Leakage test methods, equipment, devices, media and products

By measuring and adjusting the zero current of the test device during the leakage testing phase, and performing leakage current measurement after meeting the requirements, the problem of low leakage current measurement accuracy in the prior art is solved, and higher measurement accuracy is achieved.

CN118818240BActive Publication Date: 2025-03-21NEXCHIP SEMICON CO LTD
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Patent Information

Application Number
CN202411292368.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-09-14
Publication Date
2025-03-21
Estimated Expiration
2044-09-14

AI Technical Summary

Technical Problem

In the prior art, the leakage current measurement accuracy is low, mainly due to the environment in which the test device is located and the connected leakage test components.

Method used

During the leakage testing phase, the zero-position current of the test device is measured first. If the leakage testing requirements are not met, the connected leakage testing components are discharged until the zero-position current meets the requirements. Then the test voltage is applied and the leakage current is measured. Through this method, the impact of zero current on leakage current measurement is avoided and the measurement accuracy is improved.

Benefits of technology

Through this method, the impact of zero current on leakage current measurement can be effectively avoided, the accuracy of leakage current measurement is improved, and the measured leakage current is as free as possible.

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Abstract

The present application relates to a leakage test method, equipment, device, medium and product. The method comprises: in the leakage test stage, firstly measuring the zero-position current of the test device, and when the zero-position current of the test device does not meet the leakage test requirements, discharging the leakage test component connected to the test device within a preset time until the zero-position current of the test device meets the leakage test requirements, and then applying a test voltage to the test device, and measuring the leakage current when the test device responds to the test voltage; in this way, the leakage current of the test device is measured only when the zero-position current of the test device meets the leakage test requirements, so as to avoid the measurement of the leakage current being affected by the zero-position current, and make the measured leakage current as free of the zero-position current as possible, thereby improving the leakage current measurement accuracy.
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