-transmitting area 23 and the fourth opaque area 33 overlap. That is, the light-transmitting and opaque areas of the two sheet-like elements are just misaligned and aligned. The width of each single slit is 0. At this time, the elastic element 12 is in a natural elongated state, the reading of the micrometer 6 is 0, and the maximum value of the double slit spacing is the sum of the widths of the first opaque area 22 and the fourth opaque area 33.

[0037] Rotate the coarse adjustment knob 62 or the fine adjustment knob 63 to push the micrometer screw 61 into the second slot 5. The second slot 5 moves along the axis of the micrometer screw 61. At this time, the elastic element 12 is in a contracted state, causing the edges of the first light-transmitting area 21 and the third opaque area 31, as well as the second opaque area and the fourth light-transmitting area, to be simultaneously misaligned. The light-transmitting and opaque areas of the two sheet-like elements are misaligned, and the misalignment width is the slit width of a single slit. The single slit width can be obtained by reading with a micrometer 6. The double slit spacing is the sum of the widths of the first opaque area 22 and the fourth opaque area 33 minus the slit width. The minimum double slit spacing is the width of either the first opaque area 22 or the fourth opaque area 33 when they overlap. Figure 5 The diagram shows the interference patterns produced by the double-slit interference experimental apparatus provided in this embodiment under two different slit widths and double-slit spacings. It can be seen that when the slit width and double-slit spacing are adjustable, the phenomenon of missing levels can be effectively avoided.

[0038] In some other embodiments, the widths of the light-transmitting and opaque areas of the two sheet-like elements are equal, and can be set between 0 and 1.5 mm as needed.

[0039] In some other embodiments, the double slit spacing is adjustable between 0.5 and 3 mm.

[0040] In some other embodiments, the two sheet-like elements may be metal sheets, the light-transmitting area of ​​the metal sheet is a hollow structure, the edge of the hollow structure is a blade structure, and the edge thickness of each single slit is the blade thickness.

[0041] The apparatus provided in this embodiment can be applied to various double-slit interference experiments. To meet the interference experiments of different wavelength light sources, different maximum single-slit widths can be selected, thereby obtaining different double-slit spacings. The larger the spacing, the denser the obtained interference pattern. Therefore, different maximum single-slit widths can be designed according to actual needs to obtain double slits of different specifications.

[0042] The preferred embodiments of the present invention have been described in detail above. It should be understood that those skilled in the art can make numerous modifications and variations based on the concept of the present invention without creative effort. Therefore, all technical solutions that can be obtained by those skilled in the art based on the concept of the present invention through logical analysis, reasoning, or limited experimentation on the basis of existing technology should be within the scope of protection defined by the claims.

Claims

1. A dual slit interference experiment apparatus comprising an optical platform, characterized in that, The first sheet element, the second sheet element, the first clamping groove, the second clamping groove and the micrometer are also included, The first sheet element comprises a first light-transmitting area, a first light-blocking area, a second light-transmitting area and a second light-blocking area arranged in sequence, and the second sheet element comprises a third light-blocking area, a third light-transmitting area and a fourth light-blocking area arranged in sequence, the first sheet element is in close contact with the second sheet element, the first sheet element is fixed on the first clamping groove, the first clamping groove is fixed on the optical platform, the second sheet element is fixed on the second clamping groove, the micrometer comprises a micrometer screw, a knob and a scale, and is fixed on the optical platform, and the end of the micrometer screw is in butt joint with the end of the second clamping groove close to the side of the fourth light-blocking area. When the knob is rotated, the micrometer screw pushes the second clamping groove, and the second clamping groove moves along the axis direction of the micrometer screw; when the edges of the first light-transmitting area and the third light-blocking area are aligned, the projection of the first light-transmitting area overlaps with the third light-blocking area, the projection of the first light-blocking area overlaps with the third light-transmitting area, and the projection of the second light-transmitting area overlaps with the fourth light-blocking area.

2. The double-slit interference experiment apparatus according to claim 1, wherein The optical platform is provided with a groove, an elastic element is placed in the groove, one end of the groove away from the micrometer is fixedly connected with one end of the elastic element, and the other end of the elastic element is fixedly connected with the second clamping groove.

3. The double-slit interference experiment apparatus according to claim 1, wherein The micrometer is fixed on the optical platform through a fixing frame.

4. The double-slit interference experiment apparatus according to claim 1, wherein The scale comprises a fixed scale and a movable scale, and the knob comprises a coarse knob and a fine knob.

5. The double-slit interference experiment apparatus according to claim 1, wherein The width of the light-transmitting area and the light-blocking area of the first sheet element is equal.

6. The double-slit interference experimental apparatus according to claim 5, wherein The width of the light-transmitting area is less than or equal to 1.5 mm.

7. The double-slit interference experiment apparatus according to claim 1, wherein The first sheet element is a glass sheet or a metal sheet, and the second sheet element has the same material and thickness as the first sheet element.

8. The double-slit interference experiment apparatus according to claim 7, wherein The light-blocking film is attached to the light-blocking area of the glass sheet.

9. The double-slit interference experiment apparatus according to claim 7, wherein The light-transmitting area of the metal sheet is a hollow structure, and the edge of the hollow structure is a blade structure.

10. The double-slit interference experiment apparatus according to claim 7, wherein The first clamping groove and the second clamping groove have the same structure and are oppositely arranged, the first clamping groove comprises a base and a protruding part, the base is fixed on the optical platform, the protruding part is fixed on the base, and the difference between the width of the base and the protruding part is equal to the thickness of the first sheet element.

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